EN 62431-2008 en Reflectivity of electromagnetic wave absorbers in millimetre wave frequency - Measurement methods《毫米波频率中电磁波的吸收发射率 测量方法》.pdf

1、Reflectivity of electromagneticwave absorbers in millimetrewave frequency MeasurementmethodsBS EN 62431:2008raising standards worldwideNO COPYING WITHOUT BSI PERMISSION EXCEPT AS PERMITTED BY COPYRIGHT LAWBSI British StandardsNational forewordThis British Standard is the UK implementation of EN 6243

2、1:2008. It is identical to IEC 62431:2008. It supersedes DD IEC/PAS 62431:2005 which iswithdrawn.The UK participation in its preparation was entrusted by Technical CommitteeEPL/46, Cables, wires and waveguides, radio frequency connectors and accessories for communication and signalling, to Subcommit

3、tee EPL/46/2,Radio frequency connectors and waveguides.A list of organizations represented on this committee can be obtained onrequest to its secretary.This publication does not purport to include all the necessary provisions of acontract. Users are responsible for its correct application. BSI 2009I

4、SBN 978 0 580 58258 5ICS 17.220.20; 33.120.10Compliance with a British Standard cannot confer immunity fromlegal obligations.Amendments issued since publicationAmd. No. Date Text affectedBRITISH STANDARDBS EN 62431:2008This British Standard was published under the authority of the StandardsPolicy an

5、d Strategy Committee on February 2009.2 8EUROPEAN STANDARD EN 62431 NORME EUROPENNE EUROPISCHE NORM December 2008 CENELEC European Committee for Electrotechnical Standardization Comit Europen de Normalisation Electrotechnique Europisches Komitee fr Elektrotechnische Normung Central Secretariat: rue

6、de Stassart 35, B - 1050 Brussels 2008 CENELEC - All rights of exploitation in any form and by any means reserved worldwide for CENELEC members. Ref. No. EN 62431:2008 E ICS 19.080; 17.020; 29.120.10 English version Reflectivity of electromagnetic wave absorbers in millimetre wave frequency - Measur

7、ement methods (IEC 62431:2008) Rflectivit des absorbeurs dondes lectromagntiques dans la plage des frquences millimtriques - Mthodes de mesure (CEI 62431:2008) Verfahren zur Messung des Reflexionsvermgens von Absorbern fr elektromagnetische Wellen im Millimeterwellen-Frequenzbereich (IEC 62431:2008)

8、 This European Standard was approved by CENELEC on 2008-11-01. CENELEC members are bound to comply with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this European Standard the status of a national standard without any alteration. Up-to-date lists and bibliographical

9、 references concerning such national standards may be obtained on application to the Central Secretariat or to any CENELEC member. This European Standard exists in three official versions (English, French, German). A version in any other language made by translation under the responsibility of a CEN

10、ELEC member into its own language and notified to the Central Secretariat has the same status as the official versions. CENELEC members are the national electrotechnical committees of Austria, Belgium, Bulgaria, Cyprus, the Czech Republic, Denmark, Estonia, Finland, France, Germany, Greece, Hungary,

11、 Iceland, Ireland, Italy, Latvia, Lithuania, Luxembourg, Malta, the Netherlands, Norway, Poland, Portugal, Romania, Slovakia, Slovenia, Spain, Sweden, Switzerland and the United Kingdom. BS EN 62431:2008EN 62431:2008 2 Foreword The text of document 46F/65/CDV, future edition 1 of IEC 62431, prepared

12、 by SC 46F, R.F. and microwave passive components, of IEC TC 46, Cables, wires, waveguides, R.F. connectors, R.F. and microwave passive components and accessories, was submitted to the IEC-CENELEC Parallel Unique Acceptance Procedure and was approved by CENELEC as EN 62431 on 2008-11-01. The followi

13、ng dates were fixed: latest date by which the EN has to be implemented at national level by publication of an identical national standard or by endorsement (dop) 2009-08-01 latest date by which the national standards conflicting with the EN have to be withdrawn (dow) 2011-11-01 Annex ZA has been add

14、ed by CENELEC. _ Endorsement notice The text of the International Standard IEC 62431:2008 was approved by CENELEC as a European Standard without any modification. _ BS EN 62431:2008 3 EN 62431:2008 Annex ZA (normative) Normative references to international publications with their corresponding Europ

15、ean publications The following referenced documents are indispensable for the application of this document. For dated references, only the edition cited applies. For undated references, the latest edition of the referenced document (including any amendments) applies. NOTE When an international publi

16、cation has been modified by common modifications, indicated by (mod), the relevant EN/HD applies. Publication Year Title EN/HD Year ISO/IEC 17025 - 1)General requirements for the competence of testing and calibration laboratories EN ISO/IEC 17025 2005 2)1)Undated reference. 2)Valid edition at date o

