ImageVerifierCode 换一换
格式:PDF , 页数:5 ,大小:210.76KB ,
资源ID:703919      下载积分:10000 积分
快捷下载
登录下载
邮箱/手机:
温馨提示:
如需开发票,请勿充值!快捷下载时,用户名和密码都是您填写的邮箱或者手机号,方便查询和重复下载(系统自动生成)。
如填写123,账号就是123,密码也是123。
特别说明:
请自助下载,系统不会自动发送文件的哦; 如果您已付费,想二次下载,请登录后访问:我的下载记录
支付方式: 支付宝扫码支付 微信扫码支付   
注意:如需开发票,请勿充值!
验证码:   换一换

加入VIP,免费下载
 

温馨提示:由于个人手机设置不同,如果发现不能下载,请复制以下地址【http://www.mydoc123.com/d-703919.html】到电脑端继续下载(重复下载不扣费)。

已注册用户请登录:
账号:
密码:
验证码:   换一换
  忘记密码?
三方登录: 微信登录  

下载须知

1: 本站所有资源如无特殊说明,都需要本地电脑安装OFFICE2007和PDF阅读器。
2: 试题试卷类文档,如果标题没有明确说明有答案则都视为没有答案,请知晓。
3: 文件的所有权益归上传用户所有。
4. 未经权益所有人同意不得将文件中的内容挪作商业或盈利用途。
5. 本站仅提供交流平台,并不能对任何下载内容负责。
6. 下载文件中如有侵权或不适当内容,请与我们联系,我们立即纠正。
7. 本站不保证下载资源的准确性、安全性和完整性, 同时也不承担用户因使用这些下载资源对自己和他人造成任何形式的伤害或损失。

版权提示 | 免责声明

本文(ECA 186-11E-1978 Passive Electronic Component Parts Test Methods for Method 11 Thermal Shock in Air《无源电子元件测试 方法11 空气中的冷热冲击》.pdf)为本站会员(周芸)主动上传,麦多课文库仅提供信息存储空间,仅对用户上传内容的表现方式做保护处理,对上载内容本身不做任何修改或编辑。 若此文所含内容侵犯了您的版权或隐私,请立即通知麦多课文库(发送邮件至master@mydoc123.com或直接QQ联系客服),我们立即给予删除!

ECA 186-11E-1978 Passive Electronic Component Parts Test Methods for Method 11 Thermal Shock in Air《无源电子元件测试 方法11 空气中的冷热冲击》.pdf

1、-. EIA 186-LLE 78 E 323VbOO 00285b3 E (ANSIEIA RS-186-E-78 Approved October 27,1978 LIA STANDARD STANDARD TEST METHODS FOR PASSIVE . ELECTRONIC COMPONENT PARTS METHOD 11: THERMAL SHOCK IN AIR I (Revision of RS-186-0, Method 11) OCTOBER 1978 Engineering Department ELECTRONIC INDUSTRIES ASSOCIATION NO

2、TICE EIA engineering standards are designed to serve the public interest through eliminating mis- understandings between manufacturers and purchasers, facilitating interchangeability and improvement of products, and assisting the purchaser in selecting and obtaining with mini- mum delay the proper p

3、roduct for his particular need. Existence of such standards shall not in any respect preclude any member or non-member of EIA from manufacturin or selling clude their voluntary use by those other than EIA members whether the standard is to be used either domestically or internationally. Recommended

4、standards are adopted by EU yithout regard to whether or not their adop- tion may involve patents on articles, materials, OF processes. By such action, EIA does not assume any liability to any patent owner, nor does it assume any obligation whatever to parties adopting the recommended standards. Thi

5、s Standard contains the major technical contents of International ElectrotechnicaE Com- mission Publication t8-2-14, Test N: Change of Temperature. It differs from the IEC Publication 68-2-14 by listing specific test conditions, temperature tolerances and other controls. Thse differences are well kn

6、own to the U.S. Committee of Experts for the International Electrotechnical Commission Technical Committee 50 and resolution of these differences will be sought in future meetings of TC-50. products not conforming to such standards, nor shall the existence of such stan 8 ards pre- Published by ELECT

7、RONIC INDUSTRIES ASSOCIATIQN Engineering Department 2001 Eye Street, N. W., Waehington, D. C. 20006 0 Electronic ndustrlee AesochUon 1979 AU righta reserved PRICE: $3.00 EIA Lb-LIE 78 m 3234600 O028565 L m RS-186-11E Page 1 e STANDARD TEST METHODS FOR PASSIVE ELECTRONIC COMPONENT PARTS METHOD 11 THE

