ImageVerifierCode 换一换
格式:PDF , 页数:38 ,大小:1,004.42KB ,
资源ID:721187      下载积分:10000 积分
快捷下载
登录下载
邮箱/手机:
温馨提示:
如需开发票,请勿充值!快捷下载时,用户名和密码都是您填写的邮箱或者手机号,方便查询和重复下载(系统自动生成)。
如填写123,账号就是123,密码也是123。
特别说明:
请自助下载,系统不会自动发送文件的哦; 如果您已付费,想二次下载,请登录后访问:我的下载记录
支付方式: 支付宝扫码支付 微信扫码支付   
注意:如需开发票,请勿充值!
验证码:   换一换

加入VIP,免费下载
 

温馨提示:由于个人手机设置不同,如果发现不能下载,请复制以下地址【http://www.mydoc123.com/d-721187.html】到电脑端继续下载(重复下载不扣费)。

已注册用户请登录:
账号:
密码:
验证码:   换一换
  忘记密码?
三方登录: 微信登录  

下载须知

1: 本站所有资源如无特殊说明,都需要本地电脑安装OFFICE2007和PDF阅读器。
2: 试题试卷类文档,如果标题没有明确说明有答案则都视为没有答案,请知晓。
3: 文件的所有权益归上传用户所有。
4. 未经权益所有人同意不得将文件中的内容挪作商业或盈利用途。
5. 本站仅提供交流平台,并不能对任何下载内容负责。
6. 下载文件中如有侵权或不适当内容,请与我们联系,我们立即纠正。
7. 本站不保证下载资源的准确性、安全性和完整性, 同时也不承担用户因使用这些下载资源对自己和他人造成任何形式的伤害或损失。

版权提示 | 免责声明

本文(EN 62319-1-2005 en Polymeric thermistors - Directly heated positive step function temperature coefficient Part 1 Generic specification《聚合热敏电阻 直接加热的阳极阶跃函数温度系数 第1部分 总规范》.pdf)为本站会员(unhappyhay135)主动上传,麦多课文库仅提供信息存储空间,仅对用户上传内容的表现方式做保护处理,对上载内容本身不做任何修改或编辑。 若此文所含内容侵犯了您的版权或隐私,请立即通知麦多课文库(发送邮件至master@mydoc123.com或直接QQ联系客服),我们立即给予删除!

EN 62319-1-2005 en Polymeric thermistors - Directly heated positive step function temperature coefficient Part 1 Generic specification《聚合热敏电阻 直接加热的阳极阶跃函数温度系数 第1部分 总规范》.pdf

1、BRITISH STANDARDBS EN62319-1:2005Polymeric thermistors Directly heated positive step function temperature coefficient Part 1: Generic specificationICS 31.040.30g49g50g3g38g50g51g60g44g49g42g3g58g44g55g43g50g56g55g3g37g54g44g3g51g40g53g48g44g54g54g44g50g49g3g40g59g38g40g51g55g3g36g54g3g51g40g53g48g44

2、g55g55g40g39g3g37g60g3g38g50g51g60g53g44g42g43g55g3g47g36g58Incorporating March 2009 corrigendumNational forewordThis British Standard is the UK implementation of EN 62319-1:2005. It is identical with IEC 62319-1:2005, incorporating corrigendum The start and finish of text introduced or altered by c

3、orrigendum is indicated in the text by tags. Text altered by IEC corrigendum March 2009 is indicated in the text by .The UK participation in its preparation was entrusted by Technical Committee EPL/40X, Capacitors and resistors for electronic equipment.A list of organizations represented on this com

4、mittee can be obtained on request to its secretary.This publication does not purport to include all the necessary provisions of a contract. Users are responsible for its correct application.Compliance with a British Standard cannot confer immunity from legal obligations.BS EN 62319-1:2005This Britis

5、h Standard was published under the authority of the Standards Policy and Strategy Committee on 30 June 2000 BSI 2009Amendments/corrigenda issued since publicationDate Comments 31 December 2009 Implementation of IEC corrigendum March 2009ISBN 978 0 580 67556 0March 2009. EUROPEAN STANDARD EN 62319-1

6、NORME EUROPENNE EUROPISCHE NORM March 2005 CENELEC European Committee for Electrotechnical Standardization Comit Europen de Normalisation Electrotechnique Europisches Komitee fr Elektrotechnische Normung Central Secretariat: rue de Stassart 35, B - 1050 Brussels 2005 CENELEC - All rights of exploita

