IESNA LM-86-2015 IES Approved Method Measuring Luminous Flux and Color Maintenance of Remote Phosphor Components.pdf

1、IES LM-86-15IES Approved Method MeasuringLuminous Flux and Color Maintenance ofRemote Phosphor ComponentsIES LM-86-15IES Approved Method: Measuring Luminous Flux and Color Maintenance ofRemote Phosphor ComponentsPublication of this reporthas been approved by IES.Suggestions for revisionsshould be di

2、rected to IES.IES LM-86-15Copyright 2015 by the Illuminating Engineering Society of North America.Approved by the IES Board of Directors, May 27, 2015, as a Transaction of the Illuminating Engineering Society of North America.All rights reserved. No part of this publication may be reproduced in any

3、form, in any electronic retrieval system or otherwise, without prior written permission of the IES.Published by the Illuminating Engineering Society of North America, 120 Wall Street, New York, New York 10005.IES Standards and Guides are developed through committee consensus and produced by the IES

4、Office in New York. Careful attention is given to style and accuracy. If any errors are noted in this document, please forward them to the Director or Manager of Technology, at the above address for verification and correction. The IES welcomes and urges feedback and comments.ISBN- 978-0-87995-318-8

5、Printed in the United States of America.DISCLAIMERIES publications are developed through the consensus standards development process approved by the American National Standards Institute. This process brings together volunteers representing varied viewpoints and interests to achieve consensus on lig

6、hting recommendations. While the IES administers the process and establishes policies and procedures to promote fairness in the development of consensus, it makes no guaranty or warranty as to the accuracy or completeness of any information published herein. The IES disclaims liability for any injur

7、y to persons or property, or other damages of any nature whatsoever, whether special, indirect, consequential or compensatory, directly or indirectly resulting from the publication, use of, or reliance on this document.In issuing and making this document available, the IES is not undertaking to rend

8、er professional or other services for or on behalf of any person or entity. Nor is the IES undertaking to perform any duty owed by any person or entity to someone else. Anyone using this document should rely on his or her own independent judgment or, as appropriate, seek the advice of a competent pr

9、ofessional in determining the exercise of reasonable care in any given circumstance.The IES has no power, nor does it undertake, to police or enforce compliance with the contents of this document. Nor does the IES list, certify, test or inspect products, designs, or installations for compliance with

10、 this document. Any certification or statement of compliance with the requirements of this document shall not be attributable to the IES and is solely the responsibility of the certifier or maker of the statement.IES LM-86-15Prepared by: The Subcommittee on Solid-State Lighting of the IES Testing Pr

11、ocedures CommitteeLM-86 Working GroupEric Bretschneider, Technical CoordinatorDan OHare, Technical CoordinatorSolid-State Lighting SubcommitteeEmil Radkov, Sub-ChairA. BakerR. HechfellnerS. LongoE. RadkovC. AndersenJ. AndersonP. Behnke*R. BergerR. BergmanB. Besmanoff*C. Bloomfield*E. BretschneiderK.

12、 Broughton*J. Burns*D. Chan*J. Choi*P. Chou*A. Chowdhury*G. Connelly*K. Cook*J. Creveling*J. Dakin*R. Daubach*L. Davis*D. Eckel*P. Elizondo*S. Ellersick*D. EllisC. Fox*J. Gaines*A. Gelder*M. GratherY. Guan*K. HaraguchiT. Hernandez*J. Hickman*Y. Hiebert*M. Hodapp*J. HospodarskyB. Hou*J. HulettP. Hung

13、*A. JacksonD. JenkinsA. Jeon*J. JiaoJ. Kahn*D. KarambelasT. Kawabata*S. Keeney*T. Koo*M. KotrebaiB. KueblerJ. Lee*R. LeeS. Lee*M. Lehman*J. Leland*K. Liepmann*S. LongoM. Lu*J. Ludyjan*R. Ma*V. Mahajan*J. MarellaM. McClear*G. McKeeJ. Melman*C. MillerM. Nadal*D. Nava*D. Neal*B. Neale*A. Nishida*M. OBo

14、yle*D. OHare*Y. Ohno*M. ORegan*M. Pabst*D. Park*M. Piscitelli*M. Poplawski*B. Primerano*M. Raffetto*B. Rao*I. Rasputnis*E. RichmanK. Rong*R. Rykowski*E. Sahaja*M. SapcoeJ. SchutzK. ScottG. SteinbergH. Steward*D. Szombatfalvy*R. TuttleT. Uchida*V. Venkataramanan*Y. Wang*J. Welch*K. Wilcox*B. Willcock

15、*V. Wu*W. Xu*J. YonR. Young*W. Young*G. Yu*J. ZhangY. Zong* Advisory Member* Honorary MemberIES LM-86-15IES Testing Procedures CommitteeCameron Miller, ChairBecky Kuebler, Vice ChairDavid Ellis, SecretaryJianzhong Jiao, TreasurerC. AndersenL. Ayers*A. Baker*P. Behnke*R. BergerR. Bergin*R. Bergman*J.

