DLA SMD-5962-99593 REV C-2012 MICROCIRCUIT LINEAR SINGLE HIGHSPEED VOLTAGE FEEDBACK OPERATIONAL AMPLIFIER MONOLITHIC SILICON.pdf

1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Drawing updated to reflect current requirements. -gt 02-07-18 R. MONNIN B Change to the min limits of output current test, IO, in table I. -rrp 06-04-05 R. MONNIN C Update boilerplate requirements to current MIL-PRF-38535 requirements. - ro 12-02

2、-01 C. SAFFLE REV SHEET REV SHEET REV STATUS REV C C C C C C C C C C OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 PMIC N/A PREPARED BY L. G. TRAYLOR DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 http:/www.landandmaritime.dla.mil STANDARD MICROCIRCUIT DRAWING THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPART

3、MENTS AND AGENCIES OF THE DEPARTMENT OF DEFENSE CHECKED BY RAJESH PITHADIA APPROVED BY RAY MONNIN MICROCIRCUIT, LINEAR, SINGLE, HIGH SPEED, VOLTAGE FEEDBACK, OPERATIONAL AMPLIFIER, MONOLITHIC SILICON DRAWING APPROVAL DATE 99-12-16 AMSC N/A REVISION LEVEL C SIZE A CAGE CODE 67268 5962-99593 SHEET 1 O

4、F 10 DSCC FORM 2233 APR 97 5962-E152-12 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-99593 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope.

5、 This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of

6、Radiation Hardness Assurance (RHA) levels is reflected in the PIN. 1.2 PIN. The PIN is as shown in the following example: 5962 - 99593 01 Q P A Federal stock class designator RHA designator (see 1.2.1) Device type (see 1.2.2) Device class designator Case outline (see 1.2.4) Lead finish (see 1.2.5) /

7、 (see 1.2.3) / Drawing number 1.2.1 RHA designator. Device classes Q and V RHA marked devices meet the MIL-PRF-38535 specified RHA levels and are marked with the appropriate RHA designator. Device class M RHA marked devices meet the MIL-PRF-38535, appendix A specified RHA levels and are marked with

8、the appropriate RHA designator. A dash (-) indicates a non-RHA device. 1.2.2 Device type(s). The device type(s) identify the circuit function as follows: Device type Generic number Circuit function 01 THS4011M Single channel, high speed, voltage feedback operational amplifier 1.2.3 Device class desi

9、gnator. The device class designator is a single letter identifying the product assurance level as follows: Device class Device requirements documentation M Vendor self-certification to the requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, a

10、ppendix A Q or V Certification and qualification to MIL-PRF-38535 1.2.4 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style P GDIP1-T8 or CDIP2-T8 8 Dual-in-line 2 CQCC1-N20 20 Square leadless chip carri

11、er 1.2.5 Lead finish. The lead finish is as specified in MIL-PRF-38535 for device classes Q and V or MIL-PRF-38535, appendix A for device class M. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-99593 DLA LAN

12、D AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 3 DSCC FORM 2234 APR 97 1.3 Absolute maximum ratings. 1/ Supply voltage (+VCC to -VCC) 33 V Input voltage range (VI) . +VCCto -VCCDifferential input voltage (VID) . -4 V to +4 V Output current (IO) . 175 mA Power dissipation (PD): (TA 2

13、5C) Case P . 1050 mW 2/ Case 2 1375 mW 3/ Junction temperature (TJ) +150C Storage temperature range -65C to +150C Lead temperature 1.6 mm (1/16 inch) from case for 10 seconds 260C Thermal resistance, junction-to-case (JC) See MIL-STD-1835 1.4 Recommended operating conditions. Supply voltage ( VCC) 4

14、.5 V dc minimum, 16 V dc maximum Ambient operating temperature range (TA) . -55C to +125C 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise

15、 specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835

16、 - Interface Standard Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are available online at https:/assist.daps.dla.mil/quicksearch/ or from the Stand

17、ardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersede

18、s applicable laws and regulations unless a specific exemption has been obtained. _ 1/ Stresses above the absolute maximum rating may cause permanent damage to the device. Extended operation at the maximum levels may degrade performance and affect reliability. 2/ For case P, the derating factor above

19、 TA= +25C is 8.4 mW/C. 3/ For case 2, the derating factor above TA= +25C is 11.0 mW/C. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-99593 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SH

