ECA EIA-60384-9-2017 Fixed Capacitors for Use in Electronic Equipment - Part 9 Sectional Specification Fixed Capacitors of Ceramic Dielectric Class 2.pdf

1、EIASTANDARDFixed Capacitors for Use in Electronic Equipment - Part 9: Sectional Specification: Fixed Capacitors of Ceramic Dielectric, Class 2EIA-60384-9 (IEC 60384-9:2015, IDT) October 2017 Electronic Components Industry Association ANSI/EIA-60384-9-2017 Approved: October 5, 2017EIA-60384-9NOTICEEI

2、A Engineering Standards and Publications are designed to serve the public interest through eliminating misunderstandings between manufacturers and purchasers, facilitating interchangeability and improvement of products, and assisting the purchaser in selecting and obtaining with minimum delay the pr

3、oper product for his particular need. Existence of such Standards and Publications shall not in any respect preclude any member or nonmember of ECIA from manufacturing or selling products not conforming to such Standards and Publications, nor shall the existence of such Standards and Publications pr

4、eclude their voluntary use by those other than ECIA members, whether the standard is to be used either domestically or internationally. Standards and Publications are adopted by ECIA in accordance with the American National Standards Institute (ANSI) patent policy. By such action, ECIA does not assu

5、me any liability to any patent owner, nor does it assume any obligation whatever to parties adopting the Standard or Publication. This EIA Standard is identical (IDT) with the International Standard IEC Publication 60384-9:2015 Edition 4: Fixed Capacitors for Use in Electronic Equipment - Part 9: Se

6、ctional Specification Fixed Capacitors of Ceramic Dielectric, Class 2. This document is the EIA Standard EIA-60384-9-2017: Fixed Capacitors for Use in Electronic Equipment - Part 9: Sectional Specification Fixed Capacitors of Ceramic Dielectric, Class 2.The text, figures and tables of IEC 60384-9:20

7、15 are used in this Standard with the consent of the IEC and the American National Standards Institute (ANSI). The IEC copyrighted material has been reproduced with permission from ANSI. The IEC Foreword and Introduction are not part of the requirements of this standard but are included for informat

8、ion purposes only. This Standard does not purport to address all safety problems associated with its use or all applicable regulatory requirements. It is the responsibility of the user of this Standard to establish appropriate safety and health practices and to determine the applicability of regulat

9、ory limitations before its use. (From Standards Proposal No. 5390.04, formulated under the cognizance of the Steering Committee for Passive Electronic Components Standards (S-1).Published by Electronic Components Industry Association 2017 Engineering Department 2214 Rock Hill Road, Suite 265 Herndon

10、, VA 20170 PLEASE ! DONT VIOLATE THE LAW!This document is copyrighted by the ECIA and may not be reproduced without permission. Organizations may obtain permission to reproduce a limited number of copies through entering into a license agreement. For information, contact: IHS Markit 15 Inverness Way

11、 East Englewood, CO 80112-5704 or call USA and Canada (1-877-413-5186), International (303-397-7956) i CONTENTS FOREWORD iv1 General . 11.1 Scope . 11.2 Object . 11.3 Normative references 11.4 Information to be given in a detail specification . 11.4.1 General . 11.4.2 Outline drawing and dimensions

12、21.4.3 Mounting . 21.4.4 Ratings and characteristics 21.4.5 Marking . 31.5 Terms and definitions 31.6 Marking . 31.6.1 General . 31.6.2 Marking on the body 41.6.3 Marking of the packaging . 41.6.4 Additional marking . 42 Preferred ratings and characteristics . 42.1 Preferred characteristics . 42.2 P

13、referred values of ratings 42.2.1 Rated temperature . 42.2.2 Rated voltage (UR) 42.2.3 Category voltage (UC) . 52.2.4 Preferred values of nominal capacitance and associated tolerance values 52.2.5 Temperature characteristic of capacitance . 53 Quality assessment procedures . 63.1 Primary stage of ma

14、nufacture . 63.2 Structurally similar components 63.3 Certified test records of released lots 63.4 Qualification approval . 63.4.1 General . 63.4.2 Qualification approval on the basis of the fixed sample size procedure 63.4.3 Tests . 73.5 Quality conformance inspection 123.5.1 Formation of inspectio

15、n lots . 123.5.2 Test schedule 133.5.3 Delayed delivery 133.5.4 Assessment levels . 134 Test and measurement procedures 144.1 General . 144.2 Special preconditioning . 144.3 Visual examination and check of dimensions 144.4 Electrical tests 144.4.1 Capacitance 14ii 4.4.2 Tangent of loss angle (tan )

