EN 60115-9-1-2004 en Fixed resistors for use in electronic equipment Part 9-1 Blank detail specification - Fixed surface mount resistor networks with individually measurable resist.pdf

1、BRITISH STANDARD BS EN 60115-9-1:2004 Fixed resistors for use in electronic equipment Part 9-1: Blank detail specification Fixed surface mount resistor networks with individually measurable resistors Assessment level EZ The European Standard EN 60115-9-1:2004 has the status of a British Standard ICS

2、 31.040.10 BS EN 60115-9-1:2004 This British Standard was published under the authority of the Standards Policy and Strategy Committee on 19 March 2004 BSI 19 March 2004 ISBN 0 580 43577 6 National foreword This British Standard is the official English language version of EN 60115-9-1:2004. It is id

3、entical with IEC 60115-9-1:2003. The UK participation in its preparation was entrusted to Technical Committee EPL/40X, Capacitors and resistors for electronic equipment, which has the responsibility to: A list of organizations represented on this committee can be obtained on request to its secretary

4、. Cross-references The British Standards which implement international or European publications referred to in this document may be found in the BSI Catalogue under the section entitled “International Standards Correspondence Index”, or by using the “Search” facility of the BSI Electronic Catalogue

5、or of British Standards Online. This publication does not purport to include all the necessary provisions of a contract. Users are responsible for its correct application. Compliance with a British Standard does not of itself confer immunity from legal obligations. aid enquirers to understand the te

6、xt; present to the responsible international/European committee any enquiries on the interpretation, or proposals for change, and keep the UK interests informed; monitor related international and European developments and promulgate them in the UK. Summary of pages This document comprises a front co

7、ver, an inside front cover, the EN title page, pages 2 to 11 and a back cover. The BSI copyright notice displayed in this document indicates when the document was last issued. Amendments issued since publication Amd. No. Date CommentsEUROPEAN STANDARD EN 60115-9-1 NORME EUROPENNE EUROPISCHE NORM Feb

8、ruary 2004 CENELEC European Committee for Electrotechnical Standardization Comit Europen de Normalisation Electrotechnique Europisches Komitee fr Elektrotechnische Normung Central Secretariat: rue de Stassart 35, B - 1050 Brussels 2004 CENELEC - All rights of exploitation in any form and by any mean

9、s reserved worldwide for CENELEC members. Ref. No. EN 60115-9-1:2004 E ICS 31.040.10 English version Fixed resistors for use in electronic equipment Part 9-1: Blank detail specification - Fixed surface mount resistor networks with individually measurable resistors - Assessment level EZ (IEC 60115-9-

10、1:2003) Rsistances fixes utilises dans les quipements lectroniques Partie 9-1: Spcification particulire cadre - Rseaux de rsistances fixes monts en surface avec des rsistances mesurables individuellement - Niveau dassurance EZ (CEI 60115-9-1:2003) Festwiderstnde zur Verwendung in Gerten der Elektron

11、ik Teil 9-1: Vordruck fr Bauartspezifikationen - Oberflchenmontierbare Netzwerke aus Festwiderstnden mit einzeln messbaren Widerstnden - Bewertungsstufe EZ (IEC 60115-9-1:2003) This European Standard was approved by CENELEC on 2004-02-01. CENELEC members are bound to comply with the CEN/CENELEC Inte

12、rnal Regulations which stipulate the conditions for giving this European Standard the status of a national standard without any alteration. Up-to-date lists and bibliographical references concerning such national standards may be obtained on application to the Central Secretariat or to any CENELEC m

13、ember. This European Standard exists in three official versions (English, French, German). A version in any other language made by translation under the responsibility of a CENELEC member into its own language and notified to the Central Secretariat has the same status as the official versions. CENE

14、LEC members are the national electrotechnical committees of Austria, Belgium, Cyprus, Czech Republic, Denmark, Estonia, Finland, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia, Lithuania, Luxembourg, Malta, Netherlands, Norway, Poland, Portugal, Slovakia, Slovenia, Spain, Sweden,

15、Switzerland and United Kingdom. Foreword The text of document 40/1345/FDIS, future edition 1 of IEC 60115-9-1, prepared by IEC TC 40, Capacitors and resistors for electronic equipment, was submitted to the IEC-CENELEC parallel vote and was approved by CENELEC as EN 60115-9-1 on 2004-02-01. The follo

16、wing dates were fixed: latest date by which the EN has to be implemented at national level by publication of an identical national standard or by endorsement (dop) 2004-11-01 latest date by which the national standards conflicting with the EN have to be withdrawn (dow) 2007-02-01 Annex ZA has been a

