ECA EIA 62506-2017 Methods for Product Accelerated Testing.pdf

1、 EIA STANDARD Methods for Product Accelerated Testing EIA 62506 (IEC 62506:2013 Ed.1.0, IDT) May 2017 EIA 62506 ANSI/EIA 62506-2017 Approved: May 11, 2017 NOTICE EIA Engineering Standards and Publications are designed to serve the public interest through eliminating misunderstandings between manufac

2、turers and purchasers, facilitating interchangeability and improvement of products, and assisting the purchaser in selecting and obtaining with minimum delay the proper product for his particular need. Existence of such Standards and Publications shall not in any respect preclude any member or nonme

3、mber of ECIA from manufacturing or selling products not conforming to such Standards and Publications, nor shall the existence of such Standards and Publications preclude their voluntary use by those other than ECIA members, whether the standard is to be used either domestically or internationally.

4、Standards and Publications are adopted by ECIA in accordance with the American National Standards Institute (ANSI) patent policy. By such action, ECIA does not assume any liability to any patent owner, nor does it assume any obligation whatever to parties adopting the Standard or Publication. This E

5、IA Standard is identical (IDT) with the International Standard IEC Publication 62506:2013: Methods for Product Accelerated Testing. This document is the EIA Standard EIA 62506 Edition 1.0: Methods for Product Accelerated Testing. The text, figures and tables of IEC 62506:2013 are used in this Standa

6、rd with the consent of the IEC and the American National Standards Institute (ANSI). The IEC copyrighted material has been reproduced with permission from ANSI. The IEC Foreword and Introduction are not part of the requirements of this standard but are included for information purposes only. This St

7、andard does not purport to address all safety problems associated with its use or all applicable regulatory requirements. It is the responsibility of the user of this Standard to establish appropriate safety and health practices and to determine the applicability of regulatory limitations before its

8、 use. (From Standards Proposal No. 5372.06, formulated under the cognizance of the EIA Dependability Standards Committee). Published by Electronic Components Industry Association 2017 Standards any IEC National Committee interested in the subject dealt with may participate in this preparatory work.

9、International, governmental and non-governmental organizations liaising with the IEC also participate in this preparation. IEC collaborates closely with the International Organization for Standardization (ISO) in accordance with conditions determined by agreement between the two organizations. 2) Th

10、e formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international consensus of opinion on the relevant subjects since each technical committee has representation from all interested IEC National Committees. 3) IEC Publications have the form of recommendati

11、ons for international use and are accepted by IEC National Committees in that sense. While all reasonable efforts are made to ensure that the technical content of IEC Publications is accurate, IEC cannot be held responsible for the way in which they are used or for any misinterpretation by any end u

12、ser. 4) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publications transparently to the maximum extent possible in their national and regional publications. Any divergence between any IEC Publication and the corresponding national or regional publicatio

13、n shall be clearly indicated in the latter. 5) IEC itself does not provide any attestation of conformity. Independent certification bodies provide conformity assessment services and, in some areas, access to IEC marks of conformity. IEC is not responsible for any services carried out by independent

14、certification bodies. 6) All users should ensure that they have the latest edition of this publication. 7) No liability shall attach to IEC or its directors, employees, servants or agents including individual experts and members of its technical committees and IEC National Committees for any persona

15、l injury, property damage or other damage of any nature whatsoever, whether direct or indirect, or for costs (including legal fees) and expenses arising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC Publications. 8) Attention is drawn to the Normative refere

16、nces cited in this publication. Use of the referenced publications is indispensable for the correct application of this publication. 9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of patent rights. IEC shall not be held responsible for i

17、dentifying any or all such patent rights. International Standard IEC 62506 has been prepared by IEC technical committee 56: Dependability. The text of this standard is based on the following documents: FDIS Report on voting 56/1503/FDIS 56/1513/RVD Full information on the voting for the approval of

