EN ISO TS 80004-6-2015 en Nanotechnologies - Vocabulary - Part 6 Nano-object characterization《纳米技术 词汇表 第6部分 纳米物体特性描述》.pdf

1、BSI Standards PublicationPD CEN ISO/TS 80004-6:2015PD ISO/TS 80004-6:2013Nanotechnologies VocabularyPart 6: Nano-object characterizationPD CEN ISO/TS 80004-6:2015 PUBLISHED DOCUMENTNational forewordThis Published Document is the UK implementation of CEN ISO/TS 80004-6:2015. It is identical to ISO/TS

2、 80004-6:2013. It supersedes PD ISO/TS 80004-6:2013, which is withdrawn.The UK participation in its preparation was entrusted to Technical Committee NTI/1, Nanotechnologies.A list of organizations represented on this committee can be obtained on request to its secretary.This publication does not pur

3、port to include all the necessary provisions of a contract. Users are responsible for its correct application. The British Standards Institution 2015. Published by BSI Standards Limited 2015ISBN 978 0 580 88465 8ICS 01.040.07; 07.030Compliance with a British Standard cannot confer immunity from lega

4、l obligations.This British Standard was published under the authority of the Standards Policy and Strategy Committee on 30 November 2013.Amendments/corrigenda issued since publicationDate Text affected31 May 2015 This corrigendum renumbers PD ISO/TS 80004-6:2013 as PD CEN ISO/TS 80004-6:2015TECHNICA

5、L SPECIFICATION SPCIFICATION TECHNIQUE TECHNISCHE SPEZIFIKATION CEN ISO/TS 80004-6 May 2015 ICS 07.030; 01.040.07 English Version Nanotechnologies - Vocabulary - Part 6: Nano-object characterization (ISO/TS 80004-6:2013) Nanotechnologies - Vocabulaire - Partie 6: Caractrisation des nano-objets (ISO/

6、TS 80004-6:2013) Nanotechnologien - Fachwrterverzeichnis - Teil 6: Charakterisierung von Nanoobjekten (ISO/TS 80004-6:2013) This Technical Specification (CEN/TS) was approved by CEN on 16 May 2015 for provisional application. The period of validity of this CEN/TS is limited initially to three years.

7、 After two years the members of CEN will be requested to submit their comments, particularly on the question whether the CEN/TS can be converted into a European Standard. CEN members are required to announce the existence of this CEN/TS in the same way as for an EN and to make the CEN/TS available p

8、romptly at national level in an appropriate form. It is permissible to keep conflicting national standards in force (in parallel to the CEN/TS) until the final decision about the possible conversion of the CEN/TS into an EN is reached. CEN members are the national standards bodies of Austria, Belgiu

9、m, Bulgaria, Croatia, Cyprus, Czech Republic, Denmark, Estonia, Finland, Former Yugoslav Republic of Macedonia, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia, Lithuania, Luxembourg, Malta, Netherlands, Norway, Poland, Portugal, Romania, Slovakia, Slovenia, Spain, Sweden, Switzerl

10、and, Turkey and United Kingdom. EUROPEAN COMMITTEE FOR STANDARDIZATION COMIT EUROPEN DE NORMALISATION EUROPISCHES KOMITEE FR NORMUNG CEN-CENELEC Management Centre: Avenue Marnix 17, B-1000 Brussels 2015 CEN All rights of exploitation in any form and by any means reserved worldwide for CEN national M

11、embers. Ref. No. CEN ISO/TS 80004-6:2015 EPD CEN ISO/TS 80004-6:2015CEN ISO/TS 80004-6:2015 (E)CEN ISO/TS 80004-6:2015 (E) 3 Foreword The text of ISO/TS 80004-6:2013 has been prepared by Technical Committee ISO/TC 229 “Nanotechnologies” of the International Organization for Standardization (ISO) and

12、 has been taken over as CEN ISO/TS 80004-6:2015 by Technical Committee CEN/TC 352 “Nanotechnologies” the secretariat of which is held by AFNOR. Attention is drawn to the possibility that some of the elements of this document may be the subject of patent rights. CEN and/or CENELEC shall not be held r

13、esponsible for identifying any or all such patent rights. According to the CEN-CENELEC Internal Regulations, the national standards organizations of the following countries are bound to announce this Technical Specification: Austria, Belgium, Bulgaria, Croatia, Cyprus, Czech Republic, Denmark, Eston

14、ia, Finland, Former Yugoslav Republic of Macedonia, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia, Lithuania, Luxembourg, Malta, Netherlands, Norway, Poland, Portugal, Romania, Slovakia, Slovenia, Spain, Sweden, Switzerland, Turkey and the United Kingdom. Endorsement notice The t

15、ext of ISO/TS 80004-6:2013 has been approved by CEN as CEN ISO/TS 80004-6:2015 without any modification. ISO 2013 All rights reserved iiiContents PageForeword ivIntroduction vi1 Scope . 12 General terms 13 Terms related to size and shape measurement 33.1 Terms related to measurands for size and shap

