ECA EIA-364-84-2015 TP-84 Residual Magnetism Test Procedure for Electrical Connectors Used in Space Applications.pdf

1、 EIA STANDARD TP-84 Residual Magnetism Test Procedure for Electrical Connectors Used in Space Applications EIA-364-84 November 2015 Electronic Components Industry Association EIA-364-84 ANSI/EIA-364-84-2015 Approved: November 18, 2015 NOTICE EIA Engineering Standards and Publications are designed to

2、 serve the public interest through eliminating misunderstandings between manufacturers and purchasers, facilitating interchangeability and improvement of products, and assisting the purchaser in selecting and obtaining with minimum delay the proper product for his particular need. Existence of such

3、Standards and Publications shall not in any respect preclude any member or nonmember of ECIA from manufacturing or selling products not conforming to such Standards and Publications, nor shall the existence of such Standards and Publications preclude their voluntary use by those other than ECIA memb

4、ers, whether the standard is to be used either domestically or internationally. Standards and Publications are adopted by ECIA in accordance with the American National Standards Institute (ANSI) patent policy. By such action, ECIA does not assume any liability to any patent owner, nor does it assume

5、 any obligation whatever to parties adopting the Standard or Publication. This EIA Standard is considered to have International Standardization implications, but the International Electrotechnical Commission activity has not progressed to the point where a valid comparison between the EIA Standard a

6、nd the IEC document can be made. This Standard does not purport to address all safety problems associated with its use or all applicable regulatory requirements. It is the responsibility of the user of this Standard to establish appropriate safety and health practices and to determine the applicabil

7、ity of regulatory limitations before its use. (From Standards Proposal No. 5318-A, formulated under the cognizance of the CE-2.0 Committee on EIA National Connector and Sockets Standards.) Published by Electronic Components Industry Association 2015 EIA Standards (example: Bartington MAG-01H) 2.1.2

8、Appropriate axial magnetometer probe; (example Bartington MAG B axial probe) 2.1.3 Non-magnetic structure capable of holding the axial probe 3 Test specimen 3.1 Description The test specimen shall consist of a mated connector, loaded with contacts to be tested. Contact(s) shall be terminated onto wi

9、res in a manner similar to actual application. 3.2 Preparation The specimen shall be prepared as normally used in production consisting of a connector body and/or shell bonded insert assembly or a portion of a bonded insert assembly. The specimen shall be mounted in a suitable gripping fixture. EIA-

10、364-84 Page 2 4 Test procedure Connector shall be fully assembled before testing. The residual magnetism test shall be performed in a magnetically quiet area, i.e., where electric motors, generators, electronic equipment, vehicles, and personnel traffic are restricted. Refer to the test arrangement

11、of Figure 1 and proceed as follows: 4.1 Warm up the magnetometer for a minimum of fifteen minutes. 4.2 Mount the magnetometer probe in a non-magnetic stand in a horizontal position at full cable length from the magnetometer. 4.3 With the meter preset to the appropriate scale, align the probe in a ma

12、gnetic E-W direction or orient to obtain a zero reading on the meter. 4.4 Pass the connector specimen three times between the poles of a magnet with a field strength of 5000 gauss 5% at a rate of 30 centimeters per second 10 centimeters per second (11.8 inches per second 3.9 inches per second). The

13、connector shall not contact the pole pieces. 4.5 Immediately place the connector to within 3 millimeters (0.12 inch) of the probe tip and orient the specimen for a maximum magnetism reading. The measurement unit shall be in gamma, where one gamma is equivalent to 1 x 10-5gauss. 4.6 Record the residu

14、al magnetism level. 5 Details to be specified The following details shall be specified in the referencing document: 5.1 Location of magnetometer probe on the test item 5.2 Specimen description 5.3 Number of specimens to be tested 5.4 Other items as required 5.5 Any deviations from the original test

15、plan EIA-364-84 Page 3 6 Test documentation Documentation shall contain the details specified in clause 5 (when provided), and the following: 6.1 Title of test 6.2 Test equipment used, and date of last and next calibration 6.3 Test procedure 6.4 Values and observations 6.5 Name of operator and start

16、/finish date(s) of test Figure 1 Test setup Axial probe3 millimeters max (0.12 inch max) Connector under test Full cable lengthNon-magnetic stand Magnetometer ECIA Document Improvement Proposal If in the review or use of this document, a potential change is made evident for safety, health or technic

17、al reasons, please fill in the appropriate information below and mail or FAX to: Electronic Components Industry Association EIA Standards & Technology Department 2214 Rock Hill Rd., Suite 265 Herndon, VA 20170 FAX: (571-323-0245) Document No.: Document Title: Submitters Name: Telephone No.: FAX No.:

18、 e-mail: Address: Urgency of Change: Immediate: At next revision: Problem Area: a. Clause Number and /or Drawing: b. Recommended Changes: c. Reason/Rationale for Recommendation: Additional Remarks: Signature: Date: FOR ECIA USE ONLY Responsible Committee: Chairman: Date comments forwarded to Committee Chairman: Revision History Revision letter Project number Publication date Additions, changes and deletions - SP-5318-A Initial publication Electronic Components Industry Association 2214 Rock Hill Road, Suite 265 * Herndon, VA 20170 * tel 571-323-0294 * fax 571-323-0245 www.ecianow.org