18、this standard can be found in the report on voting indicated in the above table. This publication has been drafted in accordance with the ISO/IEC Directives, Part 2. EIA 62506 Page 2 The committee has decided that the contents of this publication will remain unchanged until the stability date indica

19、ted on the IEC web site under “http:/webstore.iec.ch“ in the data related to the specific publication. At this date, the publication will be reconfirmed, withdrawn, replaced by a revised edition, or amended. IMPORTANT The colour inside logo on the cover page of this publication indicates that it con

20、tains colours which are considered to be useful for the correct understanding of its contents. Users should therefore print this document using a colour printer. EIA 62506 Page 3 INTRODUCTION Many reliability or failure investigation test methods have been developed and most of them are currently in

21、 use. These methods are used to either determine product reliability or to identify potential product failure modes, and have been considered effective as demonstrations of reliability: fixed duration, sequential probability ratio, reliability growth tests, tests to failure, etc. Such tests, althoug

22、h very useful, are usually lengthy, especially when the product reliability that has to be demonstrated was high. The reduction in time-to-market periods as well as competitive product cost, increase the need for efficient and effective accelerated testing. Here, the tests are shortened through the

23、application of increased stress levels or by increasing the speed of application of repetitive stresses, thus facilitating a quicker assessment and growth of product reliability through failure mode discovery and mitigation. There are two distinctly different approaches to reliability activities: th

24、e first approach verifies, through analysis and testing, that there are no potential failure modes in the product that are likely to be activated during the expected life time of the product under the expected operating conditions; the second approach estimates how many failures can be expected afte

25、r a given time under the expected operating conditions. Accelerated testing is a method appropriate for both cases, but used quite differently. The first approach is associated with qualitative accelerated testing, where the goal is identification of potential faults that eventually might result in

26、product field failures. The second approach is associated with quantitative accelerated testing where the product reliability may be estimated based on the results of accelerated simulation testing that can be related back to the use of the environment and usage profile. Accelerated testing can be a

27、pplied to multiple levels of items containing hardware or software. Different types of reliability testing, such as fixed duration, sequential test-to-failure, success test, reliability demonstration, or reliability growth/improvement tests can be candidates for accelerated methods. This standard pr

28、ovides guidance on selected, commonly used accelerated test types. This standard should be used in conjunction with statistical test plan standards such as IEC 61123, IEC 61124, IEC 61649 and IEC 61710. The relative merits of various methods and their individual or combined applicability in evaluati

29、ng a given system or item, should be reviewed by the product design team (including dependability engineering) prior to selection of a specific test method or a combination of methods. For each method, consideration should also be given to the test time, results produced, credibility of the results,

30、 data required to perform meaningful analysis, life cycle cost impact, complexity of analysis and other identified factors. EIA 62506 Page 4 METHODS FOR PRODUCT ACCELERATED TESTING 1 Scope This International Standard provides guidance on the application of various accelerated test techniques for mea

31、surement or improvement of product reliability. Identification of potential failure modes that could be experienced in the use of a product/item and their mitigation is instrumental to ensure dependability of an item. The object of the methods is to either identify potential design weakness or provi

32、de information on item dependability, or to achieve necessary reliability/availability improvement, all within a compressed or accelerated period of time. This standard addresses accelerated testing of non-repairable and repairable systems. It can be used for probability ratio sequential tests, fixe

33、d duration tests and reliability improvement/growth tests, where the measure of reliability may differ from the standard probability of failure occurrence. This standard also extends to present accelerated testing or production screening methods that would identify weakness introduced into the produ

34、ct by manufacturing error, which could compromise product dependability. 2 Normative references The following documents, in whole or in part, are normatively referenced in this document and are indispensable for its application. For dated references, only the edition cited applies. For undated refer

35、ences, the latest edition of the referenced document (including any amendments) applies. IEC 60068 (all parts), Environmental testing IEC 60300-3-1:2003, Dependability management Part 3-1: Application guide Analysis techniques for dependability Guide on methodology IEC 60300-3-5, Dependability manag