17、dded by CENELEC. _ Endorsement notice The text of the International Standard IEC 60115-9-1:2003 was approved by CENELEC as a European Standard without any modification. _ Page2 EN6011591:2004INTRODUCTION Blank detail specification A blank detail specification is a supplementary document to the secti

18、onal specification and contains requirements for style, layout and minimum content of detail specifications. Detail specifications not complying with these requirements may not be considered as being in accordance with IEC specifications nor shall they be so described. In the preparation of detail s

19、pecifications the content of 1.4 of the sectional specification shall be taken into account. The numbers between square brackets on the first page of the detail specification correspond to the following information which shall be inserted in the position indicated. Identification of the detail speci

20、fication 1 The “International Electrotechnical Commission“ or the National Standards Organization under whose authority the detail specification is drafted. 2 The IEC or National Standards number of the detail specification, date of issue and any further information required by the national system.

21、3 The number and issue number of the IEC or national generic specification. 4 The IEC number of the blank detail specification. Identification of the resistor network 5 A short description of the type of resistor network. 6 Information on typical construction (when applicable). 7 Outline drawing wit

22、h main dimensions which are of importance for interchangeability and/or reference to the national or international documents for outlines. Alternatively, this drawing may be given in an annex to the detail specification. 8 Application or group of applications covered and/or assessment level. 9 Refer

23、ence data on the most important properties, to allow comparison between the various resistor network types. Page3 EN6011591:20041 IEC 60115-9-1-XXX 2 QC 400701XXXXXX IEC 60115-9-1 4 QC 400701 ELECTRONIC COMPONENTS OF ASSESSED QUALITY IN ACCORDANCE WITH: 3 FIXED SURFACE MOUNT RESISTOR NETWORKS WITH 5

24、 INDIVIDUALLY MEASURABLE RESISTORS 6 Outline drawing: (see Table 1) (. angle projection) 7 (Other shapes are permitted within the dimensions given) Assessment level: EZ 8 NOTE For 1 to 9: see previous page. 9 Information on the availability of components qualified to this detail specification is giv

25、en in the IEC QC 001005 Page4 EN6011591:2004FIXED RESISTORS FOR USE IN ELECTRONIC EQUIPMENT Part 9-1: Blank detail specification: Fixed surface mount resistor networks with individually measurable resistors Assessment level EZ 1 General data 1.1 Dimensions, ratings and characteristics Table 1 Styles

26、 related to dimensions, ratings and characteristics Dimensions mm Style Rated element dissipation at 70 C a) W Rated network dissipation at 70 C W Limiting element voltage (DC or AC r.m.s.) V Insulation voltage against ambient V Insulation voltage between neighbouring resistors V LWTABP a)The detail

27、 specification shall specify the conditions under which the rated dissipation applies. Resistance range 1 to Tolerances on rated resistance % Climatic category / Stability class % Limits for change of resistance: for long-term tests ( %R + ) for short-term tests ( %R + ) Temperature coefficient : 10

28、 6 /K 1The preferred values are those of the E24 and E96 series of IEC 60063. Page5 EN6011591:20041.1.1 Derating Resistors covered by this specification are derated according to the following curve: (A suitable curve to be includedin the detail specification) NOTE See also 2.2.3 of the sectional spe

29、cification. 1.2 Recommended method(s) of mounting (to be inserted) (See 1.4.2 of IEC 60115-9.) 1.3 Related documents Generic specification IEC 60115-1:1999, Fixed resistors for use in electronic equipment Part 1: Generic specification Sectional specification IEC 60115-9:2003, Fixed resistors for use

30、 in electronic equipment Part 9: Sectional specification: Fixed surface mount resistor networks with individually measurable resistors 1.4 Marking The marking of the resistors and the package shall be in accordance with the requirements of 2.4 of IEC 60115-1 and 1.4.5 of IEC 60115-9. The details of

31、the marking of the component and packaging shall be given in full in the detail specification. 1.5 Ordering information Orders for resistors covered by this specification shall contain, in clear or in coded form, the following minimum information: a) rated element resistance; b) tolerance on rated r

32、esistance; c) number and issue reference of the detail specification and style reference; d) packaging instructions. 1.6 Certified records of released lots Required/non required. 1.7 Additional information (not for inspection purposes) 1.8 Additional or increased severities or requirements to those

33、specified in the generic and/or sectional specification NOTE Additions or increased requirements should be specified only when essential. Page6 EN6011591:20042 Inspection requirements 2.1 Procedures 2.1.1 For qualification approval, the procedure shall be in accordance with 3.2 of IEC 60115-9. 2.1.2

34、 For quality conformance inspection, the test schedule (Table 2) includes sampling, periodicity, severities and requirements. The formation of inspection lots is covered by 3.3.1 of IEC 60115-9. The following list applies to the test schedules developed in Table 2 and Table 3. a) Subclause numbers o

