EN 61788-15-2011 en Superconductivity - Part 15 Electronic characteristic measurements - Intrinsic surface impedance of superconductor films at microwave frequencies《超导性 第15部分 电子特性.pdf

1、raising standards worldwideNO COPYING WITHOUT BSI PERMISSION EXCEPT AS PERMITTED BY COPYRIGHT LAWBSI Standards PublicationSuperconductivityPart 15: Electronic characteristic measurements Intrinsic surface impedance of superconductor films at microwave frequenciesBS EN 61788-15:2011Incorporating corr

2、igendum March 2012National forewordThis British Standard is the UK implementation of EN 61788-15:2011. It is identical to IEC 61788-15:2011.The UK participation in its preparation was entrusted to Technical Committee L/-/90 Super Conductivity.A list of organizations represented on this committee can

3、 be obtained on request to its secretary.This publication does not purport to include all the necessary provisions of a contract. Users are responsible for its correct application. The British Standards Institution 2012Published by BSI Standards Limited 2012ISBN 978 0 580 78739 3 ICS 17.220.20; 29.0

4、50Compliance with a British Standard cannot confer immunity from legal obligations.This British Standard was published under the authority of the Standards Policy and Strategy Committee on 29 February 2012.Amendments/corrigenda issued since publicationAmd. No. Date Text affectedBRITISH STANDARDBS EN

5、 61788-15:201131 March 2012 Missing CENELEC pages insertedEUROPEAN STANDARD EN 61788-15 NORME EUROPENNE EUROPISCHE NORM December 2011 CENELEC European Committee for Electrotechnical Standardization Comit Europen de Normalisation Electrotechnique Europisches Komitee fr Elektrotechnische Normung Manag

6、ement Centre: Avenue Marnix 17, B - 1000 Brussels 2011 CENELEC - All rights of exploitation in any form and by any means reserved worldwide for CENELEC members. Ref. No. EN 61788-15:2011 E ICS 29.050 English version Superconductivity - Part 15: Electronic characteristic measurements - Intrinsic surf

7、ace impedance of superconductor films at microwave frequencies (IEC 61788-15:2011) Supraconductivit - Partie 15: Mesures de caractristiques lectroniques - Impdance de surface intrinsque de films supraconducteurs aux frquences micro-ondes (CEI 61788-15:2011) Supraleitfhigkeit - Teil 15: Messungen der

8、 elektronischen Charakteristik - Oberflchenimpedanz von Supraleiterschichten bei Mikrowellenfrequenzen (IEC 61788-15:2011) This European Standard was approved by CENELEC on 2011-11-28. CENELEC members are bound to comply with the CEN/CENELEC Internal Regulations which stipulate the conditions for gi

9、ving this European Standard the status of a national standard without any alteration. Up-to-date lists and bibliographical references concerning such national standards may be obtained on application to the CEN-CENELEC Management Centre or to any CENELEC member. This European Standard exists in thre

10、e official versions (English, French, German). A version in any other language made by translation under the responsibility of a CENELEC member into its own language and notified to the CEN-CENELEC Management Centre has the same status as the official versions. CENELEC members are the national elect

11、rotechnical committees of Austria, Belgium, Bulgaria, Croatia, Cyprus, the Czech Republic, Denmark, Estonia, Finland, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia, Lithuania, Luxembourg, Malta, the Netherlands, Norway, Poland, Portugal, Romania, Slovakia, Slovenia, Spain, Sweden

12、, Switzerland and the United Kingdom. BS EN 61788-15:2011 EN 61788-15:2011 Foreword The text of document 90/280/FDIS, future edition 1 of IEC 61788-15, prepared by IEC/TC 90 “Superconductivity“ was submitted to the IEC-CENELEC parallel vote and approved by CENELEC as EN 61788-15:2011. The following

13、dates are fixed: latest date by which the document has to be implemented at national level by publication of an identical national standard or by endorsement (dop) 2012-08-28 latest date by which the national standards conflicting with the document have to be withdrawn (dow) 2014-11-28 Attention is

14、drawn to the possibility that some of the elements of this document may be the subject of patent rights. CENELEC and/or CEN shall not be held responsible for identifying any or all such patent rights. Endorsement notice The text of the International Standard IEC 61788-15:2011 was approved by CENELEC

15、 as a European Standard without any modification. BS EN 61788-15:2011 EN 61788-15:2011 Annex ZA (normative) Normative references to international publications with their corresponding European publications The following referenced documents are indispensable for the application of this document. For