7、tion in any form and by any means reserved worldwide for CENELEC members. Ref. No. EN 62319-1:2005 E ICS 31.040.30 English version Polymeric thermistors - Directly heated positive step function temperature coefficient Part 1: Generic specification (IEC 62319-1:2005) Thermistances polymres - Coeffici

8、ent de temprature positif de fonction chelon chauffage direct Partie 1: Spcification gnrique (CEI 62319-1:2005) Temperaturabhngige Widerstnde aus Polymerwerkstoffen - Direkt geheizte temperaturabhngige Widerstnde mit positivem Temperaturkoeffizienten Teil 1: Fachgrundspezifikation (IEC 62319-1:2005)

9、 This European Standard was approved by CENELEC on 2005-02-01. CENELEC members are bound to comply with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this European Standard the status of a national standard without any alteration. Up-to-date lists and bibliographical

10、 references concerning such national standards may be obtained on application to the Central Secretariat or to any CENELEC member. This European Standard exists in three official versions (English, French, German). A version in any other language made by translation under the responsibility of a CEN

11、ELEC member into its own language and notified to the Central Secretariat has the same status as the official versions. CENELEC members are the national electrotechnical committees of Austria, Belgium, Cyprus, Czech Republic, Denmark, Estonia, Finland, France, Germany, Greece, Hungary, Iceland, Irel

12、and, Italy, Latvia, Lithuania, Luxembourg, Malta, Netherlands, Norway, Poland, Portugal, Slovakia, Slovenia, Spain, Sweden, Switzerland and United Kingdom. Foreword The text of document 40/1505/FDIS, future edition 1 of IEC 62319-1, prepared by IEC TC 40, Capacitors and resistors for electronic equi

13、pment, was submitted to the IEC-CENELEC parallel vote and was approved by CENELEC as EN 62319-1 on 2005-02-01. The following dates were fixed: latest date by which the EN has to be implemented at national level by publication of an identical national standard or by endorsement (dop) 2005-12-01 lates

14、t date by which the national standards conflicting with the EN have to be withdrawn (dow) 2008-02-01 Annex ZA has been added by CENELEC. _ Endorsement notice The text of the International Standard IEC 62319-1:2005 was approved by CENELEC as a European Standard without any modification. _ 2 EN 62319-

15、1:2005BS EN 62319-1:2005CONTENTS 1 General5 1.1 Scope5 1.2 Normative references 5 2 Technical data6 2.1 Units and symbols .6 2.2 Terms and definitions6 2.3 Preferred values 9 2.4 Marking .10 3 Quality assessment procedures 10 3.1 General .10 3.2 Primary stage of manufacture 10 3.3 Subcontracting 11

16、3.4 Structurally similar components .11 3.5 Qualification approval procedures 11 3.6 Rework and repair .17 3.7 Release for delivery.17 3.8 Certified test records of released lots.18 3.9 Delayed delivery18 3.10 Alternative test methods 18 3.11 Manufacture outside the geographical limits of IECQ NSIs1

17、8 3.12 Unchecked parameters 18 4 Test and measurement procedures .18 4.1 Standard conditions for testing.18 4.2 Drying and recovery.19 4.3 Visual inspection and check of dimensions.19 4.4 Zero power resistance .20 4.5 Insulation resistance (for insulated types only) .20 4.6 Voltage proof (for insula

18、ted types only) 21 4.7 Robustness of terminations (for leaded types only).21 4.8 Soldering.22 4.9 Mounting .22 4.10 Rapid change of temperature.23 4.11 Climatic sequence .23 4.12 Cycle life testing24 4.13 Trip endurance 26 4.14 Trip current .27 4.15 Hold current 27 4.16 Residual current and power di

19、ssipation 28 4.17 Time-to-trip .28 4.18 Cold environmental electrical cycling29 4.19 Thermal runaway.29 3 EN 62319-1:2005BS EN 62319-1:2005Annex A (normative) Fixed sample size test schedules for qualification approval.30 Annex B (normative) Vibration-, bump-, shock-, shear-, substrate bending test3

