ECA EIA-364-46C-2012 TP-46C Microsecond Discontinuity Test Procedures for Electrical Connectors Contacts and Sockets.pdf

1、 EIA STANDARD TP-46C Microsecond Discontinuity Test Procedures for Electrical Connectors, Contacts and Sockets EIA-364-46C (Revision of EIA-364-46B) November 2012 NOTICE NOTICE ANSI/EIA-364-46C-2012 Approved: November 29, 2012 EIA-364-46CNOTICE EIA Engineering Standards and Publications are designed

2、 to serve the public interest through eliminating misunderstandings between manufacturers and purchasers, facilitating interchangeability and improvement of products, and assisting the purchaser in selecting and obtaining with minimum delay the proper product for his particular need. Existence of su

3、ch Standards and Publications shall not in any respect preclude any member or nonmember of ECIA from manufacturing or selling products not conforming to such Standards and Publications, nor shall the existence of such Standards and Publications preclude their voluntary use by those other than ECIA m

4、embers, whether the standard is to be used either domestically or internationally. Standards and Publications are adopted by ECIA in accordance with the American National Standards Institute (ANSI) patent policy. By such action, ECIA does not assume any liability to any patent owner, nor does it ass

5、ume any obligation whatever to parties adopting the Standard or Publication. This standard is based upon the major technical content of International Electrotechnical Commission standard 60512-2-5, Contact Disturbance, 2003 MAY 01. It conforms in all essential respects this IEC standard. This Standa

6、rd does not purport to address all safety problems associated with its use or all applicable regulatory requirements. It is the responsibility of the user of this Standard to establish appropriate safety and health practices and to determine the applicability of regulatory limitations before its use

7、. (From Standards Proposal No. SP-5226.06 formulated under the cognizance of the CE-2.0 National Connector and Socket Standards Committee). Published by Electronic Components Industry Association 2012 Engineering Department 2214 Rock Hill Road; Suite 170 Herndon, VA 20170 PLEASE! DONT VIOLATE THE LA

8、W! This document is copyrighted by the ECIA and may not be reproduced without permission. Organizations may obtain permission to reproduce a limited number of copies through entering into a license agreement. For information, contact: IHS 15 Inverness Way East Englewood, CO 80112-5704 or call USA an

9、d Canada (1-800-854-7179), International (303-397-7956) i CONTENTS Clause Page 1 Introduction . 1 1.1 Scope . 1 1.2 Definition 1 2 Test resources 1 2.1 Equipment . 1 3 Test specimen 2 3.1 Description 2 4 Test procedure . 2 5 Details to be specified . 2 6 Test documentation . 3 ii (This page left bla

10、nk) EIA-364-46C Page 1 TEST PROCEDURE No. 46C MICROSECOND DISCONTINUITY TEST PROCEDURE FOR ELECTRICAL CONNECTORS, CONTACTS AND SOCKETS (From EIA Standards Proposal No. 5226.06 formulated under the cognizance EIA CE-2.0 Committee on National Connector Standards, and previously published in EIA-364-46

11、B.) 1 Introduction 1.1 Scope This procedure is to define a method of detecting a discontinuity of one microsecond or longer in a mated electrical connector, contact or socket. This procedure shall not be used for durations less than one microsecond; see EIA-364-87, Test Procedure for Nanosecond Even

12、t Detection. 1.2 Definition A discontinuity is defined as a series loop resistance of 10 ohms or greater lasting for one microsecond or longer, measured at the detector input unless otherwise specified in the referencing document. 2 Test Resources 2.1 Equipment The test equipment shall consist of a

13、detector and a power supply (internal or external to the detector) and associated wiring. 2.1.1 Detector A detector shall be used that will register when a resistance is detected, indicating that a discontinuity , see 1.2, has occurred. 2.1.2 Power supply The power supply may be separate from the de

14、tector. The power supply shall be capable of supplying 100 milliamperes dc. The power supply shall be capable of supplying open circuit voltage not to exceed 5.0 volts. Power supply regulation response time shall be 0.1 microseconds or better. EIA-364-46C Page 2 3 Test specimen 3.1 Description The t

15、est specimens shall consist of fully terminated connectors. 4 Test procedure 4.1 Contacts shall be wired in one or more series circuit(s) with each circuit connected to a separate detector channel, or shall be individually connected to a separate detector channel (one detector channel for each conta

16、ct). The maximum initial resistance of any individual series loop circuit shall not exceed 3 ohms. If the resistance exceeds 3 ohms, additional circuits shall be required and connected to additional detectors. 4.2 False failure may be caused by electrical noise or interference. If a discontinuity is

17、 indicated, the detector shall be reset. If any further discontinuities occur, the time and test parameters resulting in said discontinuity shall be recorded and reported. Specimens shall not be failed by a single discontinuity indication when the detector is reset and the discontinuity does not rec

18、ur. 5 Details to be specified The following details shall be specified in the referencing document: 5.1 The number of specimens to be tested and description 5.2 Specimen configuration 5.3 Type of test and severity level 5.4 Number of contacts to be tested if other than specified in 4.1 5.5 Electrica

19、l load conditions, if other than 100 milliamperes maximum EIA-364-46C Page 3 6 Test documentation Documentation shall contain the details specified in clause 5, with any exceptions, and the following: 6.1 Title of test 6.2 Test equipment used, and date of last and next calibration 6.3 Results includ

20、ing failures 6.4 Room ambient temperature and humidity 6.5 Name of operator and start/finish date(s) of testECIA Document Improvement Proposal If in the review or use of this document, a potential change is made evident for safety, health or technical reasons, please fill in the appropriate informat

21、ion below and mail or FAX to: Electronic Components Industry Association EIA Standards & Technology Department 2214 Rock Hill Rd., Suite 170 Herndon, VA 20170 FAX: (571-323-0245) Document No.: Document Title: Submitters Name: Telephone No.: FAX No.: e-mail: Address: Urgency of Change: Immediate: At

22、next revision: Problem Area: a. Clause Number and /or Drawing: b. Recommended Changes: c. Reason/Rationale for Recommendation: Additional Remarks: Signature: Date: FOR ECIA USE ONLY Responsible Committee: Chairman: Date comments forwarded to Committee Chairman: Revision History Revision letter Project number Additions, changes and deletions C SP-5226.06 Revised paragraph 4.1, 5.4 and 6.5 Deleted paragraph 4.2 Renumbered paragraph 4.3 as 4.2 Electronic Components Industry Association 2214 Rock Hill Road, Suite 170 * Herndon, VA 20170 * tel 571-323-0294 * fax 571-323-0245 www.eciaonline.org