ECA EIA 61014-2017 Programs for Reliability Growth.pdf

1、 EIA STANDARD Programs for Reliability Growth EIA 61014 (IEC 61014:2003 Ed.2.0, IDT) May 2017 EIA 61014 ANSI/EIA 61014-2017 Approved: May 11, 2017 NOTICE EIA Engineering Standards and Publications are designed to serve the public interest through eliminating misunderstandings between manufacturers a

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4、s and Publications are adopted by ECIA in accordance with the American National Standards Institute (ANSI) patent policy. By such action, ECIA does not assume any liability to any patent owner, nor does it assume any obligation whatever to parties adopting the Standard or Publication. This EIA Stand

5、ard is identical (IDT) with the International Standard IEC Publication 61014:2003: Programs for Reliability Growth. This document is the EIA Standard EIA 61014 Edition 2.0: Programs for Reliability Growth. The text, figures and tables of IEC 61014:2003 are used in this Standard with the consent of t

6、he IEC and the American National Standards Institute (ANSI). The IEC copyrighted material has been reproduced with permission from ANSI. The IEC Foreword and Introduction are not part of the requirements of this standard but are included for information purposes only. This Standard does not purport

7、to address all safety problems associated with its use or all applicable regulatory requirements. It is the responsibility of the user of this Standard to establish appropriate safety and health practices and to determine the applicability of regulatory limitations before its use. (From Standards Pr

8、oposal No. 5372.01, formulated under the cognizance of the EIA Dependability Standards Committee). Published by Electronic Components Industry Association 2017 Standards integrated reliability engineering concept 13 4.4 Basic concepts for reliability growth in the test phase 13 4.5 Planning of the r

9、eliability growth and estimation of achieved reliability during the design phase . 15 4.5.1 General 15 4.5.2 Reliability growth in the product development/design phase 15 4.5.3 Reliability growth with the test programmes . 16 5 Management aspects 18 5.1 General . 18 5.2 Procedures including processe

10、s in the design phase . 19 5.3 Liaison 19 5.4 Manpower and costs for design phase 21 5.5 Cost benefit . 21 6 Planning and execution of reliability growth programmes 22 6.1 Integrated reliability growth concepts and overview . 22 6.2 Reliability growth activities in the design phase . 23 6.2.1 Activi

11、ties in concept and product requirements phase . 23 6.2.2 Product definition and preliminary design . 24 6.2.3 Project design phase 24 6.2.4 Tooling, first production runs (preproduction), production phase . 26 6.2.5 Product fielded phase . 26 6.3 Reliability growth activities in the validation test

12、 phase 26 6.4 Considerations for reliability growth testing . 27 6.4.1 General 27 6.4.2 Test planning . 27 6.4.3 Special considerations for non-repaired or one-shot (expendable) items and components 29 6.4.4 Classification of failures 30 6.4.5 Classes of non-relevant failures 30 6.4.6 Classes of rel

13、evant failures . 31 6.4.7 Categories of relevant failures that occur in test . 31 6.4.8 Process of reliability improvement in reliability growth tests 32 ii 6.4.9 Mathematical modelling of test reliability growth . 34 6.4.10 Nature and objectives of modelling 34 6.4.11 Concepts of reliability measur

14、es in reliability growth testing as used in modelling 35 6.4.12 Reporting on reliability growth testing and documentation . 38 7 Reliability growth in the field 40 Bibliography . 41 Figure 1 Comparison between growth and repair processes in reliability growth testing . 14 Figure 2 Planned improvemen

15、t (reduction) of the equivalent failure rate . 16 Figure 3 Planned reliability improvement expressed in terms of probability of survival . 16 Figure 4 Patterns of relevant test or field failures with time. 17 Figure 5 Overall structure of a reliability growth programme . 19 Figure 6 Chart showing li

16、aison links and functions . 21 Figure 7 Integrated reliability engineering process . 23 Figure 8 Process of reliability growth in testing 33 Figure 9 Characteristic curve showing instantaneous and extrapolated failure intensities . 36 Figure 10 Projected failure intensity estimated by modelling . 37

17、 Figure 11 Examples of growth curves and “jumps” . 38 EIA 61014 Page 1 INTERNATIONAL ELECTROTECHNICAL COMMISSION _ PROGRAMMES FOR RELIABILITY GROWTH FOREWORD 1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising all national electrotechnica

18、l committees (IEC National Committees). The object of IEC is to promote international co-operation on all questions concerning standardization in the electrical and electronic fields. To this end and in addition to other activities, IEC publishes International Standards, Technical Specifications, Te

19、chnical Reports, and Guides (hereafter referred to as “IEC Publication(s)”). Their preparation is entrusted to technical committees; any IEC National Committee interested in the subject dealt with may participate in this preparatory work. International, governmental and non-governmental organization

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22、mmittees in that sense. While all reasonable efforts are made to ensure that the technical content of IEC Publications is accurate, IEC cannot be held responsible for the way in which they are used or for any misinterpretation by any end user. 4) In order to promote international uniformity, IEC Nat

23、ional Committees undertake to apply IEC Publications transparently to the maximum extent possible in their national and regional publications. Any divergence between any IEC Publication and the corresponding national or regional publication shall be clearly indicated in the latter. 5) IEC provides n

24、o marking procedure to indicate its approval and cannot be rendered responsible for any equipment declared to be in conformity with an IEC Publication. 6) All users should ensure that they have the latest edition of this publication. 7) No liability shall attach to IEC or its directors, employees, s

25、ervants or agents including individual experts and members of its technical committees and IEC National Committees for any personal injury, property damage or other damage of any nature whatsoever, whether direct or indirect, or for costs (including legal fees) and expenses arising out of the public