20、1 B.1 Vibration 31 B.2 Bump .31 B.3 Shock.32 B.4 Shear (adhesion) test .32 B.5 Substrate bending test32 Figure 1 Test schedule flow chart.14 Figure 2 Circuit for Trip endurance .27 Table 1 Fixed sample size test schedule for qualification approval of Polymeric PTC thermistors for current limitation,

21、 assessment level EZ.15 Table 2 Quality conformance inspection for lot-by-lot inspection16 Table 3 Quality conformance inspection for periodic testing 17 Table 4 Loading weight for wire terminations 21Table 5 Number of cycles.24 4 Annex ZA (normative) Normative references to international publicatio

22、ns with their corresponding European publications. 33 EN 62319-1:2005BS EN 62319-1:2005POLYMERIC THERMISTORS DIRECTLY HEATED POSITIVE STEP FUNCTION TEMPERATURE COEFFICIENT Part 1: Generic specification 1 General 1.1 Scope This part of IEC 62319 prescribes terms and methods of test for polymeric posi

23、tive temperature coefficient thermistors, insulated and non-insulated types, typically intended for use in current limiting and overcurrent protection applications. It establishes standard terms, inspection procedures and methods of test for use in detail specifications for Qualification Approval an

24、d for Quality Assessment Systems for electronic components. 1.2 Normative references The following referenced documents are indispensable for the application of this document. For dated references, only the edition cited applies. For undated references, the latest edition of the referenced document

25、(including any amendments) applies. IEC 60027-1: Letter symbols to be used in electrical technology Part 1: General IEC 60050: International Electrotechnical Vocabulary IEC 60068-1: Environmental testing Part 1: General and guidance IEC 60068-2-6: Environmental testing Part 2: Tests Test Fc: Vibrati

26、on (sinusoidal) IEC 60068-2-14: Environmental testing Part 2: Tests Test N: Change of temperature IEC 60068-2-20: Environmental testing Part 2: Tests Test T: Soldering IEC 60068-2-21: Environmental testing Part 2-21: Tests Test U: Robustness of terminations and integral mounting devices IEC 60068-2-

27、27: Environmental testing Part 2: Tests Test Ea and guidance: Shock IEC 60068-2-29: Environmental testing Part 2: Tests Test Eb and guidance: Bump IEC 60068-2-45: Environmental testing Part 2: Tests Test XA and guidance: Immersion in cleaning solvents IEC 60294: Measurement of the dimensions of a cy

28、lindrical component having two axial terminations IEC 60410: Sampling plans and procedures for inspection by attributes. 5 EN 62319-1:2005BS EN 62319-1:2005IEC 60617-DB: 20011Graphical symbols for diagrams IECQ 001003: IEC Quality Assessment System for Electronic Components Guidance documents IECQ 0

29、01002-3: IEC Quality Assessment System for Electronic Components Rules of Procedure Part 3: Approval procedures ISO 1000: SI units and recommendations for the use of their multiples and of certain other units 2 Technical data 2.1 Units and symbols Units, graphical symbols, letter symbols and termino

30、logy shall, whenever possible, be taken from the following documents: IEC 60027 IEC 60050 IEC 60617 ISO 1000 The following subclauses contain additional terminology applicable to thermistors. Where further items are required they shall be derived in accordance with the principles of the documents li

31、sted above. 2.2 Terms and definitions For the purposes of this document, the following terms and definitions apply. 2.2.1 thermistor thermally sensitive semiconducting resistor whose primary function is to exhibit an important change in electrical resistance with a change in body temperature 2.2.2 p

32、ositive temperature coefficient thermistor thermistor in which the resistance increases with increasing temperature throughout the useful part of its characteristic. The PTC thermistors covered in this specification typically exhibit a very sharp increase in resistance over a narrow temperature rang

33、e 2.2.3 directly heated positive temperature coefficient thermistor thermistor in which the change in temperature is obtained either by the flow of current through the thermo-sensitive element, or by a change in ambient temperature, or by a combination of both of these means _ 1“DB” refers to the IE

34、C on-line database. 6 EN 62319-1:2005BS EN 62319-1:20052.2.4 zero power resistance RTvalue of the resistance of a PTC thermistor, at a given temperature, under such conditions that the change in resistance due to the internal generation of heat is negligible with respect to the total error of measur

