DLA SMD-5962-98002 REV B-2006 MICROCIRCUIT HYBRID LINEAR 4-CHANNEL OPTICALLY COUPLED ISOLATOR《微型电路 混合型 线型 4通道 光耦合隔离器》.pdf

1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Update drawing boilerplate. Editorial changes throughout. 02-08-08 Raymond Monnin B Update drawing. 06-12-11 Raymond Monnin REV SHEET REV SHEET REV STATUS REV B B B B B B B B B B B OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 PMIC N/A PREPARED BY Stev

2、e Duncan DEFENSE SUPPLY CENTER COLUMBUS STANDARD MICROCIRCUIT DRAWING CHECKED BY Michael Jones POST OFFICE BOX 3990 COLUMBUS, OHIO 43218-3990 http:/www.dscc.dla.mil THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS APPROVED BY Kendall Cottongim MICROCIRCUIT, HYBRID, LINEAR, 4-CHANNEL, OPTICALLY C

3、OUPLED ISOLATOR AND AGENCIES OF THE DEPARTMENT OF DEFENSE DRAWING APPROVAL DATE 97-11-12 AMSC N/A REVISION LEVEL B SIZE A CAGE CODE 67268 5962-98002 SHEET 1 OF 11 DSCC FORM 2233 APR 97 5962-E138-07Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STAND

4、ARD MICROCIRCUIT DRAWING SIZE A 5962-98002 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing documents five product assurance classes as defined in paragraph 1.2.3 and MIL-PRF-38534. A choice of case outlines and

5、lead finishes which are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of radiation hardness assurance levels are reflected in the PIN. 1.2 PIN. The PIN shall be as shown in the following example: 5962 - 98002 01 K E X Federal RHA Device Device Case Lea

6、d stock class designator type class outline finish designator (see 1.2.1) (see 1.2.2) designator (see 1.2.4) (see 1.2.5) / (see 1.2.3) / Drawing number 1.2.1 Radiation hardness assurance (RHA) designator. Device classes H and K RHA marked devices shall meet the MIL-PRF-38534 specified RHA levels and

7、 shall be marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device. 1.2.2 Device type(s). The device type(s) shall identify the circuit function as follows: 1/ Device type Generic number Circuit function 01 HCPL-177K, HCPL-675K, 6N140-300 Optical coupler, 4 channel 1.2.3 Dev

8、ice class designator. This device class designator shall be a single letter identifying the product assurance level. All levels are defined by the requirements of MIL-PRF-38534 and require QML Certification as well as qualification (Class H, K, and E) or QML Listing (Class G and D). The product assu

9、rance levels are as follows: Device class Device performance documentation K Highest reliability class available. This level is intended for use in space applications. H Standard military quality class level. This level is intended for use in applications where non-space high reliability devices are

10、 required. G Reduced testing version of the standard military quality class. This level uses the Class H screening and In-Process Inspections with a possible limited temperature range, manufacturer specified incoming flow, and the manufacturer guarantees (but may not test) periodic and conformance i

11、nspections (Group A, B, C, and D). E Designates devices which are based upon one of the other classes (K, H, or G) with exception(s) taken to the requirements of that class. These exception(s) must be specified in the device acquisition document; therefore the acquisition document should be reviewed

12、 to ensure that the exception(s) taken will not adversely affect system performance. D Manufacturer specified quality class. Quality level is defined by the manufacturers internal, QML certified flow. This product may have a limited temperature range. 1/ The devices listed herein are available as cl

13、ass H microcircuits (high reliability) on 83024.Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-98002 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 3 DSCC FORM 2234 APR 97 1.

14、2.4 Case outline(s). The case outline(s) shall be as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style E CDIP2-T16 16 Dual-in-line F CDFP4-F Flat package X See figure 1 16 Dual-in-line Y See figure 1 16 Dual-in-line Z See figure 1 16 Dual-in-lin

15、e 1.2.5 Lead finish. The lead finish shall be as specified in MIL-PRF-38534. 1.3 Absolute maximum ratings. 1/ Supply voltage (VCC) -0.5 V dc to +20 V dc 2/ Peak input current (each channel, 2.0 V). 8/ In applications where dV/dt may exceed 50,000 V/s (such as a static discharge) a series resistor, R

16、CC, should be included to protect the detector ICs from destructively high surge currents. The recommended value is: 9/ CMLis the maximum tolerable common mode transient to assure that the output will remain in a low logic state (i.e., VO 0.8 V). k (mA)I0.6V1= RFCCProvided by IHSNot for ResaleNo rep