16、 Blacker*C. Bloomfield*E. BretschneiderK. Broughton*E. Carter*D. Chan*P. Chou*G. Connelly*J. Dakin*R. Daubach*L. Davis*J. Demirjian*P. Elizondo*D. EllisP. Franck*M. GratherY. Guan*K. Haraguchi*R. Heinisch*K. Hemmi*T. Hernandez*R. Higley*R. Horan*J. HospodarskyS. Hua*J. HulettP. HungD. Husby*A. Jacks

17、onD. Jenkins*J. JiaoD. Karambelas*H. Kashani*T. Kawabata*R. Kelley*T. Koo*M. KotrebaiB. KueblerJ. Lawton*J. Lee*L. Leetzow*J. Leland*K. Lerbs*R. Levin*I. Lewin*R. Li*K. Liepmann*S. LongoR. Low*M. Lu*J. MarellaP. McCarthyG. McKeeC. MillerF. Morin*M. Nadal*D. Nava*B. Neale*Y. Ohno*J. Pan*D. Park*N. Pe

18、imanovic*E. Perkins*M. Piscitell*iG. Plank*E. RadkovD. Randolph*C. Richards*E. Richman*K. Rong*M. SapcoeJ. SchutzA. Serres*A. SmithR. Speck*L. Stafford*G. SteinbergR. TuttleT. Uchida*K. Wagner*J. Walker*H. Waugh*J. Welch*K. Wilcox*B. Willcock*V. Wu*J. YonR. Young*J. Zhang* Advisory Member* Honorary

19、MemberIES LM-86-15Please refer to the IES Bookstore after you have purchased this IES Standard, for possible Errata, Addenda, and Clarifications, www.ies.org/bookstore.ContentsIntroduction.11.0 Scope .12.0 Normative References13.0 Definitions .13.1 Air Temperature (TA) .13.2 Average Irradiance on DU

20、T (Eave,DUT) 13.3 Average Surface Temperature (Ts,avg) .23.4 Conversion Efficacy (Kconv) .23.5 Conversion Efficacy Maintenance .23.6 Device Under Test (DUT) .23.7 Emission Surface and Clear Aperture 23.8 Excitation Surface 23.9 Failure of DUT 23.10 Maintenance Pump LED Source .23.11 Maintenance Test

21、 .23.12 Maximum Surface Temperature (Ts,max)23.13 Measurement Interval23.14 Reference Pump LED Source .23.15 Remote Phosphor 33.16 Remote Phosphor Component 34.0 Pump LED Sources and Electrical Requirements .34.1 Pump LED Sources .34.1.1 Pump LED Source characteristics .34.1.2 Measurement of Pump LE

22、D Source Characteristics .34.2 Power Supply Electric Requirements.35.0 Physical and Environmental Conditions for Maintenance Test 35.1 Temperature .35.1.1 Temperature on DUT Surfaces 35.1.2 Air Temperature35.2 Air Flow .45.3 Humidity.46.0 Photometric Measurement 46.1 Pump LED Source Measurement 46.2

23、 Pump LED Source Radiant Flux Maintenance46.3 Measurements of Photometric and Color Characteristics 46.4 Conversion Efficacy Calculation.4IES LM-86-157.0 Maintenance Test Procedures .47.1 Seasoning or Aging .47.2 DUT Exposure to Pump LED Sources (Irradiance) 47.3 DUT Maximum Surface Temperature .47.

