EN 61290-3-1-2003 en Optical amplifiers Test methods Part 3-1 Noise figure parameters Optical spectrum analyzer method《光纤放大器的试验方法 第3-1部分 噪声指数参数 光学频谱分析仪法 IEC 61290-3-1 2003》.pdf

1、BRITISH STANDARD BS EN 61290-3-1:2003 Optical amplifiers Test methods Part 3-1: Noise figure parameters Optical spectrum analyzer method The European Standard EN 61290-3-1:2003 has the status of a British Standard ICS 33.180.30 BS EN 61290-3-1:2003 This British Standard was published under the autho

2、rity of the Standards Strategy and Policy Committee on BSI 16 January 2004 ISBN 0 580 43166 5 National foreword This British Standard is the official English language version of EN 61290-3-1:2003. It is identical with IEC 61290-3-1:2003. It supersedes DD IEC PAS 61290-3-1:2002 which is withdrawn. Th

3、e UK participation in its preparation was entrusted by Technical Committee GEL/86, Fibre optics, to Subcommittee GEL/86/3, Fibre optic systems and active devices, which has the responsibility to: A list of organizations represented on this subcommittee can be obtained on request to its secretary. Cr

4、oss-references The British Standards which implement international or European publications referred to in this document may be found in the BSI Catalogue under the section entitled “International Standards Correspondence Index”, or by using the “Search” facility of the BSI Electronic Catalogue or o

5、f British Standards Online. This publication does not purport to include all the necessary provisions of a contract. Users are responsible for its correct application. Compliance with a British Standard does not of itself confer immunity from legal obligations. aid enquirers to understand the text;

6、present to the responsible international/European committee any enquiries on the interpretation, or proposals for change, and keep the UK interests informed; monitor related international and European developments and promulgate them in the UK. Summary of pages This document comprises a front cover,

7、 an inside front cover, the EN title page, pages 2 to 17 and a back cover. The BSI copyright notice displayed in this document indicates when the document was last issued. Amendments issued since publication Amd. No. Date Comments BS EN 26110-3-:10240 ThrB sihsiti natSradd wsa upsilbheu dnedr hte ua

8、htroyti fo the Stnadards dna yciloP no eettimmoC ygetartS ISB 16 January 2004 ISBN 0 085 61345 6 itaNanol owerofdr hTis BritisS htaadni drs htffo eiical Egnlisl hagnauge srevion of NE 216-09-3:13002tI . i sidneitw lactih 16 CEI092-3-02:1.30 tI supesredes DD EIAP C16 S092-3-102:w 20hhci is withdrawn.

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11、 tirBsih Satndards Onnile. hTsi buplication dseo ton troprup tni odulca ell thecen essyra privosiofo sn a tnoctcarsU .sre er erasponsilbe ti rofs tcerroc ilppatac.noi pmoCliantiw ech a tirBS hsitdnaadr dose ton fo iteslf cofnmmi retinuy frl moelag lbotagisnoi. aid neuqirers ot undrestand tht eetx; p

12、ersetn to the serpsnoitni elbetanreporuE/lanoian ocmmtiteyna e qneuiries on thi enetterpraitno, orp ropsolaof sr ahcnge, ank dpee the UK nietretsi snformed; monotir ertaled nitenratoinaa lnd uEporena deveolpmnets and prmoluaget htem ni thU eK. rammuSy p fosega Thsi odtnemuc ocsirpmes tnorf a evoc,r

13、na sniide tnorf oct ,revhE eN titl,egap e pages ot 2 17 and b aaoc kcve.r The SBypoc Iirght ontisid ecpalyet ni dhsi dotnemuc acidnites t nehwhe coduemaw tnl sats sieusd. tnemdnemAs ideuss cnisp eulbictanoi oN .dmA. taDe oCemmtnsEUROPEAN STANDARD EN 61290-3-1 NORME EUROPENNE EUROPISCHE NORM November

