EN 61000-4-20-2010 en Electromagnetic compatibility (EMC) - Part 4-20 Testing and measurement techniques - Emission and immunity testing in transverse electromagnetic (TEM) wavegui.pdf

1、raising standards worldwideNO COPYING WITHOUT BSI PERMISSION EXCEPT AS PERMITTED BY COPYRIGHT LAWBSI Standards PublicationElectromagnetic compatibility (EMC)Part 4-20: Testing and measurement techniques Emission and immunity testing in transverse electromagnetic (TEM) waveguidesBS EN 61000-4-20:2010

2、National forewordThis British Standard is the UK implementation of EN 61000-4-20:2010. It is identical to IEC 61000-4-20:2010. It supersedes BS EN 61000-4-20:2003, which will be withdrawn on 1 October 2013.The UK participation in its preparation was entrusted by Technical Committee GEL/210, EMC - Po

3、licy committee, to Subcommittee GEL/210/12, EMC basic, generic and low frequency phenomena Standardization.A list of organizations represented on this committee can be obtained on request to its secretary.This publication does not purport to include all the necessary provisions of a contract. Users

4、are responsible for its correct application. BSI 2011ISBN 978 0 580 61452 1 ICS 33.100.10; 33.100.20Compliance with a British Standard cannot confer immunity from legal obligations.This British Standard was published under the authority of the Standards Policy and Strategy Committee on 31 March 2011

5、.Amendments issued since publicationAmd. No. Date Text affectedBRITISH STANDARDBS EN 61000-4-20:2010EUROPEAN STANDARD EN 61000-4-20 NORME EUROPENNE EUROPISCHE NORM November 2010 CENELEC European Committee for Electrotechnical Standardization Comit Europen de Normalisation Electrotechnique Europische

6、s Komitee fr Elektrotechnische Normung Management Centre: Avenue Marnix 17, B - 1000 Brussels 2010 CENELEC - All rights of exploitation in any form and by any means reserved worldwide for CENELEC members. Ref. No. EN 61000-4-20:2010 E ICS 33.100.10; 33.100.20 Supersedes EN 61000-4-20:2003 + A1:2007

7、English version Electromagnetic compatibility (EMC) - Part 4-20: Testing and measurement techniques - Emission and immunity testing in transverse electromagnetic (TEM) waveguides (IEC 61000-4-20:2010) Compatibilit lectromagntique (CEM) - Partie 4-20: Techniques dessai et de mesure - Essais dmission

8、et dimmunit dans les guides donde TEM (CEI 61000-4-20:2010) Elektromagnetische Vertrglichkeit (EMV) - Teil 4-20: Prf- und Messverfahren - Messung der Straussendung und Strfestigkeit in transversal-elektromagnetischen (TEM-)Wellenleitern (IEC 61000-4-20:2010) This European Standard was approved by CE

9、NELEC on 2010-10-01. CENELEC members are bound to comply with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this European Standard the status of a national standard without any alteration. Up-to-date lists and bibliographical references concerning such national stand

10、ards may be obtained on application to the Central Secretariat or to any CENELEC member. This European Standard exists in three official versions (English, French, German). A version in any other language made by translation under the responsibility of a CENELEC member into its own language and noti

11、fied to the Central Secretariat has the same status as the official versions. CENELEC members are the national electrotechnical committees of Austria, Belgium, Bulgaria, Croatia, Cyprus, the Czech Republic, Denmark, Estonia, Finland, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia,

12、 Lithuania, Luxembourg, Malta, the Netherlands, Norway, Poland, Portugal, Romania, Slovakia, Slovenia, Spain, Sweden, Switzerland and the United Kingdom. BS EN 61000-4-20:2010EN 61000-4-20:2010 Foreword The text of document 77B/637/FDIS, future edition 2 of IEC 61000-4-20, prepared by SC 77B, Highfr

13、equency phenomena, of IEC TC 77, Electromagnetic compatibility, was submitted to the IEC-CENELECparallel vote and was approved by CENELEC as EN 61000-4-20 on 2010-10-01. This European Standard supersedes EN 61000-4-20:2003 + A1:2007. The main changes with respect to EN 61000-4-20:2003 + A1:2007 are

14、the following: consistency of terms (e.g. test, measurement, etc.) has been improved; clauses covering test considerations, evaluations and the test report have been added; references to large TEM waveguides have been eliminated; a new informative annex has been added to deal with calibration of E-f

15、ield probes. Attention is drawn to the possibility that some of the elements of this document may be the subject ofpatent rights. CEN and CENELEC shall not be held responsible for identify ing any or all such patentrights. The following dates were fixed: latest date by which the EN has to be impleme

16、ntedat national level by publication of an identicalnational standard or by endorsement (dop) 2011-07-01 latest date by which the national standards conflictingwith the EN have to be withdrawn (dow) 2013-10-01 Annex ZA has been added by CENELEC. _ Endorsement notice The text of the International Sta

