ECA EIA-198-2-E-1998 Ceramic Dielectric Capacitors Classes I II III and IV Part II Test Methods.pdf

1、 EIA STANDARD Ceramic Dielectric Capacitors Classes I, II, III, and IV Part II: Test Methods EIA-198-2-E (Revision of EIA-198-D) April 2014 EIA-198-2-E ANSI/EIA-198-2-E Approved: December 12, 1997 Reaffirmed: April 4, 2014 NOTICE EIA Engineering Standards and Publications are designed to serve the p

2、ublic interest through eliminating misunderstandings between manufacturers and purchasers, facilitating interchangeability and improvement of products, and assisting the purchaser in selecting and obtaining with minimum delay the proper product for his particular need. Existence of such Standards an

3、d Publications shall not in any respect preclude any member or nonmember of ECIA from manufacturing or selling products not conforming to such Standards and Publications, nor shall the existence of such Standards and Publications preclude their voluntary use by those other than ECIA members, whether

4、 the standard is to be used either domestically or internationally. Standards and Publications are adopted by ECIA in accordance with the American National Standards Institute (ANSI) patent policy. By such action, ECIA does not assume any liability to any patent owner, nor does it assume any obligat

5、ion whatever to parties adopting the Standard or Publication. This EIA Standard is considered to have International Standardization implication, but the International Electrotechnical Commission activity has not progressed to the point where a valid comparison between the EIA Standard and the IEC do

6、cument can be made. This Standard does not purport to address all safety problems associated with its use or all applicable regulatory requirements. It is the responsibility of the user of this Standard to establish appropriate safety and health practices and to determine the applicability of regula

7、tory limitations before its use. (From Standards Proposal No. 5262, formulated under the cognizance of the P-2.1 Committee on Ceramic Dielectric Capacitors Standards). Published by Electronic Components Industry Association 2014 Engineering Department 2214 Rock Hill Road, Suite 265 Herndon, VA 20170

8、 PLEASE! DONT VIOLATE THE LAW! This document is copyrighted by the ECIA and may not be reproduced without permission. Organizations may obtain permission to reproduce a limited number of copies through entering into a license agreement. For information, contact: IHS 15 Inverness Way East Englewood,

9、CO 80112-5704 or call USA and Canada (1-877-413-5184), International (303-397-7956) i Ceramic Dielectric Capacitors Classes I,II,Ill,and IV Contents Page PART 1: Characteristics and Requirements Description of changes v Forward 1 Clarification statement 1 1 Scope 3 1.1 Dielectric classification 3 1.

10、2 Mechanical classification 4 1.3 Type designation 5 2Marking 11 2.1 Leaded, coated devices 11 2.2 Unleaded multilayer capacitors 11 3 Test Sequence 15 3.1 Sampling plans 15 3.2 Test requirements 16 Annex A Other pertinent ANSI standards 19 A.1 Scope 19 A.2 Document sourcing 19 A.3 Pertinent EIA and

11、 ANSIIEIA documents 19 Annex B Pertinent U.S. military standards 21 B.1 Scope 21 B.2 Document sourcing 21 B.3 Pertinent U.S. military specification documents 21 Annex C Pertinent international standards 23 C.1 Scope 23 C.2 Document sourcing 23 C.3 Pertinent IEC and CECC documents 24 C.4 Pertinent EI

12、AJ and JIS documents 26 C.5 Pertinent ISO documents 26 ii Ceramic Dielectric Capacitors Classes I,II,Ill,and IV Contents (continued) Page PART II: Test Methods Description of changes iv Forward 1 Clarification statement 1 1 Introduction 3 1.1 Scope 3 1.2 Numbering system 3 2 General Requirements 4 2

13、.1 Test requirements 4 2.2 Test conditions 4 3 Numerical list of test methods 5 Parametric conformance tests (100 class) Method 101: Capacitance and dissipation factor 7 Method 102: Quality factor 9 Method 103: Dielectric or case withstanding voltage 11 Method 104: Insulation resistance 15 Method 10

14、5: Voltage-temperature characteristic of capacitance 17 Method 106: High frequency measurements 21 Environmental performance tests (200 class) Method 201: Life (at elevated ambient temperature) 23 Method 202: Thermalshock 27 Method 203: Immersion 31 Method 204: Moisture resistance 33 Method 205: Hum

15、idity (steady state) 37 Method 206: Damp heat (steady state) 39 Method 207: Barometric pressure (reduced) 43 Method 208: Flammability (external flame) 45 Method 209: Seal 47 Method 210: Marking resistance to solvents 57 iii Ceramic Dielectric Capacitors Classes I, II, III, and IV Contents (continued

16、) Page PART II: Test Methods -cont. Physical conformance tests (300 class) Method 301: Solderability 59 Method 302: Resistance to soldering heat 67 Method 303: Terminal strength 73 Method 304: Vibration, high frequency 79 Method 305: Shock (specified pulse) 87 Method 306: Destructive physical analys

