ETSI ES 203 119-6-2018 Methods for Testing and Specification (MTS) The Test Description Language (TDL) Part 6 Mapping to TTCN-3 (V1 1 1).pdf

1、 ETSI ES 203 119-6 V1.1.1 (2018-06) Methods for Testing and Specification (MTS); The Test Description Language (TDL); Part 6: Mapping to TTCN-3 ETSI STANDARD ETSI ETSI ES 203 119-6 V1.1.1 (2018-06)2 Reference DES/MTS-203119-6 Keywords methodology, model, testing, TTCN-3 ETSI 650 Route des Lucioles F

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6、ification No part may be reproduced or utilized in any form or by any means, electronic or mechanical, including photocopying and microfilm except as authorized by written permission of ETSI. The content of the PDF version shall not be modified without the written authorization of ETSI. The copyrigh

7、t and the foregoing restriction extend to reproduction in all media. ETSI 2018. All rights reserved. DECTTM, PLUGTESTSTM, UMTSTMand the ETSI logo are trademarks of ETSI registered for the benefit of its Members. 3GPPTM and LTETMare trademarks of ETSI registered for the benefit of its Members and of

8、the 3GPP Organizational Partners. oneM2M logo is protected for the benefit of its Members. GSMand the GSM logo are trademarks registered and owned by the GSM Association. ETSI ETSI ES 203 119-6 V1.1.1 (2018-06)3 Contents Intellectual Property Rights 7g3Foreword . 7g3Modal verbs terminology 7g31 Scop

9、e 8g32 References 8g32.1 Normative references . 8g32.2 Informative references 8g33 Definitions and abbreviations . 9g33.1 Definitions 9g33.2 Abbreviations . 9g34 Basic Principles 9g34.1 Introduction 9g34.2 Document Structure 9g34.3 Notational Conventions 10g34.3.0 General 10g34.3.1 Functions used in

10、 production rules . 11g34.3.2 Predefined Annotations . 11g34.4 Conformance 11g35 Foundation 11g35.1 Overview 11g35.2 Mapping of Foundation Elements 11g35.2.1 Element . 11g35.2.2 NamedElement . 12g35.2.3 PackageableElement . 12g35.2.4 Package . 12g35.2.5 ElementImport 12g35.2.6 Comment 12g35.2.7 Anno

11、tation 13g35.2.8 AnnotationType 13g35.2.9 TestObjective 13g36 Data 13g36.1 Overview 13g36.2 Mapping of Data Definition Elements 14g36.2.1 DataResourceMapping 14g36.2.2 MappableDataElement 14g36.2.3 DataElementMapping . 14g36.2.4 ParameterMapping 14g36.2.5 DataType 14g36.2.6 DataInstance . 14g36.2.7

12、SimpleDataType . 14g36.2.8 SimpleDataInstance 14g36.2.9 StructuredDataType 15g36.2.10 Member . 15g36.2.11 StructuredDataInstance . 15g36.2.12 MemberAssignment 15g36.2.13 CollectionDataType 16g36.2.14 CollectionDataInstance . 16g36.2.15 ProcedureSignature . 16g36.2.16 ProcedureParameter 16g36.2.17 Pa

13、rameterKind 16g36.2.18 Parameter 16g36.2.19 FormalParameter . 16g36.2.20 Variable 16g3ETSI ETSI ES 203 119-6 V1.1.1 (2018-06)4 6.2.21 Action . 17g36.2.22 Function 17g36.2.23 UnassignedMemberTreatment 17g36.2.24 PredefinedFunction . 18g36.3 Mapping of Data Use Elements 18g36.3.1 DataUse 18g36.3.2 Par

