EIA RS-186-11E-1978 STANDARD TEST METHODS FOR PASSIVE ELECTRONIC COMPONENT PARTS METHOD 11 THERMAL SHOCK IN AIR.pdf

1、-. EIA 186-LLE 78 E 323VbOO 00285b3 E (ANSIEIA RS-186-E-78 Approved October 27,1978 LIA STANDARD STANDARD TEST METHODS FOR PASSIVE . ELECTRONIC COMPONENT PARTS METHOD 11: THERMAL SHOCK IN AIR I (Revision of RS-186-0, Method 11) OCTOBER 1978 Engineering Department ELECTRONIC INDUSTRIES ASSOCIATION NO

2、TICE EIA engineering standards are designed to serve the public interest through eliminating mis- understandings between manufacturers and purchasers, facilitating interchangeability and improvement of products, and assisting the purchaser in selecting and obtaining with mini- mum delay the proper p

3、roduct for his particular need. Existence of such standards shall not in any respect preclude any member or non-member of EIA from manufacturin or selling clude their voluntary use by those other than EIA members whether the standard is to be used either domestically or internationally. Recommended

4、standards are adopted by EU yithout regard to whether or not their adop- tion may involve patents on articles, materials, OF processes. By such action, EIA does not assume any liability to any patent owner, nor does it assume any obligation whatever to parties adopting the recommended standards. Thi

5、s Standard contains the major technical contents of International ElectrotechnicaE Com- mission Publication t8-2-14, Test N: Change of Temperature. It differs from the IEC Publication 68-2-14 by listing specific test conditions, temperature tolerances and other controls. Thse differences are well kn

6、own to the U.S. Committee of Experts for the International Electrotechnical Commission Technical Committee 50 and resolution of these differences will be sought in future meetings of TC-50. products not conforming to such standards, nor shall the existence of such stan 8 ards pre- Published by ELECT

7、RONIC INDUSTRIES ASSOCIATIQN Engineering Department 2001 Eye Street, N. W., Waehington, D. C. 20006 0 Electronic ndustrlee AesochUon 1979 AU righta reserved PRICE: $3.00 EIA Lb-LIE 78 m 3234600 O028565 L m RS-186-11E Page 1 e STANDARD TEST METHODS FOR PASSIVE ELECTRONIC COMPONENT PARTS METHOD 11 THE

8、RMAL SHOCK IN AIR (From EIA Standard RS-186-D and Standards Proposal No. 1271 formulated under the cognizance of the ELA P-9 Committee on Test Methods and Procedures.) INTRODUCTION This Test Method forms a part of the EIA Standard RS-186 which contains test guidance, definitions and standard test co

9、nditions. 1. PURPOSE i This test is conducted for the purpose of determining the resistance of a component part to exposures at ! extremes of high and low temperatures in air, and to the shock of alternate exposures to these extremes. Permanent changes in operating characteristics and physical darna

10、ge produced during thermal shock result principally from variations in dimensions and other physical properties. Effects of thermal shock include cracking and delamination of finishes, cracking and crazing of embedding and encapsulating compounds, opening of terminal seals and case seams, leakage of

11、 filling materials, and change in efectricai characteris- tics-due to mechanical displacement or rupture of conductors or of insulating materials. 2. APPARATUS Separate chambers shall be used for the extreme temperature conditions of steps 1 and 3. The air tem- perature of the two chambers shall be

12、held at each of the extreme temperatures by means of circulation and sufficient hot- or cold-chamber thhrmal capacity so that the ambient temperature shall reach the specified temperature within 2 minutes after the specimens have been transferred to the appropriate chamber. 3. PROCEDURE t Specimens

13、shall be placed in such a position with respect to the air stream that there is substantially no obstruction in the flow of air across and around the specimen. When special mounting is required, it shall be specified. The specimen shall then be subjected to the specified test condition of Table I, f

14、or a total of five cycles performed continuously. Cycling may be continued so that the total cycles equal 25,50 or 100 when so stated in the applicable specification. Specimens shall not be subjected to forced circulating air whce being transferred from one chamber to another. Direct heat conduction

15、 to the specimen should be minimized. 4. MEASUREMENTS This test may damage the component part, but the damage may not be detectable until some other test such as constant humidity (Method 1) or the seal test (Method 9) is performed on the thermal shock tested specimens. Specified measurements shall

16、be made prior to the first cycle and upon completion of the final cycle, except that failures shall be based on the measurements made after the specimen has returned to thermal stability at room ambient temperature following the final cycle, a RS-186-1 l.E Page 2 TEST CONDITION C TEST CONDITION D TE

17、MPERATUR E TIME TEMPERATURE TIME * STEP eC I F MINUTES OC OF MINUTES I See Table II -5 1 - 65 -85 - 65 O -85 O SeeTable II -5 +I8 5Max. -9 -5 +18 5Max. -9 + See Table II -8 +lo 392 -5 200 -f 5.4 -0 +I8 6Max. -9 .t. 18 -9 -5 -5 25 +lo 77 25 +I0 77 +O 77 -5 +3 -0 2 See Table 1 I . 3 155 31 1 -.5 25 5

18、Max. +O 77 -5 4 25 i EIA L8b-LLE 78 W 323Ltb00 00285bb 3 = TABLE I TEST CONDITION A TEST CONDITION B TEMPERATUR E TIME TEMPERATU RE TIME STEP OC “F MINUTES “C OF MINUTES +O SeeTable II +O -5 -5 I8 5Max. -.9 -5 + 5.4 +3 -65 -85 +O See Table II - 5.4 - 55 +O -67 +18 loto15 -9 + 5.4 -3 I 2 25 +I0 77 25

19、 +I0 77 4 25 +I0 77 25 +lo 77 -5 See Table II 126 257 See Table II -0 -0 -o 3 85 +3 185 -0 +I8 5Max -9 -5 +lo loto15 -5 -5 TABLE II WEIGHT OF SPECIMEN POUN DC 0.3 and Below .14 Kg Above 0.3 to 3, incl. Above 3 to 30, incl. Above 30 to 300, incl. 14-1.4 Kg 1.4-14 Kg 14-140 Kg Above 300 140 Kg MINIMUM

20、 TIME (FOR STEPS 1 AND 3) MI NUTEC 30 60 120 240 480 a - I EIA Lb-LLE 78 m 323qb00 0028567 5 m 5. SUMMARY The following details must be specified in the individual specification: e RS-186-llE Page 3 (a) Special mounting, if applicable (see 3). o) Test-Condition Letter (see 3). (c) Number of cycles if other than 5 (see 3). (d) Measurements before and after cycling.