EN 61000-4-11-2004 en Electromagnetic compatibility (EMC) Part 4-11 Testing and measurement techniques - Voltage dips short interruptions and voltage variations immunity tests《电磁兼容.pdf

1、BRITISH STANDARD BS EN 61000-4-11: 2004 Electromagnetic compatibility (EMC) Part 4-11: Testing and measurement techniques Voltage dips, short interruptions and voltage variations immunity tests The European Standard EN 61000-4-11:2004 has the status of a British Standard ICS 33.100.20 BS EN 61000-4-

2、11:2004 This British Standard was published under the authority of the Standards Policy and Strategy Committee on 26 October 2004 BSI 26 October 2004 ISBN 0 580 44681 6 National foreword This British Standard is the official English language version of EN 61000-4-11:2004. It is identical with IEC 61

3、000-4-11:2004. It supersedes BS EN 61000-4-11:1994 which is withdrawn. The UK participation in its preparation was entrusted by Technical Committee GEL/210, EMC, to Subcommittee GEL/210/8, EMC Low frequency standards, which has the responsibility to: A list of organizations represented on this subco

4、mmittee can be obtained on request to its secretary. Cross-references The British Standards which implement international or European publications referred to in this document may be found in the BSI Catalogue under the section entitled “International Standards Correspondence Index”, or by using the

5、 “Search” facility of the BSI Electronic Catalogue or of British Standards Online. This publication does not purport to include all the necessary provisions of a contract. Users are responsible for its correct application. Compliance with a British Standard does not of itself confer immunity from le

6、gal obligations. aid enquirers to understand the text; present to the responsible international/European committee any enquiries on the interpretation, or proposals for change, and keep the UK interests informed; monitor related international and European developments and promulgate them in the UK.

7、Summary of pages This document comprises a front cover, an inside front cover, the EN title page, pages 2 to 26, an inside back cover and a back cover. The BSI copyright notice displayed in this document indicates when the document was last issued. Amendments issued since publication Amd. No. Date C

8、ommentsEUROPEAN STANDARD EN 61000-4-11 NORME EUROPENNE EUROPISCHE NORM August 2004 CENELEC European Committee for Electrotechnical Standardization Comit Europen de Normalisation Electrotechnique Europisches Komitee fr Elektrotechnische Normung Central Secretariat: rue de Stassart 35, B - 1050 Brusse

9、ls 2004 CENELEC - All rights of exploitation in any form and by any means reserved worldwide for CENELEC members. Ref. No. EN 61000-4-11:2004 E ICS 33.100.20 Supersedes EN 61000-4-11:1994 + A1:2001English version Electromagnetic compatibility (EMC) Part 4-11: Testing and measurement techniques - Vol

10、tage dips, short interruptions and voltage variations immunity tests (IEC 61000-4-11:2004) Compatibilit lectromagntique (CEM) Partie 4-11: Techniques dessai et de mesure - Essais dimmunit aux creux de tension, coupures brves et variations de tension (CEI 61000-4-11:2004) Elektromagnetische Vertrglic

11、hkeit (EMV) Teil 4-11: Prf- und Messverfahren - Prfungen der Strfestigkeit gegen Spannungseinbrche, Kurzzeitunterbrechungen und Spannungsschwankungen (IEC 61000-4-11:2004) This European Standard was approved by CENELEC on 2004-06-01. CENELEC members are bound to comply with the CEN/CENELEC Internal

12、Regulations which stipulate the conditions for giving this European Standard the status of a national standard without any alteration. Up-to-date lists and bibliographical references concerning such national standards may be obtained on application to the Central Secretariat or to any CENELEC member

13、. This European Standard exists in three official versions (English, French, German). A version in any other language made by translation under the responsibility of a CENELEC member into its own language and notified to the Central Secretariat has the same status as the official versions. CENELEC m

14、embers are the national electrotechnical committees of Austria, Belgium, Cyprus, Czech Republic, Denmark, Estonia, Finland, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia, Lithuania, Luxembourg, Malta, Netherlands, Norway, Poland, Portugal, Slovakia, Slovenia, Spain, Sweden, Switz

15、erland and United Kingdom. Foreword The text of document 77A/452/FDIS, future edition 2 of IEC 61000-4-11, prepared by SC 77A, Low frequency phenomena, of IEC TC 77, Electromagnetic compatibility, was submitted to the IEC-CENELEC parallel vote and was approved by CENELEC as EN 61000-4-11 on 2004-06-

