ECA EIA-364-88A-2009 TP-88A Residual Magnetism Test Procedure for Electrical Connectors Contacts and Sockets《TP-88A型电连接器、接触和插座的残磁测试程序》.pdf

1、 ANSI/EIA-364-88A-2009 Approved: November 13, 2009 EIA STANDARD TP-88A RESIDUAL MAGNETISM TEST PROCEDURE FOR ELECTRICAL CONNECTORS, CONTACTS AND SOCKETS (Revision of EIA-364-88) EIA-364-88A EIA-364-88A NOVEMBER 2009 EIA Standards Electronic Components Association NOTICE EIA Engineering Standards and

2、 Publications are designed to serve the public interest through eliminating misunderstandings between manufacturers and purchasers, facilitating interchangeability and improvement of products, and assisting the purchaser in selecting and obtaining with minimum delay the proper product for his partic

3、ular need. Existence of such Standards and Publications shall not in any respect preclude any member or nonmember of EIA from manufacturing or selling products not conforming to such Standards and Publications, nor shall the existence of such Standards and Publications preclude their voluntary use b

4、y those other than EIA members, whether the standard is to be used either domestically or internationally. Standards and Publications are adopted by EIA in accordance with the American National Standards Institute (ANSI) patent policy. By such action, EIA does not assume any liability to any patent

5、owner, nor does it assume any obligation whatever to parties adopting the Standard or Publication. This EIA Standard is considered to have International Standardization implication, but the International Electrotechnical Commission activity has not progressed to the point where a valid comparison be

6、tween the EIA Standard and the IEC document can be made. This Standard does not purport to address all safety problems associated with its use or all applicable regulatory requirements. It is the responsibility of the user of this Standard to establish appropriate safety and health practices and to

7、determine the applicability of regulatory limitations before its use. (From Standards Proposal No. 5187 formulated under the cognizance of the CE-2.0 National Connector and Socket Standards Committee) Published by: ELECTRONIC COMPONENTS ASSOCIATION 2009 EIA Standards and Technology Department 2500 W

8、ilson Boulevard Suite 310 Arlington, VA 22201 PRICE: Please call: Global Engineering Documents, USA and Canada (1-800-854-7179) http:/ All rights reserved Printed in U.S.A. PLEASE ! DONT VIOLATE THE LAW! This document is copyrighted by the EIA and may not be reproduced without permission. Organizati

9、ons may obtain permission to reproduce a limited number of copies through entering into a license agreement. For information, contact: Global Engineering Documents 15 Inverness Way East Englewood, CO 80112-5704 or call USA and Canada (1-800-854-7179), International (303-397-7956) i CONTENTS Clause P

10、age 1 Introduction . 1 1.1 Scope . 1 2 Test resources . 1 2.1 Equipment . 1 3 Test specimen 1 3.1 Description 1 3.2 Preparation 2 4 Test procedure . 2 4.1 Instrument setup 2 4.2 Exposure . 2 4.3 After exposure . 2 5 Details to be specified . 2 6 Test documentation . 3 ii (This page left blank) iii E

11、IA-364-88A Page 1 TEST PROCEDURE No. 88A RESIDUAL MAGNETISM TEST PROCEDURE FOR ELECTRICAL CONNECTORS (From EIA Standards Proposal No. 5187, formulated under the cognizance EIA CE-2.0 Committee on National Connector Standards, and previously published in EIA-RS-364-88.) 1 Introduction 1.1 Scope This

12、standard establishes a test method to determine the residual magnetism of a connector after exposure to a specified magnetic field. NOTE Connectors with a relative magnetism of 2 MU as determined by EIA-364-54 can satisfy the nonmagnetism requirements in most applications. Residual magnetism should

13、only be required if the magnetic field constraints as associated with space flight applications warrant such stringent requirements. 2 Test resources 2.1 Equipment 2.1.1 A 0.5 Tesla magnet with an opening large enough for the passage of the specimen through the magnetic field. 2.1.2 A magnetometer a

14、nd a probe having an accuracy of 5%. 3 Test specimen 3.1 Description The test specimen shall have all contacts installed and mated unless otherwise specified in the referencing document. The specimen shall be fitted with such accessories an may be required by the referencing document. EIA-364-88A Pa

15、ge 2 3.2 Preparation The probe shall be placed horizontally on a nonmagnetic support with the probe positioned as far away from the measuring instrument as allowed by the connecting cord. The test area shall be relatively free from magnetic disturbances and magnetic fields other than the earths norm

16、al magnetic field. 4 Test procedure CAUTION Operating personnel shall remove jewelry that can affect both the test and the jewelry (such as rings, watches, bracelets, etc.). 4.1 Instrument setup The measuring instrument shall be set to the appropriate scale and adjusted to read zero by orienting the

17、 probe as necessary. 4.2 Exposure The specimen shall then be exposed to a magnetic field of 0.5 Tesla by passing the specimen between the magnetic poles three times. The specimen shall not touch the polar parts of the magnet during exposure. 4.3 After exposure Immediately after exposure, the specime

18、n shall be placed at a distance not exceeding 3 millimeters from the probe, without touching the probe. The specimen shall be scanned in various orientations to obtain a maximum reading on the measuring instrument. 5 Details to be specified The following details shall be specified in the referencing

19、 document: 5.1 Accessories to be fitted to the specimen 5.2 Maximum value of the residual magnetism in gammas 5.3 Magnetic exposure if different from 0.5 Tesla (5000 gauss) 5.4 Test specimen and magnetic field orientation 5.5 Number of specimens to be tested EIA-364-88A Page 3 6 Documentation Docume

20、ntation shall contain the details specified in clause 5, with any exceptions, and the following: 6.1 Title of test 6.2 Specimen description including accessories 6.3 Test equipment used, and date of last and next calibration 6.4 Test procedure 6.5 Values and observations 6.6 Name of operator and sta

21、rt/finish dates of test Revision History Revision letter Project number Additions, changes and deletions A SP-5187 Revised paragraph 1.1, 3.1 6.3 and 6.6. Added paragraph 5.5. EIA Document Improvement Proposal If in the review or use of this document, a potential change is made evident for safety, h

22、ealth or technical reasons, please fill in the appropriate information below and mail or FAX to: Electronic Components Association Standards and Technology Department 2500 Wilson Blvd. Suite 310 Arlington, VA 22201 FAX: (703-875-8908) Document No.: Document Title: Submitters Name: Telephone No.: FAX

23、 No.: E-mail: Address: Urgency of Change: Immediate: At next revision: Problem Area: a. Clause Number and /or Drawing: b. Recommended Changes: c. Reason/Rationale for Recommendation: .Additional Remarks: Signature: Date: FOR EIA USE ONLY Responsible Committee: Chairman: Date comments forwarded to Committee Chairman: Electronic Components Association 2500 Wilson Boulevard, Suite 310 * Arlington, VA 22201 * fax 703-875-8908 www.ecaus.org