20、EET 4 DSCC FORM 2234 APR 97 3. REQUIREMENTS 3.1 Item requirements. The individual item requirements for device classes Q and V shall be in accordance with MIL-PRF-38535 as specified herein, or as modified in the device manufacturers Quality Management (QM) plan. The modification in the QM plan shall

21、 not affect the form, fit, or function as described herein. The individual item requirements for device class M shall be in accordance with MIL-PRF-38535, appendix A for non-JAN class level B devices and as specified herein. 3.2 Design, construction, and physical dimensions. The design, construction

22、, and physical dimensions shall be as specified in MIL-PRF-38535 and herein for device classes Q and V or MIL-PRF-38535, appendix A and herein for device class M. 3.2.1 Case outlines. The case outlines shall be in accordance with 1.2.4 herein. 3.2.2 Terminal connections. The terminal connections sha

23、ll be as specified on figure 1. 3.3 Electrical performance characteristics and postirradiation parameter limits. Unless otherwise specified herein, the electrical performance characteristics and postirradiation parameter limits are as specified in table I and shall apply over the full ambient operat

24、ing temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are defined in table I. 3.5 Marking. The part shall be marked with the PIN listed in 1.2 herein. In addition, the manufacture

25、rs PIN may also be marked. For packages where marking of the entire SMD PIN number is not feasible due to space limitations, the manufacturer has the option of not marking the “5962-“ on the device. For RHA product using this option, the RHA designator shall still be marked. Marking for device class

26、es Q and V shall be in accordance with MIL-PRF-38535. Marking for device class M shall be in accordance with MIL-PRF-38535, appendix A. 3.5.1 Certification/compliance mark. The certification mark for device classes Q and V shall be a “QML“ or “Q“ as required in MIL-PRF-38535. The compliance mark for

27、 device class M shall be a “C“ as required in MIL-PRF-38535, appendix A. 3.6 Certificate of compliance. For device classes Q and V, a certificate of compliance shall be required from a QML-38535 listed manufacturer in order to supply to the requirements of this drawing (see 6.6.1 herein). For device

28、 class M, a certificate of compliance shall be required from a manufacturer in order to be listed as an approved source of supply in MIL-HDBK-103 (see 6.6.2 herein). The certificate of compliance submitted to DLA Land and Maritime-VA prior to listing as an approved source of supply for this drawing

29、shall affirm that the manufacturers product meets, for device classes Q and V, the requirements of MIL-PRF-38535 and herein or for device class M, the requirements of MIL-PRF-38535, appendix A and herein. 3.7 Certificate of conformance. A certificate of conformance as required for device classes Q a

30、nd V in MIL-PRF-38535 or for device class M in MIL-PRF-38535, appendix A shall be provided with each lot of microcircuits delivered to this drawing. 3.8 Notification of change for device class M. For device class M, notification to DLA Land and Maritime -VA of change of product (see 6.2 herein) invo

31、lving devices acquired to this drawing is required for any change that affects this drawing. 3.9 Verification and review for device class M. For device class M, DLA Land and Maritime, DLA Land and Maritimes agent, and the acquiring activity retain the option to review the manufacturers facility and

32、applicable required documentation. Offshore documentation shall be made available onshore at the option of the reviewer. 3.10 Microcircuit group assignment for device class M. Device class M devices covered by this drawing shall be in microcircuit group number 49 (see MIL-PRF-38535, appendix A). Pro

33、vided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-99593 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 5 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Test Symbol C

34、onditions -55C TC+125C unless otherwise specified Group A subgroups Device type Limits Unit Min Max Input offset voltage VIOVCC = 5 V, VIC = 0 V, 1 01 -6 6 mV RL= 1 k 2,3 -8 8 VCC = 15 V, VIC = 0 V, 1 -6 6 RL= 1 k 2,3 -8 8 Output voltage swing VOVCC = 15 V, RL= 250 1,2,3 01 -12 12 V VCC = 5 V, RL= 1

35、50 1,2,3 -3 3 VCC = 15 V, RL= 1 k 1,2,3 -13 13 VCC = 5 V, RL= 1 k 1,2,3 -3.4 3.4 Quiescent current ICCVCC = 15 V, VO= 0 V, 1 01 9.5 mA RL= 1 k 2,3 11 VCC = 5 V, VO= 0 V, 1 8.5 RL= 1 k 2,3 10 Output current IOVCC = 15 V, RL= 20 1,2,3 01 65 mA VCC = 5 V, RL= 20 1,2,3 40 Input bias current IIBVCC = 15

