ECA EIA-364-12A-2005 TP-12A Restricted Entry Test Procedure for Electrical Connectors.pdf

1、 EIA STANDARD TP-12A Restricted Entry Test Procedure for Electrical Connectors EIA-364-12A (Revision of EIA-364-12) June 2005 Electronic Components Industry Association EIA-364-12A ANSI/EIA-364-12A-2005 (R2017) Approved: June 9, 2005 Reaffirmed: January 23, 2017 NOTICE EIA Engineering Standards and

2、Publications are designed to serve the public interest through eliminating misunderstandings between manufacturers and purchasers, facilitating interchangeability and improvement of products, and assisting the purchaser in selecting and obtaining with minimum delay the proper product for his particu

3、lar need. Existence of such Standards and Publications shall not in any respect preclude any member or nonmember of ECIA from manufacturing or selling products not conforming to such Standards and Publications, nor shall the existence of such Standards and Publications preclude their voluntary use b

4、y those other than ECIA members, whether the Standard is to be used either domestically or internationally. Standards and Publications are adopted by ECIA in accordance with the American National Standards Institute (ANSI) patent policy. By such action, ECIA does not assume any liability to any pate

5、nt owner, nor does it assume any obligation whatever to parties adopting the Standard or Publication. This EIA Standard is considered to have International Standardization implications, but the International Electrotechnical Commission activity has not progressed to the point where a valid compariso

6、n between the EIA Standard and the IEC document can be made. This Standard does not purport to address all safety problems associated with its use or all applicable regulatory requirements. It is the responsibility of the user of this Standard to establish appropriate safety and health practices and

7、 to determine the applicability of regulatory limitations before its use. (From Standards Proposal No. 5373.01, formulated under the cognizance of the CE-2.0 Committee on EIA National Connector and Sockets Standards) Published by Electronic Components Industry Association 2017 EIA Standards & Techno

8、logy Department 2214 Rock Hill Road, Suite 265 Herndon, VA 20170 PLEASE ! DONT VIOLATE THE LAW! This document is copyrighted by the ECIA and may not be reproduced without permission. Organizations may obtain permission to reproduce a limited number of copies through entering into a license agreement

9、. For information, contact: IHS 15 Inverness Way East Englewood, CO 80112-5704 or call USA and Canada (1-877-413-5186), International (303-397-7956) ii CONTENTS Clause Page 1 Introduction . 1 1.1 Scope . 1 2 Test resources 1 2.1 Equipment . 1 3 Test specimen 1 3.1 Description 1 4 Test procedure . 1

10、5 Details to be specified . 2 6 Test documentation . 2 iii (This page left blank) 4 TEST PROCEDURE No. 12A RESTRICTED ENTRY TEST PROCEDURE FOR ELECTRICAL CONNECTORS (From EIA Standards Proposal No. 5061, formulated under the cognizance EIA CE-2.0 Committee on National Connector Standards, and previo

11、usly published in EIA-364-12.) 1 Introduction 1.1 Scope This standard establishes a test method to determine the ability of socket contacts, classified as restricted entry types, to prevent the insertion of an oversized pin. 2 Test resources 2.1 Equipment 2.1.1 Mounting device to securely hold the s

12、ocket contact. 2.1.2 An oversized pin that has the dimensions, material and finish specified in the referencing document. 2.1.3 An instrument for measuring the applied load to an accuracy of plus (+) and minus (-) five percent. 3 Test specimen 3.1 Description The test specimen shall consist of a soc

13、ket contact. 4 Test procedure 4.1 The test pin shall be axially positioned at the engaging end of the test specimen and the force, specified in the referencing document, applied for a period of 10 seconds 1 second. 4.2 The depth of test pin penetration shall be measured and recorded. 5 5 Details to

14、be specified The following details shall be specified in the referencing document: 5.1 Test pin oversized diameter, if other than 0.127 millimeter (0.005 inch) larger than the allowable maximum pin diameter 5.2 Dimension, materials and finish of the test pin 5.3 Force or weight to be applied to the

15、test pin 5.4 Maximum allowable depth of penetration 5.5 Any deviation from this test method 6 Documentation Documentation shall contain the details specified in clause 5, with any exceptions, and the following: 6.1 Title of test 6.2 Specimen description, including fixturing 6.3 Test equipment used,

16、and date of last and next calibration 6.4 Test procedure 6.5 Name of operator and date of test 6 EIA Document Improvement Proposal If in the review or use of this document, a potential change is made evident for safety, health or technical reasons, please fill in the appropriate information below an

17、d mail or FAX to: Electronic Industries Alliance Technology Strategy & Standards Department Publications Office 2500 Wilson Blvd. Arlington, VA 22201 FAX: (703-875-8906) Document No. Document Title: Submitters Name: Telephone No.: FAX No.: e-mail: Address: Urgency of Change: Immediate: At next revis

18、ion: Problem Area: a. Clause Number and/or Drawing: b. Recommended Changes: c. Reason/Rationale for Recommendation: Additional Remarks: Signature: Date: FOR EIA USE ONLY Responsible Committee: Chairman: Date comments forwarded to Committee Chairman: Electronic Components Industry Association 2214 Rock Hill Road, Suite 265 * Herndon, VA 20170 * tel 571-323-0294 * fax 571-323-0245 www.ecianow.org