17、is (DPA) 97 Method 307: Surface mount thermal shock 99 Annex A Other pertinent ANSI standards 109 A.1 Scope 109 A.2 Document sourcing 109 A.3 Pertinent EIA and ANSI/EIA documents 109 A.4 Pertinent IPC documents 111 Annex B Pertinent U.S. military standards 113 B.1 Scope 113 B.2 Document sourcing 113

18、 B.3 Pertinent U.S. military specification documents 113 Annex C Pertinent international standards 115 C.1 Scope 115 C.2 Document sourcing 115 C.3 Pertinent IEC and CECC documents 116 C.4 Pertinent EIAJ and JIS documents 117 C.5 Pertinent ISO documents 117 iv Ceramic Dielectric Capacitors Classes I,

19、 II, III, and IV Contents (continued) Page Part III: Individual Specifications Description of changes v Forward 1 Clarification statement 1 1 Individual product specifications 3 Annex A Other pertinent ANSI specifications 5 A.1 Scope 5 A.2 Document sourcing 5 A.3 Pertinent EIA and ANSIIEIA documents

20、 5 Annex B Pertinent U.S. military standards 9 B.1 Scope 9 B.2 Document sourcing 9 B.3 Pertinent U.S. military specification documents 9 Annex C Other international documents 11 C.1 Scope 11 C.2 Document sourcing 11 C.3 Pertinent IEC and CECC documents 12 C.4 Pertinent EIAJ and JIS documents 13 C.5

21、Pertinent ISO documents 13 Section 1 Radial-leaded, disc capacitors Section 2 Radial-leaded 500 V tubular capacitors Section 3 Unleaded multilayer chip capacitors Section 4 Radial-leaded, conformally coated capacitors Section 5 Radial-leaded, molded capacitors Section 6 Axial-leaded, conformally coa

22、ted capacitors Section 7 Axial-leaded, glass encapsulated capacitors Section 8 Two-pin, dual-in-line, encapsulated capacitors Section 9 High voltage, multilayer capacitors v Spec#- Rev Description of Changes Pages Date EIA-198-E Title Page:Modify Part II title.Title 2124/97EIA-198-E Part II General:

23、 Add method number and title to each page of all test methods; correct various typographical errors .All 2124/97 EIA-198-E Part II General: Redraw Figures as graphics files.Var. 2/24/97EIA-198-E Add new section2.2.1 Sample Conditioning with deaging requirements. At 2.2 define room temperature.4 10/3

24、1/97 EIA-198-E Method 101: Modify “Purpose“ paragraph to clarify Class-1 TCC requirements. Reformat Tables for clarity; add specification for measurement of Y5V at 1.0 V ac. 7,8 2/24/97 EIA-198-E Method 105: add note at 2.4 note that cap shall be measured per voltage and frequency specified in Metho

25、d 101. Update 2.3 requirements to match those on page 4.17 2124/97 EIA-198-E Method 201: Delete reference to English units at 3.224 2124/97EIA-198-E Method 202: Reformat Tables 1 redraw Figure 1 and move appropriate notes to text.33 35 2124/97 EIA-198-E Method 206: add test condition letters at 3.2.

26、2 equivalent to method 205 conditions.40 2124/97 EIA-198-E Method 208:Reword Purpose and Procedure paragraphs; add Summary. 45 46 2124/97 EIA-198-E Method 301: Add “Aging“ to 2.4 title; specify 4-hrs minimum steam age at 4.2 and add note for steam age of chip capacitors; add Table 1 at 4.5 specifyin

27、g dip conditions for all devices including chip capacitors; shorten 4.6.1 and 4.6.2 titles to “thin wire“ and “heavy gage terminals“ respectively; add 4.6.3 specifying examination of chip capacitor terminations. 59-63 2124/97 EIA-198-E Method 302: Add references and chip capacitor test conditions to

28、 Table 1; remove 5.1 heading and incorporate into 5. Update 6,renumber Figure 1. 69-71 2124/97 EIA-198-E Method 303: Renumbered Figures. Reformatted Table 1 for clarity. At 3.4.1 and Table 1 added metric dimensions and English equivalents. 74-77 2/24/97 vi Spec#- Rev Description of Changes - Cont. P

29、ages Date EIA-198-E Method 304: Renumbered and relocate Figure 1 properly in text. 85 2/24/97 EIA-198-E Method 307: Created Annex A for secondary procedure. Deleted report form examples 105 2/24/97 EIA-198-E Added annexes A through C referencing other pertinent specifications. 109-117 10/31/97 EIA-1

30、98-2-E Page 1 CERAMIC DIELECTRIC CAPACITORS CLASSES I, II, III and IV Part II: GENERAL TEST METHODS FOR CERAMIC CAPACITORS Forward Formulated under the cognizance of the EIA P-2.1 Subcommittee on Ceramic Capacitors. This EIA Standard is a revision and update of EIA-198-0 covering ceramic dielectric

