1、 ETSI TS 102 230 V10.2.0 (2015-03) Smart Cards; UICC-Terminal interface; Physical, electrical and logical test specification (Release 10) TECHNICAL SPECIFICATION ETSI ETSI TS 102 230 V10.2.0 (2015-03)2Release 10Reference RTS/SCP-00013va20 Keywords smart card, testing ETSI 650 Route des Lucioles F-06
2、921 Sophia Antipolis Cedex - FRANCE Tel.: +33 4 92 94 42 00 Fax: +33 4 93 65 47 16 Siret N 348 623 562 00017 - NAF 742 C Association but non lucratif enregistre la Sous-Prfecture de Grasse (06) N 7803/88 Important notice The present document can be downloaded from: http:/www.etsi.org/standards-searc
3、h The present document may be made available in electronic versions and/or in print. The content of any electronic and/or print versions of the present document shall not be modified without the prior written authorization of ETSI. In case of any existing or perceived difference in contents between
4、such versions and/or in print, the only prevailing document is the print of the Portable Document Format (PDF) version kept on a specific network drive within ETSI Secretariat. Users of the present document should be aware that the document may be subject to revision or change of status. Information
5、 on the current status of this and other ETSI documents is available at http:/portal.etsi.org/tb/status/status.asp If you find errors in the present document, please send your comment to one of the following services: https:/portal.etsi.org/People/CommiteeSupportStaff.aspx Copyright Notification No
6、part may be reproduced or utilized in any form or by any means, electronic or mechanical, including photocopying and microfilm except as authorized by written permission of ETSI. The content of the PDF version shall not be modified without the written authorization of ETSI. The copyright and the for
7、egoing restriction extend to reproduction in all media. European Telecommunications Standards Institute 2015. All rights reserved. DECTTM, PLUGTESTSTM, UMTSTMand the ETSI logo are Trade Marks of ETSI registered for the benefit of its Members. 3GPPTM and LTE are Trade Marks of ETSI registered for the
8、 benefit of its Members and of the 3GPP Organizational Partners. GSM and the GSM logo are Trade Marks registered and owned by the GSM Association. ETSI ETSI TS 102 230 V10.2.0 (2015-03)3Release 10Contents Intellectual Property Rights 11g3Foreword . 11g3Modal verbs terminology 11g3Introduction 11g31
9、Scope 12g32 References 12g32.1 Normative references . 12g32.2 Informative references 13g33 Definitions, symbols, abbreviations and coding conventions 13g33.1 Definitions 13g33.2 Symbols 13g33.3 Abbreviations . 14g33.4 Coding conventions 15g33.5 Applicability . 15g33.5.1 Applicability of the present
10、document 15g33.5.2 Applicability of the individual test cases 15g33.5.3 Applicability to terminal equipment . 15g33.6 Definitions 15g33.6.1 Format of table of the table of optional features . 15g33.6.2 Format of the applicability table . 15g33.6.3 Status and Notations 16g33.7 Table of optional featu
11、res . 16g33.8 Applicability table 17g34 Physical characteristic tests 19g34.1 Contact pressure . 19g34.1.1 Definition and applicability 19g34.1.2 Conformance requirement 19g34.1.2.1 Reference 19g34.1.3 Test purpose 19g34.1.4 Method of test . 19g34.1.4.1 Initial conditions . 19g34.1.4.2 Procedure 19g
12、34.1.5 Acceptance criteria . 19g34.2 Curvature of the contacting elements . 19g34.2.1 Definition and applicability 19g34.2.2 Conformance requirement 19g34.2.2.1 Reference 19g34.2.3 Test purpose 20g34.2.4 Method of test . 20g34.2.4.1 Initial conditions . 20g34.2.4.2 Procedure 20g34.2.5 Acceptance cri
13、teria . 20g35 Electrical characteristic tests 20g35.1 Test of the power transition phases 20g35.1.1 Phase preceding Terminal power on . 20g35.1.1.1 Definition and applicability . 20g35.1.1.2 Conformance requirement. 20g35.1.1.3 Reference 20g35.1.1.4 Test purpose 20g35.1.1.5 Method of test . 20g35.1.