35、ement NOTE Any resistance value of a PTC thermistor is dependent on the value and the mode of the applied voltage (AC or DC). 2.2.5 nominal zero power resistance Rnzero power resistance used as a reference value for which the following conditions should be given in the detail specification: a) refer

36、ence temperature, preferably 25 C b) applied voltage (DC or AC) 2.2.6 resistance/temperature characteristics relationship between the zero power resistance of a thermistor and the temperature of the thermosensitive element when measured under specified reference conditions 2.2.7 upper category tempe

37、rature UCT maximum ambient operating temperature of the thermistor 2.2.8 lower category temperature LCT minimum ambient operating temperature of the thermistor 2.2.9 trip event event of rapid increasing resistance of the thermistor in response to an overcurrent surge 2.2.10 minimum initial resistanc

38、e Rminminimum resistance of the thermistor 2.2.11 maximum initial resistance Rmaxmaximum resistance of the thermistor before its initial trip event 2.2.12 maximum resistance 1 h after tripping R1maxfor leaded thermistors the maximum resistance of the thermistor 1 h after its first trip event; for su

39、rface mount thermistors, the maximum resistance of the thermistor 1 h after reflow 2.2.13 maximum voltage Umaxmaximum AC or DC voltage which may be applied to the thermistor 7 EN 62319-1:2005BS EN 62319-1:20052.2.14 operating temperature range at maximum voltage range of ambient temperatures at whic

40、h the thermistor can operate at the maximum voltage 2.2.15 isolation voltage (applicable only to insulated thermistors) maximum peak voltage which may be applied under continuous operating conditions between any of the thermistor terminations and any conducting surface 2.2.16 maximum current Imaxval

41、ue of current for the operating temperature range, which should not be exceeded 2.2.17 residual current Iresvalue of current in the tripped thermistor at a specified ambient temperature (preferably 25 C) under steady state conditions; the applied voltage is the maximum voltage unless otherwise speci

42、fied 2.2.18 trip current Itlowest current which will cause the thermistor to trip to its high resistance state at a specified temperature (preferably 25 C) and within a time specified in the detail specification 2.2.19 hold current Ihthe maximum current at specified ambient temperature, preferably 2

43、5 C, which will not cause the trip event 2.2.20 fault current Ifaultcurrent used when measuring time to trip 2.2.21 power dissipation Pdproduct of the current flowing through a device and the voltage across it, under steady state conditions; the applied voltage is the maximum voltage unless otherwis

44、e specified 2.2.22 time-to-trip ttripunder specified ambient conditions, starting from the time the fault current (Ifault) is applied, the time-to-trip is the time required for a device to switch into the tripped state 2.2.23 insulated thermistors thermistors capable of meeting the requirements of t

45、he insulation resistance and voltage proof tests when specified in the test schedule 8 EN 62319-1:2005BS EN 62319-1:20052.3 Preferred values 2.3.1 Climatic categories The thermistors covered by this specification are classified into climatic categories according to the general rules given in the ann

46、ex to IEC 60068-1. The detail specification prescribes the appropriate category. 2.3.2 Void2.3.3 Shock test severities Test severities given in detail specifications shall preferably be the following: Test Ea (IEC 60068-2-27) Pulse shape: Half sine Acceleration: 500 m/s2Pulse duration: 11 ms. Severi

47、ty: 3 successive shocks in each axis direction per specimen. Separate specimens to be used for each axis (6 shocks total per specimen). NOTE The shock and bump tests are normally specified as alternatives. 2.3.4 Vibration severities Test severities given in the detail specifications shall preferably

48、 be selected from the following: Test Fc (IEC 60068-2-6) Frequency range: 10 Hz to 55 Hz or 10 Hz to 500 Hz Amplitude: 0,75 mm or 100 m/s2(whichever is the less severe) Sweep endurance: Total duration 6 h. Thermistors shall be mounted by their normal means, in such a manner that there shall be no pa

49、rasitic vibration. During vibration testing there shall be no interruption in electrical continuity greater than 0,5 ms. 9 EN 62319-1:2005 BS EN 62319-1:20052.4 Marking 2.4.1 General The following shall be clearly marked on the thermistor in the following order of precedence as space permits: a) values of the primary characteristics appropriate to the application of the thermistor to be specified in the detail specification. When these valu

copyright@ 2008-2019 麦多课文库(www.mydoc123.com)网站版权所有
备案/许可证编号:苏ICP备17064731号-1