31、capacitors. Clarification Statement The purpose of this clarification statement is to advise the reader that it is EIA procedure when revising a standard to include all of the outstanding addendums of the standard being superseded in the revision. Accordingly, previously published addendums to EIA-1

32、98-8; EIA-198-8-1: EIA-198-8-2; EIA-198-8-3A and EIA-198-C1 EIA-198-D have been incorporated into EIA-198-E. EIA-198-2-E Page 2 THIS PAGE INTENTIONALLY LEFT BLANK EIA-198-2-E Page 3 1 Introduction 1.1 Scope This standard establishes uniform methods for testing ceramic capacitors, including basic env

33、ironmental tests to determine resistance to deleterious effects of natural elements, and physical and electrical tests. The tests described herein have been prepared to serve several purposes. a) To specify suitable conditions obtainable in the laboratory which give test results equivalent to the ac

34、tual service conditions existing in the field, and to obtain reproducibility of the results of tests. The test methods described herein are not to be interpreted as an exact and conclusive representation of actual service operation in any one geographic location, since it is known that the only true

35、 test for operation in a specific location is an actual service test at that point; b) To describe in one standard (1) all of the test methods applicable to ceramic capacitors described in EIA-198, (2) those newly-developed test methods that are feasible for use in several standards, and (3) the rec

36、ognized extreme environments, particularly temperatures, barometric pressures etc., at which capacitors will be tested under some of the presently-standardized testing procedures. By so consolidating, these methods may be kept uniform and thus result in conservation of equipment, man-hours, and test

37、ing facilities. In achieving these objectives, it is necessary to make each of the general tests adaptable to a broad range of ceramic capacitors; c) The test methods described herein for environmental, physical and electrical evaluation of electronic parts shall also apply, when suitable, to parts

38、not covered by an approved specification or drawing. 1.2 Numbering System The test methods are designated by numbers assigned in accordance with the following system: 1.2.1 Class of Test The tests are divided into three classes: Test methods 101 to 199 inclusive cover parametric conformance; those n

39、umbered 201 to 299 inclusive, cover environmental performance; and those numbered 301 to 399 inclusive cover physical conformance. Within each class, test methods are serially numbered in the order in which they are introduced into this standard. 1.2.2 Revision of Test Methods. The test method revis

40、ion is indicated by a letter following the method number. For example, the original number assigned to the Capacitance and Dissipation Factor test method is 101; the first revision is 101-A, the second revision is 101-B, etc. EIA-198-2-E Page 4 2 General Requirements 2.1 Test Requirements. The requi

41、rements which must be met by the component parts subjected to the test methods described herein are specified in the individual specifications, as applicable, and the tests shall be applied as specified therein. Whenever this standard conflicts with the individual specification, the latter shall gov

42、ern. 2.2 Test Conditions. Unless otherwise specified herein, or in the individual specification, all measurements and tests shall be made at ambient or “room“ conditions as defined below under general requirements. Whenever ambient conditions must be closely controlled in order to obtain reproducibl

43、e results for referee purposes, the stricter conditions listed below shall be specified. CONDITION Temperature Barometric Pressure Relative Humidity GENERAL REQUIREMENTS 25 C +/- 3C 650 to 800 mm of mercury not to exceed 75 percent CONTROL REQUIREMENTS 25 C +/-1 C 650 to 800 mm of mercury, 50 +/-2 p

44、ercent 2.2.1Sample Conditioning (Classes II, Ill, and IV only) Aging characteristics of ceramic dielectrics in Class II and higher can be significant and must be controlled when performing pre- and post-test electrical measurements. An acceptable protocol is: a. Deage at 150 C (or rated temperature,

45、 whichever is higher) for two hours minimum. b. Stabilize at room temperature for a minimum of 24 hours. c. Measure electrical parameters between 24 and 72 hours after last heat. 2.2.2 Permissible temperature variation in environmental chambers. When chambers are used, specimens under test shall be

46、located only within the working area defined as follows: a) Temperature variation within working area: The controls for the chambers shall be capable of maintaining the temperature of any single reference point within the working area within +/-2 C. b) Space variation within working areas: Chambers

47、shall be so constructed that, at any given time, the temperature of any point within the working area shall not deviate more than 3 C from the reference point, except in the immediate vicinity of specimens generating heat. EIA-198-2-E Page 5 3 Numerical List of Test Methods METHOD TITLE Parametric C

48、onformance Tests (100 class) 101 Capacitance and Dissipation Factor 102 Quality Factor (Q) 103 Dielectric or Case Withstanding voltage 104 Insulation Resistance 105 Voltage-Temperature Characteristic of Capacitance 106 High Frequency Measurements Environmental Performance Tests (200 class) 201 Life

49、(at elevated ambient temperature) 202 Thermal Shock 203 Immersion 204 Moisture Resistance 205 Humidity (steady state) 206 Damp Heat (steady state) 207 Barometric Pressure (reduced) 208 Flammability (external flame) 209 Seal 210 Marking Resistance to Solvents Physical Conformance Tests (300 class) 301 Solderability 302 R