17、roduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-98002 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 7 DSCC FORM 2234 APR 97 Case outline X. Millimeters Inches Symbol Min Max Min Max A 4.57 .180 A1 1.40 1.65 .0

18、55 .065 b 0.41 0.51 .016 .020 c 0.18 0.33 .007 .013 D 20.07 20.83 .790 .820 e 2.29 2.79 .090 .110 E 9.65 9.91 .380 .390 E1 8.13 .320 L 1.07 1.32 .042 .052 S 0.89 1.52 .035 .060 Case outline Y. Millimeters Inches Symbol Min Max Min Max A 4.32 .170 A1 1.14 1.40 .045 .055 b 0.41 0.51 .016 .020 c 0.18 0

19、.33 .007 .013 D 20.07 20.83 .790 .820 e 2.29 2.79 .090 .110 E 8.13 .320 eA 7.37 7.87 .290 .310 Q 0.51 .020 S 0.89 1.52 .035 .060 NOTES: 1. The U.S. government preferred system of measurement is the metric SI. This item was designed using inch-pound units of measurement. In case of problems involving

20、 conflicts between the metric and inch-pound units, the inch-pound units shall rule. 2. Pin 1 is indicated by a dot marked on top of the package. FIGURE 1. Case outline(s). Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING

21、 SIZE A 5962-98002 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 8 DSCC FORM 2234 APR 97 Case outline Z. Millimeters Inches Symbol Min Max Min Max A 3.56 .140 b 0.89 1.14 .035 .045 c 0.18 0.33 .007 .013 D 20.07 20.83 .790 .820 e 2.29 2.79 .090 .110 E 8.13 .320 eA 7.

22、37 7.87 .290 .310 Q 0.51 .020 S 0.89 1.52 .035 .060 NOTES: 1. The U.S. government preferred system of measurement is the metric SI. This item was designed using inch-pound units of measurement. In case of problems involving conflicts between the metric and inch-pound units, the inch-pound units shal

23、l rule. 2. Pin 1 is indicated by a dot marked on top of the package. FIGURE 1. Case outline(s) - Continued. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-98002 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO

24、43218-3990 REVISION LEVEL B SHEET 9 DSCC FORM 2234 APR 97 Device type 01 Case outlines E, F, X, Y, and Z Terminal number Terminal connection 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 Cathode 1 Anode 1 Anode 2 Cathode 2 Cathode 3 Anode 3 Anode 4 Cathode 4 NC GND Output 4 Output 3 Output 2 Output 1 VCCNC

25、 FIGURE 2. Terminal connections. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-98002 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 10 DSCC FORM 2234 APR 97 TABLE II. Electr

26、ical test requirements. MIL-PRF-38534 test requirements Subgroups (in accordance with MIL-PRF-38534, group A test table) Interim electrical parameters 1 Final electrical parameters 1*,2,3,9 Group A test requirements 1,2,3,4,9,10,11 Group C end-point electrical parameters 1,2,3 End-point electrical p

27、arameters for radiation hardness assurance (RHA) devices Not applicable * PDA applies to subgroup 1. 4. VERIFICATION 4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF-38534 or as modified in the device manufacturers Quality Management (QM) plan. The

28、modification in the QM plan shall not affect the form, fit, or function as described herein. 4.2 Screening. Screening shall be in accordance with MIL-PRF-38534. The following additional criteria shall apply: a. Burn-in test, method 1015 of MIL-STD-883. (1) Test condition A, B, C, or D. The test circ

29、uit shall be maintained by the manufacturer under document revision level control and shall be made available to either DSCC-VA or the acquiring activity upon request. Also, the test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the inten

30、t specified in method 1015 of MIL-STD-883. (2) TAas specified in accordance with table I of method 1015 of MIL-STD-883. b. Interim and final electrical test parameters shall be as specified in table II herein, except interim electrical parameter tests prior to burn-in are optional at the discretion

31、of the manufacturer. 4.3 Conformance and periodic inspections. Conformance inspection (CI) and periodic inspection (PI) shall be in accordance with MIL-PRF-38534 and as specified herein. 4.3.1 Group A inspection (CI). Group A inspection shall be in accordance with MIL-PRF-38534 and as follows: a. Te

32、sts shall be as specified in table II herein. b. Subgroups 5, 6, 7, and 8 shall be omitted. 4.3.2 Group B inspection (PI). Group B inspection shall be in accordance with MIL-PRF-38534. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIR

