ECA EIA-364-F-2014 Electrical Connector Socket Test Procedures Including Environmental Classifications.pdf

1、EIA-364F EIA STANDARD Electrical Connector/Socket Test Procedures Including Environmental Classifications EIA-364F (Revision of EIA-364E) August 2014 ANSI/EIA-364F-2014 Approved: August 15, 2014 NOTICE EIA Engineering Standards and Publications are designed to serve the public interest through elimi

2、nating misunderstandings between manufacturers and purchasers, facilitating interchangeability and improvement of products, and assisting the purchaser in selecting and obtaining with minimum delay the proper product for his particular need. Existence of such Standards and Publications shall not in

3、any respect preclude any member or nonmember of ECIA from manufacturing or selling products not conforming to such Standards and Publications, nor shall the existence of such Standards and Publications preclude their voluntary use by those other than ECIA members, whether the standard is to be used

4、either domestically or internationally. Standards and Publications are adopted by ECIA in accordance with the American National Standards Institute (ANSI) patent policy. By such action, ECIA does not assume any liability to any patent owner, nor does it assume any obligation whatever to parties adop

5、ting the Standard or Publication. This EIA Standard is considered to have International Standardization implication, but the International Electrotechnical Commission activity has not progressed to the point where a valid comparison between the EIA Standard and the IEC document can be made. This Sta

6、ndard does not purport to address all safety problems associated with its use or all applicable regulatory requirements. It is the responsibility of the user of this Standard to establish appropriate safety and health practices and to determine the applicability of regulatory limitations before its

7、use. (From Standards Proposal No. 5329, formulated under the cognizance of the CE-2.0 Committee on EIA National Connector and Sockets Standards.) Published by Electronic Components Industry Association 2014 EIA Standards see EIA-364-1000. EIA-364F Page 3 Table 2 Equipment operating environmental con

8、ditions Class number Temperature (see note 1) Relative humidity (see note 3) Marine atmosphere Harsh environment G1.0 +25 C to +65 C 40% to 60% No No G1.1 +25 C to +65 C 40% to 75% No Possible G1.2 (see note 2) +25 C to +85 C 85% maximum No Yes G1.3 +15 C to +85 C 95% maximum No Yes G2.0 +5 C to +85

9、 C 95% maximum No Yes G2.1 -40 C to +100 C 95% maximum Possible Yes G3.0 -55 C to +125 C 95% maximum Yes Yes A1.0 -65 C to +200 C 95% maximum Yes Yes A2.0 -55 C to +150 C 95% maximum Yes Yes A3.0 +15 C to +35 C 85% maximum No Possible A4.0 -65 C to +200 C 85% maximum No Possible A5.0 -65 C to +200 C

10、 No No Possible NOTES 1 The temperature limits as shown above are considered maximum limits. If the application within a classification requires limits other than those shown, said limits shall be specified in the referencing document. 2 For specific environmental test methodology to assess the perf

11、ormance of electrical connectors and sockets used in business office applications that are no more severe than class number G1.2; see EIA-364-1000. 3 The values indicated are test conditions and not operating conditions. EIA-364F Page 4 2 Requirements 2.1 Qualification Qualification sequences and se

12、verity levels shall be invoked by the referencing document. The referencing document shall reference the applicable class and the specific test sequences to be used for product qualification. 2.1.1 Qualification of a connect/socket series may be established by similarity through testing parts repres

13、enting the maximum size or as defined by the qualifying agency. A series includes connectors/sockets and contacts of identical deign, spacing and configuration. 2.1.1.1 Similarity shall be granted for all sizes up to that level to which testing has been performed. Specimens for all sizes for which s

14、imilarity is desired shall be submitted at the time of qualification. 2.1.1.2 Qualified contacts which have the same physical dimensional configuration, base material, plating type and thickness, material thickness in the engagement area except that the termination area has been changed (e.g. crimp,

15、 solder, IDC, etc.) shall be qualified with testing pertinent to the termination technique involved. 2.1.2 Following a connector/socket qualification, the manufacturer shall make no design changes, substitutions, material changes or process changes that affect from, or function, without full or part

16、ial requalification. 2.1 2 1 Requalification may consist of only those tests pertinent to the specific attributes that may be affected by said changes. 2.1.3 To successfully qualify or requalify a connector/socket series, test samples shall meet all the requirements as specified within the specified

