1、 ETSI TS 102 922-2 V7.0.0 (2011-03)Technical Specification Smart Cards;Test specification for the ETSI aspects ofthe IC_USB interface;Part 2: UICC features(Release 7)ETSI ETSI TS 102 922-2 V7.0.0 (2011-03)2Release 7 Reference DTS/SCP-00USBU Keywords smart card, terminal, USB ETSI 650 Route des Lucio
2、les F-06921 Sophia Antipolis Cedex - FRANCE Tel.: +33 4 92 94 42 00 Fax: +33 4 93 65 47 16 Siret N 348 623 562 00017 - NAF 742 C Association but non lucratif enregistre la Sous-Prfecture de Grasse (06) N 7803/88 Important notice Individual copies of the present document can be downloaded from: http:
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6、the foregoing restriction extend to reproduction in all media. European Telecommunications Standards Institute 2011. All rights reserved. DECTTM, PLUGTESTSTM, UMTSTM, TIPHONTM, the TIPHON logo and the ETSI logo are Trade Marks of ETSI registered for the benefit of its Members. 3GPPTM is a Trade Mark
7、 of ETSI registered for the benefit of its Members and of the 3GPP Organizational Partners. LTE is a Trade Mark of ETSI currently being registered for the benefit of its Members and of the 3GPP Organizational Partners. GSM and the GSM logo are Trade Marks registered and owned by the GSM Association.
8、 ETSI ETSI TS 102 922-2 V7.0.0 (2011-03)3Release 7 Contents Intellectual Property Rights 8g3Foreword . 8g3Introduction 8g31 Scope 9g32 References 9g32.1 Normative references . 9g32.2 Informative references 10g33 Definitions, symbols and abbreviations . 10g33.1 Definitions 10g33.2 Symbols 11g33.3 Abb
9、reviations . 11g33.4 Formats . 11g33.4.1 Format of the table of optional features 11g33.4.2 Format of the applicability table . 11g33.4.3 Status and Notations . 12g34 Test environment 12g34.1 Table of optional features . 12g34.2 Applicability table 13g34.3 Information provided by the device supplier
10、 13g34.4 Test equipment . 14g34.4.1 Measurement/setting uncertainties 14g34.4.2 Default conditions for DUT operation 14g34.4.2.1 Temperature 14g34.4.3 Minimum/maximum conditions for DUT operation . 14g34.5 Test execution 14g34.5.1 Parameter variations . 14g34.6 Pass criterion 14g35 Conformance Requi
11、rements . 15g35.1 USB UICC system architecture 15g35.2 Physical characteristics . 15g35.3 Electrical characteristics . 15g35.4 Initial communication establishment procedures . 16g35.5 USB interface operational features . 17g35.6 Protocol stacks for USB UICC applications . 18g35.7 USB Descriptors of
12、a USB UICC 19g35.8 Assigned values for vendor specifIC_USB requests 19g36 Test cases 19g36.1 Void 19g36.2 Physical Tests . 19g36.2.1 Test case 1: Dimensions of the UICC card . 19g36.2.1.1 Test execution . 19g36.2.1.2 Initial conditions . 20g36.2.1.3 Test procedure . 20g36.2.2 Test case 2: Mechanical
13、 characteristics 20g36.2.2.1 Test execution . 20g36.2.2.2 Initial conditions . 20g36.2.2.3 Test procedure . 20g36.3 Basic Electrical Tests . 20g36.3.1 Supply Voltage Value . 20g36.3.1.1 Test case 1: No connection for incorrect voltage class . 20g36.3.1.1.1 Test execution 20g36.3.1.1.2 Initial condit
14、ions 20g3ETSI ETSI TS 102 922-2 V7.0.0 (2011-03)4Release 7 6.3.1.1.3 Test procedure . 21g36.3.1.2 Test case 2: Reaction at Class C . 21g36.3.1.2.1 Test execution 21g36.3.1.2.2 Initial conditions 21g36.3.1.2.3 Test procedure . 21g36.3.1.3 Test case 3: Reaction at Class B 21g36.3.1.3.1 Test execution
