EN 60679-5-1-1998 en Quartz Crystal Controlled Oscillators of Assessed Quality Part 5-1 Blank Detail Specification - Qualification Approval《经质量评定的石英晶体振荡器 第5-1部分 空白详细规范 合格鉴定 IEC 606.pdf

1、STD-BSI BS EN bOb77-5-L-ENGL 1778 E Lb24bb7 073070b 725 BRITISH STANDARD BS EN 60679-5-1:1998 Quartz crystal I controlled oscillators of assessed quality - Part 5-1: Blank detail specification - Qualification approval 60679-5-1:1998 The Eurom Stanard EN 60679-51:1998 has the status of a British Stan

2、dard ICs 31.140 NO COPYING WITHOUT BSI PERMISSION EXCEPT AS PERMITTED BY COPYRIGHT LAW STD-BSI BS EN bOb79-5-1-ENGL 1798 1b24bb7 073707 bbL m AmdNo. Date BS EN 606796-1:1998 Textaffected This British Standard, having been prepared under the direction of the Electrokhnicai Sector Board, was published

3、 under the authority of the Standards Board and comes into effect on 15 November 1998 6 BSI 1998 National foreword This British Standard is the English language version of EN 6067451:1998. It is identical with IEC 6067451:1998. It supersedes BS EN 169201:1996 which will be withdrawn on 2001-0501. Th

4、e UK participation in its preparation was entrusted to Technical Committee EPI49, Piezoelectric devices for frequency control and selection, which has the responsibility to: - aid enquirers to understand the tea - present to the responsible ink b) IECQ number or customer detail specification number,

5、 issue number and date; and where applicable c) nominal frequency expressed in kilohertz (kHz) or megahertz (MHz); d) product code; e) frequency tolerance(s) and operating temperature range; i) full description of any additional requirements. 5 Certified test records The detail specification shall s

6、tate whether certified test records are mquired/not required in accordance with 3.12 of IEC 60679-1. 6 Additional information (not for inspection purposes) The detail specification may include additional information (which is not normally required to be verified by the inspection procedure) such as

7、circuit diagrams, curves, drawings and notes for the clarification of the detail specification. 7 inspection requirements Clause numbers of tests and performance requirements refer to IEC 60679-1. The ILS and AQLs given in table 1 are the minimum quality levels required and selected from IEC 60410.

8、In this table: p = periodicity (in months); n = sample size; c D = destructive; ND = non-destructive; IL = inspection level; AQL = acceptable quality level. = acceptance criterion (permitted number of defectives); STD-BSI BS EN bOb77-5-1-ENGL 1998 m 1b29bb9 07309L9 BTL m - I = = I - - - * * UI Page

9、7 EN 60679-5-1:1998 Clause number and teat D or Tut conditions IL AOL Pmrformrnte requlrmmonts ND 96 in ND 4.3.1 Visual test A 4.3.1 4.3.1 4.6.2.1 Gross leak test (for 4.6.2.1 4.6.2.1 hermetically sealed enclosures only) reference temperature including offset frequency, 4.5.4 Output frequency at 4.5

10、.4 Frequency tolerance(s) where applicable 4.5.5.1 Frequency at specified 4.5.5.1 Frequency tolerance(s) 4.5.1 1 Frequency adjustment range 4.5.1 1 Minimum or minimum and temperature(s) (where applicable) maximum frequency change characteristics tests 1 to 5 (as applicable) (as applicable) 4.5.23 Fr

11、equency modulation 4.5.23 4.5.23 Tests 1 to 5 proun A in- in o To be conducted on a sampling basis, lot-by-lot 4.5.13 Oscillator output voltage 4.5.13 Minimum and maximum or or voltages 4.5.14 4.5.14 4.5.15 Oscillator output waveform 4.5.15 Waveform as specified or or 4.5.16 4.5.16 4.5.3.1 Oscillato

12、r input power 4.5.3.1 Maximum power or current 4.5.3.3 Oven input power (where 4.5.3.3 Maximum power at switch on applicable) Maximum power after or 4.5.3.2 Oven and oscillator input 4.5.3.2 Maximum power at switch on SybarouD Al ND II 1,5 stabilization power (where applicable) Maximum power after s

13、tabilization IOUP A 2 ND I 1,s 4.5.5.1 Frequency at specified 4.5.5.1 temperature(s) (if not tested 100 %) SubarouD A3 ND I 1,5 Annex B Ageing Annex B to to IEC (when applicable) IEC 60679-5 60679-5 Frequency toierance(s) Slope to be specified PUD 6 insDection I I I I SubarouII 81 ND 4.4.1 Dimension

14、s - Test A -roup 82 ND S4 4,O 4.4.1 4.4.1 S4 4.0 4.6.2.2 Fine leak test 4.6.2.2 4.6.2.1 Gross leak test 4.6.2.1 4.6.2.2 4.6.2.1 STD.BS1 BS EN bOb79-5-3-ENGL 1798 I Lb24bb9 0730935 738 W Test conditions Page 8 EN 60679-6-1:1998 Sample slze Performance and crlteilon of requirement8 acceptibility Table