36、V, VIC = 0 V, RL= 1 k 1 01 -6 6 A VCC = 5 V, VIC = 0 V, RL= 1 k 2,3 -8 8 VCC = 5 V, VIC = 0 V, RL= 1 k 1 -6 6 VCC = 5 V, VIC = 0 V, RL= 1 k 2,3 -8 8 Input offset current IIOVCC = 15 V, VIC = 0 V, RL= 1 k 1,2,3 01 -250 250 nA VCC = 5 V, VIC = 0 V, RL= 1 k 1,2,3 -250 250 See footnotes at end of table.

37、 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-99593 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 6 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics - Continue

38、d. Test Symbol Conditions -55C TC+125C unless otherwise specified Group A subgroups Device type Limits Unit Min Max Common mode rejection ratio CMRR VCC = 15 V, VIC = 12 V, RL= 1 k 1,2,3 01 75 dB VCC = 5 V, VIC = 2.5 V, RL= 1 k 1,2,3 84 Power supply rejection ratio PSRR VCC = 5 V to VCC = 15 V, VIC

39、= 0 V, RL= 1 k 1 01 80 dB VCC = 5 V to VCC = 15 V, VIC = 0 V, RL= 1 k 2,3 78 Common-mode input voltage range VICRVCC = 15 V, RL= 1 k 1,2,3 01 -13 13 V VCC = 5 V, RL= 1 k -3.8 3.8 Open loop gain AVDVCC = 15 V, VO = 10 V, RL= 1 k 1,2,3 01 6 V/mV VCC = 5 V, VO = 2.5 V, RL= 1 k 1,2,3 5 Slew rate 1/ SR V

40、CC = 15 V, RL= 1 k, closed loop, TA= 25C 7 01 300 V/s Unity gain bandwidth 1/ UGBW VCC = 15 V, RL= 1 k, closed loop, TA= 25C 7 01 160 MHz 1/ This parameter is guaranteed if not production tested. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDA

41、RD MICROCIRCUIT DRAWING SIZE A 5962-99593 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 7 DSCC FORM 2234 APR 97 Device types 01 Case outlines P 2 Terminal number Terminal symbol 1 OFFSET N1 NC 2 -INPUT OFFSET N1 3 +INPUT NC 4 -VCC NC 5 NC -INPUT 6 OUTPUT NC 7 +VCC +INPUT 8 O

42、FFSET N2 NC 9 - NC 10 - -VCC 11 - NC 12 - NC 13 - NC 14 - NC 15 - OUTPUT 16 - NC 17 - +VCC 18 - NC 19 - NC 20 - OFFSET N2 NC = No connection FIGURE 1. Terminal connections. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING

43、 SIZE A 5962-99593 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 8 DSCC FORM 2234 APR 97 4. VERIFICATION 4.1 Sampling and inspection. For device classes Q and V, sampling and inspection procedures shall be in accordance with MIL-PRF-38535 or as modified in the device manufac

44、turers Quality Management (QM) plan. The modification in the QM plan shall not affect the form, fit, or function as described herein. For device class M, sampling and inspection procedures shall be in accordance with MIL-PRF-38535, appendix A. 4.2 Screening. For device classes Q and V, screening sha

45、ll be in accordance with MIL-PRF-38535, and shall be conducted on all devices prior to qualification and technology conformance inspection. For device class M, screening shall be in accordance with method 5004 of MIL-STD-883, and shall be conducted on all devices prior to quality conformance inspect

46、ion. 4.2.1 Additional criteria for device class M. a. Burn-in test, method 1015 of MIL-STD-883. (1) Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision level control and shall be made available to the preparing or acquiring activity upon req

47、uest. The test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1015 of MIL-STD-883. (2) TA= +125C, minimum. b. Interim and final electrical test parameters shall be as specified in table II herein. 4.2.2 Addit

48、ional criteria for device classes Q and V. a. The burn-in test duration, test condition and test temperature, or approved alternatives shall be as specified in the device manufacturers QM plan in accordance with MIL-PRF-38535. The burn-in test circuit shall be maintained under document revision level control of the device manufacturers Technology Review Board (TRB) in accordance with MIL-PRF-38535 and shall be made available to the acquiring or preparing