36、ement Part 3-5: Application guide Reliability test conditions and statistical test principles IEC 60605-2, Equipment reliability testing Part 2: Design of test cycles IEC 60721 (all parts), Classification of environmental conditions IEC 61014:2003, Programmes for reliability growth IEC 61164:2004, R

37、eliability growth Statistical test and estimation methods IEC 61124:2012, Reliability testing Compliance tests for constant failure rate and constant failure intensity IEC 61163-2, Reliability stress screening Part 2: Electronic components IEC 61649:2008, Weibull analysis IEC 61709, Electronic compo

38、nents Reliability Reference conditions for failure rates and stress models for conversion EIA 62506 Page 5 IEC 61710, Power law model Goodness-of-fit tests and estimation methods IEC 62303, Radiation protection instrumentation Equipment for monitoring airborne tritium IEC/TR 62380, Reliability data

39、handbook Universal model for reliability prediction of electronics components, PCBs and equipment IEC 62429, Reliability growth Stress testing for early failures in unique complex systems 3 Terms, definitions, symbols and abbreviations For the purposes of this document, the term and definitions give

40、n in IEC 60050-191:_, as well as the following, apply. NOTE Symbols for reliability, availability, maintainability and safety measures follow those of IEC 50060-191:1990, where available. 3.1 Terms and definitions 3.1.1 item subject being considered Note 1 to entry: The item may be an individual par

41、t, component, device, functional unit, equipment, subsystem, or system. Note 2 to entry: The item may consist of hardware, software, people or any combination thereof. Note 3 to entry: The item is often comprised of elements that may each be individually considered. See “sub-item“, definition 191-41

42、-02 and “indenture level“, definition 191-41-05. Note 4 to entry: IEC 60050-191:1990, first edition, identified the term “entity” as a synonym, which is not true for all applications. Note 5 to entry: The definition for item given in the first edition is a description rather than a definition. This

43、new definition provides meaningful substitution throughout this standard. The words of the former definition form the new note 1. SOURCE: IEC 60050-191:, definition 191-41-01 113.1.2 step stress step stress test test in which the applied stress is increased, after each specified interval, until fail

44、ure occurs or a predetermined stress level is reached Note 1 to entry: The intervals could be specified in terms of number of stress applications, durations, or test sequences. Note 2 to entry: The test should not alter the basic failure modes, failure mechanisms, or their relative prevalence. SOURC

45、E: IEC 60050-191:, definition 191-49-10 3.1.3 acceleration factor ratio between the item failure distribution characteristics or reliability measures (e.g. failure intensities) of an item when it is subject to stresses in expected use and those the item acquires when the higher level stresses are ap

46、plied for achieving a shorter test duration Note 1 to entry: For a test to be effectively accelerated, the acceleration factor is 1. 1Figures in square brackets refer to the Bibliography. EIA 62506 Page 6 Note 2 to entry: When the failure distribution Poisson is assumed with constant failure rate, t

47、hen the acceleration factor corresponds to the ratio of time under stress in use vs. time under increased stress in test. 3.1.4 highly accelerated limit test HALT test or sequence of tests intended to identify the most likely failure modes of the product in a defined stress environment Note 1 to ent

48、ry: HALT is sometimes spelled out as the highly accelerated life test (as it was originally named in error). However, as a non-measurable accelerated test, it does not provide information on life duration, but on the magnitude of stress which represents the limit of the design. 3.1.5 highly accelera

49、ted stress test HAST test where applied stresses are considerably increased in order to reduce duration of their application 3.1.6 highly accelerated stress screening HASS screening intended to identify latent defects in a product caused by manufacturing process or control errors 3.1.7 highly accelerated stress audit HASA process monitoring tool where a sample from a production lot is tested to detect potential weaknesses in a product caused by manufacturing 3.1.8 activation energy Eaempirical factor for estimat