35、f tests and performance requirements refer to the generic specification, IEC 60115-1, except for resistance change requirements, which shall be selected from Table 3 of IEC 60115-9, as appropriate. b) Number to be tested: sample size as directly allotted to the code letter for IL in Table IIA of IEC

36、 60410 (single sampling plan for normal inspection). c) In these tables: p is the periodicity (in months) n is the sample size c is the acceptance criterion (permitted number of non-conforming items) D indicates a destructive test ND indicates a non-destructive test IL is the inspection level d) 100

37、 % testing shall befollowed by re-inspection by sampling in order to monitor outgoing quality level by non-conforming items per million (ppm). The sampling level shall be established by the manufacturer. For the calculation of 10 6values, any parametric failure shall be counted as a non-conforming i

38、tem. In case one or more non-conforming items occur in a sample, this lot shall be rejected. e) If one non-conforming item is obtained, all the tests of the subgroup shall be repeated on a new sample and then no further non-conforming items are permitted. Release of product may continue during repea

39、t testing. Page7 EN6011591:2004Table 2 Test schedule for quality conformance inspection: lot-by-lot IL n c Subclause number and test (see 2.1.2, list item a of this specification) D or ND Conditions of test (see 2.1.2, list item a of this specification) (see 2.1.2, list item c of this specification)

40、 Performance requirements (see 2.1.2, list item a of this specification) GROUP A INSPECTION (lot-by-lot) Subgroup A0 4.5 Resistance ND 100 % (see 2.1.2, list item d of this specification) As in 4.5.2 Subgroup A1 4.4.1 Visual examination 4.4.2 Dimensions (gauging) ND S-4 1) 0 As in 4.4.1 As specified

41、 in the detail specification GROUP B INSPECTION (lot-by-lot) Subgroup B1 4.7 Voltage proof (insulated resistors only) Voltage proof between neighbouring resistors ND Method: Insulation resistance (insulated resistors only) Voltage: V S-3 1) 0 As in 4.7.3 100 M As in 4.7.3 Subgroup B2 4.17 Solderabil

42、ity D Aging, if applicable S-3 1) 0 As in 4.17.5 Substrate material and spacing: see 2.3.2 of IEC 60115-9 The applied voltage shall be 2,5 times the rated voltage or twice the limiting element voltage, whichever is the less severe Duration: 2 s S-3 1) 0 Subgroup B3 4.31 Mounting 4.13 Overload (in th

43、e mounted state) D Visual examination Resistance No visible damage R ( %R + ) 4.30 Solvent resistance of the marking (if applicable) Solvent: Solvent temperature: Method 1 Rubbing material: cotton wool Recovery: Legible marking 1)See 2.1.2, list item b of this specification. Page8 EN6011591:2004Tabl

44、e 3 Test schedule for quality conformance inspection: periodic Subclause number and test (see 2.1.2, list item a of this specification) D or ND Conditions of test (see 2.1.2, list item a of this specification) Sample size & criterion of acceptability (see 2.1.2, list item c of this specification) Pe

45、rformance requirements (see 2.1.2, list item a of this specification) pn c 1) GROUP C INSPECTION (periodic) Subgroup C1 4.31 Mounting 4.33 Substrate bending test D Substrate material: Resistance 32 00 R (%R + ) 4.33.6 Final Inspection Visual examination No visible damage Subgroup C2 4.18 Resistance

46、to soldering heat 4.29 Component solvent resistance D Visual examination Resistance Solvent: Solvent temperature: Method 2 Recovery: 32 00 As in 4.18.3 R (%R + ) See detail specification Subgroup C3 4.31 Mounting 4.32 Shear 4.19 Rapid change of temperature D Substrate material: Visual examination T

47、A : Lower category temperature T B : Upper category temperature 32 00 No visible damage 4.23 Climatic sequence - Dry heat - Damp heat, cyclic, Test Db, first cycle - Cold - Damp heat, cyclic, Test Db, remaining cycles - DC load Visual examination Resistance No visible damage R (%R + ) Visual examina

48、tion Resistance No visible damage R (%R + ) D3 2 0 0 Subgroup C4 4.31 Mounting 4.25.1 Endurance at 70 C Substrate material: Spacing as in 2.3.2 of IEC 60115-9 Duration: 1 000 h Examination at 48 h, 500 h and 1 000 h: Visual examination Resistance No visible damage R (%R + ) Page9 EN6011591:2004Table 3 Test schedule for quality conformance inspection: periodic (continued) Subclause number and test (see 2.1.2, list item a of this specification) D or ND Conditions of test (see 2.1.2, list item a of this specification) Sam