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本文(DLA SMD-5962-98590 REV D-2008 MICROCIRCUIT LINEAR 3 3 VOLT FIXED 1 3 AMP POSITIVE VOLTAGE REGULATOR MONOLITHIC SILICON.pdf)为本站会员(fuellot230)主动上传,麦多课文库仅提供信息存储空间,仅对用户上传内容的表现方式做保护处理,对上载内容本身不做任何修改或编辑。 若此文所含内容侵犯了您的版权或隐私,请立即通知麦多课文库(发送邮件至master@mydoc123.com或直接QQ联系客服),我们立即给予删除!

DLA SMD-5962-98590 REV D-2008 MICROCIRCUIT LINEAR 3 3 VOLT FIXED 1 3 AMP POSITIVE VOLTAGE REGULATOR MONOLITHIC SILICON.pdf

1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Add radiation hardness requirements. - ro 99-12-20 R. MONNIN B Make change to case outline N. Add case outlines X and T. Make changes to 1.2.4, 1.3, 1.5, figure 1, and figure 2. - rrp 02-02-11 R. MONNIN C Drawing updated to reflect current requir

2、ements. - ro 08-01-29 R. HEBER D Make dimension changes to case outline M as specified under figure 1. - ro 08-09-22 R. HEBER REV SHET REV SHET REV STATUS REV D D D D D D D D D D D D D D OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 12 13 14 PMIC N/A PREPARED BY RICK OFFICER CHECKED BY RAJESH PITHADIA DEF

3、ENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 http:/www.dscc.dla.mil APPROVED BY RAYMOND MONNIN STANDARD MICROCIRCUIT DRAWING THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS AND AGENCIES OF THE DEPARTMENT OF DEFENSE DRAWING APPROVAL DATE 99-03-05 MICROCIRCUIT, LINEAR, 3.3 VOLT FIXED, 1.

4、3 AMP, POSITIVE VOLTAGE REGULATOR, MONOLITHIC SILICON AMSC N/A REVISION LEVEL D SIZE A CAGE CODE 67268 5962-98590 SHEET 1 OF 14 DSCC FORM 2233 APR 97 5962-E524-08 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 59

5、62-98590 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of c

6、ase outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels is reflected in the PIN. 1.2 PIN. The PIN is as shown in the following example: 5962 P 98590 01 M U A Federal stock class desi

7、gnator RHA designator (see 1.2.1) Device type (see 1.2.2)Device class designatorCase outline (see 1.2.4) Lead finish (see 1.2.5) / (see 1.2.3) / Drawing number 1.2.1 RHA designator. Device classes Q and V RHA marked devices meet the MIL-PRF-38535 specified RHA levels and are marked with the appropri

8、ate RHA designator. Device class M RHA marked devices meet the MIL-PRF-38535, appendix A specified RHA levels and are marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device. 1.2.2 Device type(s). The device type(s) identify the circuit function as follows: Device type Gene

9、ric number Circuit function 01 OM3957 3.3 volt fixed, 1.3 A, positive voltage regulator 1.2.3 Device class designator. The device class designator is a single letter identifying the product assurance level as follows: Device class Device requirements documentation M Vendor self-certification to the

10、requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A Q or V Certification and qualification to MIL-PRF-38535 1.2.4 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive des

11、ignator Terminals Package style M See figure 1 3 Power surface mount N CBCC2-N3 3 Bottom terminal chip carrier T See figure 1 3 Flange mount, glass sealed, with gull wings U See figure 1 3 TO-257 flange mounted with isolated tab and glass sealed X CBCC1-N3 3 Bottom terminal chip carrier 1.2.5 Lead f

12、inish. The lead finish is as specified in MIL-PRF-38535 for device classes Q and V or MIL-PRF-38535, appendix A for device class M. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-98590 DEFENSE SUPPLY CENTER

13、COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 3 DSCC FORM 2234 APR 97 1.3 Absolute maximum ratings. 1/ Input voltage (VIN) 2/ . 30 V dc Output current (IOUT) 1.3 A Power dissipation (PD) Internally limited Junction temperature (TJ) . +150C Lead temperature (soldering, 10 seconds) +300C S

14、torage temperature range . -65C to +150C Thermal resistance, junction-to-case (JC): Cases M, N, and U 4.2C/W Case X . 4.1C/W Case T . 7.1C/W Thermal resistance, junction-to-ambient (JA): Cases M, N, and U 42C/W Case X . 80C/W Case T . 60C/W 1.4 Recommended operating conditions. Input voltage (VIN) 2