15、 1 (continued) P“ Clause number and test C To be conducted on a sampling basis, lot-by-lot UbarouD C1 4.4.2 Dimensions - Test B 4.6.3.1 Solderability Test A (for wire terminations) Test B (for surface mounted devices) 4.6.1.1 Tensile and thrust on terminations 4.6.1.2 Flexibiliy of wire terminations

16、 4.6.1.3 Toque test on mounting Final insDect ion 4.3.2 Visual test B 4.6.2.2 Fine leak test (hermetically 4.6.2.1 Gross leak test (hermetically studs sealed enclosures only) waled enclosures only) MrOuD F;1 4.5.6 Frequency/ioad coefficient 4.5.7 Frequencylvoltage coefficient s.ukmuB 4.5.4 Output fr

17、equency at reference temperature 4.6.21 Immersion in cleaning solvents 4.6.5 Rapid change of temperature: thermal shock in air 4.6.3.2 Resistance to soldering heat Test A (for wire terminations) Test B (for surface mounted devices) 4.3.2 Visual test B 4.5.4 Output frequency at 4.5.13 Oscillator outp

18、ut voltage or 4.5.14 reference temperature D ND - D - 4.4.2 4.6.3.1 Test A Test B 4.6.3.1 4.6.1.1 4.6.1.2 4.6.1.3 4.3.2 4.6.2.2 4.6.2.1 4.5.6 4.5.7 4.5.4 4.6.21 4.6.5 4.6.3.2, Test A 4.6.3.2, Test B 4.3.2 4.5.4 4.5.13 or 4.5.14 3 - 3 3 - 8 - 8 - 8 - O - O - O - 4.4.2 4.6.3.1 Test A 4.6.3.1 Test B 4.

19、6.1.1 4.6.1.2 4.6.1.3 4.3.2 4.6.2.2 4.6.2.1 Maximum frequency :hange Maximum frequency :hange Record measurements Marking shall be legible 4.3.2 Maximum frequency change Limits to be specified STD-BSI BS EN bOb79-5-L-ENGL 1798 Lb24bb9 07309Lb b74 E I ;C I Test COfdltlOnE Page 9 EN 60679-5-1:1998 Sim

20、ple rizo and criterion of acceptability Table 1 (continued) mrouo C4 4.7.1 Ageing Clause numbor and bst Pnc ND 380 4.7.1 4.3.3 Visual test C 4.6.2.2 Fine leak test 4.6.2.1 Gross leak test 1.5.4 Output frequency at 1.5.13 Oscillator output voltage 3r 1.5.14 Warour, C5 d reference temperature D NOTE -

21、 This test is not required if the test in subgroup A3 has been performed. - Initial insoection. 4.5.4 Output frequency at 4.6.6 Bump 4.6.7 Vibration 4.6.8 Shock Final insoect ion 4.3.2 Visual test B 4.5.4 Output frequency at 4.5.13 Oscillator output voltage Dr 1.5.14 reference temperature reference

22、temperature Wrow C5 bl Applicable to sealed enclosures only) Ditial insoection . 4.5.4 Output frequency at 4.6.17 Climatic sequence reference temperature Final insoection 4.3.2 Visual test B - D - D Initial insoection 4.5.4 Output frequency at 4.6.18 Damp heat, steady state Final Insoectio n 1.3.2 V

23、isual test B 4.3.3 Visual test C reference temperature 4.5.4 4.6.6 4.6.7 4.6.8 4.3.2 4.5.4 4.5.1 3 or 4.5.14 4.5.4 4.6.17 4.3.2 4.3.3 4.6.2.2 4.6.2.1 4.5.4 4.51 3 or 4.5.14 4.5.4 4.6.18 4.3.2 4.3.3 - 24 - 24 24 8 - O - O - O Porformanco requirements Maximum frequency change Record measurements 4.3.2

24、 Maximum frequency change Limits to be specified Record measurements 4.3.2 4.3.3 4.6.2.2 4.6.2.1 Maximum frequency change Limits to be specified STD-BSI BS EN bOb79-5-1-ENGL 1778 m Lb24bb9 0730937 500 m 4.5.4 Output frequency at 4.5.13 Oscillator output voltage or 4.5.14 siuuYux 4.5.10 Stabilization

25、 time 4.5.5.2 Total frequency excursion 4.5.13 Oscillator output voltage or at temperature extremes 4.5.14 4.5.3.3 Oven input power at reference temperature (where applicable) temperature extremes Page 10 EN 60679-6-1:1998 4.5.4 4.5.13 or 4.5.14 ND 4.5.10 4.5.5.2 4.5.13 or 4.5.14 4.5.3.3 Table 1 (co

26、ncluded) Cliuie numbor and test I I Test conditions I ND I Sample slze and critrrion of atceptablllty Performance requirement6 Maximum frequency change Limits to be specified Maximum time (where applicable) Frequency tolerance(s) Limits to be specified Maximum power STDmBSI BS EN bOb79-5-1-ENGL 1998

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