EN ISO 3274-1997 en Geometrical Product Specifications (GPS) - Surface Texture Profile Method - Nominal Characteristics of Contact (Stylus) Instruments《产品几何量技术规范(GPS) 表面结构 轮廓法 接触(触.pdf

1、BRITISH STANDARD BS EN ISO 3274:1998 Incorporating Amendment No. 1 to BS ISO 3274:1996 (renumbers the BS as BS EN ISO 3274:1998) Geometric Product Specifications (GPS) Surface texture: Profile method Nominal characteristics of contact (stylus) instruments ICS 17.040.20BSEN ISO 3274:1998 This British

2、 Standard, having been prepared under the directionof the Engineering SectorBoard, was published underthe authority of the Standards Board and comes intoeffect on 15 May 1997 BSI 04-1999 ISBN 0 580 27531 0 National foreword This British Standard is the English language version of EN ISO 3274:1997. I

3、t is identical with ISO 3274:1996. The UK Participation in its preparation was entrusted to Technical Committee MTE/27, Properties and metrology of surfaces, which has the responsibility to: aid enquirers to understand the text; present to the responsible international/European committee any enquiri

4、es on the interpretation, or proposals for change, and keep the UK interests informed; monitor related international and European developments and promulgate them in the UK. A list of organizations represented on this committee can be obtained on request to its secretary. Cross-references The Britis

5、h Standards which implement international or European publications referred to in this document may be found in the BSI Standards Catalogue under the section entitled “International Standards Correspondence Index”, or using the “Find” facility of the BSI Standards Electronic Catalogue. A British Sta

6、ndard does not purport to include all the necessary provisions of a contract. Users of British Standards are responsible for their correct application. Compliance with a British Standard does not of itself confer immunity from legal obligations. Summary of pages This document comprises a front cover

7、, an inside front cover, pages i and ii, theEN ISO title page, page 2, the ISO title page, pages ii to iv, pages 1 to 10, aninside back cover and a back cover. This standard has been updated (see copyright date) and may have had amendments incorporated. This will be indicated in the amendment table

8、on the inside front cover. Amendments issued since publication Amd. No. Date Comments 9919 March 1998 March 1998 Indicated by a sideline in the marginBSEN ISO 3274:1998 BSI 04-1999 i Contents Page National foreword Inside front cover Foreword 2 Foreword iii Text of ISO 3274 1ii blankEUROPEAN STANDAR

9、D NORME EUROPENE EUROPISCHE NORM EN ISO 3274 November 1997 ICS 17.040.20 Descriptors: See ISO document English version Geometrical product specifications (GPS) Surface texture: Profile method Nominal characteristics of contact (stylus) instruments (ISO 3274:1996) Spcification gomtrique des produits

10、(GPS) Etat de surface: Mthode du profil Caractristiques nominales des appareils contact (palpeur) (ISO 3274:1996) Geometrische Produktspezifikationen (GPS) Oberflchenbeschaffenheit: Tastschnittverfahren Nenneigenschaften von Tastschnittgerten (ISO 3274:1996) This European Standard was approved by CE

11、N on 2 November 1997. CEN members are bound to comply with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this European Standard the status of a national standard without any alteration. Up-to-date lists and bibliographical references concerning such national standard

12、s may be obtained on application to the Central Secretariat or to any CEN member. This European Standard exists in three official versions (English, French, German). A version in any other language made by translation under the responsibility of a CEN member into its own language and notified to the

13、 Central Secretariat has the same status as the official versions. CEN members are the national standards bodies of Austria, Belgium, CzechRepublic, Denmark, Finland, France, Germany, Greece, Iceland, Ireland, Italy, Luxembourg, Netherlands, Norway, Portugal, Spain, Sweden, Switzerland and United Ki

14、ngdom. CEN European Committee for Standardization Comit Europen de Normalisation Europisches Komitee fr Normung Central Secretariat: rue de Stassart 36, B-1050 Brussels 1997 CEN All rights of exploitation in any form and by any means reserved worldwide for CEN national Members Ref. No. EN ISO 3274:1

15、997 EENISO 3274:1997 BSI 04-1999 2 Foreword The text of the International Standard from Technical Committee ISO/TC 57, Metrology and properties of surfaces, of the International Organization for Standardization (ISO) has been taken over as a European Standard by Technical Committee CEN/TC 290, Dimen

