EN 61280-2-3-2009 en Fibre optic communication subsystem test procedures - Part 2-3 Digital systems - Jitter and wander measurements (Incorporating corrigendum March 2010)《光纤通信子系统试.pdf

1、raising standards worldwideNO COPYING WITHOUT BSI PERMISSION EXCEPT AS PERMITTED BY COPYRIGHT LAWBSI Standards PublicationFibre optic communication subsystem test procedures Part 2-3: Digital systems Jitter and wander measurementsBS EN 61280-2-3:2009Incorporating corrigendum March 2010National forew

2、ordThis British Standard is the UK implementation of EN 61280-2-3:2009, incorporating corrigendum March 2010. It is identical to IEC 61280-2-3:2009. It supersedes BS EN 61280-2-5:1998 which is withdrawn.The UK participation in its preparation was entrusted by Technical CommitteeGEL/86, Fibre optics,

3、 to Subcommittee GEL/86/3, Fibre optic systems andactive devices.A list of organizations represented on this subcommittee can be obtained onrequest to its secretary.This publication does not purport to include all the necessary provisions of acontract. Users are responsible for its correct applicati

4、on. BSI 2010ISBN 978 0 580 70898 5ICS 33.180.01Compliance with a British Standard cannot confer immunity fromlegal obligations.This British Standard was published under the authority of the StandardsPolicy and Strategy Committee on 30 April 2010Amendments/corrigenda issued since publicationDate Text

5、 affectedBRITISH STANDARDBS EN 61280-2-3:200930 April 2010 Implementation of CENELEC corrigendum March 2010;Supersession information added to EN forewordEUROPEAN STANDARD EN 61280-2-3 NORME EUROPENNE EUROPISCHE NORM September 2009 CENELEC European Committee for Electrotechnical Standardization Comit

6、 Europen de Normalisation Electrotechnique Europisches Komitee fr Elektrotechnische Normung Central Secretariat: Avenue Marnix 17, B - 1000 Brussels 2009 CENELEC - All rights of exploitation in any form and by any means reserved worldwide for CENELEC members. Ref. No. EN 61280-2-3:2009 E ICS 33.180.

7、01 English version Fibre optic communication subsystem test procedures - Part 2-3: Digital systems - Jitter and wander measurements (IEC 61280-2-3:2009) Procdures dessai des sous-systmes de tlcommunications fibres optiques - Partie 2-3: Systmes numriques - Mesures des gigues et des drapages (CEI 612

8、80-2-3:2009) Prfverfahren fr Lichtwellenleiter-Kommunikationsuntersysteme - Teil: 2-3: Digitale Systeme - Messung von Jitter und Wander (IEC 61280-2-3:2009) This European Standard was approved by CENELEC on 2009-08-01. CENELEC members are bound to comply with the CEN/CENELEC Internal Regulations whi

9、ch stipulate the conditions for giving this European Standard the status of a national standard without any alteration. Up-to-date lists and bibliographical references concerning such national standards may be obtained on application to the Central Secretariat or to any CENELEC member. This European

10、 Standard exists in three official versions (English, French, German). A version in any other language made by translation under the responsibility of a CENELEC member into its own language and notified to the Central Secretariat has the same status as the official versions. CENELEC members are the

11、national electrotechnical committees of Austria, Belgium, Bulgaria, Cyprus, the Czech Republic, Denmark, Estonia, Finland, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia, Lithuania, Luxembourg, Malta, the Netherlands, Norway, Poland, Portugal, Romania, Slovakia, Slovenia, Spain, S

12、weden, Switzerland and the United Kingdom. BS EN 61280-2-3:2009Incorporating corrigendum March 2010EN 61280-2-3:2009 - 2 - Foreword The text of document 86C/885/FDIS, future edition 1 of IEC 61280-2-3, prepared by SC 86C, Fibre optic systems and active devices, of IEC TC 86, Fibre optics, was submit

13、ted to the IEC-CENELEC parallel vote and was approved by CENELEC as EN 61280-2-3 on 2009-08-01. The following dates were fixed: latest date by which the EN has to be implemented at national level by publication of an identical national standard or by endorsement (dop) 2010-05-01 latest date by which

14、 the national standards conflicting with the EN have to be withdrawn (dow) 2012-08-01 Annex ZA has been added by CENELEC. _ Endorsement notice The text of the International Standard IEC 61280-2-3:2009 was approved by CENELEC as a European Standard without any modification. _ BS EN 61280-2-3:2009This

15、 document supersedes EN 61280-2-5:1998. - 3 - EN 61280-2-3:2009 Annex ZA (normative) Normative references to international publications with their corresponding European publications The following referenced documents are indispensable for the application of this document. For dated references, only

16、 the edition cited applies. For undated references, the latest edition of the referenced document (including any amendments) applies. NOTE When an international publication has been modified by common modifications, indicated by (mod), the relevant EN/HD applies. Publication Year Title EN/HD Year IE

