EN 120001-1992 en Blank Detail Specification Light Emitting Diodes Light Emitting Diode Arrays Light Emitting Diode Displays Without Internal Logic and Resistor《空白详细规范 发光二极管阵列和没有内逻.pdf

1、= 3404583 0093294 395 = EUROPEANSTANDARD NORME EUROPENNE EUROPISCHE NORM EN 120 O01 May 1992 UDC: Supersedes CECC 20 O01 Issue 2 : 1991 Descriptors: Quality, electronic components, light emitting diodes, light emitting diode arrays, light emitting diode displays English version Blank Detail Specific

2、ation: Light emitting diodes, light emitting diode arrays, light emitting diode displays without internai logic and resistor Spcification Particulire Cadre: Vordruck fr Bauartspezifikation: Diodes lectroluminescentes, Leuchtdioden , rseaux de diodes lectro- Leuchtdiodenzeile n u nd luminescentes, af

3、ficheurs diodes Leuchtdioden-Anzeigen lectroluminescentes sans rsistance (-Displays) ohne interne Logik und ni circuits logiques internes Widerstand This European Standard was approved by the CENELEC Electronic Components Committee (CECC) on 20 February 1992. CENELEC members are bound to comply with

4、 CEN/CENELEC Internal Regulations which stipulate the conditions for giving this European Standard the status of a national standard without any alteration. Up-to-date lists and bibliographical references concerning such national standards may be obtained on application to the General Secretariat of

5、 the CECC or to any CENELEC member. This European Standard exists in three official versions (English, French, German). A version in any other language made by translation under the responsibility of a CENELEC member into its own language and notified to the CECC General Secretariat has the same sta

6、tus as the official versions. CENELEC members are the national electrotechnical committees of Austria, Belgium, Denmark, Finland, France, Germany, Greece, Iceland, Ireland, Italy, Luxembourg, Netherlands. Norway, Portugal. Spain, Sweden, Switzeriand. and United Kingdom. The membership of the CECC is

7、 identical, with the exception of the national elecrotechnical committees of Greece, Iceland and Luxembourg. CECC CENELEC Electronic Components Committee Comit des Composants Electroniques du CENELEC CENELEC Komitee fr Bauelemente der Elektronik General Secretariat: Garenstr. 179, D- 6000 FranMuNMai

8、n 70 0 1992 Copyright reserved to CENELEC members Ref. No. EN 120 O01 : 1992 E m 3404583 0091295 221 rn Page 2 EN 120001 : 1992 FOREWORD The CENELEC Electronic Components Committee (CECC) is composed of those member countries of the European Committee for Electrotechnical Standardization (CENELEC) w

9、ho wish to take pari in a harmonized System for electronic components of assessed quality. The object of the System is to facilitate international trade by the harmonization of the specifications and quality assessment procedures for electronic components, and by the grant of an internationally reco

10、gnized Mark, or Certificate, of Conformity. The components produced under the System are thereby acceptable in all member countries without further testing. This European Standard was prepared by CECC WG 20, Opto-Electronic Components and Liquid Crystal Devices. The text of the draft based on docume

11、nt CECC 20 O01 Issue 2 : 1991 was submitted to the formal vote for conversion to a European Standard; together with the voting report, circulated as document CECC(Secretariat)3025 it was approved by CECC as EN 120 O01 on 20 February 1992. The following dates were fixed: - latest date of announcement

12、 of the (doa) - latest date of publication of an (dopl EN a: national level identical national standard latest date of declaration of national standards obsolescence conflicting national standards - - latest date of withdrawal of (daw) 1993-02-16 1993-08- 16 1993-08-1 6 2003-02-16 W 3404583 0093296

13、168 W The CENELEC Elmnic Components cornmitte (CEO is compoCtd of those mtmbercoUntries of the European Committee for Elcctrotechnicd Standardization (CENELEC) who wish to take part in a hmonited System for electrOnic components of EIssesscd qiurlity. The object of the System is to facilitate intana