16、sional and geometrical product specification and verification, the secretariat of which is held by DIN. This European Standard shall be given the status of a national standard, either by publication of an identical text or by endorsement, at the latest by May 1998, and conflicting national standards

17、 shall be withdrawn at the latest by May 1998. According to CEN/CENELEC Internal Regulations, the following countries are bound to implement this European Standard: Austria, Belgium, CzechRepublic, Denmark, Finland, France, Germany, Greece, Iceland, Ireland, Italy, Luxembourg, Netherlands, Norway, P

18、ortugal, Spain, Sweden, Switzerland and the United Kingdom. Endorsement notice The text of the International Standard ISO4288:1996 has been approved by CEN as a European Standard without any modification. NOTENormative references to International Standards are listed in Annex ZA (normative).BS ISO 3

19、274:1996 ii BSI 04-1999 Contents Page Foreword iii Introduction 1 1 Scope 1 2 Normative references 1 3 Definitions 1 4 Nominal values for instrument characteristics 6 Annex A (informative) Instruments conforming to ISO 3274:1975 8 Annex B (informative) Background for the improvements introduced in t

20、hisInternationalStandard 8 Annex C (informative) Relation to the GPS matrix model 9 Annex D (informative) Bibliography 10 Annex ZA (normative) Normative references to international publicationswiththeir relevant European publications Inside back cover Figure 1 Schematic representation of a stylus in

21、strument 2 Figure 2 Example of measurement loop of a stylus instrument 4 Figure B.1 Gaussian filter transmission characteristics together with theuncertain nominal transmission characteristics of a 2 4m stylus 9 Figure C.1 Table 1 7 Descriptors: Surface condition, roughness, surface waviness, measur

22、ing instruments, profile meters, characteristics.BS ISO3274:1996 BSI 04-1999 iii Foreword ISO (the International Organization for Standardization) is a worldwide federation of national standards bodies (ISO member bodies). The work of preparing International Standards is normally carried out through

23、 ISO technical committees. Each member body interested in a subject for which a technical committee has been established has the right to be represented on that committee. International organizations, governmental and non-governmental, in liaison with ISO, also take part in the work. ISO collaborate

24、s closely with the International Electrotechnical Commission (IEC) on all matters of electrotechnical standardization. Draft International Standards adopted by the technical committees are circulated to the member bodies for voting. Publication as an International Standard requires approval by at le

25、ast 75 % of the member bodies casting a vote. International Standard ISO 3274 was prepared jointly by Technical Committees ISO/TC 57, Metrology and properties of surfaces, Subcommittee SC 1, Geometrical parameters Instruments and procedures for measurement of surface roughness and waviness, ISO/TC 3

26、, Limits and fits, and ISO/TC 10, Technical drawings, product definition and related documentation, Subcommittee SC 5, Dimensioning and tolerancing. This second edition of ISO 3274 cancels and replaces the first edition (ISO3274:1975) as well as ISO 1880:1979, which have been technically revised. In

27、 particular it takes into account the nominal characteristics of contact (stylus) instruments and their technical development. Modern instruments use phase-correct filters according to ISO 11562. Annex A, Annex B, Annex C and Annex D of this International Standard are for information only.iv blankBS

28、 ISO 3274:1996 BSI 04-1999 1 Introduction This International Standard is a Geometrical Product Specification (GPS) standard and is to be regarded as a General GPS standard (see ISO/TR 14638). It influences chain link 5 of the chain of standards for roughness profile, waviness profile and primary pro

29、file. For more detailed information of the relation of this standard to other standards and the GPS matrix model, see Annex C. Filters for profile meters according to ISO3274:1975 were realized as a series connection of two analog RC filters. This led to considerable phase shifts in the transition o

30、f the profile and therefore to asymmetrical profile distortions. The influence of this distortion on the parameters Ra and Rz are normally negligible if the sampling lengths (cut-off wavelength) according to ISO4288:1985 are used. Therefore, analog instruments according to ISO 3274:1975 or instrumen

31、ts using 2RC filters may be used for assessment of Ra and Rz (see annex A). However, for other parameters the distortion is relevant. 1 Scope This International Standard defines profiles and the general structure of contact (stylus) instruments for measuring surface roughness and waviness, enabling

32、existing International Standards to be applied to practical profile evaluation. It specifies the properties of the instrument which influence profile evaluation and it provides the basics of the specification of contact (stylus) instruments (profile meter and profile recorder). NOTE 1A data sheet de