14、1.5.1 Initial condition . 20g35.1.1.5.2 Procedure . 20g35.1.1.6 Acceptance criteria 21g35.1.2 Phase during UICC power on . 21g3ETSI ETSI TS 102 230 V10.2.0 (2015-03)4Release 105.1.2.1 Phase during UICC power on: 3 V - 5 V 21g35.1.2.1.1 Definition and applicability . 21g35.1.2.1.2 Conformance require
15、ment . 21g35.1.2.1.3 Reference . 21g35.1.2.1.4 Test purpose 21g35.1.2.1.5 Method of test 21g35.1.2.1.6 Acceptance criteria 21g35.1.2.2 Phase during UICC power on: 1,8 V - 3 V . 22g35.1.2.2.1 Definition and applicability . 22g35.1.2.2.2 Conformance requirement . 22g35.1.2.2.3 Reference . 22g35.1.2.2.
16、4 Test purpose 22g35.1.2.2.5 Method of test 22g35.1.2.2.6 Acceptance criteria 22g35.1.3 Phase during Terminal power off . 23g35.1.3.1 Phase during Terminal power off: 3 V - 5 V . 23g35.1.3.1.1 Definition and applicability . 23g35.1.3.1.2 Conformance requirement . 23g35.1.3.1.3 Reference . 23g35.1.3.
17、1.4 Test purpose 23g35.1.3.1.5 Method of test 23g35.1.3.1.6 Acceptance criteria 23g35.1.3.2 Phase during Terminal power off: 1.8 V - 3 V 24g35.1.3.2.1 Definition and applicability . 24g35.1.3.2.2 Conformance requirement . 24g35.1.3.2.3 Reference . 24g35.1.3.2.4 Test purpose 24g35.1.3.2.5 Method of t
18、est 24g35.1.3.2.6 Acceptance criteria 24g35.1.4 Warm reset timing 25g35.1.4.1 Definition and applicability . 25g35.1.4.2 Conformance requirement. 25g35.1.4.2.1 Reference . 25g35.1.4.3 Test purpose 25g35.1.4.4 Method of test . 25g35.1.4.4.1 Initial conditions 25g35.1.4.4.2 Procedure . 25g35.1.4.5 Acc
19、eptance criteria 25g35.1.5 UICC type recognition and voltage switching 26g35.1.5.1 Reaction of 3 V technology Terminals on type recognition of 3 V technology UICCs 26g35.1.5.1.1 Definition and applicability . 26g35.1.5.1.2 Conformance requirement . 26g35.1.5.1.3 Reference . 26g35.1.5.1.4 Test purpos
20、e 26g35.1.5.1.5 Method of test 26g35.1.5.1.6 Acceptance criteria 26g35.1.5.2 Reaction of 3 V technology Terminals on type recognition of 1,8 V technology UICCs . 27g35.1.5.2.1 Definition and applicability . 27g35.1.5.2.2 Conformance requirement . 27g35.1.5.2.3 Reference . 27g35.1.5.2.4 Test purpose
21、27g35.1.5.2.5 Method of test 27g35.1.5.2.6 Acceptance criteria 27g35.1.5.3 Reaction of 1,8 V technology Terminals on type recognition of 1,8 V technology UICCs 27g35.1.5.3.1 Definition and applicability . 27g35.1.5.3.2 Conformance requirement . 28g35.1.5.3.3 Reference . 28g35.1.5.3.4 Test purpose 28
22、g35.1.5.3.5 Method of test 28g35.1.5.3.6 Acceptance criteria 28g35.1.5.4 Reaction of 1,8 V technology Terminals on type recognition of 3 V technology UICCs . 28g35.1.5.4.1 Definition and applicability . 28g3ETSI ETSI TS 102 230 V10.2.0 (2015-03)5Release 105.1.5.4.2 Conformance requirement . 28g35.1.