16、 dated references, only the edition cited applies. For undated references, the latest edition of the referenced document (including any amendments) applies. NOTE When an international publication has been modified by common modifications, indicated by (mod), the relevant EN/HD applies. Publication Y

17、ear Title EN/HD Year IEC 60050-815 2000 International Electrotechnical Vocabulary (IEV) - Part 815: Superconductivity - - IEC 61788-7 2006 Superconductivity - Part 7: Electronic characteristic measurements - Surface resistance of superconductors at microwave frequencies EN 61788-7 2006 61788-15 IEC:

18、2011 CONTENTS FOREWORD 4 INTRODUCTION . 6 1 Scope . . 7 2 Normative references . 7 3 Terms and definitions . 7 4 Requirements . 8 5 Apparatus . 9 5.1 Measurement equipment . 9 5.2 Measurement apparatus . 9 5.3 Dielectric rods . 13 5.4 Superconductor films and copper cavity . 14 6 Measurement procedu

19、re . 14 6.1 Set-up . 14 6.2 Measurement of the reference level. 14 6.3 Measurement of the RSof oxygen-free high purity copper . 14 6.4 Determination of the effective RSof superconductor films and tan of standard dielectric rods . 17 6.5 Determination of the penetration depth 18 6.6 Determination of

20、the intrinsic surface impedance . 20 7 Uncertainty of the test method . . 21 7.1 Measurement of unloaded quality factor . 21 7.2 Measurement of loss tangent. . 21 7.3 Temperature . 22 7.4 Specimen and holder support structure . . 22 8 Test Report 22 8.1 Identification of test specimen . . 22 8.2 Rep

21、ort of the intrinsic ZSvalues . 22 8.3 Report of the test conditions 22 Annex A (informative) Additional information relating to clauses 1 to 8 . . 24 Annex B (informative) Uncertainty considerations . 41 Bibliography . 45 Figure 1 Schematic diagram for the measurement equipment for the intrinsic ZS

22、of HTS films at cryogenic temperatures 10 Figure 2 Schematic diagram of a dielectric resonator with a switch for thermal connection . 10 Figure 3 Typical dielectric resonator with a movable top plate . 11 Figure 4 Switch block for thermal connection . 12 Figure 5 Dielectric resonator assembled with

23、a switch block for thermal connection 13 Figure 6 A typical resonance peak. Insertion attenuation IA, resonant frequency f0 and half power bandwidth f3dBare defined . 16 Figure 7 Reflection scattering parameters S11and S2218 Figure 8 Definitions for terms in Table 5 . 22 Figure A.1 Schematic diagram

24、 for the measurement system . 24 Figure A.2 A motion stage using step motors . 25 BS EN 61788-15:201161788-15 IEC:2011 Figure A.3 Cross-sectional view of a dielectric resonator . 26 Figure A.4 A diagram for simplied cross-sectional view of a dielectric resonator . 30 Figure A.5 Mode chart for a sapp

25、hire resonator . . 33 Figure A.6 Frequency response of the sapphire resonator . 34 Figure A.7 QUversus temperature for the TE021and the TE012modes of the sapphire resonator with 360 nm-thick YBCO films . . 35 Figure A.8 The resonant frequency f0 versus temperature for the TE021and TE012modes of the

26、sapphire resonator with 360 nm-thick YBCO films . 35 Figure A.9 The temperature dependence of the RSeof YBCO films with the thicknesses of 70 nm to 360 nm measured at 40 GHz . 36 Figure A.10 The temperature dependence of efor the YBCO films with the thicknesses of 70 nm and 360 nm measured at 40 GHz

27、 . . 36 Figure A.11 The penetration depths of the 360 nm-thick YBCO film measured at 10 kHz by using the mutual inductance method and at 40 GHz by using sapphire resonator . 37 Figure A.12 The temperature dependence of the intrinsic surface resistance RSof YBCO films with the thicknesses of 70 nm to

28、 360 nm measured at 40 GHz . 37 Figure A.13 Comparison of the temperature-dependent value of each term in Equation (A.35) for the TE021mode of the standard sapphire resonator . 38 Figure A.14 Comparison of the temperature-dependent value of each term in Equation (A.35) for the TE012mode of the stand

29、ard sapphire resonator . 38 Figure A.15 Temperature dependence of uncertainty in the measured intrinsic RSof YBCO films 39 Table 1 Typical dimensions of a sapphire rod 14 Table 2 Typical dimensions of OFHC cavities and HTS films . 14 Table 3 Geometrical factors and filling factors calculated for the

