DLA SMD-5962-97623 REV A-2009 MICROCIRCUIT DIGITAL ADVANCED BIPOLAR CMOS OCTAL TRANSCEIVER WITH BUS HOLD AND THREE-STATE OUTPUTS TTL COMPATIBLE INPUTS MONOLITHIC SILICON.pdf

1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Update the boilerplate paragraphs to current requirements as specified in MIL-PRF-38535. - jak 09-05-14 Thomas M. Hess REV SHEET REV A A A SHEET 15 16 17 REV STATUS REV A A A A A A A A A A A A A A OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 12 13 14

2、PMIC N/A PREPARED BY Joseph A. Kerby STANDARD MICROCIRCUIT DRAWING CHECKED BY Charles F. Saffle, Jr. DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 http:/www.dscc.dla.mil THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS APPROVED BY Monica L. Poelking MICROCIRCUIT, DIGITAL, ADVANCED BIP

3、OLAR CMOS, OCTAL TRANSCEIVER WITH BUS HOLD AND THREE-STATE OUTPUTS, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON AND AGENCIES OF THE DEPARTMENT OF DEFENSE DRAWING APPROVAL DATE 99-09-29 AMSC N/A REVISION LEVEL A SIZE A CAGE CODE 67268 5962-97623 SHEET 1 OF 17 DSCC FORM 2233 APR 97 5962-E302-09 Provided

4、 by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-97623 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing documents two product ass

5、urance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) leve

6、ls is reflected in the PIN. 1.2 PIN. The PIN is as shown in the following example: 5962 - 97623 01 Q R A Federal RHA Device Device Case Lead stock class designator type class outline finish designator (see 1.2.1) (see 1.2.2) designator (see 1.2.4) (see 1.2.5) / (see 1.2.3) / Drawing number 1.2.1 RHA

7、 designator. Device classes Q and V RHA marked devices meet the MIL-PRF-38535 specified RHA levels and are marked with the appropriate RHA designator. Device class M RHA marked devices meet the MIL-PRF-38535, appendix A specified RHA levels and are marked with the appropriate RHA designator. A dash

8、(-) indicates a non-RHA device. 1.2.2 Device type(s). The device type(s) identify the circuit function as follows: Device type Generic number Circuit function 01 54ABTH245 Octal Bus transceiver with bus hold and 3-state outputs TTL compatible inputs 1.2.3 Device class designator. The device class de

9、signator is a single letter identifying the product assurance level as follows: Device class Device requirements documentation M Vendor self-certification to the requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A Q or V Certificat

10、ion and qualification to MIL-PRF-38535 1.2.4 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style R GDIP1-T20 or CDIP2-T20 20 Dual-in-line S GDFP2-F20 or CDFP3-F20 20 Flat pack 2 CQCC1-N20 20 Square leadl

11、ess chip carrier 1.2.5 Lead finish. The lead finish is as specified in MIL-PRF-38535 for device classes Q and V or MIL-PRF-38535, appendix A for device class M. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962

12、-97623 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 3 DSCC FORM 2234 APR 97 1.3 Absolute maximum ratings. 1/ 2/ 3/ Supply voltage range (VCC) -0.5 V dc to +7.0 V dc DC input voltage range except I/O ports (VIN) -0.5 V dc to +7.0 V dc 4/ DC output voltage range (VOU

13、T) . -0.5 V dc to +5.5 V dc 4/ DC input clamp current (IIK) -18 mA DC output clamp current (IOK) -50 mA DC output current (IOL) (per output). +96 mA Storage temperature range (TSTG). -65C to +150C Lead temperature (soldering, 10 seconds). +300C Thermal resistance, junction-to-case (JC) . See MIL-STD

14、-1835 Junction temperature (TJ) +175C Maximum power dissipation (PD) . 500 mW 1.4 Recommended operating conditions. 2/ 3/ Supply voltage range (VCC) (Operating) . +4.5 V dc to +5.5 V dc Input voltage range (VIN) +0.0 V dc to VCCOutput voltage range (VOUT). +0.0 V dc to VCC Maximum low level input vo

15、ltage (VIL) +0.8 V Maximum high level input voltage (VIH) +2.0 V Case operating temperature range (TC). -55C to +125C Maximum input rise or fall rate (t/V). 5 ns/V Maximum high level output current (IOH) -24 mA Maximum low level output current (IOL) +48 mA _ 1/ Stresses above the absolute maximum ra

16、ting may cause permanent damage to the device. Extended operation at the maximum levels may degrade performance and affect reliability. 2/ Unless otherwise noted, all voltages are referenced to GND. 3/ The limits for the parameters specified herein shall apply over the full specified VCCrange and ca

17、se temperature range of -55C to +125C. 4/ The input and output negative voltage ratings may be exceeded provided that the input and output clamp current ratings are observed. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWI

18、NG SIZE A 5962-97623 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 4 DSCC FORM 2234 APR 97 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to the extent

19、 specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method S

20、tandard Microcircuits. MIL-STD-1835 - Interface Standard Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are available online at http:/assist.daps.dla.