23、5.4.3 Reference . 29g35.1.5.4.4 Test purpose 29g35.1.5.4.5 Method of test 29g35.1.5.4.6 Acceptance criteria 29g35.1.5.5 Void. 29g35.1.5.6 Reaction of Terminals receiving no ATR . 29g35.1.5.6.1 Reaction of Terminals receiving no ATR, 3 V - 5 V . 29g35.1.5.6.2 Reaction of Terminals receiving no ATR, 1
24、,8 V - 3 V 30g35.2 Electrical tests on each Terminal contact . 31g35.2.1 Nominal test conditions 31g35.2.2 Electrical tests on contact C1 31g35.2.2.1 Electrical tests on contact C1, Test 1: 3 V - 5 V . 31g35.2.2.1.1 Definition and applicability . 31g35.2.2.1.2 Conformance requirement . 32g35.2.2.1.3
25、 Reference . 32g35.2.2.1.4 Test purpose 32g35.2.2.1.5 Method of test 32g35.2.2.1.6 Acceptance criteria 32g35.2.2.2 Electrical tests on contact C1, Test 2: 3 V - 5 V . 32g35.2.2.2.1 Definition and applicability . 32g35.2.2.2.2 Conformance requirement . 32g35.2.2.2.3 Reference . 32g35.2.2.2.4 Test pur
26、pose 33g35.2.2.2.5 Method of test 33g35.2.2.2.6 Acceptance criteria 35g35.2.2.3 Electrical tests on contact C1, Test 1: 1,8 V - 3 V 35g35.2.2.3.1 Definition and applicability . 35g35.2.2.3.2 Conformance requirement . 35g35.2.2.3.3 Reference . 35g35.2.2.3.4 Test purpose 35g35.2.2.3.5 Method of test 3
27、5g35.2.2.3.6 Acceptance criteria 35g35.2.2.4 Electrical tests on contact C1, Test 2: 1,8 V - 3 V 36g35.2.2.4.1 Definition and applicability . 36g35.2.2.4.2 Conformance requirement . 36g35.2.2.4.3 Reference . 36g35.2.2.4.4 Test purpose 36g35.2.2.4.5 Method of test 36g35.2.2.4.6 Acceptance criteria 37
28、g35.2.3 Electrical tests on contact C2 37g35.2.3.1 Electrical tests on contact C2: 3 V - 5 V . 37g35.2.3.1.1 Definition and applicability . 37g35.2.3.1.2 Conformance requirement . 38g35.2.3.1.3 Reference . 38g35.2.3.1.4 Test purpose 38g35.2.3.1.5 Method of test 38g35.2.3.1.6 Acceptance criteria 38g3
29、5.2.3.2 Electrical tests on contact C2: 1,8 V - 3 V 38g35.2.3.2.1 Definition and applicability . 38g35.2.3.2.2 Conformance requirement . 38g35.2.3.2.3 Reference . 38g35.2.3.2.4 Test purpose 39g35.2.3.2.5 Method of test 39g35.2.3.2.6 Acceptance criteria 39g35.2.4 Electrical tests on contact C3 39g35.
30、2.4.1 Electrical tests on contact C3: 3 V - 5 V . 39g35.2.4.1.1 Definition and applicability . 39g35.2.4.1.2 Conformance requirement . 39g35.2.4.1.3 Reference . 40g35.2.4.1.4 Test purpose 40g35.2.4.1.5 Method of test 40g3ETSI ETSI TS 102 230 V10.2.0 (2015-03)6Release 105.2.4.1.6 Acceptance criteria
31、40g35.2.4.2 Electrical tests on contact C3: 1,8 V - 3 V 40g35.2.4.2.1 Definition and applicability . 40g35.2.4.2.2 Conformance requirement . 40g35.2.4.2.3 Reference . 41g35.2.4.2.4 Test purpose 41g35.2.4.2.5 Method of test 41g35.2.4.2.6 Acceptance criteria 41g35.2.5 Electrical tests on contact C7 41
32、g35.2.5.1 Electrical tests on contact C7, Test 1: 3 V - 5 V . 41g35.2.5.1.1 Definition and applicability . 41g35.2.5.1.2 Conformance requirement . 41g35.2.5.1.3 Reference . 42g35.2.5.1.4 Test purpose 42g35.2.5.1.5 Method of test 42g35.2.5.1.6 Acceptance criteria 42g35.2.5.2 Electrical tests on conta
33、ct C7, Test 2: 3 V - 5 V . 42g35.2.5.2.1 Definition and applicability . 42g35.2.5.2.2 Conformance requirement . 42g35.2.5.2.3 Reference . 43g35.2.5.2.4 Test purpose 43g35.2.5.2.5 Method of test 43g35.2.5.2.6 Acceptance criteria 43g35.2.5.3 Electrical tests on contact C7, Test 1: 1,8 V - 3 V 44g35.2.
