EIA ECA-958-2013 Surface Mount Common Mode Choke Qualification Specification.pdf

1、 EIA STANDARD Surface Mount Common Mode Choke Qualification Specification EIA/ECA-958 September 2013 EIA/ECA-958NOTICE EIA Engineering Standards and Publications are designed to serve the public interest through eliminating misunderstandings between manufacturers and purchasers, facilitating interch

2、angeability and improvement of products, and assisting the purchaser in selecting and obtaining with minimum delay the proper product for his particular need. Existence of such Standards and Publications shall not in any respect preclude any member or nonmember of ECIA from manufacturing or selling

3、products not conforming to such Standards and Publications, nor shall the existence of such Standards and Publications preclude their voluntary use by those other than ECIA members, whether the standard is to be used either domestically or internationally. Standards and Publications are adopted by E

4、CIA in accordance with the American National Standards Institute (ANSI) patent policy. By such action, ECIA does not assume any liability to any patent owner, nor does it assume any obligation whatever to parties adopting the Standard or Publication. This EIA Standard is considered to have Internati

5、onal Standardization implication, but the International Electrotechnical Commission activity has not progressed to the point where a valid comparison between the EIA Standard and the IEC document can be made. This Standard does not purport to address all safety problems associated with its use or al

6、l applicable regulatory requirements. It is the responsibility of the user of this Standard to establish appropriate safety and health practices and to determine the applicability of regulatory limitations before its use. (From Standards Proposal No. 5258, formulated under the cognizance of the P3 I

7、nductive Devices Standards). Published by Electronic Components Industry Association 2013 Engineering Department 2214 Rock Hill Road, Suite 170 Herndon, VA 20170 PLEASE! DONT VIOLATE THE LAW! This document is copyrighted by the ECIA and may not be reproduced without permission. Organizations may obt

8、ain permission to reproduce a limited number of copies through entering into a license agreement. For information, contact: IHS 15 Inverness Way East Englewood, CO 80112-5704 or call USA and Canada (1-877-413-5184), International (303-397-7956) CONTENTS Paragraph Page Foreword ii 1 Scope 1 1.1 Descr

9、iption . 1 1.2 Reference documents 1 2 General requirements . 1 2.1 Objective. 1 2.2 Generic data 1 2.2.1 The use of generic data to satisfy qualification requirements 1 2.2.2 Qualification families 2 2.2.3 Manufacturing site (fabrication and assembly) . 2 2.3 Test samples . 2 2.3.1 Lot requirements

10、 . 2 2.3.2 Production requirements . 2 2.3.3 Reusability of test samples 2 2.3.4 Sample size requirements 2 2.3.5 Pre-stress and post stress test requirements . 2 2.4 Definition of electrical test failure after stressing . 2 2.5 Criteria for passing qualification 3 2.6 Alternative testing requiremen

11、ts . 3 2.7 Disqualification. 3 3 Qualification and requalification 3 3.1 Qualification of a new device . 3 3.2 Changes requiring requalification . 3 3.2.1 Criteria for passing requalification 3 4 Test requirements . 4 4.1 Sampling plan . 4 4.2 Electrical characteristics . 4 4.3 Visual and mechanical

12、 examination 4 4.4 Life test . 5 4.5 Aqueous conditions 5 4.5.1 Load humidity . 5 4.6 Thermal shock 5 4.7 Vibration . 6 4.8 Shock 6 4.9 Bending . 6 4.10 Flammability . 7 4.11 Solderability 7 4.12 Resistance to soldering heat 7 4.13 Terminal strength 7 4.13.1 Hanging test . 7 4.13.2 Shear test . 8 4.

13、13.3 Bending test 8 5 Preconditioning 8 6 Packaging . 8 TABLES 2 Dimensions . 9 Foreword From Standards Proposal 5104, prepared by the Electronic Industries Associations P-3 Committee on Inductive Components Task Force on Qualification Specifications. EIA/ECA-958 Page 1 1 Scope 1.1 Description This

14、specification defines the qualification program for surface mount Common Mode Chokes. The qualification program is defined in Table 1. Specification sheets can be added, as required, to define specific products or to cover unique/specific requirements. This document does not relieve the supplier of

15、their responsibility to their own companys internal qualification program. 1.2 Reference documents The current revision of the referenced documents will be in effect at the date of agreement to the qualification plan. Subsequent qualification plans will automatically use the latest revisions of thes