15、/ . 20 V dc Ambient operating temperature range (TA) . -55C to +125C 1.5 Radiation features: Maximum total dose available (dose rate = 50 300 rads(Si)/s) 30 Krads 3/ 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks

16、form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for. DEPARTMENT OF DEFE

17、NSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are a

18、vailable online at http:/assist.daps.dla.mil/quicksearch/ or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) _ 1/ Stresses above the absolute maximum rating may cause permanent damage to the device. Extended operation at the maximum levels

19、 may degrade performance and affect reliability. 2/ Guaranteed to withstand transient input voltage. 3/ These parts may be dose rate sensitive in a space environment and may demonstrate enhanced low dose rate effects. Radiation end point limits for the noted parameters are guaranteed only for the co

20、nditions specified in MIL-STD-883, method 1019, condition A. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-98590 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 4 DSCC FORM 2

21、234 APR 97 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 3.

22、REQUIREMENTS 3.1 Item requirements. The individual item requirements for device classes Q and V shall be in accordance with MIL-PRF-38535 and as specified herein or as modified in the device manufacturers Quality Management (QM) plan. The modification in the QM plan shall not affect the form, fit, o

23、r function as described herein. The individual item requirements for device class M shall be in accordance with MIL-PRF-38535, appendix A for non-JAN class level B devices and as specified herein. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions sh

24、all be as specified in MIL-PRF-38535 and herein for device classes Q and V or MIL-PRF-38535, appendix A and herein for device class M. 3.2.1 Case outlines. The case outlines shall be in accordance with 1.2.4 herein and figure 1. 3.2.2 Terminal connections. The terminal connections shall be as specif

25、ied on figure 2. 3.2.3 Radiation exposure circuit. The radiation exposure circuit shall be as specified on figure 3. 3.3 Electrical performance characteristics and postirradiation parameter limits. Unless otherwise specified herein, the electrical performance characteristics and postirradiation para

26、meter limits are as specified in table I and shall apply over the full ambient operating temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are defined in table I. 3.5 Marking. The

27、 part shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers PIN may also be marked. For packages where marking of the entire SMD PIN is not feasible due to space limitations, the manufacturer has the option of not marking the “5962-“ on the device. For RHA product using t

28、his option, the RHA designator shall still be marked. Marking for device classes Q and V shall be in accordance with MIL-PRF-38535. Marking for device class M shall be in accordance with MIL-PRF-38535, appendix A. 3.5.1 Certification/compliance mark. The certification mark for device classes Q and V

29、 shall be a “QML“ or “Q“ as required in MIL-PRF-38535. The compliance mark for device class M shall be a “C“ as required in MIL-PRF-38535, appendix A. 3.6 Certificate of compliance. For device classes Q and V, a certificate of compliance shall be required from a QML-38535 listed manufacturer in orde

30、r to supply to the requirements of this drawing (see 6.6.1 herein). For device class M, a certificate of compliance shall be required from a manufacturer in order to be listed as an approved source of supply in MIL-HDBK-103 (see 6.6.2 herein). The certificate of compliance submitted to DSCC-VA prior

31、 to listing as an approved source of supply for this drawing shall affirm that the manufacturers product meets, for device classes Q and V, the requirements of MIL-PRF-38535 and herein or for device class M, the requirements of MIL-PRF-38535, appendix A and herein. 3.7 Certificate of conformance. A

32、certificate of conformance as required for device classes Q and V in MIL-PRF-38535 or for device class M in MIL-PRF-38535, appendix A shall be provided with each lot of microcircuits delivered to this drawing. 3.8 Notification of change for device class M. For device class M, notification to DSCC-VA

33、 of change of product (see 6.2 herein) involving devices acquired to this drawing is required for any change that affects this drawing. 3.9 Verification and review for device class M. For device class M, DSCC, DSCCs agent, and the acquiring activity retain the option to review the manufacturers faci

34、lity and applicable required documentation. Offshore documentation shall be made available onshore at the option of the reviewer. 3.10 Microcircuit group assignment for device class M. Device class M devices covered by this drawing shall be in microcircuit group number 52 (see MIL-PRF-38535, appendi

35、x A). Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-98590 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 5 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characterist