34、5.3.1 Definition and applicability . 44g35.2.5.3.2 Conformance requirement . 44g35.2.5.3.3 Reference . 44g35.2.5.3.4 Test purpose 44g35.2.5.3.5 Method of test 44g35.2.5.3.6 Acceptance criteria 45g35.2.5.4 Electrical tests on contact C7, Test 2: 1,8 V - 3 V 45g35.2.5.4.1 Definition and applicability
35、. 45g35.2.5.4.2 Conformance requirement . 45g35.2.5.4.3 Reference . 45g35.2.5.4.4 Test purpose 46g35.2.5.4.5 Method of test 46g35.2.5.4.6 Acceptance criteria 46g36 Initial communication tests 46g36.1 ATR 46g36.1.1 ATR characters . 46g36.1.1.1 Definition and applicability . 46g36.1.1.2 Conformance re
36、quirement. 46g36.1.1.2.1 Reference . 46g36.1.1.3 Test purpose 46g36.1.1.4 Method of test . 47g36.1.1.4.1 Initial conditions 47g36.1.1.4.2 Procedure . 47g36.1.1.5 Acceptance criteria 49g36.2 Clock stop mode with 1,8 V technology UICC 50g36.2.1 Definition and applicability 50g36.2.2 Conformance requir
37、ement 50g36.2.2.1 Reference 50g36.2.3 Test purpose 50g36.2.4 Method of test . 50g36.2.4.1 Initial conditions . 50g36.2.4.2 Procedure 50g36.2.5 Acceptance criteria . 52g36.3 Clock stop mode with 3 V technology UICC . 52g36.3.1 Definition and applicability 52g36.3.2 Conformance requirement 52g36.3.2.1
38、 Reference 53g3ETSI ETSI TS 102 230 V10.2.0 (2015-03)7Release 106.3.3 Test purpose 53g36.3.4 Method of test . 53g36.3.4.1 Initial conditions . 53g36.3.4.2 Procedure 53g36.3.5 Acceptance criteria . 55g36.4 Void 55g36.5 Speed enhancement 55g36.5.1 Definition and applicability 55g36.5.2 Conformance req
39、uirement 55g36.5.3 Test purpose 55g36.5.4 Method of test . 55g36.5.4.1 Initial conditions . 55g36.5.4.2 Procedure 55g36.5.5 Acceptance criteria . 56g37 Transmission protocol tests 57g37.1 Character transmission . 57g37.1.1 Bit/character duration during the transmission from the Terminal to the UICC
40、. 57g37.1.1.1 Definition and applicability . 57g37.1.1.2 Conformance requirement. 57g37.1.1.2.1 Reference . 57g37.1.1.3 Test purpose 57g37.1.1.4 Method of test . 57g37.1.1.4.1 Initial conditions 57g37.1.1.4.2 Procedure . 57g37.1.1.5 Acceptance criteria 57g37.1.2 Bit/character duration during the tra
41、nsmission from the UICC to the Terminal . 57g37.1.2.1 Definition and applicability . 57g37.1.2.2 Conformance requirement. 58g37.1.2.2.1 Reference . 58g37.1.2.3 Test purpose 58g37.1.2.4 Method of test . 58g37.1.2.4.1 Initial conditions 58g37.1.2.4.2 Procedure . 58g37.1.2.5 Acceptance criteria 58g37.2
42、 T=0 protocol . 58g37.2.1 Timing 58g37.2.1.1 Definition and applicability . 58g37.2.1.2 Conformance requirement. 58g37.2.1.2.1 Reference . 58g37.2.1.3 Test purpose 58g37.2.1.4 Method of test . 59g37.2.1.4.1 Initial conditions 59g37.2.1.4.2 Procedure . 59g37.2.1.5 Acceptance criteria 60g37.2.2 Comman