8、RMAL SHOCK IN AIR (From EIA Standard RS-186-D and Standards Proposal No. 1271 formulated under the cognizance of the ELA P-9 Committee on Test Methods and Procedures.) INTRODUCTION This Test Method forms a part of the EIA Standard RS-186 which contains test guidance, definitions and standard test co

9、nditions. 1. PURPOSE i This test is conducted for the purpose of determining the resistance of a component part to exposures at ! extremes of high and low temperatures in air, and to the shock of alternate exposures to these extremes. Permanent changes in operating characteristics and physical darna

10、ge produced during thermal shock result principally from variations in dimensions and other physical properties. Effects of thermal shock include cracking and delamination of finishes, cracking and crazing of embedding and encapsulating compounds, opening of terminal seals and case seams, leakage of

11、 filling materials, and change in efectricai characteris- tics-due to mechanical displacement or rupture of conductors or of insulating materials. 2. APPARATUS Separate chambers shall be used for the extreme temperature conditions of steps 1 and 3. The air tem- perature of the two chambers shall be

12、held at each of the extreme temperatures by means of circulation and sufficient hot- or cold-chamber thhrmal capacity so that the ambient temperature shall reach the specified temperature within 2 minutes after the specimens have been transferred to the appropriate chamber. 3. PROCEDURE t Specimens

13、shall be placed in such a position with respect to the air stream that there is substantially no obstruction in the flow of air across and around the specimen. When special mounting is required, it shall be specified. The specimen shall then be subjected to the specified test condition of Table I, f

14、or a total of five cycles performed continuously. Cycling may be continued so that the total cycles equal 25,50 or 100 when so stated in the applicable specification. Specimens shall not be subjected to forced circulating air whce being transferred from one chamber to another. Direct heat conduction

15、 to the specimen should be minimized. 4. MEASUREMENTS This test may damage the component part, but the damage may not be detectable until some other test such as constant humidity (Method 1) or the seal test (Method 9) is performed on the thermal shock tested specimens. Specified measurements shall

16、be made prior to the first cycle and upon completion of the final cycle, except that failures shall be based on the measurements made after the specimen has returned to thermal stability at room ambient temperature following the final cycle, a RS-186-1 l.E Page 2 TEST CONDITION C TEST CONDITION D TE

17、MPERATUR E TIME TEMPERATURE TIME * STEP eC I F MINUTES OC OF MINUTES I See Table II -5 1 - 65 -85 - 65 O -85 O SeeTable II -5 +I8 5Max. -9 -5 +18 5Max. -9 + See Table II -8 +lo 392 -5 200 -f 5.4 -0 +I8 6Max. -9 .t. 18 -9 -5 -5 25 +lo 77 25 +I0 77 +O 77 -5 +3 -0 2 See Table 1 I . 3 155 31 1 -.5 25 5

18、Max. +O 77 -5 4 25 i EIA L8b-LLE 78 W 323Ltb00 00285bb 3 = TABLE I TEST CONDITION A TEST CONDITION B TEMPERATUR E TIME TEMPERATU RE TIME STEP OC “F MINUTES “C OF MINUTES +O SeeTable II +O -5 -5 I8 5Max. -.9 -5 + 5.4 +3 -65 -85 +O See Table II - 5.4 - 55 +O -67 +18 loto15 -9 + 5.4 -3 I 2 25 +I0 77 25

19、 +I0 77 4 25 +I0 77 25 +lo 77 -5 See Table II 126 257 See Table II -0 -0 -o 3 85 +3 185 -0 +I8 5Max -9 -5 +lo loto15 -5 -5 TABLE II WEIGHT OF SPECIMEN POUN DC 0.3 and Below .14 Kg Above 0.3 to 3, incl. Above 3 to 30, incl. Above 30 to 300, incl. 14-1.4 Kg 1.4-14 Kg 14-140 Kg Above 300 140 Kg MINIMUM

20、 TIME (FOR STEPS 1 AND 3) MI NUTEC 30 60 120 240 480 a - I EIA Lb-LLE 78 m 323qb00 0028567 5 m 5. SUMMARY The following details must be specified in the individual specification: e RS-186-llE Page 3 (a) Special mounting, if applicable (see 3). o) Test-Condition Letter (see 3). (c) Number of cycles if other than 5 (see 3). (d) Measurements before and after cycling.

copyright@ 2008-2019 麦多课文库(www.mydoc123.com)网站版权所有
备案/许可证编号:苏ICP备17064731号-1