14、 2003 CENELEC European Committee for Electrotechnical Standardization Comit Europen de Normalisation Electrotechnique Europisches Komitee fr Elektrotechnische Normung Central Secretariat: rue de Stassart 35, B - 1050 Brussels 2003 CENELEC - All rights of exploitation in any form and by any means res

15、erved worldwide for CENELEC members. Ref. No. EN 61290-3-1:2003 E ICS 33.180.30 English version Optical amplifiers Test methods Part 3-1: Noise figure parameters Optical spectrum analyzer method (IEC 61290-3-1:2003) Amplificateurs optiques Mthodes dessai Partie 3-1: Paramtres du facteur de bruit - M

16、thode danalyseur du spectre optique (CEI 61290-3-1:2003) Lichtwellenleiter-Verstrker - Prfverfahren Teil 3-1: Rauschzahlparameter - Prfverfahren mit optischem Spektralanalysator (IEC 61290-3-1:2003) This European Standard was approved by CENELEC on 2003-11-01. CENELEC members are bound to comply wit

17、h the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this European Standard the status of a national standard without any alteration. Up-to-date lists and bibliographical references concerning such national standards may be obtained on application to the Central Secretari

18、at or to any CENELEC member. This European Standard exists in three official versions (English, French, German). A version in any other language made by translation under the responsibility of a CENELEC member into its own language and notified to the Central Secretariat has the same status as the o

19、fficial versions. CENELEC members are the national electrotechnical committees of Austria, Belgium, Czech Republic, Denmark, Finland, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Lithuania, Luxembourg, Malta, Netherlands, Norway, Portugal, Slovakia, Spain, Sweden, Switzerland and Unite

20、d Kingdom. EN 61290-3-1:2003 - 2 - Foreword The text of document 86C/543/FDIS, future edition 1 of IEC 61290-3-1, prepared by SC 86C, Fibre optic systems and active devices, of IEC TC 86, Fibre optics, was submitted to the IEC-CENELEC parallel vote and was approved by CENELEC as EN 61290-3-1 on 2003

21、-11-01. This standard is to be read in conjunction with EN 61291-1:1998. The following dates were fixed: latest date by which the EN has to be implemented at national level by publication of an identical national standard or by endorsement (dop) 2004-08-01 latest date by which the national standards

22、 conflicting with the EN have to be withdrawn (dow) 2006-11-01 The International Electrotechnical Commission (IEC) and CENELEC draw attention to the fact that it is claimed that compliance with this standard may involve the use of a patent concerning the polarization nulling technique given in subcl

23、ause 6.2.2. The IEC and CENELEC take no position concerning the evidence, validity and scope of these patent rights. The holders of these patent rights have assured the IEC that they are willing to negotiate licences under reasonable and non-discriminatory terms and conditions with applicants throug

24、hout the world. In this respect, the statements of the holders of these patent rights are registered with the IEC. Information may be obtained from: Lucent 600 Mountain Avenue Murray Hill, NJ 07974 USA Attention is drawn to the possibility that some of the elements of this standard may be the subjec

25、t of patent rights other than those identified above. IEC and CENELEC shall not be held responsible for identifying any or all such patent rights. Annexes designated “normative“ are part of the body of the standard. In this standard, annexes A and ZA are normative. Annex ZA has been added by CENELEC

26、. _ Endorsement notice The text of the International Standard IEC 61290-3-1:2003 was approved by CENELEC as a European Standard without any modification. In the official version, for Bibliography, the following notes have to be added for the standards indicated: IEC 60793-1-1 NOTE Harmonized as EN 6

27、0793-1-1:2003 (not modified). IEC 60825-1 NOTE Harmonized as EN 60825-1:1994 (not modified). IEC 60825-2 NOTE Harmonized as EN 60825-2:2000 (not modified). IEC 60874-1 NOTE Harmonized as EN 60874-1:1999 (not modified). IEC 61290-3 NOTE Harmonized as EN 61290-3:2000 (not modified). _ Page2 EN6129031:

