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本文(DLA SMD-5962-97628 REV D-2011 MICROCIRCUIT HYBRID H-BRIDGE PULSE WIDTH MODULATOR MOTOR DRIVER AMPLIFIER.pdf)为本站会员(brainfellow396)主动上传,麦多课文库仅提供信息存储空间,仅对用户上传内容的表现方式做保护处理,对上载内容本身不做任何修改或编辑。 若此文所含内容侵犯了您的版权或隐私,请立即通知麦多课文库(发送邮件至master@mydoc123.com或直接QQ联系客服),我们立即给予删除!

DLA SMD-5962-97628 REV D-2011 MICROCIRCUIT HYBRID H-BRIDGE PULSE WIDTH MODULATOR MOTOR DRIVER AMPLIFIER.pdf

1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Add device type 02 and vendor CAGE 51651. Update drawing boilerplate to the most current format. 03-03-03 Raymond Monnin B Updated drawing to the latest requirements. -sld 06-10-24 Raymond Monnin C 1.3 and 1.4, supply voltage and logic supply, co

2、rrect : 80 V, 28 V and 16 V, 12 V to +80 V, +28 V and +16 V, +12 V. 1.3, power dissipation, add TC +25C. Figure 1, dimension D max, correct .770“ and 19.56 mm to .780“ and 19.81 mm. Add note to table II, Group C end-point test parameters. -gz 09-06-04 Joseph D. RodenbeckD Updated drawing paragraphs.

3、 -sld 11-02-17 Charles F. Saffle REV SHEET REV SHEET REV STATUS REV D D D D D D D D D OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 PMIC N/A PREPARED BY Gary Zahn DLA LAND AND MARITIME STANDARD MICROCIRCUIT DRAWING CHECKED BY Michael C. Jones COLUMBUS, OHIO 43218-3990 http:/www.dscc.dla.mil THIS DRAWING IS AVAI

4、LABLE FOR USE BY ALL DEPARTMENTS AND AGENCIES OF THE DEPARTMENT OF DEFENSE APPROVED BY Kendall A. Cottongim MICROCIRCUIT, HYBRID, H-BRIDGE, PULSE WIDTH MODULATOR MOTOR DRAWING APPROVAL DATE 97-09-03 DRIVER/AMPLIFIER AMSC N/A REVISION LEVEL D SIZE A CAGE CODE 67268 5962-97628 SHEET 1 OF 9 DSCC FORM 2

5、233 APR 97 5962-E117-11 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-97628 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing do

6、cuments five product assurance classes as defined in paragraph 1.2.3 and MIL-PRF-38534. A choice of case outlines and lead finishes which are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of radiation hardness assurance levels are reflected in the PIN.

7、 1.2 PIN. The PIN shall be as shown in the following example: 5962 - 97628 01 H X A Federal RHA Device Device Case Lead stock class designator type class outline finish designator (see 1.2.1) (see 1.2.2) designator (see 1.2.4) (see 1.2.5) / (see 1.2.3) / Drawing number 1.2.1 Radiation hardness assur

8、ance (RHA) designator. RHA marked devices shall meet the MIL-PRF-38534 specified RHA levels and shall be marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device. 1.2.2 Device type(s). The device type(s) identify the circuit function as follows: Device type Generic number Ci

9、rcuit function 01 SA 50M H-bridge, pulse width modulator motor driver/amplifier 02 MSK 4200B H-bridge, pulse width modulator motor driver/amplifier 1.2.3 Device class designator. This device class designator shall be a single letter identifying the product assurance level. All levels are defined by

10、the requirements of MIL-PRF-38534 and require QML Certification as well as qualification (Class H, K, and E) or QML Listing (Class G and D). The product assurance levels are as follows: Device class Device performance documentation K Highest reliability class available. This level is intended for us

11、e in space applications. H Standard military quality class level. This level is intended for use in applications where non-space high reliability devices are required. G Reduced testing version of the standard military quality class. This level uses the Class H screening and In-Process Inspections w

12、ith a possible limited temperature range, manufacturer specified incoming flow, and the manufacturer guarantees (but may not test) periodic and conformance inspections (Group A, B, C, and D). E Designates devices which are based upon one of the other classes (K, H, or G) with exception(s) taken to t