16、01. This European Standard replaces EN 61000-4-11:1994 + A1:2001. It constitutes a technical revision in which 1) preferred test values and durations have been added for the different environment classes; 2) the tests for the three-phase systems have been specified. The following dates were fixed: l

17、atest date by which the EN has to be implemented at national level by publication of an identical national standard or by endorsement (dop) 2005-03-01 latest date by which the national standards conflicting with the EN have to be withdrawn (dow) 2007-06-01 Annex ZA has been added by CENELEC. _ Endor

18、sement notice The text of the International Standard IEC 61000-4-11:2004 was approved by CENELEC as a European Standard without any modification. In the official version, for Bibliography, the following notes have to be added for the standards indicated: IEC 61000-2-4 NOTE Harmonized as EN 61000-2-4

19、:2002 (not modified). IEC 61000-4-14 NOTE Harmonized as EN 61000-4-14:1999 (not modified). _ Page2 EN61000411:2004 CONTENTS INTRODUCTION.4 1 Scope.5 2 Normative references5 3 Terms and definitions.5 4 General7 5 Test levels7 6 Test instrumentation11 7 Test set-up13 8 Test procedures.14 9 Evaluation

20、of test results16 10 Test report.17 Annex A (normative) Test circuit details.18 Annex B (informative) Electromagnetic environment classes21 Annex C (informative) Test instrumentation.22 Bibliography.26 Figure 1 Voltage dip - Examples.9 Figure 2 Short interruption.10 Figure 3 Voltage variation11 Figu

21、re 4 Phase-to-neutral and phase-to-phase testing on three-phase systems16 Figure A.1 Circuit for determining the inrush current drive capability of the short interruptions generator.19 Figure A.2 Circuit for determining the peak inrush current requirement of an EUT20 Figure C.1 Schematics of test in

22、strumentation for voltage dips, short interruptions and voltage variations22 Figure C.2 Schematic of test instrumentation for three-phase voltage dips, short interruptions and voltage variations using power amplifier.24 Table 1 Preferred test level and durations for voltage dips. 8 Table 2 Preferred

23、 test level and durations for short interruptions 8 Table 3 Timing of short-term supply voltage variations. 9 Table 4 Generator specifications12 Page3 EN61000411:2004 Annex ZA (normative) Normative references to international publications with their corresponding European publications . 25 INTRODUCT

24、ION IEC 61000 is published in separate parts according to the following structure: Part 1: General General considerations (introduction, fundamental principles) Definitions, terminology Part 2: Environment Description of the environment Classification of the environment Compatibility levels Part 3:

25、Limits Emission limits Immunity limits (in so far as they do not fall under the responsibility of the product committees) Part 4: Testing and measurement techniques Measurement techniques Testing techniques Part 5: Installation and mitigation guidelines Installation guidelines Mitigation methods and

26、 devices Part 6: Generic standards Part 9: Miscellaneous Each part is further subdivided into several parts, published either as International Standards or as technical specifications or technical reports, some of which have already been published as sections. Others will be published with the part

27、number followed by a dash and a second number identifying the subdivision (example: 61000-6-1). Page4 EN61000411:2004 ELECTROMAGNETIC COMPATIBILITY (EMC) Part 4-11: Testing and measurement techniques Voltage dips, short interruptions and voltage variations immunity tests 1 Scope This part of IEC 610

28、00 defines the immunity test methods and range of preferred test levels for electrical and electronic equipment connected to low-voltage power supply networks for voltage dips, short interruptions, and voltage variations. This standard applies to electrical and electronic equipment having a rated in

29、put current not exceeding 16 A per phase, for connection to 50 Hz or 60 Hz a.c. networks. It does not apply to electrical and electronic equipment for connection to 400 Hz a.c. networks. Tests for these networks will be covered by future IEC standards. The object of this standard is to establish a c

30、ommon reference for evaluating the immunity of electrical and electronic equipment when subjected to voltage dips, short interruptions and voltage variations. NOTE Voltage fluctuation immunity tests are covered by IEC 61000-4-14. The test method documented in this part of IEC 61000 describes a consi

31、stent method to assess the immunity of equipment or a system against a defined phenomenon. As described in IEC Guide 107, this is a basic EMC publication for use by product committees of the IEC. As also stated in Guide 107, the IEC product committees are responsible for determining whether this imm