15、21g36.3.1.3.2 Initial conditions 21g36.3.1.3.3 Test procedure . 21g36.4 Activation Tests 22g36.4.1 Voltage class Activation . 22g36.4.1.1 Test case 1: Support of voltage classes C and B 22g36.4.1.1.1 Test execution 22g36.4.1.1.2 Initial conditions 22g36.4.1.1.3 Test procedure . 22g36.4.1.2 Test case
16、 2: UICC detects non-USB Terminal 22g36.4.1.2.1 Test execution 22g36.4.1.2.2 Initial conditions 22g36.4.1.2.3 Test procedure . 23g36.4.2 Interface Selection/Activation 23g36.4.2.1 Test case 1: Activation of TS 102 221 interface only . 23g36.4.2.1.1 Test execution 23g36.4.2.1.2 Initial conditions 23g
17、36.4.2.1.3 Test procedure . 23g36.4.2.2 Test case 2: USB Interface selection - ATR procedure . 23g36.4.2.2.1 Test execution 23g36.4.2.2.2 Initial conditions 24g36.4.2.2.3 Test procedure . 24g36.4.2.3 Test case 3: USB Interface selection - USB procedure . 24g36.4.2.3.1 Test execution 24g36.4.2.3.2 In
18、itial conditions 24g36.4.2.3.3 Test procedure . 24g36.4.2.4 Test case 4: USB Interface selection - Concurrent procedure . 25g36.4.2.4.1 Test execution 25g36.4.2.4.2 Initial conditions 25g36.4.2.4.3 Test procedure . 25g36.4.2.5 Test case 5: Activation of TS 102 221 interface with PPS procedure . 25g3
19、6.4.2.5.1 Test execution 25g36.4.2.5.2 Initial conditions 25g36.4.2.5.3 Test procedure . 26g36.5 Initialisation Tests 26g36.5.1 Power Negotiation 26g36.5.1.1 Test case 1: Support of Get Interface power request current as requested 26g36.5.1.1.1 Test execution 26g36.5.1.1.2 Initial conditions 26g36.5
20、.1.1.3 Test procedure . 26g36.5.1.2 Test case 2: Support of Get Interface power request wLength greater than 2 . 26g36.5.1.2.1 Test execution 26g36.5.1.2.2 Initial conditions 27g36.5.1.2.3 Test procedure . 27g36.5.1.3 Test case 3: Support of Set Interface power request minimum current . 27g36.5.1.3.
21、1 Test execution 27g36.5.1.3.2 Initial conditions 27g36.5.1.3.3 Test procedure . 27g36.5.2 Resume Time Negotiation 27g36.5.2.1 Test case 1: Resume Time Negotiation . 27g36.5.2.1.1 Test execution 27g36.5.2.1.2 Initial conditions 27g36.5.2.1.3 Test procedure . 28g36.6 Descriptors . 28g36.6.1 Standard-
22、Descriptors 28g36.6.1.1 Device Descriptor . 28g3ETSI ETSI TS 102 922-2 V7.0.0 (2011-03)5Release 7 6.6.1.1.1 Test case 1: Device Descriptor Test 28g36.6.1.2 Configuration Descriptor with ICCD Interface . 29g36.6.1.2.1 Test case 1: Configuration Descriptor and ICCD Interface Descriptor Test . 29g36.6.
23、1.3 Interface Descriptor . 30g36.6.1.3.1 Test case 1: EEM Interface Descriptor Test 30g36.6.1.3.2 Test case 2: Mass Storage Interface Descriptor Test . 30g36.7 Protocol Stack and Higher Level 31g36.7.1 ICCD - APDU based UICC Applications . 31g36.7.1.1 Test case 1: Suspend with no effect on internal
24、State . 31g36.7.1.1.1 Test execution 31g36.7.1.1.2 Initial conditions 31g36.7.1.1.3 Test procedure . 31g36.7.2 USB ICCD Control B . 31g36.7.2.1 Test case 1: ICCD Control B Interface basic functionality . 31g36.7.2.1.1 Test execution 31g36.7.2.1.2 Initial conditions 31g36.7.2.1.3 Test procedure . 32g
25、36.7.3 USB ICCD Bulk . 32g36.7.3.1 Test case 1: ICCD Bulk Interface basic functionality . 32g36.7.3.1.1 Test execution 32g36.7.3.1.2 Initial conditions 32g36.7.3.1.3 Test procedure . 32g36.7.4 EEM - Ethernet Emulation Model 33g36.7.4.1 Test case 1: EEM Echo Test . 33g36.7.4.1.1 Test execution 33g36.