17、f issue. BS EN 62431:2008 2 62431 IEC:2008(E) CONTENTS FOREWORD.5 1 Scope.7 2 Normative references .7 3 Terms, definitions and acronyms 7 3.1 Terms and definitions 7 3.2 Acronyms and symbols10 4 Specimen .12 4.1 Specimen specification12 4.2 Reference metal plate .12 4.2.1 Material and thickness.12 4

18、.2.2 Surface roughness 12 4.2.3 Flatness 12 4.2.4 Size and shape12 4.3 Reference specimen for calibration .12 5 Specimen holder 13 6 Measurement equipment 13 6.1 Type of network analyzer 13 6.2 Antenna 13 6.2.1 Horn antenna.13 6.2.2 Lens antenna.13 6.3 Amplifier13 6.4 Cable 14 7 Measurement conditio

19、n 14 7.1 Temperature and environment.14 7.2 Warming up of measurement equipment14 7.3 Electromagnetic environment 14 8 Calibration of measurement system and measurement conditions 14 8.1 Calibration of measurement system.14 8.2 Measurement conditions14 8.2.1 Dynamic range 14 8.2.2 Setting up of the

20、network analyzer for keeping adequate dynamic range.14 9 Horn antenna method .15 9.1 Measurement system 15 9.1.1 Configuration of the measurement system .15 9.1.2 Horn antenna.16 9.1.3 Specimen holder16 9.1.4 Mounting of the specimen18 9.1.5 Antenna stand .18 9.2 Measurement conditions18 9.2.1 Measu

21、rement environment 18 9.2.2 Measuring distance .18 9.2.3 Size of specimen .18 9.3 Measurement procedures 19 10 Dielectric lens antenna method focused beam method 20 10.1 Outline 20 BS EN 62431:200862431 IEC:2008(E) 3 10.2 Measurement system 20 10.2.1 Transmitting and receiving antennas .20 10.2.2 Fo

22、cused beam horn antenna .21 10.2.3 Specimen size .22 10.2.4 Reference metal plate size 22 10.2.5 Specimen holder22 10.2.6 Method of fixing the specimen and the reference metal plate.23 10.3 Measurement procedures 23 11 Dielectric lens antenna method parallel beam method .25 11.1 Principle25 11.1.1 O

23、utline 25 11.1.2 Parallel EM wave beam formed using a EM wave lens.25 11.2 Measurement system 26 11.2.1 Composition of measurement system 26 11.2.2 Dielectric lens antenna 29 11.3 Specimen 29 11.3.1 General .29 11.3.2 Reference metal plate .29 11.3.3 Size of specimen .30 11.4 Measurement procedures

24、30 11.4.1 Normal incidence.30 11.4.2 Oblique Incidence30 12 Test report31 Annex A (informative) Reflection and scattering from metal plate Horn antenna method .33 Annex B (informative) Reflectivity of reference specimens using horn antenna method38 Annex C (informative) Specifications of commerciall

25、y available antennas 39 Annex D (normative) Calibration using VNA.42 Annex E (informative) Dynamic range and measurement errors .51 Annex F (informative) Enlargement of dynamic range Calibration by isolation .53 Annex G (informative) Relative permittivity of styrofoam and foamed polyethylene based o

26、n foam ratio 54 Annex H (informative) Calculation of Fraunhofer region Horn antenna method.55 Figure 1 Definition of reflectivity.10 Figure 2 Configuration of the measurement system normal incidence (S11).15 Figure 3 Configuration of the measurement system oblique incidence (S21) 16 Figure 4 Mountin

27、g method of specimen17 Figure 5 The mechanism of adjusting azimuth and elevation17 Figure 6 Measurement system for normal incidence (side view).20 Figure 7 Measurement system for oblique incidence (top view)21 Figure 8 Structure of a dielectric lens antenna .22 Figure 9 Structure of specimen holder2

28、3 Figure 10 EM wave propagation using a horn antenna and a dielectric lens .26 Figure 11 Block diagram of the measurement system 27 Figure 12 A measurement system for normal incidence .28 BS EN 62431:2008 4 62431 IEC:2008(E) Figure 13 Measurement system for oblique incidence 28 Figure 14 Position of

29、 a shielding plate .29 Figure 15 Items to be mentioned in a test report 32 Figure A.1 Reflection from the reference metal plate versus measurement distance between the antenna and the metal plate33 Figure A.2 Reflectivity of reference metal plate versus size34 Figure A.3 Reflectivity of reference me

30、tal plate at 40 GHz .35 Figure A.4 Reflectivity of reference metal plate with cross section of 200 mm 200 mm at 40 GHz35 Figure A.5 Analysis of reflection from a metal plate37 Figure B.1 Reflectivity of a 200 mm 200 mm silica-glass plate in millimetre wave frequency38 Figure C.1 Representative speci