33、CUIT DRAWING SIZE A 5962-98002 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 11 DSCC FORM 2234 APR 97 4.3.3 Group C inspection (PI). Group C inspection shall be in accordance with MIL-PRF-38534 and as follows: a. End-point electrical parameters shall be as specified

34、 in table II herein. b. Steady-state life test, method 1005 of MIL-STD-883. (1) Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision level control and shall be made available to either DSCC-VA or the acquiring activity upon request. Also, the

35、 test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1005 of MIL-STD-883. (2) TAas specified in accordance with table I of method 1005 of MIL-STD-883. (3) Test duration: 1,000 hours, except as permitted by me

36、thod 1005 of MIL-STD-883. 4.3.4 Group D inspection (PI). Group D inspection shall be in accordance with MIL-PRF-38534. 4.3.5 Radiation Hardness Assurance (RHA) inspection. RHA inspection is not currently applicable to this drawing. 5. PACKAGING 5.1 Packaging requirements. The requirements for packag

37、ing shall be in accordance with MIL-PRF-38534. 6. NOTES 6.1 Intended use. Microcircuits conforming to this drawing are intended for use for Government microcircuit applications (original equipment), design applications, and logistics purposes. 6.2 Replaceability. Microcircuits covered by this drawin

38、g will replace the same generic device covered by a contractor-prepared specification or drawing. 6.3 Configuration control of SMDs. All proposed changes to existing SMDs will be coordinated as specified in MIL-PRF-38534. 6.4 Record of users. Military and industrial users shall inform Defense Supply

39、 Center Columbus (DSCC) when a system application requires configuration control and the applicable SMD. DSCC will maintain a record of users and this list will be used for coordination and distribution of changes to the drawings. Users of drawings covering microelectronic devices (FSC 5962) should

40、contact DSCC-VA, telephone (614) 692-0544. 6.5 Comments. Comments on this drawing should be directed to DSCC-VA, Post Office Box 3990, Columbus, Ohio 43218-3990, or telephone (614) 692-1081. 6.6 Sources of supply. Sources of supply are listed in MIL-HDBK-103 and QML-38534. The vendors listed in MIL-

41、HDBK-103 and QML-38534 have submitted a certificate of compliance (see 3.7 herein) to DSCC-VA and have agreed to this drawing. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING BULLETIN DATE: 06-12-11 Approved sources of s

42、upply for SMD 5962-98002 are listed below for immediate acquisition information only and shall be added to MIL-HDBK-103 and QML-38534 during the next revisions. MIL-HDBK-103 and QML-38534 will be revised to include the addition or deletion of sources. The vendors listed below have agreed to this dra

43、wing and a certificate of compliance has been submitted to and accepted by DSCC-VA. This information bulletin is superseded by the next dated revisions of MIL-HDBK-103 and QML-38534. DSCC maintains an online database of all current sources of supply at http:/www.dscc.dla.mil/Programs/Smcr/. Standard

44、 microcircuit drawing PIN 1/ Vendor CAGE number Vendor similar PIN 2/ 5962-9800201KEA 5962-9800201KEA 5962-9800201KEC 5962-9800201KEC 31757 50434 31757 50434 66012-300 HCPL-177K#200 66012-300 HCPL-177K 5962-9800201KFC 50434 HCPL-675K 5962-9800201KXA 5962-9800201KXA 5962-9800201KXC 31757 50434 31757

45、66012-300J HCPL-177K#300 66012-300J 5962-9800201KYA 5962-9800201KYC 50434 50434 HCPL-177K#100 HCPL-177K#100 5962-9800201KZA 5962-9800201KZC 50434 50434 HCPL-177K#600 HCPL-177K#600 1/ The lead finish shown for each PIN representing a hermetic package is the most readily available from the manufacture

46、r listed for that part. If the desired lead finish is not listed contact the Vendor to determine its availability. 2/ Caution. Do not use this number for item acquisition. Items acquired to this number may not satisfy the performance requirements of this drawing. Vendor CAGE Vendor name number and a

47、ddress 31757 Micropac Industries, Incorporated Optoelectronics Division 905 East Walnut Street Garland, TX 75040-6611 50434 Avago Technologies 350 West Trimble Road San Jose, CA 95131 The information contained herein is disseminated for convenience only and the Government assumes no liability whatsoever for any inaccuracies in the information bulletin. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-