26、7.4.1.2 Initial conditions 33g36.7.4.1.3 Test procedure . 33g36.7.5 Mass-Storage 33g36.7.5.1 Test case 1: Device Type Test. 33g36.7.5.1.1 Test execution 33g36.7.5.1.2 Initial conditions 33g36.7.5.1.3 Test procedure . 33g36.7.5.2 Test case 2: Removable Media Test 34g36.7.5.2.1 Test execution 34g36.7.
27、5.2.2 Initial conditions 34g36.7.5.2.3 Test procedure . 34g36.7.5.3 Test case 3: Insufficent Power Capabilities for Mass Storage Test . 34g36.7.5.3.1 Test execution 34g36.7.5.3.2 Initial conditions 34g36.7.5.3.3 Test procedure . 35g36.7.5.4 Test case 4: Stop Unit Test 35g36.7.5.4.1 Test execution 35
28、g36.7.5.4.2 Initial conditions 35g36.7.5.4.3 Test procedure . 35g36.7.5.5 Test case 5: MBR Test 35g36.7.5.5.1 Test execution 35g36.7.5.5.2 Initial conditions 36g36.7.5.5.3 Test procedure . 36g3Annex A (informative): List of test cases for each conformance requirement 37g3Annex B (informative): Addit
29、ional optional test cases for USB ICCD 39g3B.1 USB ICCD Control B . 39g3B.1.1 Send XFR_BLOCK with Chaining (ICCD State=Waiting for Command APDU) 39g3B.1.1.1 Test execution . 39g3B.1.1.2 Initial conditions . 39g3B.1.1.3 Test procedure 39g3B.1.2 Send DATA_BLOCK with different length (ICCD State=4) 39g
30、3B.1.2.1 Test execution . 39g3B.1.2.2 Initial conditions . 40g3B.1.2.3 Test procedure 40g3ETSI ETSI TS 102 922-2 V7.0.0 (2011-03)6Release 7 B.1.3 Send valid commands in ICCD State= Ready to receive next command APDU part 40g3B.1.3.1 Test execution . 40g3B.1.3.2 Initial conditions . 40g3B.1.3.3 Test
31、procedure 40g3B.1.4 Send DATA_BLOCK with different length (ICCD State=3) 41g3B.1.4.1 Test execution . 41g3B.1.4.2 Initial conditions . 41g3B.1.4.3 Test procedure 41g3B.1.5 Send valid commands in ICCD State= Response APDU partially sent . 41g3B.1.5.1 Test execution . 41g3B.1.5.2 Initial conditions .
32、41g3B.1.5.3 Test procedure 42g3B.1.6 Send XFR Block (ICCD State= Response APDU partially sent) . 42g3B.1.6.1 Test execution . 42g3B.1.6.2 Initial conditions . 42g3B.1.6.3 Test procedure 42g3B.1.7 Send valid commands in ICCD State= 5 43g3B.1.7.1 Test execution . 43g3B.1.7.2 Initial conditions . 43g3B
33、.1.8.3 Test procedure 43g3B.2 USB ICCD Bulk . 43g3B.2.1 Send Icc Power On (ICCD State=Waiting for Command APDU) . 43g3B.2.1.1 Test execution . 43g3B.2.1.2 Initial conditions . 43g3B.2.1.3 Test procedure 44g3Annex C (informative): Additional optional requirements and test cases for Electrical charact
34、eristics. 45g3C.1 Conformance Requirements from Inter-Chip USB and USB 2.0 45g3C.1.1 Full-Speed general conditions 45g3C.1.2 Electrical Interface for voltage class C (1,8 V) 45g3C.1.3 Electrical Interface for voltage class B (3,0 V) 46g3C.1.4 Buffer Characteristics . 46g3C.1.5 Connection to IC_USB .
