ECA 186-4E-1978 Passive Electronic Component Parts Test Methods for Method 4 Dielectric Test (Withstanding Voltage)《无源电子元件测试 方法4 电介质测试(耐压)》.pdf

1、EIA 386-4E 78 3234600 0028593 2 .-: -, -t - _- o 3 ANSI/EIA RS-186-E-78 Approved October27, 1978 STANDARD TEST METHODS FOR PASSIVE 6i in ELECTRONIC CQMPONENT PARTS 9 METHOD 4: Y I. DI ELECTRIC TEST (WITHSTAND I NO VOLTAGE) RSl864E (Revision of RS-l86-D, Method 4) OCTOBER 1978 ELECTRONIC INDUSTRIM AS

2、SOCIATION a EIA LBb-4E ? W 3234b00 0028592 4 W NOTICE EIA engineering standards are designed to serve the public interest through eliminating mis- understandings between manufacturers and purchasers, facilitating interchangeability and improvement of products, and assisting the purchaser in selectin

3、g and obtaining with mini- mum delay the proper product for his particular need. Existence of such standards shali not in any respect preclude any member or non-member of EIA from manufacturing or selling products not conforming to such standards, nor shall the existence of such standards preclude t

4、heir voluntary use by those other than EIA members whether the standard is to be used either domestically or internationally. Recommended standards are adopted by EIA without regard to whether or not their adop- tion may involve patents on articles, materials, or processes. By such action, EIA does

5、not assume any liability to any patent owner, nor does it assume any obligation whatever to parties adopting the recommended standards. This EIA Recommended Standard is considered to have international standardization impli- cations, but the International Electrotechnical Commission has chosen to wr

6、ite this test procedure for each type of component. There is therefore no valid comparison between this RIA recommended standard and the International Electrotechnical Commission recommendation. Ththe differences are well known to the U.S. Committee of Experts for the International Electrotechnical

7、Commission Technical Committee 50 and resolution of these differences will be sought in future meetings of TC-50. . i . Fubliahedby ELECTRONIC INDUSTRIES ASSOCIATION Enginmring Department 2001 Eye Street, N. W., Washington, D. C. 26004 PRICE: .O0 . EIA 186-4E 78 3234600 0028593 b RS-1864E Page 1 STA

8、NDARD TEST METHODS FOR PASSIVE ELECTRONIC COMPONENT PARTS METHOD 4 DIELECTRIC TEST (Withstanding Voltage) (From EIA Standard RS-186-0 and Standards Proposal No. 1271 formulated under the cognizance of the EIA P-9 Committee on Test Methods and Procedures) INTRODUCTION This Test Method forms a part of

9、 the EIA Standard RS-186 which contains test guidance, definitions and standard test conditions. 1. PURPOSE This dielectric test is performed for the purpose of determining the ability of component parts to withstand a potential at sea level or at a specified altitude. The potential used is normally

10、 above rated voltage and simulates momentary overpotentials due to switching, surges, and other similar phenomena. AIthough this test is often called a voltage breakdown or dielectric strength test, the intention is not to cause a breakdown of the insulation of to detect corona, but to determine whe

11、ther insulating materials and spacings in the component are adequate. If a specimen is faulty in these respects, application of the test voltage will result in either an air, surface, or puncture discharge. In the following paragraphs, when items are required to be specified, it is understood to ref

12、er to the individual specification. 2. PRECAUTIONS The dielectric test should be used with caution, as even an overpotential less than the breakdown voltage probably injures the insulation and reduces its safety factor. Repeated application of the test voltage on the same specimen is, therefore, not

13、 recommended. In cases when subsequent application of a dielectric test potential is specified in the test routine, it is recommended that the tests be made at reduced potential. For exampIe, the dielectric test might be reduced 10% following moisture resistance, and 25% followng life test. Direct p

14、otentials are considered less damaging than alternating potentials which are equivalent in ability to detect flaws in design and construction. However, alternating potentials are specified usually because of convenience. Suitable precautions during this test must be taken to protect test personnel a

15、nd apparatus against high potentials. Components with high absorption qualities may be capable of retaining high voltages in spite of a short-time discharge. 3. APPARATUS 3.1 High-Voltage Source - The nature of the potential (alternating or direct voltage) shall be specified. The applied voltage sha

16、ll be within the range of 100 to 105% of the specified voltage as measured under load at the test specimen. The kilovolt-ampere rating and impedance of the source shall permit operation at all testing loads without distorting the waveform beyond the limits given in Paragraphs 3.1.1 and 3.1.2, and wi

17、thout change in voltage exceeding 5%. When the test specimen demandssub- stantial test source power capacity, the regulation and minimum kilovolt-ampere rating of the source shall be specified. When required and specified, a suitable current-limiting device shall be used to limit current surges. EIA

