1、BRITISH STANDARD BS EN ISO 12179:200 Geometrical Product Specifications (GPS) Surface texture: Profile method Calibration of contact (stylus) instruments ICS 17.040.20 NO COPYING WITHOUT BSI PERMISSION EXCEPT AS PERMITTED BY COPYRIGHT LAW Incorporating corrigendum December 2003 0BS EN ISO 12179:2000
2、 This British Standard was published under the authority of the Standards Policy and Strategy Committee on 22 August 2001 National foreword The UK participation in its preparation was entrusted by Technical Committee TDW/4, Engineering drawing, metrology, precision measurement and related documentat
3、ion, to Subcommittee TDW/4/-/3, The properties and metrology of A list of organizations represented on this subcommittee can be obtained on request to its secretary. from legal obligations. This British Standard is the UK implementation of EN ISO 12179:2000. It is identical with ISO 12179:2000, inco
4、rporating corrigendum December 2003. surfaces. This publication does not purport to include all the necessary provisions of a contract. Users are responsible for its correct application. Compliance with a British Standard cannot confer immunity BSI 2009 ISBN 978 0 580 65220 2 Amendments issued since
5、 publication Date Comments 30 June 2009 Implementation of ISO corrigendum December 2003, in Annex C the calculations the sum-of-squares S 1 , S 2 , S 3and S 4have been modifiedEUROPEANSTANDARD NORMEEUROPENNE EUROPISCHENORM ENISO12179 March2000 ICS17.040 Englishversion GeometricalProductSpecification
6、s(GPS)Surfacetexture: ProfilemethodCalibrationofcontact(stylus)instruments(ISO 12179:2000) Spcificationgomtriquedesproduits(GPS)Etatde surface:MthodeduprofilEtalonnagedesinstruments contact(palpeur)(ISO12179:2000) GeometrischeProduktspezifikation(GPS) Oberflchenbeschaffenheit:Tastschnittverfahren Ka
7、librierungvonTastschnittgerten(ISO12179:2000) ThisEuropeanStandardwasapprovedbyCENon15March2000. CENmembersareboundtocomplywiththeCEN/CENELECInternalRegulationswhichstipulatetheconditionsforgivingthisEurope an Standardthestatusofanationalstandardwithoutanyalteration.Uptodatelistsandbibliographicalre
8、ferencesconcernings uchnational standardsmaybeobtainedonapplicationtotheCentralSecretariatortoanyCENmember. ThisEuropeanStandardexistsinthreeofficialversions(English,French,German).Aversioninanyotherlanguagemadebytra nslation undertheresponsibilityofaCENmemberintoitsownlanguageandnotifiedtotheCentra
9、lSecretariathasthesamestatusast heofficial versions. CENmembersarethenationalstandardsbodiesofAustria,Belgium,CzechRepublic,Denmark,Finland,France,Germany,Greece, Iceland,Ireland,Italy,Luxembourg,Netherlands,Norway,Portugal,Spain,Sweden,SwitzerlandandUnitedKingdom. EUROPEANCOMMITTEEFORSTANDARDIZATIO
10、N COMITEUROPENDENORMALISATION EUROPISCHESKOMITEEFRNORMUNG CentralSecretariat:ruedeStassart,36B1050Brussels 2000CEN Allrightsofexploitationinanyformandbyanymeansreserved worldwideforCENnationalMembers. Ref.No.ENISO12179:2000E2egaP 0002:97121OSINE CORRECTED20000823 Foreword ThetextoftheInternationalSt
11、andardfromTechnicalCommitteeISO/TC213“Dimensionalandgeometrical productspecificationsandverification“oftheInternationalOrganizationforStandardization(ISO)hasbeen takenoverasanEuropeanStandardbyTechnicalCommitteeCEN/TC290“Dimensionalandgeometrical productspecificationandverification“,thesecretariatof
12、whichisheldbyDIN. ThisEuropeanStandardshallbegiventhestatusofanationalstandard,eitherbypublicationofanidentical textorbyendorsement,atthelatestbySeptember2000,andconflictingnationalstandardsshallbe withdrawnatthelatestbySeptember2000. AccordingtotheCEN/CENELECInternalRegulations,thenationalstandards
13、organizationsof thefollowing countriesareboundtoimplementthisEuropeanStandard:Austria,Belgium,CzechRepublic,Denmark, Finland,France,Germany,Greece,Iceland,Ireland,Italy,Luxembourg,Netherlands,Norway,Portugal, Spain,Sweden,SwitzerlandandtheUnitedKingdom. Endorsementnotice ThetextoftheInternationalSta
14、ndardISO12179:2000hasbeenapprovedbyCENasaEuropeanStandard withoutanymodification. NOTE:NormativereferencestoInternationalStandardsarelistedinannexZA(normative). BS EN ISO 12179:2000ISO 97121:(0002)E ISO 0002 All irhgts seredevr iii Contents Page Introduction.v 1 Scope 1 2 Normative references 1 3 Te
15、rms and definitions .2 4 Conditions of use.2 5 Measurement standards .3 6 Contact (stylus) instrument metrological characteristics.3 7 Calibration 6 8 Uncertainty of measurement 8 9 Contact (stylus) instrument calibration certificate.9 Annex A (normative) Calibration of instruments measuring the mot
16、ifs method parameters.10 Annex B (normative) Calibration of simplified operator instruments for the measurements of surface texture .12 Annex C (informative) Example: roughness measurement standard parameter Ra 13 Annex D (informative) Relation to the GPS matrix model.16 Bibliography17 BS EN ISO 121