17、C 60825-1 -1)Safety of laser products - Part 1: Equipment classification and requirements EN 60825-1 20072)ITU-T Recommendation G.813 -1)Timing characteristics of SDH equipment slave clocks (SEC) - - 1)Undated reference. 2)Valid edition at date of issue. BS EN 61280-2-3:2009 2 CONTENTS 1 Scope.7 1.1

18、 Types of jitter measurements 7 1.2 Types of wander measurements 7 2 Normative references .7 3 Terms and definitions .7 4 General considerations.11 4.1 Jitter generation 11 4.1.1 Timing jitter .11 4.1.2 Alignment jitter 11 4.1.3 Other effects12 4.2 Effects of jitter on signal quality.12 4.3 Jitter t

19、olerance 12 4.4 Waiting time jitter 13 4.5 Wander .14 5 Jitter test procedures14 5.1 General considerations14 5.1.1 Analogue method 14 5.1.2 Digital method .14 5.2 Common test equipment15 5.3 Safety .16 5.4 Fibre optic connections .17 5.5 Test sample 17 6 Jitter tolerance measurement procedure.17 6.

20、1 Purpose 17 6.2 Apparatus17 6.3 BER penalty technique 17 6.3.1 Equipment connection .17 6.3.2 Equipment settings 18 6.3.3 Measurement procedure18 6.4 Onset of errors technique 18 6.4.1 Equipment connection .18 6.4.2 Equipment settings 19 6.4.3 Measurement procedure19 6.5 Jitter tolerance stressed e

21、ye receiver test .20 6.5.1 Purpose.20 6.5.2 Apparatus20 6.5.3 Sinusoidal jitter template technique .20 7 Measurement of jitter transfer function .21 7.1 General .21 7.2 Apparatus21 7.3 Basic technique.22 7.3.1 Equipment connection .22 7.3.2 Equipment settings 22 7.3.3 Measurement procedure22 7.4 Ana

22、logue phase detector technique.23 BS EN 61280-2-3:2009EN 61280-2-3:2009 3 7.4.1 Equipment connections23 7.4.2 Equipment settings 23 7.4.3 Measurement procedure24 7.4.4 Measurement calculations .24 8 Measurement of output jitter .24 8.1 General .24 8.2 Equipment connection .24 8.2.1 Equipment setting

23、s 24 8.2.2 Measurement procedure24 8.2.3 Controlled data25 9 Measurement of systematic jitter 25 9.1 Apparatus25 9.2 Basic technique.25 9.2.1 Equipment connection .25 9.2.2 Equipment settings 26 9.2.3 Measurement procedure26 10 BERT scan technique .27 10.1 Apparatus29 10.2 Basic technique.29 10.2.1

24、Equipment connection .29 10.2.2 Equipment settings 29 10.2.3 Measurement process .29 11 Jitter separation technique .30 11.1 Apparatus31 11.2 Equipment connections .31 11.3 Equipment settings31 11.4 Measurement procedure32 11.4.1 Sampling oscilloscope: 32 11.4.2 Real-time oscilloscope.32 12 Measurem

25、ent of wander .33 12.1 Apparatus33 12.2 Basic technique.33 12.2.1 Equipment connection .33 12.2.2 Equipment settings 34 12.2.3 Measurement procedure35 13 Measurement of wander TDEV tolerance35 13.1 Intent.35 13.2 Apparatus35 13.3 Basic technique.35 13.4 Equipment connection .35 13.4.1 Wander TDEV to

26、lerance measurement for the test signal of EUT 35 13.4.2 Wander TDEV tolerance measurement for timing reference signal of EUT.36 13.5 Equipment settings36 13.6 Measurement procedure37 14 Measurement of wander TDEV transfer 37 14.1 Apparatus37 14.2 Equipment connection .37 BS EN 61280-2-3:2009EN 6128

27、0-2-3:2009 4 14.2.1 Wander TDEV transfer measurement for the test signal of EUT.37 14.2.2 Wander TDEV transfer measurement for timing reference signal of EUT.37 14.3 Equipment settings38 14.4 Measurement procedure38 15 Test results 38 15.1 Mandatory information.38 15.2 Available information.39 Bibli

28、ography40 Figure 1 Jitter generation.11 Figure 2 Example of jitter tolerance13 Figure 3 Jitter and wander generator .15 Figure 4 Jitter and wander measurement .16 Figure 5 Jitter stress generator 16 Figure 6 Jitter tolerance measurement configuration: bit error ratio (BER) penalty technique18 Figure

29、 7 Jitter tolerance measurement configuration: Onset of errors technique 19 Figure 8 Equipment configuration for stressed eye tolerance test.20 Figure 9 Measurement of jitter transfer function: basic technique.22 Figure 10 Measurement of Jitter transfer: analogue phase detector technique .23 Figure

30、11 Output jitter measurement25 Figure 12 Systematic jitter measurement configuration: basic technique 26 Figure 13 Measurement of the pattern-dependent phase sequence xi 27 Figure 14 BERT scan bathtub curves (solid line for low jitter, dashed line for high jitter).28 Figure 15 Equipment setup for th