17、 test groups. Deviation from the specified requirements may be granted only by the qualifying agency. 2.1.4 To successfully qualify, each specimen shall pass all the test requirements as specified for each test in the sequences indicated. No defects shall be allowed. 3 Qualification procedure 3.1 Te

18、st sequence 3.1.1 The test specimens shall be subjected to the test sequence as shown in figure 1. The test sequence establishes the order of exposure to the environmental conditions, and the subsequent test parameters measured to determine adequate performance for each connector/socket class. 3.1.2

19、 Specific tests may be added or deleted from the recommended sequence, supplemental and/or termination test s contingent on the specific application. EIA-364F Page 5 3.2 Specimen size 3.2.1 The sample size shall be as specified in the referencing document. If not specified, each test group shall con

20、sist of the quantity of the test specimens shown in figure 1. Each specimen consisting of both mated halves with a full complement of contacts and shall include applicable hardware when appropriate. 3.2.2 The referencing document shall specify the number of data points to be monitored for each attri

21、bute. If not specified, 25% of the contact positions/specimen shall be measured but not fewer than 25. If there are fewer than 25 contact positions then all contact positions shall be measured. Additional specimens shall be added in order to obtain 25 data points for those situations when the number

22、 of positions are less than 25. When applicable, the positions measured shall be identified by a specimen identification and position number. All positions to be monitored shall be randomly chosen or as specified. 3.3 Standard atmospheric conditions 3.3.1 Unless otherwise specified, all measurements

23、 shall be made within the following ambient conditions: Temperature: 15 to 35 C, Atmospheric pressure: 650 millimeters of mercury to 800 millimeters of mercury, Relative humidity 20% to 80%. 3.3.2 Special tests may require tighter control of conditions when specified in the test procedure. 3.4 Test

24、specimen The test specimens shall be representative of the manufacturers normal production and shall be selected at random. Each test specimen or part thereof shall be individually identified, such that the marking will not be destroyed throughout the test. 3.5 Test specimen disposition Following co

25、mpletion of the test program, test specimens should be packaged and retained by the testing facility or test sponsor for not less than one year unless otherwise specified in the referencing document. Unit identification and all test report identification shall be included in each package. EIA-364F P

26、age 6 3.6 Test data The results of each test shall be recorded as data. Details of failure or failure analysis shall be included. 3.7 Data measurement Unless otherwise specified in the specific procedures used, measurements following an exposure shall be performed within 24 hours. Measurements shall

27、 be performed after the samples have recovered to room ambient conditions unless otherwise specified. The test specimens shall be handled in a manner so as not to disturb the contact interface. If measurements can be performed without handling of the test samples, then this procedure is preferable.

28、3.8 Test report A test report shall be prepared by the test facility. Specimen preparation, schematics, photographs, etc. as applicable shall also be included. The test report shall contain a description (complete part number is acceptable) of the test specimens, summary of results, discussion of an

29、y test problems, a statement of conformance to requirements specified in the referencing document, test data as specified in the referencing document, and test descriptions which shall include procedures, test conditions, and requirement levels. 3.8.1 The following additional information should be i

30、ncluded in the test report when qualifying to a specification which does not specify materials and/or plating thickness. Only those items not included in the specification shall be reported. 3.8.1.1 Plastic (generic type, color, glass content) 3.8.1.2 Contact material (CDA number) 3.8.1.3 Plating ty

31、pe and alloy, underplate, and thicknesses that were tested (actual data to be supplied in report) 3.8.1.4 Lubrication, if any (generic description) 3.8.1.5 Surface treatment, if any (generic description) 3.8.2 In the event a failure occurs, a failure report shall be issued and the qualifying agency

32、notified. All specifics of the failure shall be recorded. EIA-364F Page 7 3.9 Sample distribution The specimens shall be separated into groups according to the applicable test sequence. Each group shall be tested according to the conditions indicated. 3.10 Detail test procedures Each test within a s

33、equence shall reference the test procedure, test severities and requirements. In the event a specific test is required for which no established test procedure exists, said test shall be specified in the applicable referencing document. 3.11 Calibration Calibration requirements shall be in accordance

34、 with ANSI-Z-540. 4 Recommended test sequence 4.1 The recommended minimum test plan flow diagram is shown in figure 1. The test plan as shown shall apply to all environmental classifications. The level of severity may change contingent on the application and/or classification involved. The applicabl

