ECA EIA 61124-2017 Reliability Testing - Compliance Tests for Constant Failure Rate and Constant Failure Intensity.pdf

1、 EIA STANDARD Reliability Testing - Compliance Tests for Constant Failure Rate and Constant Failure Intensity EIA 61124 (IEC 61124:2012 Ed.3.0, IDT) May 2017 EIA 61124 ANSI/EIA 61124-2017 Approved: May 11, 2017 NOTICE EIA Engineering Standards and Publications are designed to serve the public intere

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4、d is to be used either domestically or internationally. Standards and Publications are adopted by ECIA in accordance with the American National Standards Institute (ANSI) patent policy. By such action, ECIA does not assume any liability to any patent owner, nor does it assume any obligation whatever

5、 to parties adopting the Standard or Publication. This EIA Standard is identical (IDT) with the International Standard IEC Publication 61124:2012: Reliability Testing - Compliance Tests for Constant Failure Rate and Constant Failure Intensity. This document is the EIA Standard EIA 61124 Edition 3.0:

6、 Reliability Testing - Compliance Tests for Constant Failure Rate and Constant Failure Intensity. The text, figures and tables of IEC 61124:2012 are used in this Standard with the consent of the IEC and the American National Standards Institute (ANSI). The IEC copyrighted material has been reproduce

7、d with permission from ANSI. The IEC Foreword and Introduction are not part of the requirements of this standard but are included for information purposes only. This Standard does not purport to address all safety problems associated with its use or all applicable regulatory requirements. It is the

8、responsibility of the user of this Standard to establish appropriate safety and health practices and to determine the applicability of regulatory limitations before its use. (From Standards Proposal No. 5372.03, formulated under the cognizance of the EIA Dependability Standards Committee). Published

9、 by Electronic Components Industry Association 2017 Standards probability of acceptance Pa as a function of the (unknown) true expected number of failures, 0C-5 Figure C.3 Discrimination ratio, D, as a function of the expected number of failures, 0, for recommended values, 2,5 %, 5 %, 10 %, 15 %, 20

10、 % and 30 % of = . C-6 Figure C.4 Acceptable number of failures, c, minus expected number of failures, 0 (0= c 0) as a function of the expected number of failures 0 for recommended values 2,5 %, 5 %, 10 %, 20 %, and 30 % of = . C-7 Figure D.1 Accept and reject lines D-2 Figure D.2 Expected test time

11、 to decision eT D-3 Figure D.3 Expected test time to decision of acceptance eT (+) D-3 Figure D.4 Operating characteristic PaD-3 Figure D.5 Accept and reject lines D-4 iv Figure D.6 Expected test time to decision eT D-5 Figure D.7 Expected test time to decision of acceptance )(eT . D-5 Figure D.8 Op

12、erating characteristic PaD-5 Figure D.9 Accept and reject lines D-6 Figure D.10 Expected test time to decision eT . D-7 Figure D.11 Expected test time to decision of acceptance )(eT . D-7 Figure D.12 Operating characteristic PaD-8 Figure D.13 Accept and reject lines . D-9 Figure D.14 Expected test t

13、ime to decision eT . D-10 Figure D.15 Expected test time to decision of acceptance )(eT . D-10 Figure D.16 Operating characteristic PaD-10 Figure D.17 Accept and reject lines . D-11 Figure D.18 Expected test time to decision eT D-12 Figure D.19 Expected test time to decision of acceptance )(eTD-12 F

14、igure D.20 Operating characteristic PaD-12 Figure D.21 Accept and reject lines . D-13 Figure D.22 Expected test time to decision eT . D-14 Figure D.23 Expected test time to decision of acceptance )(eT . D-14 Figure D.24 Operating characteristic PaD-14 Figure D.25 Accept and reject lines . D-15 Figur