21、mil/quicksearch/ or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in

22、 this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 3. REQUIREMENTS 3.1 Item requirements. The individual item requirements for device classes Q and V shall be in accordance with MIL-PRF-38535 and as specified herein or as modified in th

23、e device manufacturers Quality Management (QM) plan. The modification in the QM plan shall not affect the form, fit, or function as described herein. The individual item requirements for device class M shall be in accordance with MIL-PRF-38535, appendix A for non-JAN class level B devices and as spe

24、cified herein. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38535 and herein for device classes Q and V or MIL-PRF-38535, appendix A and herein for device class M. 3.2.1 Case outlines. The case outlines shall be

25、 in accordance with 1.2.4 herein. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 1. 3.2.3 Truth table. The truth table shall be as specified on figure 2. 3.2.4 Logic diagram. The logic diagram shall be as specified on figure 3. 3.2.5 Ground bounce test circuit a

26、nd waveforms. The ground bounce test circuit and waveforms shall be as specified on figure 4. 3.2.6 Switching waveforms and test circuit. The switching waveforms and test circuit shall be as specified on figure 5. Provided by IHSNot for ResaleNo reproduction or networking permitted without license f

27、rom IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-97623 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 5 DSCC FORM 2234 APR 97 3.2.7 Radiation exposure circuit. The radiation exposure circuit shall be as specified when available. 3.3 Electrical performance charac

28、teristics and postirradiation parameter limits. Unless otherwise specified herein, the electrical performance characteristics and postirradiation parameter limits are as specified in table I and shall apply over the full case operating temperature range. 3.4 Electrical test requirements. The electri

29、cal test requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are defined in table I. 3.5 Marking. The part shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers PIN may also be marked. For packages where marking of the entire

30、SMD PIN number is not feasible due to space limitations, the manufacturer has the option of not marking the “5962-“ on the device. For RHA product using this option, the RHA designator shall still be marked. Marking for device classes Q and V shall be in accordance with MIL-PRF-38535. Marking for de

31、vice class M shall be in accordance with MIL-PRF-38535, appendix A. 3.5.1 Certification/compliance mark. The certification mark for device classes Q and V shall be a “QML“ or “Q“ as required in MIL-PRF-38535. The compliance mark for device class M shall be a “C“ as required in MIL-PRF-38535, appendi

32、x A. 3.6 Certificate of compliance. For device classes Q and V, a certificate of compliance shall be required from a QML-38535 listed manufacturer in order to supply to the requirements of this drawing (see 6.6.1 herein). For device class M, a certificate of compliance shall be required from a manuf

33、acturer in order to be listed as an approved source of supply in MIL-HDBK-103 (see 6.6.2 herein). The certificate of compliance submitted to DSCC-VA prior to listing as an approved source of supply for this drawing shall affirm that the manufacturers product meets, for device classes Q and V, the re

34、quirements of MIL-PRF-38535 and herein or for device class M, the requirements of MIL-PRF-38535, appendix A and herein. 3.7 Certificate of conformance. A certificate of conformance as required for device classes Q and V in MIL-PRF-38535 or for device class M in MIL-PRF-38535, appendix A shall be pro

35、vided with each lot of microcircuits delivered to this drawing. 3.8 Notification of change for device class M. For device class M, notification to DSCC-VA of change of product (see 6.2 herein) involving devices acquired to this drawing is required for any change that affects this drawing. 3.9 Verifi

36、cation and review for device class M. For device class M, DSCC, DSCCs agent, and the acquiring activity retain the option to review the manufacturers facility and applicable required documentation. Offshore documentation shall be made available onshore at the option of the reviewer. 3.10 Microcircui

37、t group assignment for device class M. Device class M devices covered by this drawing shall be in microcircuit group number 126 See MIL-PRF-38535, appendix A). Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-