16、. 154.4.3 Insulation resistance (Ri) . 154.4.4 Voltage proof . 164.5 Temperature characteristic of capacitance 174.5.1 Special preconditioning 174.5.2 Measuring conditions . 174.5.3 Requirements 174.6 Robustness of terminations . 174.7 Resistance to soldering heat . 174.7.1 General . 174.7.2 Special

17、 preconditioning 184.7.3 Initial measurement . 184.7.4 Recovery . 184.7.5 Final inspection, measurements and requirements. 184.8 Solderability 184.8.1 General . 184.8.2 Test conditions 184.8.3 Final inspection, measurements and requirements. 184.9 Rapid change of temperature (if required) . 184.9.1

18、General . 184.9.2 Special preconditioning 184.9.3 Initial measurement . 194.9.4 Test conditions 194.9.5 Recovery . 194.10 Vibration . 194.10.1 General . 194.10.2 Test conditions 194.10.3 Final inspection, measurements and requirements. 194.11 Bump (repetitive shock) 194.11.1 General . 194.11.2 Initi

19、al measurements . 194.11.3 Test conditions 194.11.4 Final inspection, measurements and requirements. 204.12 Shock (non-repetitive shock) . 204.12.1 General . 204.12.2 Initial measurements . 204.12.3 Test conditions 204.12.4 Final inspection, measurements and requirements. 204.13 Climatic sequence. 2

20、14.13.1 General . 214.13.2 Special preconditioning 214.13.3 Initial measurements . 214.13.4 Dry heat 214.13.5 Damp heat, cyclic, Test Db, first cycle . 214.13.6 Cold. 214.13.7 Low air pressure 214.13.8 Damp heat, cyclic, Test Db, remaining cycles 224.14 Damp heat, steady state . 22iii 4.14.1 General

21、 . 224.14.2 Special preconditioning 224.14.3 Initial measurement . 234.14.4 Test conditions 234.14.5 Recovery . 234.14.6 Final inspection, measurements and requirements. 234.15 Endurance 244.15.1 General . 244.15.2 Special preconditioning 244.15.3 Initial measurement . 244.15.4 Test conditions 244.1

22、5.5 Recovery . 244.15.6 Final inspection, measurements and requirements. 244.16 Component solvent resistance (if applicable) 254.17 Solvent resistance of the marking (if applicable) . 25Annex A (informative) Capacitance ageing of fixed capacitors of ceramic dielectric, Class 2 26A.1 General . 26A.2

23、Law of capacitance ageing 26A.3 Capacitance measurements and capacitance tolerance (see 4.4.1). 27A.4 Special preconditioning (see 4.2) 27Bibliography 29Table 1 Preferred tolerance on nominal capacitance 5Table 2 Preferred values of temperature characteristics . 5Table 3 Sampling plan together with

24、numbers of permissible non-conforming items for qualification approval tests, assessment level EZ 8Table 4 Test schedule for qualification approval 9Table 5 Lot-by-lot inspection 13Table 6 Periodic tests 14Table 7 Measuring conditions 15Table 8 Insulation resistance requirements 16Table 9 Test volta

25、ges . 16Table 10 Details of measuring conditions . 17Table 11 Maximum capacitance change . 18Table 12 Preferred severities (of non-repetitive shock) 20Table 13 Maximum capacitance change . 21Table 14 Number of damp heat cycles . 22Table 15 Final inspection measurements and requirements . 22Table 16

26、Test conditions for damp heat, steady state . 23Table 17 Final inspection, measurements and requirements 23Table 18 Endurance test conditions . 24Table 19 Final inspection, measurements and requirements 24iv INTERNATIONAL ELECTROTECHNICAL COMMISSION_ FIXED CAPACITORS FOR USE IN ELECTRONIC EQUIPMENT

27、Part 9: Sectional specification: Fixed capacitors of ceramic dielectric, Class 2 FOREWORD 1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising all national electrotechnical committees (IEC National Committees). The object of IEC is to prom

28、ote international co-operation on all questions concerning standardization in the electrical and electronic fields. To this end and in addition to other activities, IEC publishes International Standards, Technical Specifications, Technical Reports, Publicly Available Specifications (PAS) and Guides

29、(hereafter referred to as “IEC Publication(s)”). Their preparation is entrusted to technical committees; any IEC National Committee interested in the subject dealt with may participate in this preparatory work. International, governmental and non-governmental organizations liaising with the IEC also

30、 participate in this preparation. IEC collaborates closely with the International Organization for Standardization (ISO) in accordance with conditions determined by agreement between the two organizations. 2) The formal decisions or agreements of IEC on technical matters express, as nearly as possib