32、unity test standard should be applied or not, and, if applied, they are responsible for defining the appropriate test levels. Technical committee 77 and its sub-committees are prepared to co-operate with product committees in the evaluation of the value of particular immunity tests for their product

33、s. 2 Normative references The following referenced documents are indispensable for the application of this document. For dated references, only the edition cited applies. For undated references, the latest edition of the referenced document (including any amendments) applies. IEC 61000-2-8, Electrom

34、agnetic compatibility (EMC) Part 2-8: Environment Voltage dips and short interruptions on public electric power supply systems with statistical measurement results 3 Terms and definitions For the purpose of this document, the following terms and definitions apply: Page5 EN61000411:2004 3.1 basic EMC

35、 standard standard giving general and fundamental conditions or rules for the achievement of EMC, which are related or applicable to all products and systems and serve as reference documents for product committees NOTE As determined by the Advisory Committee on Electromagnetic Compatibility (ACEC) s

36、ee IEC Guide 107. 3.2 immunity (to a disturbance) the ability of a device, equipment or system to perform without degradation in the presence of an electromagnetic disturbance IEV 161-01-20 3.3 voltage dip a sudden reduction of the voltage at a particular point of an electricity supply system below

37、a specified dip threshold followed by its recovery after a brief interval NOTE 1 Typically, a dip is associated with the occurrence and termination of a short circuit or other extreme current increase on the system or installations connected to it. NOTE 2 A voltage dip is a two-dimensional electroma

38、gnetic disturbance, the level of which is determined by both voltage and time (duration). 3.4 short interruption a sudden reduction of the voltage on all phases at a particular point of an electric supply system below a specified interruption threshold followed by its restoration after a brief inter

39、val NOTE Short interruptions are typically associated with switchgear operations related to the occurrence and termination of short circuits on the system or on installations connected to it. 3.5 residual voltage (of voltage dip) the minimum value of r.m.s. voltage recorded during a voltage dip or s

40、hort interruption NOTE The residual voltage may be expressed as a value in volts or as a percentage or per unit value relative to the reference voltage. 3.6 malfunction the termination of the ability of equipment to carry out intended functions or the execution of unintended functions by the equipme

41、nt 3.7 calibration method to prove that the measurement equipment is in compliance with its specifications NOTE For the purposes of this standard, calibration is applied to the test generator. 3.8 verification set of operations which is used to check the test equipment system (e.g. the test generato

42、r and the interconnecting cables) to demonstrate that the test system is functioning within the specifications given in Clause 6 NOTE 1 The methods used for verification may be different from those used for calibration. NOTE 2 The verification procedure of 6.1.2 is meant as a guide to insure the cor

43、rect operation of the test generator, and other items making up the test set-up that the intended waveform is delivered to the EUT. Page6 EN61000411:2004 4 General Electrical and electronic equipment may be affected by voltage dips, short interruptions or voltage variations of power supply. Voltage

44、dips and short interruptions are caused by faults in the network, primarily short circuits (see also IEC 61000-2-8), in installations or by sudden large changes of load. In certain cases, two or more consecutive dips or interruptions may occur. Voltage variations are caused by continuously varying l

45、oads connected to the network. These phenomena are random in nature and can be minimally characterized for the purpose of laboratory simulation in terms of the deviation from the rated voltage and duration. Consequently, different types of tests are specified in this standard to simulate the effects

46、 of abrupt voltage change. These tests are to be used only for particular and justified cases, under the responsibility of product specification or product committees. It is the responsibility of the product committees to establish which phenomena among the ones considered in this standard are relev

47、ant and to decide on the applicability of the test. 5 Test levels The voltages in this standard use the rated voltage for the equipment (U T ) as a basis for voltage test level specification. Where the equipment has a rated voltage range the following shall apply: if the voltage range does not excee

48、d 20 % of the lower voltage specified for the rated voltage range, a single voltage within that range may be specified as a basis for test level specification (U T ); in all other cases, the test procedure shall be applied for both the lowest and highest voltages declared in the voltage range; guida

49、nce for the selection of test levels and durations is given in IEC 61000-2-8. 5.1 Voltage dips and short interruptions The change between U Tand the changed voltage is abrupt. The step can start and stop at any phase angle on the mains voltage. The following test voltage levels (in % U T ) are used: 0 %, 40 %, 70 % and 80 %, corresponding to dips with residual voltages of 0 %, 40 %, 70 % and 80 %. For voltag