31、fications of a horn antenna.39 Figure C.2 Structure of cylindrical horn antenna with dielectric lens in Table C.2, A used at 50 GHz - 75 GHz40 Figure C.3 A structure of dielectric lens and horn antenna in Table C.2, D.41 Figure D.1 Measurement configuration for the case of normal incidence with a di

32、rectional coupler connected directly to the horn antenna42 Figure D.2 Configuration for response calibration using a reference metal plate in the case of normal incidence 43 Figure D.3 Configuration for response calibration using a reference metal plate in the case of oblique incidence44 Figure D.4

33、Configuration for response and isolation calibration in the case of normal incidence 45 Figure D.5a Response calibration Figure D.5b Isolation calibration.45 Figure D.5 Configuration for response and isolation calibration in the case of oblique incidence 45 Figure D.6 Configuration for S111-port ful

34、l calibration in the case of normal incidence 47 Figure D.7 Precision antenna positioner configuration48 Figure D.8 TRL calibration procedure.49 Figure D.9 Measurement and TRL calibration of transmission line .50 Figure E.1 An example of receiving level of a reference metal plate and that without a

35、specimen .51 Figure E.2 Dynamic range and measurement error of reflectivity52 Figure F.1 A method to remove spurious waves.53 Figure H.1 Fraunhofer region and antenna gain .55 Table 1 Acronyms 11 Table 2 Symbols 11 Table C.1 Antenna gain 24 dB (example A)39 Table C.2 Some specifications of antennas

36、with dielectric lenses 40 Table G.1 Relative permittivity and foam ratio of styrofoam54 Table G.2 Relative permittivity and foam ratio of foamed polyethylene.54 BS EN 62431:200862431 IEC:2008(E) 5 INTERNATIONAL ELECTROTECHNICAL COMMISSION _ REFLECTIVITY OF ELECTROMAGNETIC WAVE ABSORBERS IN MILLIMETR

37、E WAVE FREQUENCY MEASUREMENT METHODS FOREWORD 1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising all national electrotechnical committees (IEC National Committees). The object of IEC is to promote international co-operation on all questi

38、ons concerning standardization in the electrical and electronic fields. To this end and in addition to other activities, IEC publishes International Standards, Technical Specifications, Technical Reports, Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC Publication(s

39、)”. Their preparation is entrusted to technical committees; any IEC National Committee interested in the subject dealt with may participate in this preparatory work. International, governmental and non-governmental organizations liaising with the IEC also participate in this preparation. IEC collabo

40、rates closely with the International Organization for Standardization (ISO) in accordance with conditions determined by agreement between the two organizations. 2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international consensus of opinion on

41、the relevant subjects since each technical committee has representation from all interested National Committees. 3) IEC Publications have the form of recommendations for international use and are accepted by IEC National Committees in that sense. While all reasonable efforts are made to ensure that

42、the technical content IEC Publications is accurate, IEC cannot be held responsible for the way in which they are used or for any misinterpretation by any end user. 4) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publications transparently to the maximu

43、m extent possible in their national and regional publications. Any divergence between any IEC Publication and the corresponding national or regional publication shall be clearly indicated in the latter. 5) EC provides no marking procedure to indicate its approval and cannot be rendered responsible f

44、or any equipment declared to be in conformity with an IEC Publication. 6) All users should ensure that they have the latest edition of this publication. 7) No liability shall attach to IEC or its directors, employees, servants or agents including individual experts and members of its technical commi

45、ttees and IEC National Committees for any personal injury, property damages or other damage of any nature whatsoever, whether direct or indirect, or for costs (including legal fees) and expenses arising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC Publicati

46、ons. 8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is indispensable for the correct application of this publication. 9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of pate

47、nt rights. IEC shall not be held responsible for identifying any or all such patent rights. International Standard IEC 62431 has been prepared by subcommittee SC46F: RF and microwave passive components, of IEC technical committee 46: Cables, wires, waveguides, R.F. connectors, R.F. and microwave pas

48、sive components and accessories. IEC 62431 replaces and cancels IEC/PAS 62431 with corrections of obvious errors as noted in 46F/29A/RVN. The text of this standard is based on the following documents: CDV Report on voting 46F/65/CDV 46F/72/RVC Full information on the voting for the approval of this

49、standard can be found in the report on voting indicated in the above table. This publication has been drafted in accordance with the ISO/IEC Directives, Part 2. BS EN 62431:2008 6 62431 IEC:2008(E) The committee has decided that the contents of this publication will remain unchanged until the maintenance result date indicated on the IEC web site under “http:/webstore.iec.ch” in t