17、ndard IEC 61000-4-20:2010 was approved by CENELEC as a EuropeanStandard without any modification. In the official version, for Bibliography , the following notes have to be added for the standards indicated: CISPR 20 NOTE Har monized as EN 55020. CISPR 25 NOTE Har monized as EN 55025. IEC 60068-1 NO

18、TE Har monized as EN 60068-1. IEC 60118-13 NOTE Har monized as EN 60118-13. IEC 61967-2 NOTE Har monized as EN 61967-2. IEC 62132-2 NOTE Har monized as EN 62132-2. 11 C ISPR 14 series NOTE Har monized in EN 55014 series (not modified). 23 IEC 61000-2-9 NOTE Har monized as EN 61000-2-9. 42 IEC 61000-

19、4-3 NOTE Har monized as EN 61000-4-3. 44 C ISPR 16-4-2 NOTE Har monized as EN 55016-4-2. _ BS EN 61000-4-20:2010EN 61000-4-20:2010 A nnex ZA (normative) Normativ e references to international publicationswith their correspond ing European publications The following referenced documents are indispens

20、able for the application of this document. For datedreferences, only the edition cited applies. For undated references, the latest edition of the referenceddocument (including any amendments) applies. NOTE When an international publication has been modified by common modification s, indicated by (mo

21、d), the relevant EN /HDapplies. Publication Year Title EN/HD Year IEC 60050-161 - International Electrotechnical Vocabulary(IEV) - Chapter 161: Electromagnetic compatibility - - IEC 61000-2-11 1999 Electromagnetic compatibility (EMC) - Part 2-11: Environment - Classification ofHEMP environments - -

22、IEC 61000-4-23 - Electromagnetic compatibility (EMC) - Part 4-23: Testing and measurementtechniques - Test methods for protectivedevices for HEMP and other radiateddisturbances EN 61000-4-23 - IEC/TR 61000-4-32 - Electromagnetic compatibility (EMC) - Part 4-32: Testing and measurementtechniques - Hi

23、gh-altitude electromagneticpulse (HEMP) simulator compendium - - IEC/TR 61000-5-3 - Electromagnetic compatibility (EMC) - Part 5: Installation and mitigation guidelines - Section 3: HEMP protection concepts - - CISPR 16-1-1 - Specification for radio disturbance andimmunity measuring apparatus and me

24、thods - Part 1-1: Radio disturbance and immunitymeasuring apparatus - Measuring apparatus EN 55016-1-1 - CISPR 16-1-4 - Specification for radio disturbance andimmunity measuring apparatus and methods - Part 1-4: Radio disturbance and immunitymeasuring apparatus - Antennas and testsites for radiated

25、disturbance measurements EN 55016-1-4 - CISPR 16-2-3 2006 Specification for radio disturbance andimmunity measuring apparatus and methods - Part 2-3: Methods of measurement ofdisturbances and immunity - Radiateddisturbance measurements EN 55016-2-31) 2006 CISPR 22 (mod) - Information technology equi

26、pment - Radiodisturbance characteristics - Limits andmethods of measurement EN 55022 - 1) EN 55016-2-3 is superseded by EN 55016-2-3:2010, w hich is based on CISPR 16-2-3:2010. BS EN 61000-4-20:201061000-4-20 IEC:2010 CONTENTS INTRODUCTION. 6 1 Scope and object. 7 2 Normative references 7 3 Terms, d

27、efinitions and abbreviations 8 3.1 Terms and definitions . 8 3.2 Abbreviations .11 4 General . 11 5 TEM waveguide requirements12 5.1 General .12 5.2 General requirements for the use of TEM waveguides 12 5.2.1 TEM mode verification .12 5.2.2 Test volume and maximum EUT size 12 5.2.3 Validation of usa

28、ble test volume 13 5.3 Special requirements and recommendations for certain types of TEM waveguides . .15 5.3.1 Set-up of open TEM waveguides .15 5.3.2 Alternative TEM mode verification for a two-port TEM waveguide . 16 6 Overview of EUT types . 16 6.1 General .16 6.2 Small EUT . .16 6.3 Large EUT.

29、.16 7 Laboratory test conditions . 17 7.1 General .17 7.2 Climatic conditions 17 7.3 Electromagnetic conditions. .17 8 Evaluation and reporting of test results. .17 Annex A (normative) Emission testing in TEM waveguides. 19 Annex B (normative) Immunity testing in TEM waveguides. 40 Annex C (normativ

30、e) HEMP transient testing in TEM waveguides .46 Annex D (informative) TEM waveguide characterization53 Annex E (informative) Calibration method for E-field probes in TEM waveguides .61 Bibliography. 71 Figure A.1 Routing the exit cable to the corner at the ortho-angle and the lower edge of the test

31、volume .30 Figure A.2 Basic ortho-axis positioner or manipulator . . 31 Figure A.3 Three orthogonal axis-rotation positions for emission measurements32 Figure A.4 Twelve-face (surface) and axis orientations for a typical EUT 33 Figure A.5 Open-area test site (OATS) geometry .34 Figure A.6 Two-port T