33、aling with characteristics of contact (stylus) instruments to be completed by the instrument makers is under preparation and will be introduced in a future standard on calibration procedures. NOTE 2The relationships between the waviness cut-off f, tip radius and waviness cut-off ratio are under cons

34、ideration and will be added to this International Standard as an amendment. 2 Normative references The following standards contain provisions which, through reference in this text, constitute provisions of this International Standard. At the time of publication, the editions indicated were valid. Al

35、l standards are subject to revision, and parties to agreements based on this International Standard are encouraged to investigate the possibility of applying the most recent editions of the standards indicated below. Members of IEC and ISO maintain registers of currently valid International Standard

36、s. ISO 4287:1996, Geometrical Product Specifications (GPS) Surface texture: Profile method Terms, definitions and surface texture parameters. ISO 4288:1996, Geometrical Product Specifications (GPS) Surface texture: Profile method Rules and procedures for the assessment of surface texture. ISO 5436:1

37、985, Calibration specimens Stylus instruments Types, calibration and use of specimens. ISO 11562:1996, Geometrical Product Specifications (GPS) Surface texture: Profile method Metrological characteristics of phase correct filters. ISO 12085:1996, Geometrical Product Specifications (GPS) Surface text

38、ure: Profile method Motif parameters. ISO 13565-1:1996, Geometrical Product Specifications (GPS) Surface texture: Profile method; Surfaces having stratified functional properties Part 1: Filtering and overall measuring conditions. ISO 13565-2:1996, Geometrical Product Specifications (GPS) Surface te

39、xture: Profile method; Surfaces having stratified functional properties Part 2: Height characterization using the linear material ratio curve. ISO 13565-3:, Geometrical Product Specifications (GPS) Surface texture: Profile method; Surfaces having stratified functional properties Part 3: Height chara

40、cterization using the material probability curve 1) . 3 Definitions For the purposes of this International Standard, the following definitions apply. 3.1 Profiles 3.1.1 traced profile locus of the centre of a stylus tip which features an ideal geometrical form (conical with spherical tip) and nomina

41、l dimensions with nominal tracing force, as it traverses the surface within the intersection plane NOTEThis is the profile from which all other profiles defined in this International Standard are derived. 3.1.2 reference profile trace on which the probe is moved within the intersection plane along t

42、he guide NOTEThe shape of the reference profile is the practical realization of a theoretical exact profile. Its nominal deviations depend on the deviations of the guide as well as on external and internal disturbances. 1) To be published.BSISO 3274:1996 2 BSI 04-1999 Figure 1 Schematic representati

43、on of a stylus instrumentBS ISO 3274:1996 BSI 04-1999 3 3.1.3 total profile digital form of the traced profile relative to the reference profile, with the vertical and horizontal coordinates assigned to each other NOTEThe total profile is characterized by the vertical and horizontal digital steps. 3

44、.1.4 primary profile total profile after application of the short wavelength filter, s NOTE 1The primary profile represents the basis for digital profile processing by means of a profile filter and calculation of the profile parameters according to ISO 4287. It is characterized by the vertical and h

45、orizontal digital steps which may be different from those of the total profile. NOTE 2The best fit least squares form of the type indicated in the specification is not part of the primary profile and should be excluded before filters are applied. For a circle, the radius should also be included in t

46、he least squares optimization and not held fixed to the nominal value. NOTE 3The nominal form is removed before the primary profile is obtained. 3.1.5 residual profile primary profile obtained by tracing an ideally smooth and flat surface (optical flat) NOTEThe residual profile is composed of the de

47、viations of the guide, external and internal disturbances, as well as deviations in profile transmission. The determination of the causes of the deviations is not normally possible without special equipment and a suitable environment. 3.2 stylus instrument Measuring instrument which explores surface

48、s with a stylus and acquires deviations in the form of a surface profile, calculates parameters and can record the profile (see Figure 1). NOTEThe diagram as shown represents only the essential operators required in a theoretically exact measuring system. The specific inter-relationship of operators

49、 may be subject to design considerations. Therefore Figure 1 should not be considered as the only form of theoretically exact configuration. 3.2.1 displacement sensitive, digitally storing stylus instrument stylus instrument whose profile presentation contains deviations including long-wave components and set-up deviations NOTEThe profile is digitally stored and, if filtered, is phase-correct filtered. Parameters are digitally calculated and the profile is recorded by means of a graphics system