30、 standard sapphire resonator . 17 Table 4 Specifications of vector network analyzer . 21 Table 5 Type B uncertainty for the specifications on the sapphire rod . 21 Table A.1 Geometrical factors and filling factors calculated for the standard sapphire resonator . 31 Table B.1 Output signals from two

31、nominally identical extensometers . 42 Table B.2 Mean values of two output signals . 42 Table B.3 Experimental standard deviations of two output signals 42 Table B.4 Standard uncertainties of two output signals 42 Table B.5 Coefficient of variations of two output signals. 43 BS EN 61788-15:2011 4 61

32、788-15 IEC:2011 INTERNATIONAL ELECTROTECHNICAL COMMISSION _ SUPERCONDUCTIVITY Part 15: Electronic characteristic measurements Intrinsic surface impedance of superconductor films at microwave frequencies FOREWORD 1) The International Electrotechnical Commission (IEC) is a worldwide organization for s

33、tandardization comprising all national electrotechnical committees (IEC National Committees). The object of IEC is to promote international co-operation on all questions concerning standardization in the electrical and electronic fields. To this end and in addition to other activities, IEC publishes

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35、cipate in this preparatory work. International, governmental and non-governmental organizations liaising with the IEC also participate in this preparation. IEC collaborates closely with the International Organization for Standardization (ISO) in accordance with conditions determined by agreement bet

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37、ons have the form of recommendations for international use and are accepted by IEC National Committees in that sense. While all reasonable efforts are made to ensure that the technical content of IEC Publications is accurate, IEC cannot be held responsible for the way in which they are used or for a

38、ny misinterpretation by any end user. 4) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publications transparently to the maximum extent possible in their national and regional publications. Any divergence between any IEC Publication and the correspondin

39、g national or regional publication shall be clearly indicated in the latter. 5) IEC itself does not provide any attestation of conformity. Independent certification bodies provide conformity assessment services and, in some areas, access to IEC marks of conformity. IEC is not responsible for any ser

40、vices carried out by independent certification bodies. 6) All users should ensure that they have the latest edition of this publication. 7) No liability shall attach to IEC or its directors, employees, servants or agents including individual experts and members of its technical committees and IEC Na

41、tional Committees for any personal injury, property damage or other damage of any nature whatsoever, whether direct or indirect, or for costs (including legal fees) and expenses arising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC Publications. 8) Attention

42、 is drawn to the Normative references cited in this publication. Use of the referenced publications is indispensable for the correct application of this publication. 9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of patent rights. IEC sh

43、all not be held responsible for identifying any or all such patent rights. International Standard IEC 61788-15 has been prepared by IEC technical committee 90: Superconductivity. The text of this standard is based on the following documents: FDIS Report on voting 90/280/FDIS 90/283/RVD Full informat

44、ion on the voting for the approval of this standard can be found in the report on voting indicated in the above table. This publication has been drafted in accordance with the ISO/IEC Directives, Part 2. BS EN 61788-15:201161788-15 IEC:2011 5 A list of all parts of the IEC 61788 series, published un

45、der the general title Superconductivity, can be found on the IEC website. The committee has decided that the contents of this publication will remain unchanged until the stability date indicated on the IEC web site under “http:/webstore.iec.ch“ in the data related to the specific publication. At thi

46、s date, the publication will be reconfirmed, withdrawn, replaced by a revised edition, or amended. IMPORTANT The colour inside logo on the cover page of this publication indicates that it contains colours which are considered to be useful for the correct understanding of its contents. Users should t

47、herefore print this document using a colour printer. BS EN 61788-15:2011 6 61788-15 IEC:2011 INTRODUCTION Since the discovery of high TCsuperconductors (HTS), extensive research has been performed worldwide on electronic applications and large-scale applications with HTS filter subsystems based on Y

48、Ba2Cu3O7-(YBCO) having already been commercialized 11. The merits of using HTS films for microwave devices such as resonators, filters, antennas, delay lines, etc., include i) possibility of microwave losses from HTS films being extremely low and ii) no signal dispersion on transmission lines made o

49、f HTS films due to extremely low microwave surface resistance (RS) 2 and frequency-independent penetration depth () of HTS films, respectively. In this regard, when it comes to designing HTS-based microwave devices, it is important to measure the surface impedance (ZS) of HTS films with ZS= RS+ jXSand XS= 0 (here and 0denote the angular frequency and the permeability of vacuum, respectively, XS, the surface react