31、le, an international consensus of opinion on the relevant subjects since each technical committee has representation from all interested IEC National Committees. 3) IEC Publications have the form of recommendations for international use and are accepted by IEC National Committees in that sense. Whil

32、e all reasonable efforts are made to ensure that the technical content of IEC Publications is accurate, IEC cannot be held responsible for the way in which they are used or for any misinterpretation by any end user. 4) In order to promote international uniformity, IEC National Committees undertake t

33、o apply IEC Publications transparently to the maximum extent possible in their national and regional publications. Any divergence between any IEC Publication and the corresponding national or regional publication shall be clearly indicated in the latter. 5) IEC itself does not provide any attestatio

34、n of conformity. Independent certification bodies provide conformity assessment services and, in some areas, access to IEC marks of conformity. IEC is not responsible for any services carried out by independent certification bodies. 6) All users should ensure that they have the latest edition of thi

35、s publication. 7) No liability shall attach to IEC or its directors, employees, servants or agents including individual experts and members of its technical committees and IEC National Committees for any personal injury, property damage or other damage of any nature whatsoever, whether direct or ind

36、irect, or for costs (including legal fees) and expenses arising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC Publications. 8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is indispensable for t

37、he correct application of this publication. 9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of patent rights. IEC shall not be held responsible for identifying any or all such patent rights. International Standard IEC 60384-9 has been pre

38、pared by IEC technical committee 40: Capacitors and resistors for electronic equipment. This fourth edition cancels and replaces the third edition published in 2005. This fourth edition is a result of maintenance activities related to the previous edition. All changes that have been agreed upon can

39、be categorized as minor revisions. The text of this standard is based on the following documents: v FDIS Report on voting 40/2339/FDIS 40/2364/RVD Full information on the voting for the approval of this standard can be found in the report on voting indicated in the above table. This publication has

40、been drafted in accordance with the ISO/IEC Directives, Part 2. A list of all parts in the IEC 60384 series, published under the general title Fixed capacitors for use in electronic equipment, can be found on the IEC website. The committee has decided that the contents of this publication will remai

41、n unchanged until the stability date indicated on the IEC web site under “http:/webstore.iec.ch“ in the data related to the specific publication. At this date, the publication will be reconfirmed, withdrawn, replaced by a revised edition, or amended. EIA-60384-9 Page 1 FIXED CAPACITORS FOR USE IN EL

42、ECTRONIC EQUIPMENT Part 9: Sectional specification: Fixed capacitors of ceramic dielectric, Class 2 1 General 1.1 Scope This part of IEC 60384 is applicable to fixed capacitors of ceramic dielectric with a defined temperature coefficient (dielectric Class 2), intended for use in electronic equipment

43、, including leadless capacitors but excluding fixed surface mount multilayer capacitors of ceramic dielectric, which are covered by IEC 60384-22 (Class 2). Capacitors for electromagnetic interference suppression are not included, but are covered by IEC 60384-14. 1.2 Object The object of this standar

44、d is to prescribe preferred ratings and characteristics and to select from IEC 60384-1:2008 the appropriate quality assessment procedures, tests and measuring methods and to give general performance requirements for this type of capacitor. Test severities and requirements prescribed in detail specif

45、ications referring to this sectional specification shall be of equal or higher performance level because lower performance levels are not permitted. 1.3 Normative references The following documents, in whole or in part, are normatively referenced in this document and are indispensable for its applic

46、ation. For dated references, only the edition cited applies. For undated references, the latest edition of the referenced document (including any amendments) applies. IEC 60063:1963, Preferred number series for resistors and capacitors IEC 60063:1963/AMD1:1967 IEC 60063:1963/AMD2:1977 IEC 60068-1:20

47、13, Environmental testing Part 1: General and guidance IEC 60384-1:2008, Fixed capacitors for use in electronic equipment Part 1: Generic specification IEC 61193-2:2007, Quality assessment systems Part 2: Selection and use of sampling plans for inspection of electronic components and packages ISO 3:

48、1973, Preferred numbers Series of preferred numbers 1.4 Information to be given in a detail specification 1.4.1 General Detail specifications shall be derived from the relevant blank detail specification. Detail specifications shall not specify requirements inferior to those of the generic, sectiona

49、l or blank detail specification. When more severe requirements are included, they shall be EIA-60384-9 Page 2 listed in 1.9 of the detail specification and indicated in the test schedules, for example by an asterisk. The information given in 1.4.2 may for convenience, be presented in tabular form. The following information shall be given in each detail specification and the values quoted shall preferably be selected from those given in the appropriate clause of this sectional specification. 1.4.2 Outline drawing an