14、ameterBinding . 18g36.3.3 StaticDataUse . 18g36.3.4 DataInstanceUse . 18g36.3.5 SpecialValueUse . 20g36.3.6 AnyValue 20g36.3.7 AnyValueOrOmit . 20g36.3.8 OmitValue. 20g36.3.9 DynamicDataUse 20g36.3.10 FunctionCall . 20g36.3.11 FormalParameterUse 22g36.3.12 VariableUse 23g36.3.13 PredefinedFunctionCa

15、ll 25g37 Time . 25g37.1 Overview 25g37.2 Mapping of Time Elements 25g37.2.1 Time 25g37.2.2 TimeLabel . 25g37.2.3 TimeLabelUse . 26g37.2.4 TimeLabelUseKind . 26g37.2.5 TimeConstraint . 26g37.2.6 TimeOperation 28g37.2.7 Wait 28g37.2.8 Quiescence 28g37.2.9 Timer 28g37.2.10 TimerOperation . 29g37.2.11 T

16、imerStart . 29g37.2.12 TimerStop . 29g37.2.13 TimeOut 29g38 Test Configuration 29g38.1 Overview 29g38.2 Mapping of TestConfiguration Elements in Non-special Cases . 29g38.2.1 Introduction. 29g38.2.2 GateType 30g38.2.3 GateTypeKind . 30g38.2.4 GateInstance . 30g38.2.5 ComponentType . 31g38.2.6 Compon

17、entInstance 31g38.2.7 ComponentInstanceRole . 31g38.2.8 GateReference . 31g38.2.9 Connection 32g38.2.10 TestConfiguration . 32g38.2.11 Definition of the component type of MTC . 32g38.2.12 Definition of the component type of system . 33g38.3 Mapping of TestConfiguration Elements in Special Cases 33g3

18、8.3.1 Introduction. 33g38.3.2 Connectable and mappable GateType. 33g38.3.3 A gate connected to a Tester and an SUT . 33g38.3.4 More than one SUT. 34g38.3.5 A gate of a Tester is connected to more SUTs 35g38.3.6 A gate is connected to more gates of the same component . 35g39 Test Behaviour . 36g39.1

19、Overview 36g39.2 Mapping of Test Description Elements 37g39.2.1 TestDescription . 37g3ETSI ETSI ES 203 119-6 V1.1.1 (2018-06)5 9.2.2 BehaviourDescription . 39g39.3 Mapping of Combined Behaviour elements . 39g39.3.1 Behaviour 39g39.3.2 Block . 39g39.3.3 LocalExpression . 39g39.3.4 CombinedBehaviour .

20、 39g39.3.5 SingleCombinedBehaviour . 39g39.3.6 CompoundBehaviour 39g39.3.7 BoundedLoopBehaviour . 40g39.3.8 UnboundedLoopBehaviour. 40g39.3.9 OptionalBehaviour 40g39.3.10 MultipleCombinedBehaviour . 42g39.3.11 AlternativeBehaviour 43g39.3.12 ConditionalBehaviour . 43g39.3.13 ParallelBehaviour . 43g3

21、9.3.14 ExceptionalBehaviour . 44g39.3.15 DefaultBehaviour 46g39.3.16 InterruptBehaviour 46g39.3.17 PeriodicBehaviour 46g39.4 Mapping of Atomic Behaviour Elements . 46g39.4.1 AtomicBehaviour 46g39.4.2 Break . 46g39.4.3 Stop . 47g39.4.4 VerdictAssignment . 47g39.4.5 Assertion . 47g39.4.6 Interaction .