43、d processing, ACK, NACK, NULL procedure bytes . 60g37.2.2.1 Definition and applicability . 60g37.2.2.2 Conformance requirement. 60g37.2.2.2.1 Reference . 60g37.2.2.3 Test purpose 60g37.2.2.4 Method of test . 60g37.2.2.4.1 Initial conditions 60g37.2.2.4.2 Procedure . 60g37.2.2.5 Acceptance criteria 6
44、1g37.2.3 Case 2 command, use of procedure bytes 61xx and 6Cxx . 61g37.2.3.1 Definition and applicability . 61g37.2.3.2 Conformance requirement. 61g37.2.3.2.1 Reference . 61g37.2.3.3 Test purpose 61g37.2.3.4 Method of test . 61g37.2.3.4.1 Initial conditions 61g37.2.3.4.2 Procedure . 61g3ETSI ETSI TS
45、102 230 V10.2.0 (2015-03)8Release 107.2.3.5 Acceptance criteria 61g37.2.4 Case 4 command, use of procedure bytes 61xx . 62g37.2.4.1 Definition and applicability . 62g37.2.4.2 Conformance requirement. 62g37.2.4.2.1 Reference . 62g37.2.4.3 Test purpose 62g37.2.4.4 Method of test . 62g37.2.4.4.1 Initia
46、l conditions 62g37.2.4.4.2 Procedure . 62g37.2.4.5 Acceptance criteria 62g37.2.5 Command processing, warning and error status bytes 62g37.2.5.1 Definition and applicability . 62g37.2.5.2 Conformance requirement. 62g37.2.5.2.1 Reference . 63g37.2.5.3 Test purpose 63g37.2.5.4 Method of test . 63g37.2.
47、5.4.1 Initial conditions 63g37.2.5.4.2 Procedure . 63g37.2.5.5 Acceptance criteria 63g37.2.6 Error correction . 63g37.2.6.1 Definition and applicability . 63g37.2.6.2 Conformance requirement. 63g37.2.6.2.1 Reference . 63g37.2.6.3 Test purpose 63g37.2.6.4 Method of test . 63g37.2.6.4.1 Initial condit
48、ions 63g37.2.6.4.2 Procedure . 64g37.2.6.5 Acceptance criteria 64g37.2.7 Error detection 64g37.2.7.1 Definition and applicability . 64g37.2.7.2 Conformance requirement. 64g37.2.7.2.1 Reference . 64g37.2.7.3 Test purpose 64g37.2.7.4 Method of test . 64g37.2.7.4.1 Initial conditions 64g37.2.7.4.2 Proc
49、edure . 64g37.2.7.5 Acceptance criteria 64g37.3 T=1 protocol . 64g37.3.1 Character Waiting Time 64g37.3.1.1 Definition and applicability . 64g37.3.1.2 Conformance requirement. 64g37.3.1.2.1 Reference . 65g37.3.1.3 Test purpose 65g37.3.1.4 Method of test . 65g37.3.1.4.1 Initial conditions 65g37.3.1.4.2 Procedure . 65g37.3.1.5 Acceptance criteria 65g37.3.2 Block Timing 66g37.3.2.1 Definition and applicability . 66g37.3.2.2 Conformance requirement. 66g37.3.2.2.1 Reference . 66g37.3.2.3 Test purpose 66g37.3.2.4 Method of test . 66g37.3.2.4.1 Initial conditions 66g37.3.2.4.2 P
copyright@ 2008-2019 麦多课文库（www.mydoc123.com）网站版权所有
备案/许可证编号：苏ICP备17064731号-1