17、79:2000ISO 97121:(0002)E ISO 0002 All irhgts seredevr v Introduction This International Standard is a geometrical product specification (GPS) standard and is to be regarded as a general GPS standard (see ISO/TR 14638). It influences the chain link 6 of the chain of standards on roughness, waviness a
18、nd primary profile. For more detailed information on the relationship of this standard to the GPS matrix model, see annex D. This International Standard introduces calibration of contact (stylus) instruments as defined in ISO 3274. The calibration is to be carried out with the aid of measurement sta
19、ndards. BS EN ISO 12179:2000INTENRATIONAL TSANDADR ISO 97121:(0002)E ISO 0002 All irhgts seredevr 1 Geometrical Product Specifications (GPS) Surface texture: Profile method Calibration of contact (stylus) instruments 1 Scope This International Standard applies to the calibration of the metrological
20、characteristics of contact (stylus) instruments for the measurement of surface texture by the profile method as defined in ISO 3274. The calibration is to be carried out with the aid of measurement standards. Annex B applies to the calibration of metrological characteristics of simplified operator c
21、ontact (stylus) instruments which do not conform with ISO 3274. 2 Normative references The following normative documents contain provisions which, through reference in this text, constitute provisions of this International Standard. For dated references, subsequent amendments to, or revisions of, an
22、y of these publications do not apply. However, parties to agreements based on this International Standard are encouraged to investigate the possibility of applying the most recent editions of the normative documents indicated below. For undated references, the latest edition of the normative documen
23、t referred to applies. Members of ISO and IEC maintain registers of currently valid International Standards. ISO 3274:1996, Geometrical Product Specifications (GPS) Surface texture: Profile method Nominal characteristics of contact (stylus) instruments. ISO 4287:1997, Geometrical Product Specificati
24、ons (GPS) Surface texture: Profile method Terms, definitions and surface texture parameters. ISO 5436-1:2000, Geometrical Product Specifications (GPS) Surface texture: Profile method; Measurement standards Part 1: Material measures. ISO 10012-1:1992, Quality assurance requirements for measuring equi
25、pment Part 1: Metrological confirmation system for measuring equipment. ISO 12085:1996, Geometrical Product Specifications (GPS) Surface texture: Profile method Motif parameters. ISO 14253-1:1998, Geometrical Product Specifications (GPS) Inspection by measurement of workpieces and measuring equipmen
26、t Part 1: Decision rules for proving conformance or non-conformance with specification. ISO/TS 14253-2:1999, Geometrical Product Specifications (GPS) Inspection by measurement of workpieces and measuring equipment Part 2: Guide to the estimation of uncertainty of measurement in GPS measurement, in c
27、alibration of measuring equipment and in product verification. Guide to the expression of uncertainty in measurement (GUM). B I P M ,I E C ,I F C C ,I S O ,I U P A C ,I U P A P ,O I M L , 1st edition, 1995. International vocabulary of basic and general terms used in metrology (VIM). BIPM, IEC, IFCC,
28、 ISO, IUPAC, IUPAP, OIML, 2nd edition, 1993. 1 BS EN ISO 12179:2000ISO 97121:(0002)E 2 ISO 0002 All irhgts seredevr 3 Terms and definitions For the purposes of this International Standard, the terms and definitions given in ISO 3274, ISO 4287, ISO 14253-1, VIM some of which are reproduced below (wit
29、hout their notes) for convenience, GUM, and term and definition 3.2, apply. 3.1 calibration set of operations that establish, under specified conditions, the relationship between values of quantities indicated by a measuring instrument or measuring system, or values represented by a material measure
30、 or a reference material, and the corresponding values realized by standards VIM 6.11 3.2 task related calibration set of operations which establish, under specified conditions, the relationship between values of quantities indicated by a measuring instrument and the corresponding known values of a
31、limited family of precisely defined measurands which constitute a subset of the measuring capabilities of the measuring instrument 3.3 adjustment (of a measuring instrument) operation of bringing a measuring instrument into a state of performance suitable for its use VIM 4.30 3.4 (measurement) stand
32、ard etalon material measure, measuring instrument, reference material or measuring system intended to define, realize, conserve or reproduce a unit or one or more values of a quantity to serve as a reference VIM 6.1 NOTE In ISO 5436:1985, “measurement standards“ were referred to as “calibration spec
