ECA EIA-364-23C-2006 TP-23C Low Level Contact Resistance Test Procedure For Electrical Connectors and Sockets.pdf

1、 EIA STANDARD TP-23C Low Level Contact Resistance Test Procedure for Electrical Connectors and Sockets EIA-364-23C (Revision of EIA-364-23B) June 2006 Electronic Components Industry Association EIA-364-23C ANSI/EIA-364-23C-2006(R2017) Approved: June 21, 2006 Reaffirmed: August 21, 2017 NOTICE EIA En

2、gineering Standards and Publications are designed to serve the public interest through eliminating misunderstandings between manufacturers and purchasers, facilitating interchangeability and improvement of products, and assisting the purchaser in selecting and obtaining with minimum delay the proper

3、 product for his particular need. Existence of such Standards and Publications shall not in any respect preclude any member or nonmember of ECIA from manufacturing or selling products not conforming to such Standards and Publications, nor shall the existence of such Standards and Publications preclu

4、de their voluntary use by those other than ECIA members, whether the standard is to be used either domestically or internationally. Standards and Publications are adopted by ECIA in accordance with the American National Standards Institute (ANSI) patent policy. By such action, ECIA does not assume a

5、ny liability to any patent owner, nor does it assume any obligation whatever to parties adopting the Standard or Publication. This EIA Standard is considered to have International Standardization implication, but the International Electrotechnical Commission activity has not progressed to the point

6、where a valid comparison between the EIA Standard and the IEC document can be made. This Standard does not purport to address all safety problems associated with its use or all applicable regulatory requirements. It is the responsibility of the user of this Standard to establish appropriate safety a

7、nd health practices and to determine the applicability of regulatory limitations before its use. (From Standards Proposal No. SP-5393.04 formulated under the cognizance of the CE-2.0 National Connector Standards Committee). Published by Electronic Components Industry Association 2017 EIA Standards a

8、lternating current, pulsed direct current or current reversal. Integrated meters generally measure the actual test current and the voltage drop across the specimen. The measured resistance is then internally calculated and displayed. 4.2. Option 2, current reversal (direct current) Apply direct curr

9、ent through the specimen. Measure the current and record it as If. Measure the voltage drop across the specimen and record it as Vf. Reverse the direction of current through the specimen. Do not reverse the voltage leads. Measure the current and record it as Ir. Measure the voltage drop across the s

10、pecimen and record it as Vr.Calculate the contact resistance with the following equation: rfrfIIVVRg14g16g32 (1)NOTE g127 The sign of the voltage readings shall be carried into the equation to obtain a proper result. 4.3. Option 3, offset compensation Apply direct current through the specimen. Measu

11、re the current and record it as I. Measure the voltage drop across the specimen and record it as V1.Remove the current from the specimen. Measure the voltage drop across the specimen as V2.Calculate the contact resistance with the following equation: IVVR21g16g32 (2)4.4. Option 4, alternating curren

12、t Apply alternating current through the specimen. Measure the current and record it as I. Measure the voltage drop across the specimen using a true RMS voltmeter and record it as V.Calculate the contact resistance with the following equation: IVR g32(3)EIA-364-23CPage 45 Details to be specified The

13、following details shall be specified in the referencing document: 5.1 Test specimen preparation or conditioning 5.2 Test specimen mating conditions or fixturing 5.3 Placement of test leads on specimen (see 3.2) 5.4 Test current and voltage other than 100 milliamperes maximum and 20 millivolts open c

14、ircuit (source) voltage maximum 5.5 Number of specimens to be tested 6 Test documentation Documentation shall contain the details specified in clause 5, with any exceptions, and the following:6.1 Title of test 6.2 Specimen description 6.3 Test specimen preparation or conditioning 6.4 Test specimen m

15、ating conditions or fixturing 6.5 Test equipment used, and date of last and next calibration 6.6 Test current and voltage other than 100 milliamperes maximum and 20 millivolts open circuit (source) voltage maximum 6.7 Values and observations 6.8 Name of operator and date of test EIA Document Improve

16、ment ProposalIf in the review or use of this document, a potential change is made evident for safety, health or technicalreasons, please fill in the appropriate information below and mail or FAX to:Electronic Components Industry AssociationEngineering Department Publications Office4212 Rock Hill Roa

17、d, Suite 170Herndon, VA 20170-4212Phone: (571) 323-0294Document No. Document Title:Submitters Name: Telephone No.:FAX No.:e-mail:Address:Urgency of Change:Immediate: At next revision:Problem Area:a. Clause Number and/or Drawing:b. Recommended Changes:c. Reason/Rationale for Recommendation:Additional Remarks:Signature: Date:FOR EIA USE ONLYResponsible Committee:Chairman:Date comments forwarded to Committee Chairman:Electronic Components Industry Association 2214 Rock Hill Road, Suite 265 * Herndon, VA 20170 * tel 571-323-0294 * fax 571-323-0245 www.ecianow.org