16、e 33.2 Terms related to scattering techniques . 43.3 Terms related to aerosol characterization 53.4 Terms related to separation techniques . 63.5 Terms related to microscopy 73.6 Terms related to surface area measurement . 104 Terms related to chemical analysis 115 Terms related to measurement of ot

17、her properties 155.1 Terms related to mass measurement . 155.2 Terms related to crystallinity measurement 165.3 Terms related to charge measurement in suspensions 16Annex A (informative) Index 18Bibliography .23PD CEN ISO/TS 80004-6:2015 ISO/TS 80004-6:2013(E)ForewordISO (the International Organizat

18、ion for Standardization) is a worldwide federation of national standards bodies (ISO member bodies). The work of preparing International Standards is normally carried out through ISO technical committees. Each member body interested in a subject for which a technical committee has been established h

19、as the right to be represented on that committee. International organizations, governmental and non-governmental, in liaison with ISO, also take part in the work. ISO collaborates closely with the International Electrotechnical Commission (IEC) on all matters of electrotechnical standardization.The

20、procedures used to develop this document and those intended for its further maintenance are described in the ISO/IEC Directives, Part 1. In particular the different approval criteria needed for the different types of ISO documents should be noted. This document was drafted in accordance with the edi

21、torial rules of the ISO/IEC Directives, Part 2. www.iso.org/directivesAttention is drawn to the possibility that some of the elements of this document may be the subject of patent rights. ISO shall not be held responsible for identifying any or all such patent rights. Details of any patent rights id

22、entified during the development of the document will be in the Introduction and/or on the ISO list of patent declarations received. www.iso.org/patentsAny trade name used in this document is information given for the convenience of users and does not constitute an endorsement.For an explanation on t

23、he meaning of ISO specific terms and expressions related to conformity assessment, as well as information about ISOs adherence to the WTO principles in the Technical Barriers to Trade (TBT) see the following URL: Foreword - Supplementary informationISO/TS 80004-6 was prepared jointly by Technical Co

24、mmittee ISO/TC 229, Nanotechnologies and Technical Committee IEC/TC 113, Nanotechnology standardization for electrical and electronic products and systems. The draft was circulated for voting to the national bodies of both ISO and IEC.Documents in the 80000 to 89999 range of reference numbers are de

25、veloped by collaboration between ISO and IEC.ISO/TS 80004 consists of the following parts, under the general title Nanotechnologies Vocabulary: Part 1: Core terms Part 3: Carbon nano-objects Part 4: Nanostructured materials Part 5: Nano/bio interface Part 6: Nano-object characterization Part 7: Diag

26、nostics and therapeutics for healthcare Part 8: Nanomanufacturing processesThe following parts are under preparation: Part 2: Nano-objects: Nanoparticle, nanofibre and nanoplate1) Part 9: Nano-enabled electrotechnical products and systems Part 10: Nano-enabled photonic components and systems Part 11

27、: Nanolayer, nanocoating, nanofilm, and related terms1) Revision of ISO/TS 27687:2008, Nanotechnologies Terminology and definitions for nano-objects Nanoparticle, nanofibre and nanoplate.iv ISO 2013 All rights reservedPD CEN ISO/TS 80004-6:2015 ISO/TS 80004-6:2013(E) Part 12: Quantum phenomena in na

28、notechnologyGraphene and other two dimensional materials will form the subject of a future Part 13. ISO 2013 All rights reserved vPD CEN ISO/TS 80004-6:2015 ISO/TS 80004-6:2013(E)IntroductionMeasurement and instrumentation techniques have effectively opened the door to modern nanotechnology. Charact

29、erization is key to understanding the properties and function of all nano-objects.Nano-object characterization involves interactions between people with different backgrounds and from different fields. Those interested in nano-object characterization might, for example, be materials scientists, biol

30、ogists, chemists or physicists and might have a background that is primarily experimental or theoretical. Those making use of the data extend beyond this group to include regulators and toxicologists. To avoid any misunderstandings, and to facilitate both comparability and the reliable exchange of i

31、nformation, it is essential to clarify the concepts, to establish the terms for use and to establish their definitions.The terms are classified under the following broad headings: Clause 2: General terms Clause 3: Terms related to size and shape measurement Clause 4: Terms related to chemical analys

32、is Clause 5: Terms related to measurement of other propertiesThese headings are intended as guide only, as some techniques can determine more than one property. Subclause 3.1 lists the overarching measurands that apply to the rest of Clause 3. Other measurands are more technique specific and are pla

33、ced in the text adjacent to the technique.It should be noted that most techniques require analysis in a non-native state and involve sample preparation, for example placing the nano-objects on a surface or placing it in a specific fluid or vacuum. This could change the nature of the nano-objects.The