33、imens“. 3.5 uncertainty of measurement parameter, associated with the result of a measurement, that characterizes the dispersion of the values that could reasonably be attributed to the measurand VIM 3.9 3.6 traceability property of the result of a measurement or the value of a standard whereby it c
34、an be related to stated references, usually national or international standards, through an unbroken chain of comparisons all having stated uncertainties VIM 6.10 4 Conditions of use 4.1 Components and configurations of the contact (stylus) instrument The contact (stylus) instrument is comprised of
35、the basic equipment, a drive unit, a probe and a profile recorder (see ISO 3274). 2 BS EN ISO 12179:2000ISO 97121:(0002)E ISO 0002 All irhgts seredevr 3 If the basic equipment is used with several drive units and probes, each of these instrumental combinations (configurations) shall be calibrated se
36、parately. 4.2 Calibration of a configuration The contact (stylus) instrument shall be calibrated when a change is made to the basic elements of the system which intentionally or unintentionally modifies the measured profile/measuring result. Each configuration of the contact (stylus) instrument shal
37、l be calibrated separately. EXAMPLE With a change of probe the contact (stylus) instrument shall be calibrated. 4.3 Place of calibration The contact (stylus) instrument should be calibrated at the place of use with environmental conditions similar to those present when in use for measurement to take
38、 into account external influence factors. EXAMPLE Noise, temperature, vibration, air movement, etc. 5 Measurement standards The following measuring standards are applicable to the calibrations given in clause 6: optical flat; depth measurement standard (Figure 1): type A according to ISO 5436-1; spa
39、cing measurement standard (Figure 2): type C according to ISO 5436-1; inclined optical flat (Figure 3); profile co-ordinate measurement standard (consisting of a sphere or prism): type E according to ISO 5436-1; roughness measurement standard (Figure 4): type D according to ISO 5436-1. NOTE It is re
40、commended that a profile co-ordinate measurement standard be used on contact (stylus) instruments where the stylus rotates plus and minus one half of a degree when moving through its full range. 6 Contact (stylus) instrument metrological characteristics Only those task-related contact (stylus) instr
41、ument metrological characteristics which are relevant for the intended measurements should be selected for calibration. For example, for the measurement of spacing parameters, the vertical profile component need not be calibrated. 6.1 Residual profile calibration The scratch-free optical flat reprod
42、uces the residual profile. For task-related calibrations use the appropriate profile and parameters (for example: the roughness profile with Ra, Rq or Rt; the waviness profile with Wq or Wt). NOTE By using this approach the effects of external guide straightness, environmental conditions and instrum
43、ent noise can be established. 3 BS EN ISO 12179:2000ISO 97121:(0002)E 4 ISO 0002 All irhgts seredevr Dimension in millimetres Figure 1 Example of a depth measurement standard (type A2) Figure 2 Example of a spacing measurement standard (type C) 4 BS EN ISO 12179:2000ISO 97121:(0002)E ISO 0002 All ir
44、hgts seredevr 5 Figure 3 Example of an inclined optical flat and a measuring plan Values in millimetres Figure 4 Example of a roughness measurement standard (type D) and measuring plan 6.2 Vertical profile component calibration The depth measurement standard reproduces the profile depth in order to
45、measure the error of indication of the vertical profile component. NOTE If no depth measurement standards are available gauge blocks may be used. Care must be taken concerning the uncertainty of the height difference when using gauge blocks. 5 BS EN ISO 12179:2000ISO 97121:(0002)E 6 ISO 0002 All irh
46、gts seredevr 6.3 Horizontal profile component calibration The spacing measurement standard reproduces the mean width of profile element, PSm, in order to measure the error of indication of the horizontal profile component. 6.4 Profile co-ordinate system calibration The inclined optical flat reproduc
47、es: the least squares best fit angle in degrees; the total height of the primary profile, Pt, after removal of the least squares best fit straight line; thus establishing the error of the linked horizontal and vertical co-ordinates (i.e. variation in traverse speed, non- linearities in scales, etc.)
48、. The profile co-ordinate measurement standard reproduces the total height of the primary profile, Pt,a fte rre mo v alo f the least squares best fit nominal form, thus establishing the co-ordinate system. 6.5 Calibration of the total contact (stylus) instrument The roughness measurement standards reproduce the: arithmetical mean deviation, Ra; maximum height of profile Rz; thus estab
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