13、he requirements of that class. These exception(s) must be specified in the device acquisition document; therefore the acquisition document should be reviewed to ensure that the exception(s) taken will not adversely affect system performance. D Manufacturer specified quality class. Quality level is d

14、efined by the manufacturers internal, QML certified flow. This product may have a limited temperature range. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-97628 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-39

15、90 REVISION LEVEL D SHEET 3 DSCC FORM 2234 APR 97 1.2.4 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style X See figure 1 8 Flange mount package 1.2.5 Lead finish. The lead finish shall be as specified

16、in MIL-PRF-38534. 1.3 Absolute maximum ratings. 1/ Supply voltage (+VS) . +80 V dc Logic supply (+VCC) +16 V dc Continuous output current. 5 A Peak output current (T 100 ms) . 7 A Input voltage (VIN) . +VCCTotal power dissipation (PD) TC +25C . 60 W/Transistor Thermal resistance (output switches) .

17、2.6C/W Junction temperature (TJ) . +175C Storage temperature range . -65C to +150C Lead temperature (soldering, 10 seconds) . +300C 1.4 Recommended operating conditions. Supply voltage (+VS) . +28 V dc Logic supply (+VCC) +12 V dc Input voltage (VIN) . +4 V dc to +8 V dc Case operating temperature r

18、ange (TC) -55C to +125C 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the s

19、olicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATIONS MIL-PRF-38534 - Hybrid Microcircuits, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard Electronic Component Case Outlines. DEPARTMENT OF DEFENSE

20、 HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are available online at https:/assist.daps.dla.mil/quicksearch/ or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia,

21、PA 19111-5094.) 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained

22、. 1/ Stresses above the absolute maximum rating may cause permanent damage to the device. Extended operation at the maximum levels may degrade performance and affect reliability. All voltages are with respect to ground and are at +25C. Provided by IHSNot for ResaleNo reproduction or networking permi

23、tted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-97628 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 4 DSCC FORM 2234 APR 97 3. REQUIREMENTS 3.1 Item requirements. The individual item performance requirements for device classes D, E, G, H, and K sh

24、all be in accordance with MIL-PRF-38534. Compliance with MIL-PRF-38534 shall include the performance of all tests herein or as designated in the device manufacturers Quality Management (QM) plan or as designated for the applicable device class. The manufacturer may eliminate, modify or optimize the

25、tests and inspections herein, however the performance requirements as defined in MIL-PRF-38534 shall be met for the applicable device class. In addition, the modification in the QM plan shall not affect the form, fit, or function of the device for the applicable device class. 3.2 Design, constructio

26、n, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38534 and herein. 3.2.1 Case outline(s). The case outline(s) shall be in accordance with 1.2.4 herein and figure 1. 3.2.2 Terminal connections. The terminal connections shall be as specifie

27、d on figure 2. 3.2.3 Schematic diagram. The schematic diagram shall be as specified on figure 3. 3.3 Electrical performance characteristics. Unless otherwise specified herein, the electrical performance characteristics are as specified in table I and shall apply over the full specified operating tem

28、perature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are defined in table I. 3.5 Marking of device(s). Marking of device(s) shall be in accordance with MIL-PRF-38534. The device shall b

29、e marked with the PIN listed in 1.2 herein. In addition, the manufacturers vendor similar PIN may also be marked. 3.6 Data. In addition to the general performance requirements of MIL-PRF-38534, the manufacturer of the device described herein shall maintain the electrical test data (variables format)

30、 from the initial quality conformance inspection group A lot sample, for each device type listed herein. Also, the data should include a summary of all parameters manually tested, and for those which, if any, are guaranteed. This data shall be maintained under document revision level control by the

31、manufacturer and be made available to the preparing activity (DLA Land and Maritime -VA) upon request. 3.7 Certificate of compliance. A certificate of compliance shall be required from a manufacturer in order to supply to this drawing. The certificate of compliance (original copy) submitted to DLA L

32、and and Maritime -VA shall affirm that the manufacturers product meets the performance requirements of MIL-PRF-38534 and herein. 3.8 Certificate of conformance. A certificate of conformance as required in MIL-PRF-38534 shall be provided with each lot of microcircuits delivered to this drawing. 4. VE

33、RIFICATION 4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF-38534 or as modified in the device manufacturers Quality Management (QM) plan. The modification in the QM plan shall not affect the form, fit, or function as described herein. Provided by I