14、tional tra& by re hammimion of the specifications and quality assessment procedures for damnc components, and by the grant of an intanationally ncgnizuj Mark, or ccrtifimte, of confomllty. Thecomponents producad under the Systcm arc heady ele in all member counmes witbout further ttsting. This speci

15、fication has been fonnatly approved by the CECC, and has been prepared for tbuse munuies taking parc in the System who wish to issue nationai hannonizad spccications for LIGHT EMI“G DIODES, LIGHT EMITTING DIODE ARRAYS, LIGHT EMITTING DIODE DISPLAYS without internal logic and resistor. It should be r

16、ead in conjunction With the curnnt regulations for the CECC System. At the date of printing of this specification, the member countries of tbc CECC are Austria, Belgium, Denmark, Finland, France, Gemany, Ireland, Italy, the Netherlands, Noway, Portugal, Spain, Sweden, Switzerland and the United King

17、dom - _. ._. F!EmAcE This specification was prepared by CECC WG 20: “SEMCONDUCTOR OPTOELEOMC AND LIQUID CRYSTAL DEVICES“. It is one of a series of blank detail specifications for semiconductor devices, based on the generic specification CECC 20 OOO. CECC 20 O01 (1983) has been amended IO include LIG

18、HT EMITTING DIODE DISPLAYS. The amendments have no influence on tbe detail specifications established in accordance with CECC 20 001. The text of this specification was circulated to the CECC for boting in the documents listed Mow and was ratifkd by the President of the CECC for printuig as a CECC S

19、pecification. G- Document pate of Vom PeDm on the Vm CECC(Secretanat)l038 CECC(Secrctariat) 1039 CECC(Secretariat)l455 June 1981 June 1981 sept. 1984 This issue 2 of CECC 20 O01 shall become effective for di new qualification approvals frwi Ist March 1991. Issue 1 shall remain valid for existing qua

20、lification approvals. -1- CECC 20 O01 - Issue 2 - I 3404583 0093277 OT4 LIGHT EMXTiNG DIODES, LIGHT EhT7lNG DIODE ARRAYS, UGH“ EhTTnNG DIODE DISPLA o o ELECTRONIC Cl)rrpONtn of ASStfSED QUALITY IN AUORDANCE YITH : ttt to OOo. issue .and nrticicul rrfeimcts if 1. MECHANICAL MSCRIPTION different) Eith

21、cr outllne references (codc A) or bau and case rtferrns (codes I C) : - fm IEC 191-2 : - nrtionrl if rtd) OIITLIKE WUYINC AwD mCT1WS (leriinal conntcld ta Use. if any) The outline drawing nay comrpond ta tha devlce itself and/or the device with tts munting cp my bt transfer& to, ot given with mm eti

22、is, in clause 9 of this rpecifiutiai tURKIffi : letters and flgureslcolour cbdr hee 2.5 of QCC 20 o00 an!or ciause 6 of this ipcd f i u tion POlbdty Indication if SplCtal rthod fS utd tEcc 20 001-xxx act detail rpeclftcrtlon nmibcr plut Sssue nriakr andlor thte ETAIL SPLCIFICATIOII FOR : o Type nrmb

23、tr (I) of rtlevant device (s) and. if rppropriite structwrlly sliilar devirer) 3RDERIWG IWFOWATIW : rn dam 7 Of thil ncipsulHion : metr/grss/pirstic/. . . Igplicitlon : LLO for indiutlnp purpose/ Ponr : ambient-rated (i&) Four diode arrwl- 7 dot matrix/stvtn regment disla case-ratcd (fers,) 5 sa imp

24、ortant quick referrnu dita : diffusing dcviCe/n8m had. nay be added 3. LEVEL (5) of QKITr ASSESYQMT fif rrevint 4. LIMITING WNS (Absolute aixiipiio rating sysb) These apply per di& over the o rrtlng trmpcraturc rrnge unless otherwise stited. X denotes that a value shalrbe Inserted In the detail spec