26、ation, use of, or reliance upon, this IEC Publication or any other IEC Publications. 8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is indispensable for the correct application of this publication. 9) Attention is drawn to the possibil

27、ity that some of the elements of this IEC Publication may be the subject of patent rights. IEC shall not be held responsible for identifying any or all such patent rights. International Standard IEC 61014 has been prepared by IEC technical committee 56: Dependability. The text of this standard is ba

28、sed on the following documents: FDIS Report on voting 56/859/FDIS 56/863/RVD Full information on the voting for the approval of this standard can be found in the report on voting indicated in the above table. This publication has been drafted in accordance with the ISO/IEC Directives, Part 2. This s

29、econd edition of IEC 61014 cancels and replaces the first edition, published in 1989, and constitutes a technical revision. EIA 61014 Page 2 The main changes with respect to the previous edition are listed below. a) References to dependability management standards have been inserted. b) Terms and de

30、finitions related to the reliability growth during the product design have been added. c) Flow diagrams for reliability growth in 4.4 and 6.4.8 (see Figures 1 and 8) have been corrected. d) A subclause on planning reliability growth in the design phase has been added (see 4.5). e) A subclause on man

31、agement aspects covering both reliability growth in design and the test phase has been added (see Clause 5). f) Clause 6 has been extended to include reliability growth in the design phase with its analytical and test aspects. g) The figure showing projected failure intensity estimated by modelling

32、(see Figure 10) has been corrected. h) A clause on reliability growth in the field (see Clause 7) has been added. The committee has decided that the contents of this publication will remain unchanged until 2011. At this date, the publication will be reconfirmed; withdrawn; replaced by a revised edit

33、ion, or amended. EIA 61014 Page 3 INTRODUCTION Reliability improvement by a growth programme should be part of an overall reliability activity in the development of a product. This is especially true for a design that uses novel or unproven techniques, components, or a substantial content of softwar

34、e. In such a case the programme may expose, over a period of time, many types of weaknesses having design-related causes. It is essential to reduce the probability of failure due to these weaknesses to the greatest extent possible to prevent their later appearance in formal tests or in the field. At

35、 that late stage, design correction is often highly inconvenient, costly and time-consuming. Life-cycle costs can be minimized if the necessary design changes are made at the earliest possible stage. IEC 60300-3-5, Clause 1 refers to a “reliability growth (or improvement) programme” employ-ing equip

36、ment reliability design analysis and reliability testing, with the principal objective to realize reliability growth. Reliability design analysis applies analytical methods and techniques described in IEC 60300-3-1. Reliability design analysis is of a particular value, as it allows early identificat

37、ion of potential design weakness, well before design completion. This allows introduction of design modifications that are inexpensive and relatively easy to implement without consequences such as major design changes, programme delays, modification of tooling and manufacturing processes. The reliab

38、ility growth testing and environmental arrangements for the test part of this programme are essentially the same as those covered by IEC 60300-3-5, IEC 60605-2 and IEC 60605-3. The importance of the reliability growth programme, integrated into the design or product development process, and known as

39、 integrated reliability engineering, is driven by limited time to market, programme costs and striving for product cost reduction. Although effective for disclosure of potential field problems, a reliability growth testing pro-gramme alone is typically expensive, requiring extensive test time and re

40、sources, and the corrective actions are considerably more costly than if they were found and corrected in the early stages of design. Additionally, the duration of these tests, sometimes lasting for a very long time, would seriously affect the marketing or deployment schedule of the system. The cost

41、-effective solution to these challenges is a reliability growth programme fully integrated in both the design and evaluation phase as well as the testing phase. This effort is enabled by strong project management, by design engineering and often by customer participation and involvement. Over the pa

42、st few years, leading industry organizations have developed and applied analytical and test methods fully integrated with the design efforts for increasing the reliability during the product design phase. This reduces reliance on formal and lengthy reliability growth testing. This technology is the

43、basis for the integrated reliability growth strategy in this standard and will be discussed further in Clause 6. Some definitions and concepts are given first in order to lay the groundwork for discussing the integrated reliability growth methodologies. EIA 61014 Page 4 PROGRAMMES FOR RELIABILITY GR

44、OWTH 1 Scope This International Standard specifies requirements and gives guidelines for the exposure and removal of weaknesses in hardware and software items for the purpose of reliability growth. It applies when the product specification calls for a reliability growth programme of equipment (elect

45、ronic, electromechanical and mechanical hardware as well as software) or when it is known that the design is unlikely to meet the requirements without improvement. A statement of the basic concepts is followed by descriptions of the management, planning, testing (laboratory or field), failure analys

46、is and corrective techniques required. Mathematical modelling, to estimate the level of reliability achieved, is outlined briefly. 2 Normative references The following referenced documents are indispensable for the application of this document. For dated references, only the edition cited applies. F

47、or undated references, the latest edition of the referenced document (including any amendments) applies. IEC 60300-1, Dependability management Part 1: Dependability management systems1IEC 60300-2, Dependability management Part 2: Guidance for dependability programme management2IEC 60300-3-1, Dependa

48、bility management Part 3-1: Application guide Analysis tech-niques for dependability Guide on methodology IEC 60300-3-5:2001, Dependability management Part 3-5: Application guide Reliability test conditions and statistical test principles IEC 60605-2, Equipment reliability testing Part 2: Design of

49、test cycles IEC 60605-3 (all parts), Equipment reliability testing Part 3: Preferred test conditions IEC 60605-4, Equipment reliability testing Part 4: Statistical procedures for exponential distribution Point estimates, confidence intervals, prediction intervals and tolerance intervals IEC 60812, Analysis techniques for system reliability Procedure for failure mode and effects analysis (FMEA) IEC 61025, Fault tree analysis (FTA) IEC 61160, Formal design review IEC 61164, Reliability growth Statistical test and estimation met