15、e D.26 Expected test time to decision eT D-15 Figure D.27 Expected test time to decision of acceptance )(eT . D-15 Figure D.28 Operating characteristic PaD-16 Figure D.29 Accept and reject lines . D-16 Figure D.30 Expected test time to decision *eT D-17 Figure D.31 Expected test time to decision of

16、acceptance )(eT . D-17 Figure D.32 Operating characteristic PaD-17 Figure E.1 Example of a sequential test using test plan A.3 = 10 %, D = 3, 0m = 1,11106h; r versus o*mT. E-3 Figure F.1 SPRT spreadsheet graphing example . F-7 Figure F.2 OC curve for probability of acceptance, PaF-10 Figure F.3 Expe

17、cted test time for making a decision F-10 Figure H.1 OC curve plotted from the spreadsheet calculations H-6 Figure K.1 Test plan types and terminology . K-2 Figure K.2 Principle of test plans K-4 Figure K.3 Partitioning of the test plan graph . K-4 v Figure K.4 Interior nodes and border nodes . K-5

18、Figure K.5 Paths to the accept line . K-5 Figure K.6 Paths to the reject line . K-5 Figure K.7 Probabilities of paths transfer between nodes . K-6 Figure K.8 The recurrent element Two cases K-8 Table 1 Advantages and disadvantages for the different test plan types . 8 Table 2 Overview of the sequent

19、ial test plans given in Annex A and D 12 Table 3 Fixed time/failure terminated test plans . 13 Table 4 Combined test plans in Annex D . 18 Table A.1 Accept and reject lines for test plan A.1 . A-2 Table A.2 Accept and reject lines for test plan A.2 . A-4 Table A.3 Accept and reject lines for test pl

20、an A.3 . A-6 Table A.4 Accept and reject lines for test plan A.4 . A-8 Table A.5 Accept and reject lines for test plan A.5 . A-10 Table A.6 Accept and reject lines for test plan A.6 . A-12 Table A.7 Accept and reject lines for test plan A.7 . A-14 Table A.8 Accept and reject lines for test plan A.8

21、. A-16 Table A.9 Accept and reject lines for test plan A.9 . A-18 Table D.1 Sequential test plans in this annex D-1 Table D.2 Combined test plans in this annex . D-1 Table D.3 Accept and reject lines D-2 Table D.4 Expected test time to decision and operating characteristic PaD-3 Table D.5 Accept and

22、 reject lines D-4 Table D.6 Expected test time to decision and operating characteristic PaD-6 Table D.7 Accept and reject lines D-7 Table D.8 Expected test time to decision and operating characteristic PaD-8 Table D.9 Accept and reject lines D-9 Table D.10 Expected test time to decision and operatin

23、g characteristic PaD-10 Table D.11 Accept and reject lines D-11 Table D.12 Expected test time to decision and operating characteristic PaD-12 Table D.13 Accept and reject lines D-13 Table D.14 Expected test time to decision and operating characteristic PaD-14 Table D.15 Accept and reject lines D-15

24、Table D.16 Expected test time to decision and operating characteristic PaD-16 Table D.17 Accept and reject lines D-17 Table D.18 Expected test time to decision and operating characteristic PaD-18 Table E.1 Example for a sequential test using test plan A.3 (with example data) . E-3 Table E.2 Constant

25、s for border line formulae and their coordinates for sequential test plans A.1 to A.9 E-8 Table F.1 Beginning of the spreadsheet prepared to obtain a sequential test graph F-2 Table F.2 Continuation of parameters calculation for the lines necessary for the SPRT graph F-3 vi Table F.3 Calculations of

26、 accept and reject line for the SPRT graph . F-3 Table F.4 Determination of the test termination time F-4 Table F.5 Formulae for accept and reject line along with the test termination F-6 Table F.6 Spreadsheet set-up for construction of the OC curves for the SPRT F-9 Table H.1 Set-up of the spreadsh