35、e EIA-364 test procedures are listed in annex A. 4.2 The test sequences in figure 1 are recommended test sequences and may be modified by the referencing document for specific applications. Additional tests may be added to evaluate specific attributes that may be unique to the connector/socket class

36、 or application. Tests may be deleted in those instances where they may not be applicable to the application. 4.3 Contact resistance at rated current shall be used in those applications where the current levels are in excess of 100 milliamperes and the voltage levels are in excess of 3.0 volts. 4.4

37、Low level circuit resistance shall be used in those applications where the current levels are equal to or less than 100 milliamperes with the voltage level equal to or less than 3.0 volts and/or the product is used in conjunction with solid state logic. 4.5 Contact being monitored for electrical res

38、istance shall be excluded from any test where voltages of 1.0 volts or greater may be applied (e.g., monitoring contact interruption, IR and/or DWV prior to measuring electrical resistance, etc.). 4.6 The referencing document shall specify if the test specimens are to be unmated after vibration, phy

39、sical shock and salt spray for visual examination. If not specified, the test samples shall remain mated. EIA-364F Page 8 4.6.1 In performing failure mode analysis, specimens may remain mated, then potted and sectioned if so specified followed by examination. 4.7 One of two humidity tests shall be s

40、pecified, steady state humidity or temperature cycling with humidity (preferred). Unless otherwise specified, insulation resistance shall be measured within one hour after removal from the test chamber. 4.4 Final measurements When insulation resistance is performed in conjunction with environmental

41、tests, the specimens shall be measured within one hour, unless otherwise specified in the referencing document. 4.8 Unless otherwise specified, when test boards are used, they shall be double sided, 1.59 mm (0.062 in) thick, glass epoxy, FR-4 with plated through holes. 4.8.1 When traces are involved

42、, they shall be properly sized to minimize possible current heating effects. DWV and IR test shall not be performed on specimens mounted to test boards with traces. 4.8.2 DWV and IR requirements may have to be modified in the event that these tests are required with specimens mounted to test boards

43、(without traces). 4.8.3 Test boards may have to be adequately protected when tested in humid environments under powered conditions. 4.8.4 The length of the test board shall be equal to the length of the test specimen plus 12.7 mm (0.50 in) minimum on each side. 4.8.4.1 The width of the test board sh

44、all equal the width of the test specimen plus 12.7 mm (0.50 in) minimum on each side. 4.8.4.2 For right angle terminations, the test board shall extend a minimum of 12.7 mm (0.50 in) from the appropriate row of terminations. 4.9 Fixturing for vibration and shock testing shall be defined in the refer

45、encing document. EIA-364F Page 9 NOTE See notes for additional guidance. The numbers in ( ) refer to specific notes following. Figure 1 Minimum test plan flow diagram Sample preparationLLCR or contact resistance (6) Mating force DWV (13) LLCR or contact resistance (6)Mating unmating force (7) Supple

46、mentaltests (see table A through D) LLCR or contact resistance (6) Shock IR (13) Precondition-ing optional (14) LLCR or contact resistance (6) Vibration Unmating force LLCR or contact resistance (6) Durability (7) Mating and unmating force LLCR or contact resistance (6) Thermal shock LLCR or contact

47、 resistance (6) Cyclic humidity or steady state LLCR or contact resistance (6) Thermal shock Cyclic humidity or steady state ()IR DWV Salt sprayor mixed flowing gas or harsh environmentLLCR or contact resistance (6)Temperature life (3) LLCR or contact resistance (6) Unmatingforce Group 1 Group 2 Gro

48、up 3 Group 4 Group 5 Group 6EIA-364F Page 10 NOTES 1 Sample size, see table 3 Table 3 Sample size Sample size Description Test group 1 Four connector pairs (two for electrical resistance and two for monitoring contact interruptions) Test group 2 5 Two specimens each test group Test group 6 To be spe

49、cified in the referencing document 2 The flow diagram as shown in figure 1 shall be considered as minimum for each environmental class. Additional tests or test groups may be required and shall be as specified in the referencing document. The levels of severity may differ contingent on the environmental class or application involved. 3 Temperature life may be performed with or without an electrical load being applied. It is recommended that for power applications where the current levels are in excess of 1.0 ampere, the use of an electrical load shou