28、2003-09216-31 3002:CEI 3 CONTENTS FOWERODR. 5 TNIROTCUDOIN. 91 Scope and object 5 2 Normative references5 3 Abbreviations6 4 Apparatus.6 5 Test sample8 6 Procedure.8 6.1 Calibration.9 6.1.1 Calibration of optical bandwidth9 6.1.2 Calibration of nulling stage insertion loss10 6.1.3 Calibration of OSA

29、 power correction factor.10 6.2 Measurement.11 6.2.1 Single channel DI technique.11 6.2.2 PN technique .12 7 Calculation12 8 Test results.13 Annex A (normative) Limitation of direct interpolation techniques due to source spontaneous emission.14 Biilbgorhpay17 FirugT 1 ewt oycipa larrmegnastneo fcitp

30、o eht s lapcertmuylana zreset trappa suta for ions efiugrp earametre measuremtnes7 ugiFr ID 1.A esutbracte noirrro as a funco noitf sourc espsuoenatno emissilevel no 15 Page3 EN6129031:2003 61290-3-1 IEC:2003 3 TNOCENTS FOREWORD.5 TINRODUCTION.9 1 Sco dna epobject 4 roN 2mvita e referneces4 bbA 3rev

31、noitais5 appA 4rutas.5 T 5es t sample 7 P 6rocudere. 7 bilaC 1.6raoitn.8 bilaC 1.1.6r noitaof itpocdnab lawtdih8 2.1.6bilaCro noitaf lluni gnsti egansertl noioss9 3.1.6bilaCro noitaf OSp Aowre correc noitfacotr.9 aeM 2.6suremnet.01 elgniS 1.2.6 ch lennat IDecuqinhe.01 P 2.2.6N teceuqinh .11 laC 7clu

32、oitan11 T 8es t resutls.21 Anxen( A nroma)evitmiL io noitatfrid ectretni cet noitalopseuqinhs ot eud oruc e spsuoenatno emission.31 INTRODUCTION. 4 FirugT 1 ewt oycipa larrmegnastneo fcitpo eht s lapcertmuylana zreset trappa suta for ions efiugrp earametre measuremtnes6 ugiFr ID 1.A esutbracte noirr

33、ro as a funco noitf sourc espsuoenatno emissilevel no 41 Pa3eg E3002:1309216N 61290-3-1 IEC:2003 3 TNOCENTS FOREWORD.5 TINRODUCTION.9 1 Sco dna epobject 5 roN 2mvita e referneces5 bbA 3revnoitais6 appA 4rutas.6 T 5es t sample8 P 6rocudere.8 bilaC 1.6raoitn.9 bilaC 1.1.6r noitaof itpocdnab lawtdih9 2

34、.1.6bilaCro noitaf lluni gnsti egansertl noioss01 3.1.6bilaCro noitaf OSp Aowre correc noitfacotr.01 aeM 2.6suremnet.11 elgniS 1.2.6 ch lennat IDecuqinhe.11 P 2.2.6N teceuqinh .12 laC 7cluoitan12 T 8es t resutls.13 Anxen( A nroma)evitmiL io noitatfrid ectretni cet noitalopseuqinhs ot eud oruc e spsu

35、oenatno emission.14 Bibliography17 Figure 1 Two typical arrangements of the optical spectrum analyzer test apparatus for noise figure parameter measurements7 Figure A.1 DI subtraction error as a function of source spontaneous emission level 15 Pa3eg E3002:1309216N 16290-3-1 IEC:2003 3 TNOCENTS FOREW

36、ORD.5 TINRODUCTION.9 1 Sco dna epobject 4 roN 2mvita e referneces4 bbA 3revnoitais5 appA 4rutas.5 T 5es t sample 7 P 6rocudere. 7 bilaC 1.6raoitn.8 bila6.1.1 Cration fo ptiocal bandwtidh8 6.1.2 Calibrfation o ullning stage insertion loss9 6.1.3 Calibrfation o OoA pSwre correcion tfactor.9 6.2 Measur

