ECA 483-1981 Standard Method of Test for Effective Series Resistance (ESR) and Capacitance of Multilayer Ceramic Capacitors at High Frequencies (Editorially Corrected - February 19.pdf

1、ACCEPTANCE IJOTICE istuck Point. NeVal Publicntlons and Forms Center, Philatlelphia, PA 19120, for : :;:;tic CO 1100 ric.i.tvi.ti;i-cs only. Contriictors iiri( iririustry groups iiiust ol)tain coli .;i*ctiy s“-oii Electronic Industries Association, 2001 Eye Street N. W. , Washing Jc 2OOQfi. : .- . -

2、it1 c of llocuiiicrnt: Staniiwd Method of Test for a EfPac.t;l vc Saries Rcsi stnncc (I:. . iind Ciilcr trinco of Mu1 tY 1 ayor Ceraniic Capacitors at Hi gh F re qir c iic i o s teicncfiig nrltistry Groups: Electronic Industrles Associal :JACE: klliari rcasli riiiati oii , uiiiendiiieiit, rev SI o11

3、 , or caiicei 1 at$ an OP th* s stand i i*it* al ly- proposed the i iiclustry group responsi bl e for thi s standard shall i nf .- iiii 5tniy coQrdi nati ng ncti vity of the proposed chatigs and request parti ci pati Iqilitwy Coordination Activity . ( Pro3 act fi9 10 - 1432 ) Ariiiy - ER THIS DOCUME

4、NT CONTAINS PAGES. - - - -=- PROBLEM HARD COPY / _c_ EIA 483 81 M 2575532 0055355 5 ANSI/EIA RC-483-19P1 APPROVED DECEMBER 7, 1981 EIA STANDARD STANDARD METHOD OF TEST FOR EFFECTIVE SERIES RESISTANCE (ECR) AND CAPACITANCE OF MULTILAYER CERAMIC CAPACITORS AT HIGH FREQUENCIES RS-483 DECEMBER 19J. (Edi

5、torially corrected: February, 1 YU2: Engineering Deportment ELECTRONIC INDUSTRIES ASSOCIATION NOTICE EIA Engineering Standards and Publications are designed to serve the public interest through eliminating misunderstandings between manufacturers- and purchasers, facilitating interchangeability and i

6、mprovement of products, and assisting the purchaser in selecting and obtaining with minimum delay the proper product for his particular need. Existence of such Standards and Pub- lications shall not in any respect preclude any member or non-member of EIA from manufacturing or selling products not co

7、nforming to such Standards and Publications, nor shall the existence of such Standards and Publications preclude their voluntary use by those other than EIA members, whether the standard is to be used either domestically or internationally. Recommended Standards and Publications are adopted by EIA w

8、ithout regard to whether or not their adoption may involve patents on articles, materials, or processes, By such action, EIA does not assume any liability to any patent owner, nor does it assume any obligation whatever to parties adopting the Recom- mended Standard or Publication. This EIA Recommend

9、ed Standard is considered to have international stan- dardization implications, but the IEC (or ISO) activity has not progressed to the point where a valid comparison between the EIA Recommended Standard and the IEC (or ISO) Recommendation can be made. Published by ELECTRONIC INDUSTRIES ASSOCIATION

10、Engineering Department 2001 Eye Street, N.W. Washington, D.C. 20006 . Copyright 1981 ELECTRONIC INDUSTRIES ASSOCIATION All rights reserved PRICE: $10.00 Printed in U.S.A. Paraqraph 1.0 2.0 3.0 4.0 5.0 6.0 7.0 8.0 9.0 . -. 10.0 11.0 12.0 EIA 483 BL 2575532 0055357 7 W RS-483 STANDARD METHOD OF TEST F

