ECA EIA-364-87B-2017 TP-87B Nanosecond Event Detection Test Procedure for Electrical Connectors Contacts and Sockets.pdf

1、 EIA STANDARD TP-87B Nanosecond Event Detection Test Procedure for Electrical Connectors, Contacts and Sockets EIA-364-87B (Revision of EIA-364-87A) April 2017 Electronic Components Industry Association EIA-364-87B ANSI/EIA-364-87B-2017 Approved: April 3, 2017 NOTICE EIA Engineering Standards and Pu

2、blications are designed to serve the public interest through eliminating misunderstandings between manufacturers and purchasers, facilitating interchangeability and improvement of products, and assisting the purchaser in selecting and obtaining with minimum delay the proper product for his particula

3、r need. Existence of such Standards and Publications shall not in any respect preclude any member or nonmember of ECIA from manufacturing or selling products not conforming to such Standards and Publications, nor shall the existence of such Standards and Publications preclude their voluntary use by

4、those other than ECIA members, whether the standard is to be used either domestically or internationally. Standards and Publications are adopted by ECIA in accordance with the American National Standards Institute (ANSI) patent policy. By such action, ECIA does not assume any liability to any patent

5、 owner, nor does it assume any obligation whatever to parties adopting the Standard or Publication. This EIA Standard is considered to have International Standardization implications, but the International Electrotechnical Commission activity has not progressed to the point where a valid comparison

6、between the EIA Standard and the IEC document can be made. This Standard does not purport to address all safety problems associated with its use or all applicable regulatory requirements. It is the responsibility of the user of this Standard to establish appropriate safety and health practices and t

7、o determine the applicability of regulatory limitations before its use. (From Standards Proposal No. 5346.09 formulated under the cognizance of the CE-2.0 Committee on EIA National Connector and Sockets Standards.) Published by Electronic Components Industry Association 2017 EIA Standards see 3.1.3.

8、1.2, Method 1 and 3.2.4.1, Method 2. 1.3 Definition An event shall be defined as a voltage increase of a given magnitude that lasts longer than a specified time duration. 2 Test conditions 2.1 Test current shall be 100 mA 20 mA when the specimen is a maximum of 10 ohms, unless otherwise specified in

9、 the referencing document. EIA-364-87B Page 2 2.2 The resistance change necessary to produce an event shall be 10 ohms, unless otherwise specified in the referencing document. NOTE Subclauses 2.1 and 2.2 define the default voltage increase of 1.0 volt 0.2 volts necessary to produce an event. Table 1

10、 - Test conditions Test condition Minimum event duration, nanosecond(s) Application Test method 1 Test method 2 A 1.0 Yes No B 2.0 Yes Yes C 5.0 Yes Yes D 10.0 Yes Yes E 20.0 Yes Yes F 50.0 Yes Yes G As specified in the referencing document NOTE The application column indicates the method that may b

11、e used for the event duration indicated. Event durations of 1.0, 10.0 and 50.0 nanoseconds are preferred. 3 Test methods 3.1 Method 1 3.1.1 Equipment 3.1.1.1 Detector The detector used shall be an AnaTech 64 EHD, 32 EHD or equivalent. 3.1.1.1.1 Electromagnetic interference (EMI) It is recommended th

12、at the detector pass the European Community (EC) electrostatic discharge (ESD) requirement for computers (EN50082-1:94, based on IEC 801-2, ed 2:91). The recommended performance criteria is “1) normal performance within the specification limits;“ i.e., no channel is allowed to trip. Recommended air

13、discharge voltages include 2, 4, 8 and 15 kilovolts. Recommended contact discharge voltages include 2, 4, 6 and 8 kilovolts. Protect the detector inputs with coaxial shorts during this ESD test. 3.1.1.1.2 DC current Each detector channel shall supply 100 milliamperes 20 milliamperes current when the

14、 specimen is a maximum of 10 ohms resistance. EIA-364-87B Page 3 3.1.1.1.3 Input impedance 3.1.1.1.3.1 Direct current (dc) Detector source resistance (impedance) shall be 50 ohms when the specimen resistance is between zero and 10 ohms. 3.1.1.1.3.2 RF input impedance A Time Domain Reflectometer (TDR

15、) or Network Analyzer Time Domain Reflectometer (NATDR) shall be used to measure the reflection in percent of a (simulated) 0.5 nanosecond risetime step when the specimen direct current resistance is 10 ohms and the detector current is 100 milliamperes. (The 10 ohm specimen resistance is put on the

16、bias port for NATDR.) An acceptable detector shall reflect less than 30% amplitude. 3.1.1.1.4 Amplitude sensitivity Amplitude required to trip the detector with a 1 nanosecond duration pulse shall be no more than 120% of the direct current trip amplitude. One nanosecond pulse duration shall be measu