22、 47g39.4.7 Message 47g39.4.8 ProcedureCall . 48g39.4.9 Target 50g39.4.10 ValueAssignment 50g39.4.11 TestDescriptionReference . 50g39.4.12 ComponentInstanceBinding 50g39.4.13 ActionBehaviour . 51g39.4.14 ActionReference . 51g39.4.15 InlineAction 51g39.4.16 Assignment . 51g310 Predefined TDL Model Ins

23、tances . 51g310.1 Overview 51g310.2 Mapping of Predefined Instances of the SimpleDataType Element . 51g310.2.1 Boolean . 51g310.2.2 Integer . 51g310.2.3 String 52g310.2.4 Verdict 52g310.3 Mapping of Predefined Instances of SimpleDataInstance Element 52g310.3.1 true 52g310.3.2 false . 52g310.3.3 pass

24、 . 52g310.3.4 fail . 52g310.3.5 inconclusive 52g310.4 Mapping of Predefined Instances of Time Element 52g310.4.1 Second 52g310.5 Mapping of Predefined Instances of the Function Element 52g310.5.1 Overview 52g310.5.2 Functions of Return Type Boolean 52g310.5.3 Functions of Return Type Integer 54g310.

25、5.4 Functions of Return Type of Instance of Time 54g3Annex A (informative): Examples of mapping TDL to TTCN-3 . 55g3A.1 Introduction 55g3A.2 A 3GPP Conformance Example in Textual Syntax . 55g3ETSI ETSI ES 203 119-6 V1.1.1 (2018-06)6 A.3 An IMS Interoperability Example in Textual Syntax . 60g3History

26、 67g3ETSI ETSI ES 203 119-6 V1.1.1 (2018-06)7 Intellectual Property Rights Essential patents IPRs essential or potentially essential to normative deliverables may have been declared to ETSI. The information pertaining to these essential IPRs, if any, is publicly available for ETSI members and non-me

27、mbers, and can be found in ETSI SR 000 314: “Intellectual Property Rights (IPRs); Essential, or potentially Essential, IPRs notified to ETSI in respect of ETSI standards“, which is available from the ETSI Secretariat. Latest updates are available on the ETSI Web server (https:/ipr.etsi.org/). Pursua

28、nt to the ETSI IPR Policy, no investigation, including IPR searches, has been carried out by ETSI. No guarantee can be given as to the existence of other IPRs not referenced in ETSI SR 000 314 (or the updates on the ETSI Web server) which are, or may be, or may become, essential to the present docum

29、ent. Trademarks The present document may include trademarks and/or tradenames which are asserted and/or registered by their owners. ETSI claims no ownership of these except for any which are indicated as being the property of ETSI, and conveys no right to use or reproduce any trademark and/or traden

30、ame. Mention of those trademarks in the present document does not constitute an endorsement by ETSI of products, services or organizations associated with those trademarks. Foreword This ETSI Standard (ES) has been produced by ETSI Technical Committee Methods for Testing and Specification (MTS). The

31、 present document is part 6 of a multi-part deliverable covering the Test Description Language. Full details of the entire series can be found in part 1 1. Modal verbs terminology In the present document “shall“, “shall not“, “should“, “should not“, “may“, “need not“, “will“, “will not“, “can“ and “

32、cannot“ are to be interpreted as described in clause 3.2 of the ETSI Drafting Rules (Verbal forms for the expression of provisions). “must“ and “must not“ are NOT allowed in ETSI deliverables except when used in direct citation. ETSI ETSI ES 203 119-6 V1.1.1 (2018-06)8 1 Scope The present document s

33、pecifies how the elements of the Test Description Language (TDL) should be mapped to Testing and Test Control Notation version 3 (TTCN-3) 2. The intended use of the present document is to serve as the basis for the development of TDL tools. The meta-model of TDL and the meanings of the meta-classes

34、are described in ETSI ES 203 119-1 1. 2 References 2.1 Normative references References are either specific (identified by date of publication and/or edition number or version number) or non-specific. For specific references, only the cited version applies. For non-specific references, the latest ver

35、sion of the referenced document (including any amendments) applies. Referenced documents which are not found to be publicly available in the expected location might be found at https:/docbox.etsi.org/Reference. NOTE: While any hyperlinks included in this clause were valid at the time of publication,

36、 ETSI cannot guarantee their long term validity. The following referenced documents are necessary for the application of the present document. 1 ETSI ES 203 119-1 (V1.4.1): “Methods for Testing and Specification (MTS); The Test Description Language (TDL); Part 1: Abstract Syntax and Associated Seman

