ECA TEP 196-1989 Cathode Ray Tube X-Radiation Round Robin Procedures Report of the JT-32 Committee《JT-32委员会JT-32X射线轮循程序的报告》.pdf

1、ElA ENGINEERING P U B LI CAT I ON EIA TEP196 89 M 3234600 0008736 1 m f .“ r -i Cathode Ray Tube X-Radiation Round Robin Procedures Report of the JT-32 Committee TEP196 ELECTRONIC INDUSTRIES ASSOCIATION ENGINEERING DEPARTMENT - EIA TEPLb 89 m 3234600 0008737 3 m NOTICE , EIA Engineering Standards an

2、d Publications are designed to serve the public interest through eliminating misunderstandings between manufacturers and purchasers, facilitating interchangeability and improvement of products, and assisting the purchaser in selecting and obtaining with minimum delay the proper product for his parti

3、cular need. Existence of such Standards and Publication shall not in any respect preclude any member or non- member of EIA from manufacturing or selling products not conforming to such Standards and Publications, nor shall the existence of such Standards and Publications preclude their voluntary use

4、 by those other than EIA members, whether the standard is to be used either domestically or internationally. Recommended Standards and Publications are adopted by EIA without regard to whether or not their adoption may involve patents on articles, materials, or processes. By such action, EIA does no

5、t assume any liability to any patent owner, nor does it assume any obligation whatsoever to parties adopting the Recommended Standard or Publication. Technical Publications are distinguished from EIA Recommended Standards or Interim Standards, in that they contain a compilation of engineering data o

6、r information useful to the technical community, and represent approaches to good engineering practices that are suggested by the formulating committee. This Publication is not intended to preclude or discourage other approaches that similarly represent good engineering practice, or that may be acce

7、ptable to, or have been accepted by, appropriate bodies. Parties who wish to bring other approaches to the attention of the formulating committee to be considered for inclusion in future revisions of this Publication are encouraged to do so. It is the intention of the formulating committee to revise

8、 and update this Publication from time to time as may be occasioned by changes in technology, industry practice, or government regulations, or for other appropriate reasons. COPYRIGHT 1989 Published by ELECTRONIC INDUSTRIES ASSOCIATION Engineering Department 2001 Pennsylvania Ave., N.W. Washington,

9、D.C. 20006 (Tempomy Headquarters 1722 Eye St, N.W. Washington, D.C. 20006) PRICE: $10.00 Printed in U.S.A. All rights reserved J EIA TEP176 89 3234600 0008738 5 m TEP196 Cathode Ray Tube Page 1 X-rndiat ion Round Robin Pr-ocedrires For JT-32 - Fur-gose: - This pc-ocedcrre was established so that a c

10、onsistent method would be available ver- t inie and after- Conmittee niember-ship changes. - Farticieanfs: - Cathode r-ay tribe nianufact ur-er-s who are nieniber-s oF 3T-32. Fldditions or deletions to the pr-ogs-ani niay be made by contacting the JT-y32 Committee Chair-nian. Ft-eauencv: The round-r

11、wbin will be conducted as needed or- annually. Tube Supplier-: The tribe supplier- frili- the r-ciund-r-obin will be on a t-mtating basis involving all participating cathode ray tube nianufact;urer-s. The tube supplier for each round will supply two tubes of the assigned type. Tubes niay be screen s

12、cr-ap. The tribes must be void of extermal coatings and labels. Integral iniploion hardwar-e niay be used for shipping purposes. The panel and funnel date codes should be legible. deflection yoke shall be included. Tube Tyegs: Participants will decide on the tube type to be scheduled by the round r-

13、obin coordinator. kn attempt will be made to cixtet- all major- types of bulb families throughout *he duration of the pr*og r-ani . Data Rcauisifion: Rppropriate EIAkNCI test procedures will be adhered to. Measure the X-r-adiation exposure-rate (mR/h) at the locations of niaxinitini intensity for- e

14、ach of the following areas of the hypot het ical cabinet . Cabinet Front - Tube Face Cabinet Sides - Funnel Side, Rear-, Eottoni Panel Skirt Region Rnode Contact - appropr-iate cabinet side Neck - cabinet r-ear- or cone area k. E. c. D. For a piven tube type, testing will be at IkV anude voltage int

15、ervals over- a range of at least 5kV. The anode voltage should range 2kV both sides of the registration refer-ence voltage for- the tube type being measured. Measure and r-ecor-d the glass thickness at the locations of nia x i ni uni ex pos ci r-e- r a t e. Determine the 1 ineai- absor-pt ion coeffi

16、cient for- the individual glass components of the tube. Rd j ust the nieasrir-ed exposur-e-rate data for background, nietet- leakage effects and nietet- cal ibr-at ion factor. - . - EIA TEPLSb 89 M 3234600 O008739 7 = TEP196 Page 2 E. kdjust the data to the appropriate reference anode cur-rent . F.

17、kdjurjt the cor-rected exposur-e-rate values to the nrininiuni ut cond it i on. 6. For- the sets of data r-ecorded at the different measurement locat ion5 calculate and r-epor-t the aver-age, citandar-d deviation and average plis three times the standard devint ion. H. Gr-nph on senri-log paper the

18、X-r-adiation and 0.5 niRih I soex posure- Rate Curves. i. The tube should be tested and t-muted to next participant within 4S days of receipt. Repor-ts: The r-epor-t of the required data should be pr-epnved and serit to *he r-ound-r-obin coordinator. The r-ound-r-obin comrdinatob- wi 11 prepat-e a c

19、omposite t-eport summarizing *he data Proni each of Che participants for- the JT-32 Conimittee. -I- RoLtting: The or-iginatcw shall be th& supplier- of the tubes for fhe round. The suppl ier, upon coniplet ion of his measurnients, wi l l r-oute the tubes to the next participant listed, etc., until the tubes are returned back to the supplier-., When sending a tube to the next participant please notify the pnr-ticipant and the coordinator- by mail or- phone 50 that the coor-dinator- may keep tr&k of the round-r-obin p t- o g re cis.