ECA EIA-364-33A-2002 TP-33A Inductance Measurement Test Procedure for Electrical Connectors (100 nH C 100 mH).pdf

1、 EIA STANDARD TP-33A Inductance Measurement Test Procedure for Electrical Connectors(100 nH 100 mH) EIA-364-33A (Revision of EIA-364-33) October 2002 ANSI/EIA-364-33A-2002(R2015) Approved: February 20, 2002 Reaffirmed: March 23, 2015 EIA-364-33A NOTICE EIA Engineering Standards and Publications are

2、designed to serve the public interest through eliminating misunderstandings between manufacturers and purchasers, facilitating interchangeability and improvement of products, and assisting the purchaser in selecting and obtaining with minimum delay the proper product for his particular need. Existen

3、ce of such Standards and Publications shall not in any respect preclude any member or nonmember of ECIA from manufacturing or selling products not conforming to such Standards and Publications, nor shall the existence of such Standards and Publications preclude their voluntary use by those other tha

4、n ECIA members, whether the standard is to be used either domestically or internationally. Standards and Publications are adopted by ECIA in accordance with the American National Standards Institute (ANSI) patent policy. By such action, ECIA does not assume any liability to any patent owner, nor doe

5、s it assume any obligation whatever to parties adopting the Standard or Publication. This EIA standard is considered to have International Standardization implication, but the International Electrotechnical Commission activity has not progresses to the point where a valid comparison between the EIA

6、Standard and the IEC document can be made. This Standard does not purport to address all safety problems associated with its use or all applicable regulatory requirements. It is the responsibility of the user of this Standard to establish appropriate safety and health practices and to determine the

7、applicability of regulatory limitations before its use. (From Standards Proposal No. 4829 resolution: 1%; test frequency range: 1 kHz to 10 MHz; test frequency accuracy: 0.1%. EIA-364-33A Page 2 2.2 Fixture The test fixture shall be a mechanically stable assembly. The spacing between test points sho

8、uld be adjustable to accept the specimen without the use of additional conductors. NOTES 1 One-piece connectors require the use of a special fixture to allow connection to the measuring equipment. 2 It is recommended that the fixtures provided by the equipment manufacturer be used as they typically

9、improve measurement accuracy. 3 Test specimen 3.1 Description The test specimen shall consist of the following: an individual contact; a mated contact assembly that would normally be installed in a connector; one-piece connectors (e.g. card edge connectors or chip sockets); mated two-piece connector

10、s. 4 Test procedure 4.1 The inductance of at least three specimens shall be measured unless otherwise specified in the referencing document. In the case of multi-contact connectors, at least three specimens of each type of contact from at least three connector specimens shall be measured unless othe

11、rwise specified in the referencing document. For pin and socket contacts the depth of engagement shall be the nominally designed engagement depth unless specified in the referencing document. 4.2 The point of measurement shall be between the termination points of the specimen. 4.3 Adjust the spacing

12、 of the test fixture test points to accept the specimen. 4.4 Set the test equipment to the desired measurement frequency. Unless otherwise specified in the referencing document, a measurement frequency of 1 MHz is recommended. 4.5 Record the value indicated by the test equipment. NOTE When external

13、test leads are used to connect to the specimen, the measured inductance is increased. Test lead inductance shall be subtracted from the measured value. EIA-364-33A Page 3 5 Details to be specified The following details shall be specified in the referencing document: 5.1 Specimen description and meas

14、urement points 5.2 Depth of engagement for pin and socket contacts if other than nominally designed engagement depth. 5.3 Test frequency(s) to be used, if other than 1 MHz 5.4 Special fixture requirements, if any 5.5 Output format (e.g. Inductance versus frequency plots or tabular listing of data) 5

15、.6 Quantity of specimens (and/or contacts within the specimen) to be measured 6 Test documentation Documentation shall contain the details specified in clause 5, with any exceptions, and the following: 6.1 Title of test 6.3 Test equipment used, and date of last and next calibration 6.4 Method of mou

16、nting test specimen to test fixture 6.5 Ambient temperature and humidity 6.6 Measured values and test frequency(s) 6.7 Name of operator and date of test ECIA Document Improvement Proposal If in the review or use of this document, a potential change is made evident for safety, health or technical rea

17、sons, please fill in the appropriate information below and mail or FAX to: Electronic Components Industry Association EIA Standards & Technology Department 2214 Rock Hill Rd., Suite 265 Herndon, VA 20170 FAX: (571-323-0245) Document No.: Document Title: Submitters Name: Telephone No.: FAX No.: e-mai

18、l: Address: Urgency of Change: Immediate: At next revision: Problem Area: a. Clause Number and /or Drawing: b. Recommended Changes: c. Reason/Rationale for Recommendation: Additional Remarks: Signature: Date: FOR ECIA USE ONLY Responsible Committee: Chairman: Date comments forwarded to Committee Chairman: Electronic Components Industry Association 2214 Rock Hill Road, Suite 265 * Herndon, VA 20170 * tel 571-323-0294 * fax 571-323-0245 www.ecianow.org