37、tics“. 2 ETSI ES 201 873-1 (V4.9.1): “Methods for Testing and Specification (MTS); The Testing and Test Control Notation version 3; Part 1: TTCN-3 Core Language“. 3 ETSI ES 203 119-3 (V1.3.1): “Methods for Testing and Specification (MTS); The Test Description Language (TDL); Part 3: Exchange Format“

38、. 2.2 Informative references References are either specific (identified by date of publication and/or edition number or version number) or non-specific. For specific references, only the cited version applies. For non-specific references, the latest version of the referenced document (including any

39、amendments) applies. NOTE: While any hyperlinks included in this clause were valid at the time of publication, ETSI cannot guarantee their long term validity. The following referenced documents are not necessary for the application of the present document but they assist the user with regard to a pa

40、rticular subject area. i.1 ETSI TS 136 523-1 (V10.2.0): “LTE; Evolved Universal Terrestrial Radio Access (E-UTRA) and Evolved Packet Core (EPC); User Equipment (UE) conformance specification; Part 1: Protocol conformance specification (3GPP TS 36.523-1 version 10.2.0 Release 10)“. i.2 ETSI TS 186 01

41、1-2: “Core Network and Interoperability Testing (INT); IMS NNI Interoperability Test Specifications (3GPP Release 10); Part 2: Test descriptions for IMS NNI Interoperability“. ETSI ETSI ES 203 119-6 V1.1.1 (2018-06)9 3 Definitions and abbreviations 3.1 Definitions For the purposes of the present doc

42、ument, the following terms and definitions apply: behaviour function: function used in TTCN code that describes the behaviour of a TDL component instance TTCNname: name of a TDL meta-model element that is used in the TTCN code NOTE: A TTCNname of a TDL element follows the syntactical rules of identi

43、fiers specified in ETSI ES 201 873-1 2. A TTCNname of a TDL element may contain a part that is derived from the TDL name with some prefixes and/or postfixes determined by a naming convention used in the TTCN-3 code. 3.2 Abbreviations For the purposes of the present document, the following abbreviati

44、ons apply: IMS IP Multimedia Subsystem MTC Main Test Component PTC Parallel Test ComponentSUT System Under Test TDL Test Description Language TTCN-3 Testing and Test Control Notation version 3 4 Basic Principles 4.1 Introduction While both TDL and TTCN-3 are standardized languages, there are various

45、 ways how TTCN-3 code can be derived from a TDL test description. This may result in different or even incompatible code intended to implement the same test description. Without a standardized mapping of TDL to TTCN-3, there could be a proliferation of different and possibly incompatible tool- and u

46、ser-specific mappings of TDL test descriptions to executable test cases which can present new challenges to users and tool vendors. A standardized mapping between the two languages provides a consistent approach for producing executable tests from high level test descriptions specified in TDL. This

47、enables the generation of executable tests from TDL test descriptions in a (semi-) automatic way, and by extension of the re-use of existing test tools and frameworks for test execution. This way, test engineers can concentrate on the specification of test descriptions at a higher level of abstracti

48、on, while having a clear expectation of what the resulting test implementation will look like. 4.2 Document Structure The meta-model of the Test Description Language is specified in ETSI ES 203 119-1 1. The present document specifies how the elements of the meta-model of TDL in locally ordered TestD

49、escriptions should be mapped to TTCN-3 code. The mapping of the globally ordered TestDescriptions is outside the scope of the present document. The structure of the present document follows the structure of the meta-model specification in ETSI ES 203 119-1 1. The clauses 5 to 10 describe the standardized mappings of the meta-model elements with identical clause numbers in ETSI ES 203 119-1 1. In each clause, first the description of the mapping of the corresponding meta-model element is described. It may be followed by a Constraints se