18、 Lb-4E 78 3234600 0028594 = RS-186-?E Page 2, 3.1.1 Alternating Potential - The test voltage shall be nominally 60 Hertz in frequency although other commercial power frequencies may be used if permitted in the indi6dualspecification. Alternating potentials shall be expressed as rms values. The wavef

19、orm shall be essentially sinusoidal with the peak voltage not differing from the peak of a sinusoidal wave by more than +5%. A voltage having a waveform exceeding this limit may be used at the option of the manufacturer. Direct Potential - The test voltage waveform shall be flat with maximum ripple

20、peak-to-peak voltage not exceeding 5% of the nominal (average) voltage. A voltage having a waveform exceeding this limit may be used at the option of the manufacturer. 3.1.2 3.2 Voltage Measuring Device - A voltmeter shall be used to measure the applied voltage to an accuracy within 2% of the specif

21、ied value, When a testing transformer is used as a high-voltage source of alternating potential, a voltmeter connected across the primary side or across a tertiary winding may by used, provided it is previously determined that the actual voltage across the test specimen will be obtained within the a

22、llowable tolerance under any normal load condition. 3.3 Breakdown Indicator - A suitable means shall be provided to indicate the occurrence of breakdown in case it is not visually evident in the specimen. The voltage measuring device of Paragraph 3.2, or an appropriate indicator light, or an overloa

23、d protective device may be used for this purpose. The indicator shall operate a flashover or puncture or current teakage rather than corona. 3.4 High Altitude Equipment,- The apparatus used for high altitude testing shall consist of a vacuum pmp and a sealed chamber with a means of applying a voltag

24、e to the specimen under test while at reduced pressure. 4. PROCEDURE 4.1 Preparation for Test - When special conditions such as special test fixtures, grounding, isolation, or immersion in water or environmental preconditioning are required, they shall be specified. Specimens shall be mounted as spe

25、cified with proper hardware, if such mounting is likely to affect test results by indicating mechanical stress, or by reducing electrical spacing. humidity and temperature conditions. The pressure shall be maintained at one of the altitudes in the . table. Sea level shall be interpreted as room pres

26、sure conditions existing at the time of test. If samples tested at nominal sea level air pressure fail because of low air pressure conditions, the same samples or -additional samples may be retested at a pressure of 28 to 30 inches of mercury absolute (711 to 762 mm mercury absolute. Other altitudes

27、 shall be held within *2%. 4.2 Test Voltage - Specimens shall be subjected to a test voltage of the magnitude specified, under standard ALTITUDE PR ESSU RE I Feet Meters Indies of Mercury Millimeters of Mercury ABS ABS Sea Level Sea Level 29.92 (nominal) 760 3a,ooo 91 50 8.88 226 50,000 15250 3.44 8

28、7.5 20,000 6100 13.75 350 4.3 Points of Application - The test voltage shall be applied between mutually insulated portions of the specimen, or between insulated portions and ground as specified. The method of connection of the test voltage to the specimen should be specified only when it is an impo

29、rtant factor. 4.4 Rate of Application - The test voltage shall be raised from zero ta the specified value as uniformly as possible, at a rate of approximately 500 volts per second, and lowered at the same rate after EIA i18b-qE 78 = 3234b00 0028595 T 4.5 4.6 5. 5.1 RS-18643 Page 3 testing. At the op

30、tion of the manufacturer, the test voltage may be applied and removed instantane- ously, or at a faster rate than 500 volts per second. Forinstantaneious testing, it is recommended that the testing potential be switched by completing the high voltage (secondary) test circuit, Low voltage (primary) s

31、witching is permissible provided that some means, such as the use of damping resistors, is provided to reduce voltage surges. Duration of Application - Unless otherwise specified, the test voltage shall be maintained at the specified value for 60 seconds, Components with movable parts shall be teste

32、d as specified in a manner to minimize the applications of repeated stresses to the same dielectric. Examination and Measurement of Specimens - During and after the dielectric test, Specimens and breakdown indicator shall be monitored for evidence of flashover, surface arcing, and puncturing. Disass

33、embly of complicated specimens is not contemplated. Following this, measurements shall be performed as specified to determine the effect of the dielectric test on operating characteristics. Such measurements may be important on specimens where visual inspection is difficult or impossible. SUMMARY Th

34、e following details shall be specified: Test voltage, magnitude and nature (AC or DC). 5.2 Source capacity and regulation, when required (3.1). 5.3 Current surge limits, when required (3.1). 5.4 Special conditions when required (4.1). 5.5 Special humidity or temperature conditions if other than stan

35、dard (4.2). a 5.6 Altitude(4.2). 5.7 Position of test specimens, when necessary. 5.8 Points of application of the test voltage (4.3). 5.9 Duration of voltage application, when required (4.5). 5.10 Method of testing components with moving parts (4.5). 5.11 Measurements following test, when required (4.6).