34、 order of the techniques in this document should not be taken to indicate a preference and the techniques listed in this document are not intended to be exhaustive. Equally, some of the techniques listed in this document are more popular than others in their usage in analysing certain properties of

35、nano-objects. Table 1 lists alphabetically the main current techniques for nano-object characterization.Table 1 Alphabetical list of main current techniques for nano-object characterizationProperty Current main techniquesSize atomic force microscopy (AFM), centrifugal liquid sedimentation (CLS), dif

36、ferential mobility analysing system (DMAS), dynamic light scattering (DLS), scanning electron microscopy (SEM), particle tracking analysis (PTA), transmission electron microscopy (TEM)Shape atomic force microscopy (AFM), scanning electron microscopy (SEM), transmission electron microscopy (TEM)Surfa

37、ce area Brunauer-Emmett-Teller (BET) methodSurface chemistry secondary ion mass spectrometry (SIMS), X-ray photoelectron spectroscopy (XPS)Chemistry of the bulk sampleinductively coupled plasma mass spectrometry (ICP-MS), nuclear magnetic resonance spectroscopy (NMR)Charge in suspensions zeta potent

38、ialThis document is intended to serve as a starting reference for the vocabulary that underpins measurement and characterization efforts in the field of nanotechnologies.vi ISO 2013 All rights reservedPD CEN ISO/TS 80004-6:2015 ISO/TS 80004-6:2013(E)TECHNICAL SPECIFICATION Nanotechnologies Vocabular

39、y Part 6: Nano-object characterization1 ScopeThis Technical Specification lists terms and definitions relevant to the characterization of nano-objects.2 General terms2.1nanoscalesize range from approximately 1 nm to 100 nmNote 1 to entry: Properties that are not extrapolations from a larger size wil

40、l typically, but not exclusively, be exhibited in this size range. For such properties the size limits are considered approximate.Note 2 to entry: The lower limit in this definition (approximately 1 nm) is introduced to avoid single and small groups of atoms from being designated as nano-objects (2.

41、2) or elements of nanostructures, which might be implied by the absence of a lower limit.SOURCE: ISO/TS 80004-1:2010, definition 2.12.2nano-objectmaterial with one, two or three external dimensions in the nanoscale (2.1)Note 1 to entry: Generic term for all discrete nanoscale objects.SOURCE: ISO/TS

42、80004-1:2010, definition 2.52.3nanoparticlenano-object (2.2) with all three external dimensions in the nanoscale (2.1)Note 1 to entry: If the lengths of the longest to the shortest axes of the nano-object differ significantly (typically by more than three times), the terms nanofibre (2.6) or nanopla

43、te (2.4) are intended to be used instead of the term nanoparticle.SOURCE: ISO/TS 27687:2008, definition 4.12.4nanoplatenano-object (2.2) with one external dimension in the nanoscale (2.1) and the two other external dimensions significantly largerNote 1 to entry: The smallest external dimension is th

44、e thickness of the nanoplate.Note 2 to entry: The two significantly larger dimensions are considered to differ from the nanoscale dimension by more than three times.Note 3 to entry: The larger external dimensions are not necessarily in the nanoscale.SOURCE: ISO/TS 27687:2008, definition 4.2 ISO 2013

45、 All rights reserved 1ISO/TS 80004-6:2013(E)PD CEN ISO/TS 80004-6:20152.5nanorodsolid nanofibre (2.6)SOURCE: ISO/TS 27687:2008, definition 4.52.6nanofibrenano-object (2.2) with two similar external dimensions in the nanoscale (2.1) and the third dimension significantly largerNote 1 to entry: A nanof

46、ibre can be flexible or rigid.Note 2 to entry: The two similar external dimensions are considered to differ in size by less than three times and the significantly larger external dimension is considered to differ from the other two by more than three times.Note 3 to entry: The largest external dimen

47、sion is not necessarily in the nanoscale.SOURCE: ISO/TS 27687:2008, definition 4.32.7nanotubehollow nanofibre (2.6)SOURCE: ISO/TS 27687:2008, definition 4.42.8quantum dotcrystalline nanoparticle (2.3) that exhibits size-dependent properties due to quantum confinement effects on the electronic states

48、SOURCE: ISO/TS 27687:2008, definition 4.72.9particleminute piece of matter with defined physical boundariesNote 1 to entry: A physical boundary can also be described as an interface.Note 2 to entry: A particle can move as a unit.Note 3 to entry: This general particle definition applies to nano-objec

49、ts (2.2).SOURCE: ISO 14644-6:2007, definition 2.102 and ISO/TS 27687:2008, definition 3.12.10agglomeratecollection of weakly bound particles (2.9) or aggregates (2.11) or mixtures of the two where the resulting external surface area is similar to the sum of the surface areas of the individual componentsNote 1 to entry: The forces holding an agglomerate together are weak forces, for example van der Waals forces, or simple physical entanglement.Note 2 to entry: Agglomerates are also termed secondary particles and the