35、 46g3C.1.6 Electrical Characteristics for Currents 47g3C.1.7 Electrical Characteristics for Capacitive loads . 47g3C.2 Additional Electrical test cases . 47g3C.2.1 Electrical characteristics during connection to IC_USB 47g3C.2.1.1 Test case 1: Check timings and pull up resistors 47g3C.2.1.1.1 Test e
36、xecution . 47g3C.2.1.1.2 Initial conditions . 47g3C.2.1.1.3 Test procedure . 48g3C.2.2 Electrical characteristics during communication 48g3C.2.2.1 Test case 1: Full-Speed Timings and uninfluenced electrical characteristics for voltage class C 48g3C.2.2.1.1 Test execution . 48g3C.2.2.1.2 Initial cond
37、itions . 48g3C.2.2.1.3 Test procedure . 49g3C.2.2.2 Test case 2: Full-Speed Timings and uninfluenced electrical characteristics for voltage class B 49g3C.2.2.2.1 Test execution . 49g3C.2.2.2.2 Initial conditions . 49g3C.2.2.2.3 Test procedure . 50g3C.2.2.3 Test case 3: Electrical characteristics for
38、 voltage class C at limits 50g3C.2.2.3.1 Test execution . 50g3C.2.2.3.2 Initial conditions . 50g3C.2.2.3.3 Test procedure . 51g3C.2.2.4 Test case 4: Electrical characteristics for voltage class B at limits . 51g3C.2.2.4.1 Test execution . 51g3C.2.2.4.2 Initial conditions . 52g3C.2.2.4.3 Test procedu
39、re . 52g3C.2.2.5 Test case 5: Check power consumption ICCand Input current Iin. 52g3ETSI ETSI TS 102 922-2 V7.0.0 (2011-03)7Release 7 C.2.2.5.1 Test execution . 52g3C.2.2.5.2 Initial conditions . 53g3C.2.2.5.3 Test procedure . 53g3C.2.2.6 Test case 6: Check Capacitive loads during transmitting and r
40、eceiving . 53g3C.2.2.6.1 Test execution . 53g3C.2.2.6.2 Initial conditions . 53g3C.2.2.6.3 Test procedure . 54g3Annex D (informative): Bibliography . 55g3Annex D (informative): Change history . 56g3History 57g3ETSI ETSI TS 102 922-2 V7.0.0 (2011-03)8Release 7 Intellectual Property Rights IPRs essent
41、ial or potentially essential to the present document may have been declared to ETSI. The information pertaining to these essential IPRs, if any, is publicly available for ETSI members and non-members, and can be found in ETSI SR 000 314: “Intellectual Property Rights (IPRs); Essential, or potentiall
42、y Essential, IPRs notified to ETSI in respect of ETSI standards“, which is available from the ETSI Secretariat. Latest updates are available on the ETSI Web server (http:/webapp.etsi.org/IPR/home.asp). Pursuant to the ETSI IPR Policy, no investigation, including IPR searches, has been carried out by
43、 ETSI. No guarantee can be given as to the existence of other IPRs not referenced in ETSI SR 000 314 (or the updates on the ETSI Web server) which are, or may be, or may become, essential to the present document. Foreword This Technical Specification (TS) has been produced by ETSI Technical Committe
44、e Smart Card Platform (SCP). The contents of the present document are subject to continuing work within TC SCP and may change following formal TC SCP approval. If TC SCP modifies the contents of the present document, it will then be republished by ETSI with an identifying change of release date and
45、an increase in version number as follows: Version x.y.z where: x the first digit: 0 early working draft; 1 presented to TC SCP for information; 2 presented to TC SCP for approval; 3 or greater indicates TC SCP approved document under change control. y the second digit is incremented for all changes
46、of substance, i.e. technical enhancements, corrections, updates, etc. z the third digit is incremented when editorial only changes have been incorporated in the document. The present document is part 2 of a multi-part deliverable covering the Test specification for the USB interface, as identified b
47、elow: Part 1: “Terminal features“; Part 2: “UICC features“; Introduction The present document defines test cases for the UICC relating to the USB interface, as specified in TS 102 600 1. The aim of the present document is to ensure interoperability between the terminal and the UICC independently of
48、the respective manufacturer, card issuer or operator. ETSI ETSI TS 102 922-2 V7.0.0 (2011-03)9Release 7 1 Scope The present document covers the minimum characteristics which are considered necessary for the UICC in order to provide compliance to TS 102 600 1. The present document specifies the test
49、cases for: the characteristics of the Inter-Chip USB electrical interface between the USB UICC and the USB UICC-enabled terminal; the initial communication establishment and the transport protocols; the communication layers between the USB UICC and the USB UICC-enabled terminal. Test cases for the USB UICC relating to TS 102 221 2 interface are out of scope of the present document. 2 References References are either specific (identified by date of publication and/or edition number or version number) or non-specific. For specific references, only the cited vers
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