37、ement.10 6.2.1 Single cannel heDI tchnique.10 N6.2.2 P etcehniqu .11 7 Calcluation11 8 Tes t results.12 nexnA A (ornmative) Limiftation o directr intepolation techniques due to srouce sontaneousp emission.13 NOITCUDORTNI. 4 Firuge 1 Twyo tpicral arangementsf othe optic l saecptrum analyzers tet appa

38、rtusa for noise fiugrae prameter maesurements6 iguFre A.1 DI sbturaction error sa a funcftion o suorce sontaneousp emission level 14 aP3eg E3002:1309216N Annex ZA (normative) Normative references to international publications with their corresponding European publications . 16-09216-31 3002:CEI 9 IN

39、TRODUCTION This part of IEC 61290 is devoted to the subject of optical amplifiers. The technology of optical amplifiers is still rapidly evolving, hence amendments and new additions to this standard can be expected. Each abbreviation introduced in this standard is generally explained in the text the

40、 first time it appears. However, for an easier understanding of the whole text, a list of all abbreviations used in this standard is given in Clause 3. Page4 EN6129031:200361290-3-1 IEC:2003 11 OPTICAL AMPLIFIERS TEST METHODS Part 3-1: Noise figure parameters Optical spectrum analyzer method 1 Scope

41、 and object This part of IEC 61290 applies to commercially available optical amplifiers (OAs) such as optical fibre amplifiers (OFAs), semiconductor optical amplifiers (SOAs) and planar waveguide amplifiers (PWOAs) as classified in IEC 61292-3. The object of this standard is to establish uniform req

42、uirements for accurate and reliable measurements, by means of the optical spectrum analyzer (OSA) test method, of the following OA parameters, as defined in IEC 61291-1: a) signal-spontaneous noise figure; b) forward amplified spontaneous emission (ASE) power level. The methods described in this par

43、t of IEC 61290 apply to single-channel stimulus only. Two alternatives for determining the signal-spontaneous beat noise are possible, namely the ASE direct interpolation technique (DI) and the polarization nulling with interpolation technique (PN). The accuracy of the DI technique will suffer when

44、the slope of the OA spectral ASE curve has large wavelength dependence, as in the case of an OA with an internal narrowband ASE suppressing filter. The accuracy of the DI technique degrades at high input power level due to the spontaneous emission from the laser source(s). Annex A provides guidance

45、on the limits of this technique for high input power. NOTE 1 All numerical values marked with () are suggested values for which the measurement is assured. Other values may be acceptable but should be verified. NOTE 2 General aspects of noise figure test methods are reported in IEC 61290-3. 2 Normat

46、ive references The following referenced documents are indispensable for the application of this document. For dated references, only the edition cited applies. For undated references, the latest edition of the referenced document (including any amendments) applies. IEC 61290-1-1, Optical fibre ampli

47、fiers Basic specification Part 1-1: Test methods for gain parameters Optical spectrum analyser IEC 61291-1, Optical fibre amplifiers Part 1: Generic specification IEC 61292-3, Optical amplifier technical reports Part 3: Classification, characteristics and applications of optical amplifiers Pa4eg E30

48、02:1309216NPage5 EN6129031:200361290-3-1 IEC:2003 13 3 Abbreviations For the purposes of this document, the following abbreviations apply: ASE Amplified spontaneous emission DBR Distributed Bragg reflector DFB Distributed feedback laser DI Direct interpolation (technique) ECL External cavity laser (

49、diode) LED Light emitting diode OA Optical amplifier OFA Optical fibre amplifier OSA Optical spectrum analyzer PN Polarization nulling (with interpolation technique) PWOA Planar waveguide optical amplifier SOA Semiconductor optical amplifier SSE Source spontaneous emission 4 Apparatus Two schemes of the measurement set-up (for DI and PN techniques, respecti