16、e referenced documents: MIL-STD-202 Test Method Standard - Electronic and Electrical Component Parts MIL-HDBK-53-1A Military Handbook - Guide for Attribute Lot Sampling Inspection UL-94V Tests for Flammability of Plastic Materials IEC 60068 Basic Environmental Testing Procedures IPC-9504 Assembly Pr

17、ocess Simulation for Evaluation of Non-IC Components (Preconditioning) 2 General requirements This specification includes requirements with the intention of developing a single set of robust qualification tests that would enable a supplier to leverage test results to satisfy the requirements of mult

18、iple original equipment manufacturer (OEM) customers. 2.1 Objective The objective of this qualification program is to ensure that components meet a minimum quality and/or reliability level. 2.2 Generic data 2.2.1 The use of generic data to satisfy qualification requirements The use of generic data f

19、or qualification will be based on specific requirements associated with each characteristic of the device and manufacturing process. These requirements, listed in Table 1, are the same for new components, new processes, and requalification associated with a process change. A maximum negotiable set o

20、f qualification tests must be performed for the appropriate changes proposed for the component or process. Section 2.2.2 Qualification families defines the criteria by which components are grouped into a qualification family for the purpose of considering the data from one or more components that ca

21、n be generically applied to the qualification of other components within the family. For each stress test, two or more qualification families can be combined if reasoning for this is technically sound, supported by data and periodically reviewed for soundness of original assumptions. With proper att

22、ention to these qualification guidelines, greater information applicable to other devices in the family can be accumulated and used to demonstrate their reliability so that qualification testing on new devices entering a family can be minimized. For example, this can be achieved through extensive qu

23、alification and monitoring of the most complex device in the reliability family and applied to less complex devices that subsequently join this family. Sources of generic data should come from supplier-certified test labs, and can include internal suppliers qualification, user-specific qualification

24、s and suppliers in-process monitors, as long as the test conditions and endpoint test temperatures address the worst case temperature extremes and designed product life for the application or the user requesting the qualification. Justification for the use of generic data must be demonstrated by the

25、 supplier and approved by the user. EIA/ECA-958 Page 2 2.2.2 Qualification families The qualification must represent the same manufacturing process, materials and formulation. The supplier will provide a complete description of each process and material of significance. Samples should represent diff

26、erent values within the family. These values should represent the low range, and upper range of the family. There must be valid and obvious links between the data and the subject of qualification. 2.2.3 Manufacturing site (fabrication and assembly) Each manufacturing site and line is to be considere

27、d independently for site qualification, meaning that the site is proven to be capable (resources and equipment) of running particular processes with adequate yields (to be determined by the supplier). A site cannot be qualified based on the results from a different location. Qualification families d

28、o not apply across manufacturing sites. 2.3 Test samples 2.3.1 Lot requirements Test samples shall consist of representative devices from the qualification family. Multiple lot samples are specified in Table 1. Test samples shall be composed of approximately equal numbers of devices from three nonco

29、nsecutive lots, with each assembly lot composed of a different date code separated by a minimum of one week. 2.3.2 Production requirements All test samples shall be processed, tested, screened and inspected on the same production site and with the same production process for which the qualification

30、family to be qualified will be manufactured for production. 2.3.3 Reusability of test samples Devices which have been used for nondestructive qualification tests may be used to populate other qualification tests. 2.3.4 Sample size requirements Sample sizes used for qualification testing and/or gener

31、ic data submission must be consistent with the specified minimum sample sizes and acceptance criteria in Table 1. 2.3.5 Pre-stress and post stress test requirements All endpoint test temperatures (room, hot and/or cold) are specified in the appropriate test paragraphs. The specific value of temperat

32、ure must address the worst case temperature extremes and designed product life for the application of the user requesting the qualification. 2.4 Definition of electrical test failure after stressing Electrical test failures are defined as those devices not meeting the requirements called out in Sect

33、ion 4 of this document. EIA/ECA-958 Page 3 2.5 Criteria for passing qualification Passing all appropriate qualification tests in this specification qualifies the device. Any unique reliability tests or conditions requested by the user and not specified in this document shall be negotiated between th

34、e supplier and user requesting the test. Any failure shall be analyzed for root cause, and demonstration of corrective and preventive actions is required. 2.6 Alternative testing requirements All deviations from the qualification requirements and conditions must be approved by the user. All deviatio