34、HSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-97628 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 5 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Test Symbol Conditions

35、1/ -55C TC+125C Group A subgroups Device type Limits Unit unless otherwise specified Min Max Quiescent current IQ VIN= 6 V dc 1,2,3 01,02 20 mA ON voltage VDSID= 5 A 1 01,02 1.8 V 2 2.4 3 1.2 OFF leakage IDSSOutput off, VDS= 70 V, no load 1,3 01,02 25 A 2 250 Switching frequency FSVIN= 6 V dc 4 01,0

36、2 41 49 kHz 5,6 40 50 Duty cycle A DC A VIN= 3 V dc, verify 0%, TC= +25C 7 01,02 Pass/Fail VIN= 6 V dc, TC= +25C 4 40 60 % VIN= 9 V dc, verify 100%, TC= +25C 7 Pass/Fail Duty cycle B DC B VIN= 3 V dc, verify 100%, TC= +25C 7 01,02 Pass/Fail VIN= 6 V dc, TC= +25C 4 40 60 % VIN= 9 V dc, verify 0%, TC=

37、 +25C 7 Pass/Fail 1/ +VCC= +12 V dc, +VS= +28 V dc, RSENSE A, B= Ground, Load = 1 kohm, AOUTto BOUT, unless otherwise specified. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-97628 DLA LAND AND MARITIME COL

38、UMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 6 DSCC FORM 2234 APR 97 Case outline X. Symbol Millimeters Inches Min Max Min Max A - 6.35 - .250 b 0.97 1.07 .038 .042 D - 39.22 - 1.544 D - 19.81 - .780 E - 25.65 - 1.010 F - 2.54 - .100 L 12.19 12.70 .480 .500 p 3.84 4.09 .151 .161 q 30.02 30.28 1.182

39、 1.192 R 6.35 REF .250 REF s 15.06 REF .593 REF NOTE: 1. The U.S. preferred system of measurement is the metric SI. This item was designed using inch-pound units of measurement. In case of problems involving conflicts between the metric and inch-pound units, the inch-pound units shall rule. FIGURE 1

40、. Case outline(s). Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-97628 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 7 DSCC FORM 2234 APR 97 Device types 01 and 02 Case outline X Te

41、rminal number Terminal symbol 1 2 3 4 5 6 7 8 RSENSE BBOUT+VSAOUTRSENSE A+VCCGround Input FIGURE 2. Terminal connections. FIGURE 3. Schematic diagram. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-97628 DLA

42、 LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 8 DSCC FORM 2234 APR 97 TABLE II. Electrical test requirements. MIL-PRF-38534 test requirements Subgroups (in accordance with MIL-PRF-38534, group A test table) Interim electrical parameters 1 Final electrical parameters 1*, 2, 3, 4

43、, 5, 6, 7 Group A test requirements 1, 2, 3, 4, 5, 6, 7 Group C end-point electrical parameters 1/ 1, 2, 3, 4, 7 End-point electrical parameters for radiation hardness assurance (RHA) devices Not applicable * PDA applies to subgroup 1. 1/ As a minimum, for all Group C testing performed after June 4,

44、 2009 manufacturers shall perform subgroups 1, 2, and 3 from the Group A electrical test table (Table C-Xa of MIL-PRF-38534). 4.2 Screening. Screening shall be in accordance with MIL-PRF-38534. The following additional criteria shall apply: a. Pre-seal burn-in test, method 1030 of MIL-STD-883. (opti

45、onal for class H) (1) Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision level control and shall be made available to either DLA Land and Maritime -VA or the acquiring activity upon request. Also, the test circuit shall specify the inputs,

46、outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1015 of MIL-STD-883. (2) TAas specified in accordance with table I of method 1015 of MIL-STD-883. b. Burn-in test, method 1015 of MIL-STD-883. (1) Test condition A, B, C, or D. The test circuit s

47、hall be maintained by the manufacturer under document revision level control and shall be made available to either DLA Land and Maritime -VA or the acquiring activity upon request. Also, the test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance w

48、ith the intent specified in method 1015 of MIL-STD-883. (2) TAas specified in accordance with table I of method 1015 of MIL-STD-883. c. Interim and final electrical test parameters shall be as specified in table II herein, except interim electrical parameter tests prior to burn-in are optional at the discretion of the manufacturer. 4.3 Conformance and periodic inspections. Conformance inspection (

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