17、red at 90% of the pulse amplitude, and the rise and fall times shall be less than 0.5 nanosecond. Pulse low level shall be zero volts. These shall be measured with a 1 gigahertz minimum bandwidth oscilloscope and a pulse generator; see figure 1. Figure 1 - Equipment setup for amplitude sensitivity m

18、easurement EIA-364-87B Page 4 3.1.1.1.5 Accuracy It shall be possible to adjust the detector to trip at 10 ohms 1 ohm for all channels in use, unless otherwise specified in the referencing document. 3.1.2 Test setup Recommended equipment is as shown in figure 4. A short flexible ground strap directs

19、 ground loop currents away from the specimen. The RG-223 coaxial cable is well shielded whereas the short 50 ohm miniature coaxial cable is flexible. Each EMI loop is connected to a detector channel and is used as a control. 3.1.3 Specimen and EMI loop preparation Specimen circuit shall have a resis

20、tance less than 4 ohms. 3.1.3.1 Specimen wiring 3.1.3.1.1 A contact or series wired contacts; see figure 2, note A, shall be wired from the center conductor to the braid of miniature 50 ohm coaxial cable; see figure 4, note C. EIA-364-87B Page 5 NOTES A Series wired contacts, see 3.1.3.1.1. B Contac

21、ts skipped to reduce crosstalk, see 3.1.3.2.2. C Circuit connected to EMI loop, see 3.1.3.3.1.2 and 3.1.3.3.2.2 D Optional miniature coaxial cable ground, see 3.1.3.2.1. Figure 2 - Series wired specimen example EIA-364-87B Page 6 3.1.3.1.2 The specimen, as wired to the miniature coaxial cable for te

22、sting, shall be capable of passing short duration pulses. A time domain reflectometer (TDR) shall be used to measure the transition time of a fast risetime step (28.9ns will be detected. NOTE Requirement is that point 2 - point 1 minimum event duration from table 1. Figure 3 - TDR measurement trace

23、of specimen circuit 3.1.3.2 Electromagnetic interference (EMI) concerns of specimen wiring At least three major paths for EMI can be identified in the specimen fixturing. EIA-364-87B Page 7 3.1.3.2.1 EMI couples to the specimen through the parasitic capacitance between the specimen and any metal fix

24、turing. An optional strategy to greatly reduce this coupling, and thereby reduce the risk of false trips due to EMI, is to connect the miniature coaxial cable shield to the metal fixturing. This optional connection is most effective if the connection is as short as possible and is perpendicular to n

25、earby specimen conductors; see figure 2, note D. This optional connection is applicable to the specimen channel(s) only, not the control channel(s) with the EMI loop(s). NOTE If there is no metal fixturing within 5 cm of the specimen circuit, EMI coupling to the specimen through parasitic capacitanc

26、e is not expected to be significant, so the optional connection of the miniature coaxial cable shield to the metal fixturing is not expected to be beneficial in reducing incidence of false trips due to EMI. 3.1.3.2.2 Large EMI currents in adjacent contacts can couple through crosstalk or capacitance

27、 to monitored channels. To reduce this, no conductor of any type may be connected to contacts not being monitored for an event. It is recommended that monitored contacts be evenly distributed around the connector to minimize crosstalk with other monitored channels; see figure 2, note B. 3.1.3.2.3 Th

28、e loop area of the specimen circuits shall be minimized to reduce magnetic field coupling. 3.1.3.3 Control channel(s) Anytime a failure is indicated, it is possible that the real cause was actually electromagnetic interference (EMI), and not the connector-under-test. The goal of the control channel(

29、s) is to detect EMI at levels much lower than required to trigger an event on a specimen channel. During testing, the control channels shall be monitored with the same detector values as used on the specimen circuits. An event observed on a control channel invalidates any other events detected durin

30、g the polling period, see 3.1.4.6 to define polling period. 3.1.3.3.1 Ten and fifty nanoseconds event detection 3.1.3.3.1.1 A control channel shall consist of a separate loop of wire with an area of one square meter suspended above the specimen(s) and monitored through a miniature coaxial cable atta

31、ched at the top center of the loop; see figure 4, note A. 3.1.3.3.1.2 Select a typical specimen series wired circuit that can be dedicated to an EMI control channel. Instead of connecting this specimen circuit directly to a miniature coaxial cable, connect it to the center of the control channel EMI

32、 loop, opposite the coaxial cable connection; see figure 4, note B. A separate specimen may be required if specimen has only one contact. EIA-364-87B Page 8 NOTES A One square meter EMI loop monitored at top center, see 3.1.3.3.1.1. B Connection to a series wired specimen circuit, see 3.1.3.3.1.2. C

33、 Miniature coaxial cable (50 ohm), see 3.1.3.1.1. D Patch panel, coaxial through-bulkhead RF connectors in metal panel. E Flexible ground strap, as short as practical, see 3.1.4.3 F Strain relief coaxial cable at these locations. G Physical support for patch panel. H RG-223 double braid coaxial cabl