35、ns should be clearly reported when the results of the qualification are submitted to the user for approval. 2.7 Disqualification When the number of failures for any given test in Table 1 exceeds the acceptance criteria using the procedure in 2.5, the device shall be disqualified until the root cause

36、 of the failure(s) is (are) determined and corrective and preventive actions are confirmed to be effective. New samples or data may be requested to verify the above. 3 Qualification and requalification 3.1 Qualification of a new device The test requirements and corresponding test conditions for the

37、qualification of a new device are listed in Table 1. For each qualification, the supplier must present data for all of these tests, either specific to the device to be qualified or acceptable qualification family data. Justification for the use of generic data must be demonstrated by the supplier an

38、d approved by the user. 3.2 Changes requiring requalification Changes to a device, or the processes used in its fabrication, will require retesting as agreed upon between the supplier and the user. The supplier and the user should agree upon the appropriate test plan prior to starting the requalific

39、ation. 3.2.1 Criteria for passing requalification Passing all appropriate requalification tests specified in this document agreed upon by both the user and the supplier, qualifies the change per this document. All requalification failures shall be analyzed for root cause, and demonstration of correc

40、tive and preventative actions is required. EIA/ECA-958 Page 4 4 Test Requirements 4.1 Sampling plan The sample size per lot in Table 1 is selected from one manufacturing lot. The total sample size per family shall consist of a minimum of three manufacturing lots separated by at least one week of dat

41、e. Any reduction in sample size can only be authorized by the user. Table 1Common Mode Choke qualification test program; approval levels and sampling plan Test method Ferrite chip bead inspection Sample size per lot Total sample size Defects permitted 4.2 Electrical characteristics 83 249 0 4.3 Visu

42、al and mechanical 5 15 0 4.4 Life 16 48 0 4.5 Load Humidity 16 48 0 4.6 Thermal shock 16 48 0 4.7 Vibration 5 15 0 4.8 Shock 5 15 0 4.9 Bending 5 15 0 4.10 Flammability Present certificate of compliance 4.11 Solderability 10 30 0 4.12 Resistance to soldering heat 5 15 0 4.13 Terminal Strength 5 15 0

43、 4.2 Electrical characteristics The total samples required in Table 1 shall be measured initially at ambient room temperature, relative humidity, and atmospheric pressure (253C, 502%, 760mm Hg) before subsequent testing. Initial electrical parameters shall meet the requirements listed in the applica

44、ble product specifications. 4.3 Visual and mechanical evaluation The Common Mode Chokes shall be visually examined to verify that no defects in workmanship exist. Mechanical dimensions will be measured and shall meet the requirements defined in the detailed specification sheet or reference documents

45、. Unless otherwise specified, when Common Mode Chokes are tested in accordance with the environmental and other stress tests listed below, there shall be no evidence of mechanical damage or measurable discontinuity. This test may be conducted at room temperature. EIA/ECA-958 Page 5 4.4 Life test Com

46、mon Mode Chokes shall be tested in accordance with MIL-STD-202, Method 108, Test Condition D where applicable except: a) Preconditioning is required as specified in Section 5. b) Test temperature shall be 125* 2 oC. c) Apply maximum rated DC current for 1000 hours minimum. d) Measurements shall be t

47、aken at 0 h, 250 h, 500 h, and 1000 h. The beads shall be allowed to stabilize at room temperature for 24 hours before measurements are taken. e) The impedance value shall not change by more than 15% of the initial value at the intermediate or final measurements; the DC resistance (DCR) value shall

48、not exceed the initial specification value at intermediate or final measurements; no physical or mechanical damage shall be observed. 4.5 Aqueous Conditions Test 4.5.1 Load humidity test (steady state) Common Mode Chokes shall be tested in accordance with MIL-STD-202, Method 103, Test Condition D wh

49、ere applicable except: a) Preconditioning as specified in Section 5, is required. b) Test temperature (+85 2) oC. c) Relative humidity shall be held at 85%. d) Apply 100% of the rated current continuously for 1000 hours. e) Measurements shall be taken at 0 h, 250 h, 500 h, and 1000 h. The Common Mode Chokes shall be allowed to stabilize at room temperature for 24 hours before measurements are taken. f) The impedance value shall not change by more than 15% from the initial value. The DCR value shall not exceed the initial specification value. No physical or mech