11、OR EFFECTNE SERIES RESISTANCE (ESR) AND CAPACITANCE . OF MULTILAYER CERAMIC CAPACITORS AT HIGH FREQUENCIES TABLE OF CONTENTS SCOPE SUMMARY OF METHOD Paqe 1 2 SIGNIFICANCE AND USE 2 SYMBOLS 3-4 APPARATUS 4-6 PRECAUTIONS 6 TEST SPECIMENS CALIBRATION 6-7 7-9 PROCEDURE ? 9 -19 CALCULATIONS PRECISION AND

12、 ACCURACY COMPUTER PROGRAM 19 -25 26 27 - 28 ,- EIA 483 81 m 2575532 0055358 O RS-483 Page 1 STANDARD METHOD OF TEST FOR EFFECTIVE SERIES RESISTANCE (ESR) AND CAPACITANCE OF MULTILAYER CERAMIC CAPACITORS AT HIGH FREQUENCIES (From EIA Standards Proposal No. 1381, formulated under the cognizance of EI

13、A P-2.1 Working Group on Ceramic Capacitors.) 1.0 SCOPE 1.1 This method provides procedures for the measurement of effective series re- sistance (esr) and capacitance of multilayer ceramic capacitors from frequencies of 25 MHz to 1.25 GHz. A series connection permits the measurement of capacitance f

14、rom below 1 pF to over 1 nF between frequencies of 130 MHz and 1.25 GHz. There is no maximum value of capacitance for series measurements of esr, but the determination of large values of capacitance at high frequencies suffers from inaccuracy. The esr of capacitors can be measured with this method a

15、t frequencies that exceed the self-resonant frequency of the test capacitor. A shunt connection allows the measurement of capacitance from O to 200 pF at frequencies from 25 to 910 MHz. Resonant Mode Frequency Ranqe Measurable Capacitance Series Mode 14 130 to 250 MHz 1 nf to. r= esr = effective ser

16、ies resistance of the test specimen, Q= Q-factor of the test specimen. Q = X,/r = l/qCr. L= series inductance of the test specimen. self-resonant frequency of test s ecimen, owing to series capacitance and self inductance. fr = 1/2a s- LCo series capacitance of the test specimen at a frequency suffi

17、ciently tow to exclude the effect of the series inducatance: fr = Co = generally at 1 MHz. 5.0 APPARATUS 5.1 Measuring Instruments In addition to the resonant coaxial-line, the system is comprised of a stable signal generator and a sensitive rf millivoltmeter. The generator should have the following

18、 salient features: 1. Nominal 50-ohm impedance. 2. Continuously adjustable output level with a maximum of at least +13 dBm. 3. Frequency coverage of 25 to 1250 MHz, with frequency doublers, if necessary. 4. Frequency accuracy of - i 5 ppm, and stability of 0.1 ppm/hr. 5. Frequency resolution of 100

19、Hz. 6. Harmonic content: 30 dB or more below carrier. -1 EIA 483 83 W 2575532 O055362 2 E RS-483 Page 5 5.1 Measuring Instruments (continued) The rf millivoltmeter should have the following characteristics: 1. Full-scale ranges of 1 and 3 mV. 2. . 3. Frequency coverage of 25 to 1250 MHz. Accuracy of

20、 - + 1.0% at 1.5 mV, relative to 3 mV, f.s. 4. Probe Input: For use at 25 - 500 MHz: Capacitance - Conductance - (2.5 pF at 3 mV. (200 pS at 100 MHz and 3 mV. (2 mS at 500 MHz and 3 mV. For use at 25 - 1250 MHz: r: - Capacitance - Conductance - (1.5 pF at 3 mV. 450 p S at 500 MHz and 3 mV. (1 mS at

21、1250 MHz and 3 mV. 5.2 Resonant Coaxial-Line This test method specifies four frequency bands for shunt connected measure- ments, and five bands for series connected measurements. The frequency of measurement within each band is a function of the impedance and length of the line, and the effective va

