EIA ECA-364-50B-2012 TP-50B Dust (Fine Sand) Test Procedure for Electrical Connectors.pdf

1、 EIA STANDARD TP-50B Dust (Fine Sand) Test Procedure for Electrical Connectors EIA-364-50B (Revision of EIA-364-50A) November 2012 ANSI/EIA-364-50B-2012 Approved: November 29, 2012 EIA-364-50BNOTICE EIA Engineering Standards and Publications are designed to serve the public interest through eliminat

2、ing misunderstandings between manufacturers and purchasers, facilitating interchangeability and improvement of products, and assisting the purchaser in selecting and obtaining with minimum delay the proper product for his particular need. Existence of such Standards and Publications shall not in any

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4、her domestically or internationally. Standards and Publications are adopted by EIA in accordance with the American National Standards Institute (ANSI) patent policy. By such action, EIA does not assume any liability to any patent owner, nor does it assume any obligation whatever to parties adopting

5、the Standard or Publication. This EIA Standard is considered to have International Standardization implications, but the International Electrotechnical Commission activity has not progressed to the point where a valid comparison between the EIA Standard and the IEC document can be made. This Standar

6、d does not purport to address all safety problems associated with its use or all applicable regulatory requirements. It is the responsibility of the user of this Standard to establish appropriate safety and health practices and to determine the applicability of regulatory limitations before its use.

7、 (From Standards Proposal No. SP-5230 formulated under the cognizance of the CE-2.0 National Connector and Socket Standards Committee). Published by Electronic Components Industry Association 2012 Engineering Department 2214 Rock Hill Road; Suite 170 Herndon, VA 20170 PLEASE ! DONT VIOLATE THE LAW!

8、This document is copyrighted by the ECIA and may not be reproduced without permission. Organizations may obtain permission to reproduce a limited number of copies through entering into a license agreement. For information, contact: IHS 15 Inverness Way East Englewood, CO 80112-5704 or call USA and C

9、anada (1-800-854-7179), International (303-397-7956) i CONTENTS Clause Page 1 Introduction 1 1.1 Scope . 1 1.2 Object 1 2 Test resource . 1 2.1 Equipment . 1 2.2 Material . 2 3 Test specimen 2 3.1 Preparation 2 4 Test procedure . 2 4.1 Initial measurements . 2 4.2 Conditioning . 2 4.3 Sequence . 3 4

10、.4 Final measurements 3 5 Details to be specified . 4 6 Test documentation . 4 ii (This page left blank) EIA-364-50B Page 1 TEST PROCEDURE No. 50B DUST (FINE SAND) TEST PROCEDURE FOR ELECTRICAL CONNECTORS (From EIA Standards Proposal No. 5230, formulated under the cognizance EIA CE-2.0 Committee on

11、National Connector and Socket Standards, and previously published in EIA-364-50A.) 1 Introduction 1.1 Scope This standard establishes a method to ascertain the ability of fully wired connector assemblies to resist the effects of dry dust (fine sand) laden atmosphere. 1.2 Object This object of this t

12、est is to simulate the effect of sharp edged dust particles, (up to 150 micrometers in size) that may penetrate into cracks, bearings and joints. 2 Test resources 2.1 Equipment The test equipment shall consist of a dust chamber and instrumentation to control dust concentration, velocity and humidity

13、 of the dust laden air. In order to provide adequate circulation of the dust laden air, no more than 50% of the cross-sectional area (normal to air flow) and 30% of the volume of the chamber shall be occupied by the test specimen(s). The chamber shall be provided with a suitable means of maintaining

14、 and verifying the dust concentration and circulation. A minimum acceptable means for doing this is by use of a properly calibrated smoke meter and standard light source. The dust laden air shall be introduced into the dust chamber in such a manner as to allow it to become approximately laminar in f

15、low before it strikes the test specimen. EIA-364-50B Page 2 2.2 Material The dust used in this test shall be a fine sand (97% or greater by weight SiO2) of angular structure, and shall have the following size distribution as determined by weight using wire cloth and sieves in accordance with ASTM E

16、11: 100% of this dust shall pass through a 100 - mesh screen 98% 2% of the dust shall pass through a 140 mesh screen 90% 2% of the dust shall pass through a 200 mesh screen 75% 2% of the dust shall pass through a 325 mesh screen 3 Test specimen 3.1 Preparation 3.1.1 The test specimen shall be prepar

17、ed and mounted according to the referencing document. 3.1.2 When required by the referencing document, the test specimen shall be operated the number of times specified prior to the test. 3.1.3 For each test carried out, the referencing document shall specify the condition of the test specimen, e.g.