31、e BERT scan.29 Figure 16 Dual Dirac jitter model31 Figure 17 Equipment setup for jitter separation measurement31 Figure 18 Measurement of time interval error.32 Figure 19 Synchronized wander measurement configuration34 Figure 20 Non-synchronized wander measurement configuration.34 Figure 21 Wander T

32、DEV tolerance measurement configuration for the test signal of EUT 36 Figure 22 Wander TDEV tolerance measurement configuration for the timing signal of EUT 36 Figure 23 Wander TDEV transfer measurement configuration for the test signal of EUT 37 Figure 24 Wander TDEV transfer measurement configurat

33、ion for the timing signal of EUT 38 BS EN 61280-2-3:2009EN 61280-2-3:2009 7 FIBRE OPTIC COMMUNICATION SUBSYSTEM TEST PROCEDURES Part 2-3: Digital systems Jitter and wander measurements 1 Scope This part of IEC 61280 specifies methods for the measurement of the jitter and wander parameters associated

34、 with the transmission and handling of digital signals. 1.1 Types of jitter measurements This standard covers the measurement of the following types of jitter parameters: a) jitter tolerance 1) sinusoidal method 2) stressed eye method b) jitter transfer function c) output jitter d) systematic jitter

35、 e) jitter separation 1.2 Types of wander measurements This standard covers the measurement of the following types of wander parameters: a) non-synchronized wander b) TDEV tolerance c) TDEV transfer d) synchronized wander 2 Normative references The following referenced documents are indispensable fo

36、r the application of this document. For dated references, only the edition cited applies. For undated references, the latest edition of the referenced document (including any amendments) applies. IEC 60825-1, Safety of laser products Part 1: Equipment classification and requirements ITU-T Recommenda

37、tion G.813, Timing characteristics of SDH equipment slave clocks (SEC) 3 Terms and definitions For the purposes of this document, the following terms and definitions apply. NOTE See also IEC 61931. BS EN 61280-2-3:2009EN 61280-2-3:2009 8 3.1 jitter the short-term, non-cumulative, variation in time o

38、f the significant instances of a digital signal from their ideal position in time. Short-term variations in this context are jitter components with a repetition frequency equal to or exceeding 10 Hz 3.2 jitter amplitude the deviation of the significant instance of a digital signal from its ideal pos

39、ition in time NOTE For the purposes of this standard the jitter amplitude is expressed in terms of the unit interval (UI). It is recognized that jitter amplitude may also be expressed in units of time. 3.3 unit interval (UI) the shortest interval between two equivalent instances in ideal positions i

40、n time. In practice this is equivalent to the ideal timing period of the digital signal 3.4 jitter frequency the rate of variation in time of the significant instances of a digital signal relative to their ideal position in time. Jitter frequency is expressed in Hertz (Hz) 3.5 jitter bandwidth the j

41、itter frequency at which the jitter amplitude has decreased by 3dB relative to its maximum value 3.6 alignment jitter jitter created when the timing of a data signal is recovered from the signal itself 3.7 timing jitter jitter present on a timing source 3.8 systematic jitter jitter components which

42、are not random and have a predictable rate of occurrence. Systematic jitter in a digital signal results from regularly recurring features in the digital signal, such as frame alignment data, and justification control data. This is sometimes referred to as deterministic jitter and is composed of peri

43、odic uncorrelated jitter and data dependent jitter 3.9 periodic uncorrelated jitter a form of systematic jitter that occurs at a regular rate, but is uncorrelated to the data when the data pattern repeats. Periodic uncorrelated jitter will be the same independent of which edge in a pattern is observ

44、ed over time. Sources of periodic uncorrelated jitter include switching power supplies phase modulating reference clocks or any form of periodic phase modulation of clocks that control data rates 3.10 inter-symbol interference jitter caused by bandwidth limitations in transmission channels. If the c

45、hannel bandwidth is low, signal transitions may not reach full amplitude before transitioning to a different logic state. Starting at a level closer to the midpoint between logic states, the time at which the signal edge then crosses a specific amplitude threshold can be early compared to consecutiv

46、e identical digits which have reached full amplitude and then switch to the other logic state BS EN 61280-2-3:2009EN 61280-2-3:2009 9 3.11 duty cycle distortion occurs when the duration of a logic 1 (0-1-0) is different from the duration of a logic 0 (1-0-1). For example, if the logic 1 has a longer

47、 duration, rising edges will occur early relative to falling edges, compared to their ideal locations in time 3.12 data dependent jitter represents jitter that is correlated to specific bits in a repeating data pattern. That is, when a data pattern repeats, the jitter on any given signal edge will m

48、anifest itself in the same way for any repetition of the pattern. It is due to either duty cycle distortion and/or inter-symbol interference 3.13 waiting time jitter applies to plesiochronous multiplexing and is defined as the jitter caused by the varying delay between the demand for justification a

49、nd its execution 3.14 jitter tolerance maximum jitter amplitude that a digital receiver can accept for a given penalty or alternatively without the addition of a given number of errors to the digital signal. The maximum jitter amplitude tolerated is generally dependent on the frequency of the jitter 3.15 jitter generation process of adding jitter impairment to a data signal 3.16 input jitter magnitude of the jitter occurring at a hierarchical interface or the in