25、iflotion Clause CL cc 20 O01 4.1 4.2 4.3 1.4 1.4.1 1.4.2 1.5 1.6.1 1.5.2 4.6 4.7 - Repeat only clause nuabcrs used. uith text. Additionil values. if any, shall bc given at the appropriate place uithout clause nvpkt (s). Curves should preferably be given In clause 9 of this docraant. iocratinp ambien

26、t or cast kmpcraturts Storage tcapcraturrs feldcrinp temperature Solderfng time and minimm distance to case shall be glwn given ln clause 9.1 of this docrracnt Recmnbed mounting conditlons (temperiturc. duration.) my be rol up for LEO nd arrays : Reverir voltrgl ior LCD dirpryr : Volrrge beteen Cerm

27、iNlS fonard cumnt at operrtinp tuveratum of 2S *C. with taipcrrtum &rating curve if nectrsrry (HI 9.2) For LfO arrays and LED dlsplrys, iihtw appropriate all diodes *rating (contiweus or averrpc rriuc) Or per dio& pandatory for ringle diode (contlnuour ralw) Yhcm appropriate : Peak fonard cumnt, at

28、&lent tnrpcratwt there appropriate : Total peer dtssipitton at ambient tmptraturr of 25.C. under specified pulse conditions of ZSC. with teiperakre derating CUM f ntCtSSAy (Se 9.2) klue J n. _I X X Information about manufacturers who have components qualified to this detail specification is availabl

29、e in the current CECC O0 200: Oualiffcd Products Lists. CECC 20 001 Issue 2 -2- - Thore e)uracteristin Yrked .rhcrr appropriate In Mis cluiu e n the impcction section dull - For equivalent chrracterstics iven as rltemntives, the cholce should prtfcribly be left cgm to Repeat only claust Mkrs wed, wi

30、th tut. Any additional duractrrlstlcs to be given at appplate plue but without clause ar. Uhen several devices art defined in the sm detrll spclfiutlon, the relevant m1-s should be given on successive lins. there possible avoiding rcpttition of Identical values. he values of specified fowrd cumnt sh

31、all be thc samt for all tests (except for Coot). For bl-colour devices the cturrctmltticr shall k given for each colour. For LOD rmw and Lu) displays. this 4pplIn per dio& (aopt for W). titer be mitted or. if specified, shall then be asumd. 81or the use of the suc etri? speclfiution by dlffemt unufa

32、cturtn or unufu. - Clam CEU - 5.1 s.1.1 5.1.2 5.1.3 5.2 5.3 5.4 5.5 1.6 5.7 5.8 5.9 5.10 5.11 5.12 - Lminous Intensity and matching factor at sprcified fomrd Currrnt (d.c. and/or under specified pulse condltlw) : Hinium value Wert tht device is b be lncorperatrd in a rilti d.vi- display : bxlu value

33、 I(rtshng factor for dlodtt : m - yhtrc appropriate : lmlnous intensity (srne conditions u (my also be given as a curve (see 9.3) Radiation diagram given 4s a cum (see 9.4) vhtm appropriate : kif-lntrnslty rngle Wert appropriate : Risaligrmnt ktwnn optical uis and rchlniul uls Ptak anissIon nve leng

34、th (sue conditions u for 5.1) t hem appmpriate : Sptctral bandwidth s herc ippmpriate : TaPpcrattm cocfficlent of peak dsslon (may alto k given as a curve : UI 9.5) Fomrd voltage (saw conditions U for 5.1) Reverse contimiour (d.c.) mnt at sptcified rrvenr utters apprcpriate : Capacitance under speci