22、lue of the capacitance of the test specimen at that frequency. In the interest of reproducibility it is imperative that a common line impedance and length be used for all measurements so that common test frequencies resut.2 The Model 34A Resonant Coaxial-Line, designed for this method of testing mul

23、tilayer ceramic capacitors, is available from Boonton Electronics Corp., Parsippany, NJ The Model 34A, or its equivalent, is recommended for these measurements. 07054. XI EIA 483 81 W 2595532 00553b3 4 W RS-483 Page 6 6.0 PRECAUTIONS 6.1 In addition to the obvious need for the accurate presentation

24、of generator fre- quency and rf millivoltmeter indications, the validity of this method of test depends upon a linear rise of line attentuation with frequency (on a log-log plot). This is achieved if the line loss is series loss, only (conductor loss). This is true at .frequencies below four or five

25、 hundred MHz, as evidenced by measurements of the intrinsic Q-factors of the transmission-line. At higher frequencies, however, two sources of loss appear which are manifested as additional line loss, and will, if not removed, cause the apparent attenuation of the line to rise above its normal value

26、. Onesource is radiated energy from the open end of the line, which increases with frequency and is evidenced as added series resistance in the line, It is eliminated by adding a conductive tube to the open end. As such, it is an extension of the outer conductor and it prevents the spillage of flux

27、beyond the center conductor, and the energy is contained within the line. - 6.2 A second source of loss is the capacitive coupling from the center conductor to the input resistance of the rf millivoltmeter probe. A good rf detector probe (passive, non-sampling type) exhibits an equivalent parallel i

28、nput resistance that is virtually independent of level below 10 mV. It is constant at 100 kQ below 10 MHz, and above 40 MHz it decreases approximately 12 dB/octave, The corner frequency is about 29 MHz. The influence of the coupled loss is increasingly apparent above 500 MHz. The solution rests in a

29、 special high impedance probe with the same sensitivity as a normal probe but more than 10 times the input resistance (Boonton Model 34-1A, or equivalent). -7 6.3 If the measurebent frequencies are confined to the bands below 500 MHz, . satisfactory results obtain without the use of the special rf p

30、robe. For measurements over the full range, the special high-impedance probe can be used at all frequencies, and the shield (conductive tube) should be used for all series measurements. It may be convenient to remove the shield for shunt measure- ments below 500 MHz, but its use is recommended above

31、 500 MHz and whenever it is possible at lower frequencies, by using the shield in place of the outer wall clamp. 7.0 TEST SPECIMENS 7.1 Series Connection The series connection is used to measure non-leaded, multilayer, ceramic capacitors. Tests specimens are placed in a fixture between parallel surf

32、aces of coin silver. Pressure is applied to the fixture to contact opposing terminal pads and support the specimen. It is evident that the terminal pads of the specimen should be sensibly parallel, and lightly coated with solder, if possible, to provide a shallow meniscus on each surface. The plianc

33、y of tho solder allows it to yield to slight irregularities, which improves the potential for a good electrical connection. c- EIA 483 83 W 2575532 00553b4 b W RS-483 Page 7 7.2 Shunt Connection The shunt connection is primarily for leaded capacitors, or for those capacitors whose dimensions preclud

34、e their insertion in series with the line. Connection to the test specimen is made through clamps at the end of the center conductor and on the outer wall of the line. The distance between the clamps is 0.59 inches (1.5 cm).- Because a portion of the leads of the test specimen are included in the me

35、asurement, their inductance and resistance affect the measured parameters of the specimen. The lead inductance increases the effective series capacitance, and the resistance increases the effective series resistance of the test specimen. The influence of the leads may be reduced somewhat, by using s

36、ilver ribbons. The ribbon dimensions must be kept within the bounds of the clamps, but in general, the wider and thicker the leads, the less their influence. . 8.0 CALIBRATION 8.1 The symbols and definitions of terms required for calibration are given in Section 4.0, SYMBOLS. 8.2 Short-circuited Q-F