34、e. I Optional miniature coaxial cable ground, see 3.1.3.2.1 Figure 4 - Test setup, with control channel fixturing for 10 and 50 nanosecond event detection EIA-364-87B Page 9 3.1.3.3.2 One nanosecond event detection 3.1.3.3.2.1 Three control channels shall be provided, consisting of 3 nested, mutuall

35、y perpendicular loops, see figure 5. Each loop shall have a nominal area of 36 square cm (e.g., 6 cm x 6 cm). These loops shall be suspended over the specimen(s). 3.1.3.3.2.2 Select a typical specimen series wired circuit that can be dedicated to EMI control channels. Instead of connecting this spec

36、imen circuit directly to a miniature coaxial cable, connect it to the center of one of the control channel EMI loops, opposite the coaxial cable connection; see figure 5. A separate specimen may be required if specimen has only one contact. 3.1.3.3.2.3 Optionally, for enhanced false-trip detection d

37、uring one-nanosecond detection, a second typical specimen series circuit may be dedicated to an additional control channel that is configured as described in 3.1.3.3.1 and depicted in Figure 4. This additional control channel configuration is the same as that used for 10 and 50 nanosecond event dete

38、ction. The additional control channel would supplement the required three control channels described in 3.1.3.3.2.1 and depicted in Figure 5; it would not replace them. NOTE A Optional miniature coaxial cable ground, see 3.1.3.2.1. Figure 5 - Control channel fixturing for one nanosecond event detect

39、ion, with nested 6 x 6 centimeter EMI loops EIA-364-87B Page 10 3.1.4 Procedure 3.1.4.1 Prepare specimens and the fall time shall be measured per 3.1.3.1.2 using TDR. If this requirement cannot be met, fewer contacts in series or better fixture wiring may be required. 3.1.4.2 The EMI loop(s) shall b

40、e placed in accordance with 3.1.3.3 over the specimen and connected to a typical specimen circuit. 3.1.4.3 The equipment shall be assembled as indicated in figure 4 (except see figure 5 for control channel fixturing for one nanosecond event duration). The 50 ohm miniature coaxial cable and especiall

41、y the ground strap, see figure 4, note E, shall be kept as short as practical. Miniature coaxial cable ground connections to the connector shell and/or metal fixturing may be employed to reduce the risk of false trips due to EMI. These connections are most effective if kept as short as possible and

42、perpendicular to nearby specimen conductors, see 3.1.3.2.1 and figure 2. 3.1.4.4 Turn on detector. Unless otherwise specified, the detector shall be set to deliver 100 milliamperes 20 milliamperes current and set to trip at 10 ohms above the initial resistance. Reset all channels. If the referencing

43、 document specifies using a current less than 80 milliamperes or a threshold resistance less than 10 ohms, it may be necessary to add additional shielding, i.e., shielded room, box, etc. 3.1.4.5 Disconnect each specimen from the detector by unmating the coaxial connectors. Confirm that the indicator

44、 trips when disconnected as a functional check. 3.1.4.6 The desired environmental stress shall be applied to the connector-under-test. The test shall be broken up into equal length time periods. At the end of each, the status of each channel shall be polled. Any events detected during a polling peri

45、od that also registers an event on a control channel shall be considered EMI induced (not a connector failure). 3.1.4.7 At the end of testing, the failure indications at different polling times shall be analyzed for patterns suggesting EMI, such as simultaneous events in different channels. 3.2 Meth

46、od 2 3.2.1 Equipment 3.2.1.1 Direct current power supply capable of supplying currents up to 100 milliamperes with an accuracy of 10% when the specimen is 10 ohms maximum. 3.2.1.2 Detector(s) compatible for detecting events as specified. 3.2.1.3 Pulse generator compatible to the speed characteristic

47、s as specified. 3.2.1.4 Digital scope with a minimum bandwidth of 1.0 GHz. 3.2.2 Basic theory of operation EIA-364-87B Page 11 3.2.2.1 Figure 6 indicates the basic detector/test specimen arrangement Figure 6 - Basic detector/test specimen arrangement 3.2.2.2 A constant dc signal is maintained throug

48、h the contacts under test. The resistance across the test specimen will be the sum of the resistances of the contacts wired in series for the test. This resistance will be in the order of milliohms. The resistor has a magnitude significantly higher than the specimen resistance. This results in the d

49、etector input voltage in being low. 3.2.2.3 Thus any increase in the contact resistance will cause the detector input to increase. If this voltage increase exceeds the detector threshold and is maintained for a given time period, the detector will trigger. 3.2.2.4 The time period that the detector input voltage must exceed the threshold level is dependent upon the detection circuit design and the transmission line attenuations. With the use of the proper components and careful circuit layout, the detector is designed to operate when the threshold level has exceeded th