1、 EIA STANDARD TP-57 COUPLING PIN STRENGTH TEST PROCEDURE FOR CIRCULARBAYONET ELECTRICAL CONNECTORS EIA-364-57 (Previously published as MIL-DTL-38999, clause 3.21 and 4.5.17) NOVEMBER 2011 EIA Standards Electronic Components Industry Association ANSI/EIA-364-57-2011 Approved: November 15, 2011 EIA-36
2、4-57 NOTICE EIA Engineering Standards and Publications are designed to serve the public interest through eliminating misunderstandings between manufacturers and purchasers, facilitating interchangeability and improvement of products, and assisting the purchaser in selecting and obtaining with minimu
3、m delay the proper product for his particular need. Existence of such Standards and Publications shall not in any respect preclude any member or nonmember of ECIA from manufacturing or selling products not conforming to such Standards and Publications, nor shall the existence of such Standards and P
4、ublications preclude their voluntary use by those other than ECIA members, whether the standard is to be used either domestically or internationally. Standards and Publications are adopted by ECIA in accordance with the American National Standards Institute (ANSI) patent policy. By such action, ECIA
5、 does not assume any liability to any patent owner, nor does it assume any obligation whatever to parties adopting the Standard or Publication. This EIA Standard is considered to have International Standardization implication, but the International Electrotechnical Commission activity has not progre
6、ssed to the point where a valid comparison between the EIA Standard and the IEC document can be made. This Standard does not purport to address all safety problems associated with its use or all applicable regulatory requirements. It is the responsibility of the user of this Standard to establish ap
7、propriate safety and health practices and to determine the applicability of regulatory limitations before its use. (From Standards Proposal No. 5219, formulated under the cognizance EIA CE-2.0 Committee on National Connector Standards, and previously published by the DLA Land and Maritime as Departm
8、ent of Defense Specification MIL-DTL-38999, clause 3.21 and 4.5.17.) Published by: ELECTRONIC COMPONENTS INDUSTRY ASSOCIATION 2011 EIA Standards and Technology Department 2500 Wilson Boulevard Suite 310 Arlington, VA 22201 PRICE: Please call: IHS, USA and Canada (1-800-854-7179) http:/ All rights re
9、served Printed in U.S.A. PLEASE ! DONT VIOLATE THE LAW! This document is copyrighted by the ECIA and may not be reproduced without permission. Organizations may obtain permission to reproduce a limited number of copies through entering into a license agreement. For information, contact: IHS 15 Inver
10、ness Way East Englewood, CO 80112-5704 or call USA and Canada (1-800-854-7179), International (303-397-7956) i CONTENTS Clause Page 1 Introduction . 1 1.1 Scope . 1 2 Test resources 1 2.1 Equipment . 1 3 Test specimen 1 3.1 Description 1 4 Test procedure . 2 4.1 Load application 2 4.2 Pass/fail crit
11、eria . 2 5 Details to be specified . 2 6 Test documentation . 3 Figure 1 Acceptance criteria 2 (This page left blank) EIA-364-57 Page 1 TEST PROCEDURE No. 57 COUPLING PIN STRENGTH TEST PROCEDURE FOR CIRCULAR BAYONET ELECTRICAL CONNECTORS (From EIA Standards Proposal No. 5219, formulated under the co
12、gnizance EIA CE-2.0 Committee on National Connector Standards. 1 Introduction 1.1 Scope This test procedure establishes a test method to determine whether coupling pin strength can withstand external forces required to mate and unmated circular bayonet electrical connectors with gages or devices. 2
13、Test resources 2.1 Equipment 2.1.1 A steel test tip shall be used for application of the load on swaged pins. 2.1.2 A steel test fixture contoured to the shape of the coupling pin shall be used for application of the load on the weld or brazed pins. 3 Test specimens 3.1 Description Specimens shall b
14、e applicable to series I and II type circular connectors. When tested as specified in 4.1, bayonet coupling pins shall withstand a load of 50 pounds +5/-0 pounds without displacement or perceptible loosening of coupling pins. 3.1.1 Series I connectors General application within weapon system where a
15、 quick disconnect coupling system is required for blind mating or other mating problem areas. These connectors provide high-vibration characteristics and are suitable for Severe Wind And Moisture Problem (SWAMP) areas with proper connector accessories. 3.1.2 Series II connectors General application
16、within weapon systems which are not subjected to high vibration or (SWAMP) areas. EIA-364-57 Page 2 4 Test procedures 4.1 Load application One coupling pin in each receptacle shall be subjected to 50 pounds +5/-0 pounds load applied to the swaged end along the major axis of the coupling on swaged pi
17、ns, and perpendicular to the pin centerline on the exposed portion of welded or brazed pins. 4.1.1 Perform push-out / retention force test utilizing suitable equipment to verify the properly installed bayonet pin withstands a minimum of 50 pounds push-out force. 4.2 Pass/fail criteria 4.2.1 Microsco
18、pically inspect the surface below the bayonet pin head before and after push-out retention test using appropriate magnification. The head of the bayonet pin should remain flat, with no gaps between the bayonet pin head and the shell body. The bayonet pin head shall not be deformed in any way, and it
19、 shall be perpendicular to the shell body within 3 (not slanted to the side); see figure 1. There shall be no evidence of cracked or chipped plating (if plated) and no evidence of splitting of the staked pin on the staked surface. Figure 1 - Acceptance criteria 4.2.2 If any of these cited rejection
20、criteria are observed, do not proceed until problems have been corrected. 5 Details to be specified The following details shall be specified in the referencing document: 5.1 Part numbers 5.2 Pass/fail criteria 5.3 If applicable, connector assemblies to be included. EIA-364-57 Page 3 6 Documentation
21、Documentation shall contain the details specified in clause 5, with any exceptions, and the following: 6.1 Title of test 6.2 Specimen description 6.3 Test equipment used, and date of last and next calibration 6.4 Test procedure 6.5 Visual observations and results 6.6 Name of operator and start/finis
22、h date(s) of test EIA Document Improvement Proposal If in the review or use of this document, a potential change is made evident for safety, health or technical reasons, please fill in the appropriate information below and mail or FAX to: Electronic Components Industry Association Standards Departme
23、nt Publications Office 2500 Wilson Blvd, Suite 310 Arlington, VA 22201-3834 FAX: (703-875-8908) Document No.: Document Title: Submitters Name: Telephone No.: FAX No.: e-mail: Address: Urgency of Change: Immediate: At next revision: Problem Area: a. Clause Number and /or Drawing: b. Recommended Chang
24、es: c. Reason/Rationale for Recommendation: Additional Remarks: Signature: Date: FOR ECIA USE ONLY Responsible Committee: Chairman: Date comments forwarded to Committee Chairman: Revision History Revision letter Project number Additions, changes and deletions SP-5219 Was previously contained in MIL-DTL-38999, clause 3.21 and 4.5.17.
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