37、actors, Qsc. Q-factors of the shorted line can be measured at 130 and 390 MHz, approxi- mately. A short circuit at the closed end of the line is established by inserting the movable plunger of the series test fixture into the line to meet the center conductor, and the threaded ferrule clamp is tight

38、ened to secure the plunger and provide a pressure contact. The two contacting surfaces are discs of coin silver, which is a good conductor and resistant to oxidation. The two surfaces should be parallel, and when under pressure the resistance must be low and repeatable for each mating. 8.2.1 The sur

39、faces of the contacts may develop slight irregularities with use, but any effect this may have on the integrity of the short circuit is usually negated by the insertion of a thin square of soft copper, about 0.31 inches (8 mm) on a side, placed between the discs. It is important that both surfaces o

40、f the copper foil be cleaned thoroughly just before using to remove the oxide which forms quickly on exposed copper. 8.2.2 Measure the short-circuited Q-factors at the 1/4 and 3/4 wavelength Record the Q-factors and frequencies (approximately 130 and 390 MHz). the resonant frequencies. 8.2.3 Q-facto

41、r measurements of the basic line and the system (line plus test specimen) are the only measurements used for calibration and test spe- cimen evaluation. The procedure for measuring Q-factors is described in detail in Section 9.0, PROCEDURE. EIA 483 81 m 2595512 0055365 8 m RS-483 Page 8 8.3 GIo, fo,

42、 and x. Qo IS defined as the Q-factor of theline at the ik4-wavelength resonant frequency, fo. Both of these quantities have been measured (see Section 8,2), and the values are needed for shunt-connected test specimen measurements, The slope, x, of the short-circuited Q-factors is needed in order to

43、 determine the Q- factor of the fine at the test specimen measurement frequency (QI at fl). If we denote the 1/4- and 3/4-wavelength resonant frequencies as fo and f3, and the Q- factors measured at these frequencies as Qo and Q3, respectively, the slope may be calculated from: . 8,4 Open-Circuited

44、Q-Factors, Qo, Q-factors of the open line are measured at 258 and 516 MHz, approximately. The center conductor at the closed end of the line is open-circuited by removing the plunger and threaded ferrule clamp from the bushing in the end plate. 8.4.1 Measure the open-circuited Q-factors at the half-

45、 and full-wavelength frequencies (approximately 258 and 516 MHz), and record the Q-factors and frequencies. .- 8,5 Q8 and x. QA is the Q-factor of the open-circuited line at a frequency f;. This frequency .is a function of the dimensions of the test specimen, but because it is generally only two or

46、three tenths of a percent less than fo, it is permissible to use the value of Q6 at fo. The slope of the open-circuited Q-factors, x, is needed to determine Q not the accuracy. If the two resistors cannot be matched with a precision dc bridge, slect two metal film resistors of equal rated value for

47、a first series of measurements, then transpose them and repeat the measurements. The arithmetic mean of the half-scale indications should be used for Q-factor measurements. 8.8.7 This calibration need be done at one frequency, only. The relative accuracy of semiconductor diode type rf probes is sens

48、ibly independent of frequency. - . EIA Li83 81 2575512 0055367 1 RS-483 Page 10 9.0 PROCEDURE 9.1 Series Measurement With the aid of a pair of tweezers insert the nonleaded test capacitor between the contact discs of the series fixture. Move the plunger inward to engage and hold the capacitor while

49、the threaded ferrule clamp is tightened to provide a pressure contact. If possible, avoid rotating the plunger after it is engaged to prevent scoring the surfaces of the fixture. 9.1.1 The measurement frequency in each frequency band depends upon the effective capacitance of the test specimen. A frequency search in the vicinity of a number of suitable test frequencies, as determined with the aid of charts (supplied with the Resonant Coaxial-Line), will establish resonance in the system. 9.1.2 The Q-factor of the system, Qm, is measured as