36、ics. Test Symbol Conditions 1/ 2/ -55C TA +125C unless otherwise specified Group A subgroups Device type Limits Unit Min Max Output voltage VOUTIOUT= 10 mA, VIN= 5.0 V 1 01 3.267 3.333 V VIN= 4.75 to 18 V, IOUT= 10 mA to 1.3 A 2,3 3.235 3.365 IOUT= 10 mA, VIN= 5.0 V 1 3.267 3.333 M,D,P Line regulati

37、on 3/ VRLINEVIN= 4.5 V to 18 V, 1 01 10 mV IOUT= 0 mA 2,3 12 M,D,P 1 10 Load regulation 3/ VRLOADVIN= 5 V, 1 01 15 mV IOUT= 0 A to 1.3 A 2,3 25 M,D,P 1 15 Dropout voltage VDOIOUT= 1.3 A, VREF= 1.0 % 1,2,3 01 1.5 V M,D,P 1 1.5 Thermal regulation 30 ms pulse, TA= +25C 1 01 0.04 %/W M,D,P 1 0.04 Ripple

38、 rejection VIN/ VOUTCADJ= 25 F, f = 120 Hz, COUT= 25 F (tantalum), IOUT= 1.3 A, VIN= 6.3 V 4,5,6 01 60 dB M,D,P 4 60 Quiescent current IQVIN= 18 V 1,2,3 01 10 mA M,D,P 1 10 Current limit ILIMVIN= 8.3 V 1,2,3 01 1.3 2.5 A M,D,P 1 1.3 2.5 VIN= 28.3 V 1,2,3 .050 M,D,P 1 .050 See footnotes at end of tab

39、le. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-98590 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 6 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristic

40、s Continued. Test Symbol Conditions 1/ 2/ -55C TA +125C unless otherwise specified Group A subgroups Device type Limits Unit Min Max Temperature 4/ 5/ stability VOUT/ T -55C TJ +125C 1,2,3 01 1.5 % Long term stability 4/ 5/ VOUT/ t 1000 hours, TA= +125C 2 01 1.0 % 1/ Devices supplied to this drawing

41、 will meet all levels M, D, P of irradiation. However, this device is only tested at the P level. Pre and Post irradiation values are identical unless otherwise specified in table I. When performing post irradiation electrical measurements for any RHA level, TA= +25C. 2/ These parts may be dose rate

42、 sensitive in a space environment and may demonstrate enhanced low dose rate effects. Radiation end point limits for the noted parameters are guaranteed only for the conditions specified in MIL-STD-883, method 1019, condition A. 3/ Line and load regulation are measured at a constant junction tempera

43、ture using a low duty cycle pulse technique. Although power dissipation is internally limited, regulation is guaranteed up to the maximum power dissipation of 13 W. Power dissipation is determined by the input/output differential voltage and the output current. Guaranteed maximum power dissipation w

44、ill not be available over the full input/output voltage range. 4/ If not tested, shall be guaranteed to the limits specified in table I. 5/ This parameter is not tested to post irradiation. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MIC

45、ROCIRCUIT DRAWING SIZE A 5962-98590 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 7 DSCC FORM 2234 APR 97 Case M Symbol Inches Millimeters Min Max Min Max A .155 .165 3.94 4.19 A2 .075 .085 1.91 2.16 b .030 .040 0.76 1.02 C .015 .025 0.38 0.64 D .420 .430 10.67 10.9

46、2 E .420 .430 10.67 10.92 e .195 .205 4.95 5.21 e1 .095 .105 2.41 2.67 L .350 - 8.89 - L1 0.95 .135 2.41 3.43 NOTE: The U.S. government preferred system of measurement is the metric SI system. However, since this item was originally designed using inch-pound units of measurement, in the event of con

47、flict between the metric and inch-pound units, the inch-pound units shall take precedence. FIGURE 1. Case outlines. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-98590 DEFENSE SUPPLY CENTER COLUMBUS COLUMBU

48、S, OHIO 43218-3990 REVISION LEVEL D SHEET 8 DSCC FORM 2234 APR 97 Case U Symbol Inches Millimeters Min Max Min Max A .190 .200 4.83 5.08 A1 .035 .045 0.89 1.14 A2 .120 BSC 3.05 BSC b .025 .035 0.64 0.89 D .645 .665 16.38 16.89 D1 .410 .430 10.41 10.92 D3 .000 .065 0.00 1.65 e .100 BSC 2.54 BSC E .410 .422 10.41 10.71 L .500 .750 12.70 19.05 O .527 .537 13.39 16.64 P .140 .150 3.56 3.81 NOTE: The U.S. government preferred system of measurement is the metric SI system. However, since this item was originally designed using inch-po

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