27、eet with embedded formulae Example . H-2 Table H.2 Formulae embedded into the spreadsheet shown in Table H.1 H-3 Table H.3 OC curve for the time/failure terminated fixed duration test . H-5 Table I.1 Cumulative normal distribution for fixed uvalues . I-7 Table I.2 Inverse cumulative normal distribut

28、ion for fixed 1 values I-7 EIA 61124 Page 1 IEC 61124 (Third edition 2012) Reliability testing Compliance tests for constant failure rate and constant failure intensity CEI 61124 (Troisime dition 2012) Essais de fiabilit Plan dessais de conformit dun taux de dfaillance constant et dune intensit de d

29、faillance constante CORRIGENDUM 1 10.3 Decision criteria Replace, in the existing text “Reject the test“, the formula “r r0+1“ by “r r0+1 “. I.3.2.1 Determination of c and D for 0 5 Replace the existing Equation (I.3) by the following new equation: 85021010uuc ,t(rounded) I.3.2.3 Determination of fr

30、om OC curves Replace the existing Equation (I.7) by the following new equation: 3)1(9119111cu)(c)(cReplace the existing Equation (I.8) by the following new equation: 850835022ucuuc , 10.3 Critres de dcision Remplacer, dans le texte “Rejeter lessai“, la formule “ r0r0+1“ par “r r0+1 “. I.3.2.1 Dtermi

31、nation de c et D pour 0 5 La correction de lquation (I.3) ne sapplique quau texte anglais. I.3.2.3 Dtermination de partir des courbes OC Remplacer lquation existante (I.7) par la nouvelle quation suivante: 3)1(9119111cu)(c)(cLa correction de lquation (I.8) ne sapplique quau texte anglais. EIA 61124

32、Page 2 INTERNATIONAL ELECTROTECHNICAL COMMISSION _ RELIABILITY TESTING COMPLIANCE TESTS FOR CONSTANT FAILURE RATE AND CONSTANT FAILURE INTENSITY FOREWORD 1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising all national electrotechnical co

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41、 or other damage of any nature whatsoever, whether direct or indirect, or for costs (including legal fees) and expenses arising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC Publications. 8) Attention is drawn to the Normative references cited in this public

42、ation. Use of the referenced publications is indispensable for the correct application of this publication. 9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of patent rights. IEC shall not be held responsible for identifying any or all suc

43、h patent rights. International Standard IEC 61124 has been prepared by IEC technical committee 56: Dependability. This third edition of IEC 61124 cancels and replaces the second edition, published in 2006, and constitutes a technical revision. The main changes with respect to the previous edition ar

44、e as follows: A number of new test plans have been added based on the Russian standard GOST R 27.402 1 1, and it is intended to align the new edition of MIL-HDBK-781 2 with this edition. Algorithms for optimizing test plans using a spreadsheet program are given and a 1Figures in square brackets refe

45、r to the bibliography. EIA 61124 Page 3 number of optimized test plans are listed. Furthermore, emphasis is laid on the fact that the test should be repeated following design changes. Discrepancies in test plans A, B as well as Annexes A and B that originated in IEC 60605-7 3, now withdrawn, have be

46、en corrected so these test plans differ from those given in previous editions of IEC 61124. As requested by the National Committees, mathematical background material and spreadsheet program information has been moved to informative annexes. In addition, the symbol lists have been divided, so that so

47、me annexes have separate lists of symbols. Guidance on how to choose test plans has been added as well as guidance on how to use spreadsheet programs to create them. Test plans A.1 to A.9 and B.1 to B.13 have been corrected. Subclauses 8.1, 8.2, 8.3, Clause 9, Annex C, Clauses G.2, I.2, I.3 and Anne

48、x J are unchanged, except for updated terminology and references. Corrections to the second edition proposed by National Committees have been implemented. The text of this standard is based on the following documents: FDIS Report on voting 56/1461/FDIS 56/1468/RVD Full information on the voting for the approval of this standard can be found in the report on voting indicated in the above table. This publication has been drafted in accordance with the ISO/IEC Directives, Part 2. The committee has deci