35、fied mtnc fim appropriate : Wtchl tlme at paclffrd fo-rd masud on any enlttlng potnt or on the rihole drvl For arrays rnd displ8yt 1y (hww ly (1-t) for 5.1 it othtr specifitd teqmaturts (TI, Tz) mvt length a volta* VR VOltJQt (V,) and frquency (I) sondltlonr currentTsrin as tor 5.1) - Any particular

36、 lnfotmtlon other than given in box on front page and/or 2.5 of CECC 26 o00 shall k tpectfied here.) -:* 7. ORDERING INFWTION Thc folloving mtninrra infomtlon is messav to ordtr a sptcifc dcvitc, unless othtnist tpccifitd : - prtrisc type nrapkr - CECC reference of detail spulficatlon 4th Issue niak

37、r and/or drtt rhtn reltvant - any other partialars. -3- tftt 20 001 Issue 2 These are given In the following ables, be spccifted at Value is to inserted In the detail specification. values should k given on wccestive lins. &err possble avoiding rrpetition of identicr1 tonditlm and/or values. The cho

38、ice ktmn altemative tests should preferably be left open, unless very sound technkal reasons forMd this. Although such tests arc not strictly equivalent, thcy arc want to achlevc the Saat results which are to Bsscss the correct mnufacture of b device. Altenatlvcr are provided to Uke Into account dif

39、ferent equipnts or acthods of ratumnt urd in varIous countrlrs.) the values and exact test conditions to be Used should Wufred for a given type, and as rcquiird by the rrlevant test in CECC 20 OOO. X sheus nKn SeVerbl devices art Incluled in the sw detail rpccffiution. the relevant condltlms and/or

40、fn this section, rcferencct to clause nrmkrs are made with rcspcct to CECC ZD OOO, unless OthcMSC Itrtcd. - 6RUP A - Lot by lot All tests are non destructive (3.5.6) EWIIUTIOII OR Tal (Ref. 4.3.4/ .) Conditions at 1- or lau 25 C unless othendse stated SUB-GROUP Al Pisuai inspection 1.2.1 SUB-GROUP A

41、a Ron-operative &vices 1 State rrlevant limits kt Note 2 Iv(Z) (here appro- priate) (L-001) displays) (L-001) (for arrays and “F (L-006) IR (L-007) IF (d.c. or pulse) spccificd axis specified lr (d.c. or pulse) specified VR specified 1 SUB-CROUP A3 (here appropriate) I tor f (L45) 1 IF spccifltd cto

42、t (L-008) I VR and f spcclfied IMPECrIW I - LIHITS (see MSESSIQHI Hote 1) X - - Note 1 : The relevant min and mx limits of Grou A are referred to Iater on, In 6r0vps B and C. as - Note 2 : Non operatives are defined IS follob : LSL and USL (lowr/uppcr specificatlon ! init). - VF any volage higher th

43、an 5 tfms the maximua specifid value. - IR any cumnt hlgher than 100 times the mdam specified valut. - wr0nv polarity. - ly(l) any intensity louer than 10 rcd except ff the speclfcd value is lowcr than 100 vcd : In !“ SpccifIed this case i, t t I I 1 Ii - 40 - 70 O + 20 + 40 + 60 + 80 .+ 100 IF (d.c

44、. or under pulse eonddtions) to be specified 3404583 OOl130i.I Ob4 9.5 Change of ip versus tupe ram Typlul values -9- fF to k speclfld . QCC 20 O01 - Irrw 2 3404583 0093305 TTO APPENDIX TO acC 20 001 ENDURANCE TEST CONDITIONS 1. For single diodes tlcctriul operation shall k perforrd at T unb or TaSe = 25 O6 2 10 C with the maxiiaum value of continuous fomd current. 4 = current liiting nsister D.U.T. - kvice under test n diodes. cmn cathode diSpl8y l 1 1, e- a I a l 4 I I n row, I matrix I II column display I l I I 1 I I 8 8 I l l I 4 I * -& - 10 - CECC 20 O01 - Issue 2