18、, operated or nonoperated, mated or unmated, sample orientation relative to settling dust. 4 Test procedure 4.1 Initial measurements The specimen shall meet the visual inspection and the specified electrical and mechanical requirements of the referencing document. 4.2 Conditioning Place the test spe

19、cimen in the dust chamber, positioned as near the center of the chamber as practicable. If more than one specimen is being tested, there shall be a minimum clearance of 100 millimeters (4 inches) between surfaces of test specimens. No surface of the test specimen shall be closer than 100 millimeters

20、 (4 inches) from any wall of the test chamber. The test specimen orientation may be changed during the test if so required by the referencing document. EIA-364-50B Page 3 4.3 Sequence Subject the specimen(s) to the following steps: Step 1 - Set the chamber controls to maintain an internal chamber te

21、mperature of 23 C 5 C (73 F 9 F) and a relative humidity of less than 22%. Adjust the air velocity to 9 meters per second 1 meter per second (1,750 feet per minute 250 feet per minute). Adjust the dust feeder to control the dust concentration to 11 grams per cubic meter 7 grams per cubic meter (0.3

22、grams per cubic foot 0.2 grams per cubic foot). With the test specimen nonoperating, maintain these conditions for 6 hours. Step 2 - Stop the dust feed and reduce the air velocity to 1.5 meters per second 1 meter per second (300 feet per minute 200 feet per minute ). Raise the internal chamber air t

23、emperature to 63 C 5 C (145 F 9 F). With the test specimen nonoperating, maintain these conditions for 16 hours. Step 3 - While holding chamber temperature at 63 C 5 C (145 F 9 F) adjust the air velocity to 9 meters per second 1 meter per second (1,750 feet per minute 250 feet per minute). Adjust th

24、e dust feeder to control the dust concentration to 11 grams per cubic meter 7 grams per cubic meter (0.3 gram per cubic foot 0.2 gram per cubic foot. Unless otherwise specified in the referencing document, with the test specimen nonoperating, maintain these conditions for 6 hours. Step 4 - Turn off

25、all chamber controls and allow the test specimen to return to standard ambient conditions. Remove accumulated dust from the test specimen by brushing, wiping, or shaking. Care should be taken to avoid introduction of additional dust into the test specimen. Dust shall not be removed by either air bla

26、st or vacuum cleaning. 4.4 Final measurements Upon completion of the above test, the specimen shall be examined for evidence of deterioration and shall meet the specified electrical and mechanical requirements of the referencing document. EIA-364-50B Page 4 5 Details to be specified The following de

27、tails shall be specified in the referencing document: 5.1 Method of mounting and wiring the specimen 5.2 Preconditioning, if required 5.3 Initial measurement and requirements 5.4 Final measurements and requirements 5.5 Any deviation from the standard test method 6 Test documentation Documentation sh

28、all contain the details specified in clause 5, with any exceptions, and the following: 6.1 Title of test 6.2 Sample description, including fixturing 6.3 Test equipment used, and date of last and next calibration 6.4 Test procedure 6.5 Dust chamber atmospheric conditions 6.6 Name of operator and star

29、t/finish date(s) of test ECIA Document Improvement Proposal If in the review or use of this document, a potential change is made evident for safety, health or technical reasons, please fill in the appropriate information below and mail or FAX to: Electronic Components Industry Association EIA Standa

30、rds & Technology Department 2214 Rock Hill Rd., Suite 170 Herndon, VA 20170 FAX: (571-323-0245) Document No.: Document Title: Submitters Name: Telephone No.: FAX No.: e-mail: Address: Urgency of Change: Immediate: At next revision: Problem Area: a. Clause Number and /or Drawing: b. Recommended Chang

31、es: c. Reason/Rationale for Recommendation: Additional Remarks: Signature: Date: FOR ECIA USE ONLY Responsible Committee: Chairman: Date comments forwarded to Committee Chairman: Revision History Revision letter Project number Additions, changes and deletions B SP-5230 Revised format to comply with current practices in conjunction with 5 year review. Revised paragraph 3.1.3. Electronic Components Industry Association 2214 Rock Hill Road, Suite 170 * Herndon, VA 20170 * tel 571-323-0294 * fax 571-323-0245 www.eciaonline.org