32、EM cell (symmetric septum) 35 Figure A.7 One-port TEM cell (asymmetric septum) 36 Figure A.8 Stripline (two plates) 38 Figure A.9 Stripline (four plates, balanced feeding) . 39 BS EN 61000-4-20:201061000-4-20 IEC:2010 Figure B.1 Example of test set-up for single-polarization TEM waveguides . . 44 Fi

33、gure B.2 Uniform area calibration points in TEM waveguide . 45 Figure C.1 Frequency domain spectral magnitude between 100 kHz and 300 MHz .52 Figure D.1 Simple waveguide (no TEM mode). .59 Figure D.2 Example waveguides for TEM-mode propagation. 59 Figure D.3 Polarization vector . 59 Figure D.4 Trans

34、mission line model for TEM propagation 59 Figure D.5 One- and two-port TEM waveguides .60 Figure E.1 An example of the measurement points for the validation. 62 Figure E.2 Setup for validation of perturbation . 63 Figure E.3 Setup for measuring net power to a transmitting device 66 Figure E.4 Exampl

35、e of setup for calibration of E-field probe 67 Figure E.5 Setup for calibration of E-field probe by another method . 69 Figure E.6 Equivalent circuit of antenna and measurement apparatus. 70 Table 1 Values K for expanded uncertainty with normal distribution . 15 Table B.1 Uniform area calibration po

36、ints. .42 Table B.2 Test levels 42 Table C.1 Radiated immunity test levels defined in the present standard 52 Table E.1 Calibration frequencies . .63 Table E.2 Calibration field strength level . 64 BS EN 61000-4-20:2010 6 61000-4-20 IEC:2010 INTRODUCTION IEC 61000 is published in separate parts acco

37、rding to the following structure: Part 1: General General considerations (introduction, fundamental principles) Definitions, terminology Part 2: Environment Description of the environment Classification of the environment Compatibility levels Part 3: Limits Emission limits Immunity limits (in so far

38、 as they do not fall under the responsibility of the product committees) Part 4: Testing and measurement techniques Measurement techniques Testing techniques Part 5: Installation and mitigation guidelines Installation guidelines Mitigation methods and devices Part 6: Generic Standards Part 9: Miscel

39、laneous Each part is further subdivided into several parts, published either as International Standards, Technical Specifications or Technical Reports, some of which have already been published as sections. Others are and will be published with the part number followed by a dash and a second number

40、identifying the subdivision (example: IEC 61000-6-1). This part of IEC 61000 is an International Standard which gives emission, immunity and HEMP transient testing requirements. BS EN 61000-4-20:201061000-4-20 IEC:2010 7 ELECTROMAGNETIC COMPATIBILITY (EMC) Part 4-20: Testing and measurement techniqu

41、es Emission and immunity testing in transverse electromagnetic (TEM) waveguides 1 Scope and object This part of IEC 61000 relates to emission and immunity test methods for electrical and electronic equipment using various types of transverse electromagnetic (TEM) waveguides. These types include open

42、 structures (for example, striplines and electromagnetic pulse simulators) and closed structures (for example, TEM cells). These structures can be further classified as one-, two-, or multi-port TEM waveguides. The frequency range depends on the specific testing requirements and the specific TEM wav

43、eguide type. The object of this standard is to describe TEM waveguide characteristics, including typical frequency ranges and EUT-size limitations; TEM waveguide validation methods for EMC tests; the EUT (i.e. EUT cabinet and cabling) definition; test set-ups, procedures, and requirements for radiat

44、ed emission testing in TEM waveguides and test set-ups, procedures, and requirements for radiated immunity testing in TEM waveguides. NOTE Test methods are defined in this standard for measuring the effects of electromagnetic radiation on equipment and the electromagnetic emissions from equipment co

45、ncerned. The simulation and measurement of electromagnetic radiation is not adequately exact for quantitative determination of effects for all end-use installations. The test methods defined are structured for a primary objective of establishing adequate repeatability of results at various test faci

46、lities for qualitative analysis of effects. This standard does not intend to specify the tests to be applied to any particular apparatus or system(s). The main intention of this standard is to provide a general basic reference for all interested product committees of the IEC. For radiated emissions

47、testing, product committees should select emission limits and test methods in consultation with CISPR standards. For radiated immunity testing, product committees remain responsible for the appropriate choice of immunity tests and immunity test limits to be applied to equipment within their scope. T

48、his standard describes test methods that are separate from those of IEC 61000-4-3.12 Normative references The following referenced documents are indispensable for the application of this document. For dated references, only the edition cited applies. For undated references, the latest edition of the

49、 referenced document (including any amendments) applies. IEC 60050(161), International Electrotechnical Vocabulary Chapter 161: Electromagnetic compatibility IEC 61000-2-11:1999, Electromagnetic compatibility (EMC) Part 2-11: Environment Classification of HEMP environments _ 1These other distinct test methods may be used when so specified by product committees, in consultation with CISPR and TC 77. BS