38、97623 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 6 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Test and MIL-STD-883 test method 1/ Symbol Test condition 2/ -55C TC +125C 4.5 V VCC 5.5 V unless otherwise specified Device type VCCGroup A

39、subgroups Limits 3/ Unit Min Max Negative input clamp voltage 3022 VIC-For input under test IIN= -18 mA All 4.5 V 1, 2, 3 -1.2 V High level output voltage 3006 VOH1For all inputs affecting output under test VIH= 2.0 V or VIL= 0.8 V IOH= -3 mA All 4.5 V 1, 2, 3 2.5 V VOH2For all inputs affecting outp

40、ut under test VIH= 2.0 V or VIL= 0.8 V IOH= -3 mA All 5.0 V 1, 2, 3 3.0 VOH3For all inputs affecting output under test VIH= 2.0 V or VIL= 0.8 V IOH= -24 mA All 4.5 V 1, 2, 3 2.0 Low level output voltage 3007 VOLFor all inputs affecting output under test VIH= 2.0 V or VIL= 0.8 V IOH= 48 mA All 4.5 V

41、1, 2, 3 0.55 V Three-state Power-up current IOZPU 4/ OE = 2.0 V or 0.0 V VOUT= 0.5 V to 2.7 V All 0.0 V to 2.1 V 1, 2, 3 50.0 A Three-state Power-down current IOZPD 4/ OE = 2.0 V or 0.0 V VOUT= 0.5 V to 2.7 V All 2.1 V to 0.0 V 1, 2, 3 50.0 A Off-state leakage current IOFFFor output under test VINor

42、 VOUT= 4.5 V All other pins at 0.0 V All 0.0 V 1 100.0 A High-state leakage current ICEXFor output under test VOUT= 5.5 V Outputs at high logic state All 5.5 V 1, 2, 3 50.0 A VIN= 0.8 V 1, 2, 3 +100.0 A Input hold current II(hold) A or B ports VIN= 2.0 V All 4.5 V 1, 2, 3 -100.0 Input current high I

43、IHFor input under test Control 3010 VIN= VCCinput All +1.0 A 5/ A or B ports All 5.5 V 1, 2, 3 +100.0 Input current low IILFor input under test Control 3010 VIN= GND input All -1.0 A 5/ A or B ports All 5.5 V 1, 2, 3 -100.0 Output current 3011 IOUT 6/ VOUT= 2.5 V All 5.5 V 1, 2, 3 -50.0 -180.0 A See

44、 footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-97623 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 7 DSCC FORM 2234 APR 97 TABLE I. Electrical pe

45、rformance characteristics - Continued. Test and MIL-STD-883 test method 1/ Symbol Test condition 2/ -55C TC +125C 4.5 V VCC 5.5 V unless otherwise specified Device type VCCGroup A subgroups Limits 3/ Unit Min Max Quiescent supply current delta ICCFor input under test, VIN= 3.4 V Data inputs, outputs

46、 TTL input levels 7/ For all other inputs, enabled All 5.5 V 1, 2, 3 1.5 mA 3005 VIN= VCCor GND Data inputs, outputs disabled All 5.5 V 1, 2, 3 1.5 mA Control inputs All 5.5 V 1, 2, 3 1.5 mA Quiescent supply current, output high 3005 ICCHVIN= VCCor GND IOUT= 0.0 A A or B ports All 5.5 V 1, 2, 3 250.

47、0 A Quiescent supply current, output low 3005 ICCLVIN= VCCor GND IOUT= 0.0 A A or B ports All 5.5 V 1, 2, 3 30.0 mA Quiescent supply current, output three-state 3005 ICCZVIN= VCCor GND IOUT= 0.0 A A or B ports All 5.5 V 1, 2, 3 250.0 A Input capacitance, control inputs CINSee 4.4.1c TC= +25C pF 3012

48、 All 5.0 V 4 9.0 Output capacitance, control inputs CI/OSee 4.4.1c TC= +25C pF 3012 All 5.0 V 4 11.0 Low level ground bounce VOLPnoise 8/ VIH= 3.0 V VIL= 0.0 V TA= +25C See figure 4 All 5.0 V 4 750 mV High level ground bounce VOLVnoise 8/ See 4.4.1d All 5.0 V 4 -1250 mV High level VCCbounce noise VOHP8/ All 5.0 V 4 1750 mV High level VCCbounce noise VOHV/ All 5.0 V 4 -750 mV See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-S