ECA EIA-364-21E-2014 TP-21E Insulation Resistance Test Procedure for Electrical Connectors Sockets and Coaxial Contacts (2).pdf

1、 EIA STANDARD TP-21E Insulation Resistance Test Procedure for Electrical Connectors, Sockets and Coaxial Contacts EIA-364-21E (Revision of EIA-364-21D) May 2014 ANSI/EIA-364-21E Approved: May 29, 2014 EIA-364-21E NOTICE EIA Engineering Standards and Publications are designed to serve the public inte

2、rest through eliminating misunderstandings between manufacturers and purchasers, facilitating interchangeability and improvement of products, and assisting the purchaser in selecting and obtaining with minimum delay the proper product for his particular need. Existence of such Standards and Publicat

3、ions shall not in any respect preclude any member or nonmember of ECIA from manufacturing or selling products not conforming to such Standards and Publications, nor shall the existence of such Standards and Publications preclude their voluntary use by those other than ECIA members, whether the stand

4、ard is to be used either domestically or internationally. Standards and Publications are adopted by ECIA in accordance with the American National Standards Institute (ANSI) patent policy. By such action, ECIA does not assume any liability to any patent owner, nor does it assume any obligation whatev

5、er to parties adopting the Standard or Publication. This standard is based upon the major technical content of International Electrotechnical Commission standard 60512-3-1 (was 512-2, test 3a), Insulation Resistance, 2002-02, first edition. It conforms in all essential respects this IEC standard. Th

6、is Standard does not purport to address all safety problems associated with its use or all applicable regulatory requirements. It is the responsibility of the user of this Standard to establish appropriate safety and health practices and to determine the applicability of regulatory limitations befor

7、e its use. (From Standards Proposal No. 5323, formulated under the cognizance of the CE-2.0 Committee on EIA National Connector and Sockets Standards.) Published by Electronic Components Industry Association 2014 EIA Standards and between connector shell or mounting plate and the closest adjacent co

8、ntact, or both. Unless otherwise specified in the referencing document, a minimum of five measurements (5 adjacent contacts and/or 5 contacts-to-shell and/or 5 contacts-to-base plate) or 10% of the total number of contacts (whichever is greater) shall be made for each case, per test specimen. The sa

9、me contact locations for a given connector shall be used each time the insulation resistance test is performed. Unless otherwise specified, test voltage applied shall be 500 Vdc 10%. Insulation resistance measurements for coaxial contacts shall be made between the inner and outer contacts, as specif

10、ied in the referencing document. 4.2 Electrification time When electrification time is a factor, or when variable data are required, the insulation measurements shall be made immediately after a two-minute period of uninterrupted test voltage application, unless otherwise specified. However, if the

11、instrument reading indicates that an insulation resistance meets the specified limit, and is steady or increasing, the test may be terminated before the end of the specified period. When more than one measurement is specified, subsequent measurements of insulation resistance shall be made using the

12、same polarity as the initial measurements. The minimum value of insulation resistance obtained shall be greater than the minimum value specified in the requirements for the specimens being tested. 4.3 Precautions Suitable precautions must be taken to protect personnel and apparatus from the relative

13、ly high potentials used in performing the test. Care shall be taken to prevent a direct short circuit of the testing apparatus since damage to the indication device may result. 4.4 Final measurements When insulation resistance is performed in conjunction with environmental tests, the specimens shall

14、 be measured within one hour, unless otherwise specified in the referencing document. EIA-364-21E Page 3 5 Details to be specified The following details shall be specified in the referencing document: 5.1 Test specimen preparations or conditioning, if required; see 3.2.1 5.2 Magnitude of test voltag

15、e, if other than 500 Vdc; see 4.1. (Typical dc test voltages are 100 V, 500 V, 1000 V and 1500 V) 5.3 Electrification time, if other than two minutes; see 4.2 5.4 Points of application of test voltage, if other than specified in 4.1 5.5 The minimum value of insulation resistance; see annex A 5.6 Env

16、ironmental conditions for test if other than standard conditions. (Barometric pressure, temperature and relative humidity) 5.7 Define test specimen (mated or unmated) 5.8 Number of specimens to be tested 5.9 Number of readings per specimen 5.10 Specimen description including fixture, if applicable 6

17、 Test documentation Documentation shall contain the details specified in clause 5, with any exceptions, and the following: 6.1 Title of test 6.2 Specimen description including fixturing, if applicable 6.3 Test equipment used, and date of last and next calibration 6.4 Test procedure 6.5 Values and ob

18、servations 6.6 Name of operator and start/finish date(s) of test EIA-364-21E Page A-1 Annex A A Informative A.1 This test procedure is used for determining the resistance offered by the insulation materials and the various seals of a connector to a dc potential tending to produce a leakage of curren

19、t through or on the surface of these members. This test is especially useful in determining the extent to which insulating properties are affected by deteriorating influences, such as heat, moisture, contamination, or loss of volatile materials. A.2 The purpose of the insulation resistance test is t

20、o measure the resistance offered by the insulating members of a component part to an impressed direct voltage tending to produce a leakage current through or on the surface of these members. The value of insulation resistance may be the limiting factor in the design of high-impedance circuits, and c

21、an disturb the operation of circuits intended to be isolated, for example, by forming feedback loops. Excessive leakage currents can lead to deterioration of insulation by heating or by direct current effects. Insulation resistance measurements are not equivalent to dielectric withstanding voltage o

22、r dielectric breakdown test. A.3 Since members composed of different materials or combinations of materials may have inherently different insulation resistance values, the numerical value of measured insulation resistance cannot be taken as a direct measure of the degree of cleanliness or absence of

23、 deterioration. The test is especially helpful in determining the extent to which insulation is affected by deteriorating influences. A.4 The following situations should be considered while formulating the testing requirements of an item where insulation resistance is tested: A.4.1 Test potential ap

24、plied (voltage range) should be of the same range as that of the connector use and expected voltage spike that the connector is expected to see in its use. A.4.2 Connector insulation resistance values will vary depending on contact size, composition of contact and insulator, and distance between tes

25、t points. However, designers specifying test values should realize that connectors of identical properties should have identical resistance values specified. ECIA Document Improvement Proposal If in the review or use of this document, a potential change is made evident for safety, health or technica

26、l reasons, please fill in the appropriate information below and mail or FAX to: Electronic Components Industry Association EIA Standards & Technology Department 2214 Rock Hill Rd., Suite 265 Herndon, VA 20170 FAX: (571-323-0245) Document No.: Document Title: Submitters Name: Telephone No.: FAX No.:

27、e-mail: Address: Urgency of Change: Immediate: At next revision: Problem Area: a. Clause Number and /or Drawing: b. Recommended Changes: c. Reason/Rationale for Recommendation: Additional Remarks: Signature: Date: FOR ECIA USE ONLY Responsible Committee: Chairman: Date comments forwarded to Committe

28、e Chairman: Revision History Revision letter Project number Publication date Additions, changes and deletions - SP-1016 December 1969 Initially published in EIA RS-364 A SP-1549 April 1983 B SP-3586 April 1996 C SP-4213-A May 2000 D SP-5161 March 2008 E SP-5323 Revise paragraph 3.1 to clarify specimen test condition Electronic Components Industry Association 2214 Rock Hill Road, Suite 265 * Herndon, VA 20170 * tel 571-323-0294 * fax 571-323-0245 www.eciaonline.org