24、4 DUT Average Surface Temperature.4 7.5 Test Duration, Measurement Interval, and Time Keeping 48.0 Test Report .5Informative References .5Annex A Conversion Efficacy of Remote Phosphor Components .6Annex B Recommendations for Surface Temperature Measurements and Thermocouple Usage 6Annex C Thermal T

25、est Recommendations 7Annex D Photometric Measurement Recommendations .81IES LM-86-15INTRODUCTION Remote phosphor is an emerging technology in LED lighting, which to date has not been covered by light measurement standards.Due to gradual nature of decay mechanisms, a remote phosphor component may und

26、ergo shifts in spectral emission, color rendering, and luminous efficacy that degrade performance over time. Thus, an LED based lamp or luminaire with a remote phosphor component could experience shifts in per-formance outside the products specification over the products lifetime. With prolonged exp

27、osure to high irradiance levels from pump LED sources, the remote phosphor component may exhibit changes in chromaticity, cor-related color temperature (CCT) and color rendering index (CRI). The causes of the changes may be due to the types and quantities of phosphors used in the remote phosphor com

28、ponent. More specifically, the current practice indicates that LED lamps or luminaires with lower CCT (e.g., 2700K) and higher CRI (e.g., 90) have slightly more rapid degradation characteristics.This document addresses the test method to mea-sure the remote phosphor component degradation behavior. I

29、n addition to using the method of test-ing the entire LED lamps and luminaires where remote phosphors are used per IES LM-84-14 IES Approved Method for Measuring Luminous Flux and Color Maintenance of LED Lamps, Light Engines, and Luminaires, this document provides an alterna-tive method where the s

30、eparable remote phosphor component can be tested. For the purposes of this document, it is assumed that degradation characteristics of the remote phos-phor components do not depend on pump device design or pump source layout, and that degradation is characterized entirely by the temperature and asso

31、ciated irradiance level of the remote phos-phor. Maintenance impact due to pump source wavelength can be evaluated through use of pump sources at the extremes of the remote phosphor dominant wavelength range; however this docu-ment does not specify the pump source wave-length. Therefore, the use of

32、the remote phosphor components tested per this document can apply to any pump source that generates similar or lower irradiance levels at the same or lower maximum and average temperatures on the remote phosphor components. The pump devices or sources may be in the form of discrete devices, chip on

33、board, arrays, or any other configuration. In ANSI/IES LM-80-15 IES Approved Method: Measuring Luminous Flux and Color Maintenance of LED Packages, Arrays and Modules, the luminous flux and color maintenance tests are defined based on LED case temperatures and LED forward cur-rent. In this document,

34、 the luminous flux and color maintenance tests are defined based on the remote phosphor components maximum and average tem-peratures and irradiance level. As the forward cur-rent increases LED case temperature, similarly the irradiance level increases the operating temperature of the remote phosphor

35、 component. 1.0 SCOPEThis document provides the method for measurement of luminous flux and color maintenance of remote phosphor components. The method describes the procedures to be followed and the precautions to be observed in obtaining uniform and reproducible luminous flux and color maintenance

36、 measurements under standard operating conditions. This document does not cover the determination of the performance rating of products, in which individual variations among the products should be considered. This approved method does not provide guidance or make any recommendation regarding samplin

37、g, predictive estimations or extrapolation for luminous flux or chromaticity maintenance deter-mined from actual photometric measurements.2.0 NORMATIVE REFERENCES2.1 ANSI/IES RP-16-10, Nomenclature and Definitions for Illumination Engineering.2.2 ANSI/IES LM-80-15, IES Approved Method: Measuring Lum

38、inous Flux and Color Maintenance of LED Packages, Arrays and Modules.3.0 DEFINITIONS3.1 Air Temperature (TA)The temperature of the air surrounding the DUT. 3.2 Average Irradiance on DUT (Eave,DUT) The total radiant flux e,incfrom the pump LED source incident onto the remote phosphor compo-nent, divi

39、ded by the remote phosphor component 2IES LM-86-15surface area, ADUT, which is irradiated by the pump LED:The excitation beam diameter defining the area exposed on a two dimensional DUT shall be defined by the 10 percent points of the peak irradiance for cases where the DUT is not uniformly exposed

40、to pump LED source radiant flux.For complex three dimensional surfaces, the surface area can be calculated using the solid model file for the DUT. If the excitation surface is not uniformly exposed the 10 percent points can be obtained through luminance measurement of the DUT emis-sion surface or by

41、 using the pump LED source inten-sity distribution. 3.3 Average Surface Temperature (Ts,ave)The average temperature on the excitation surface of the DUT defined by its clear aperture.3.4 Conversion Efficacy (Kconv)The ratio of the total luminous flux v,emitemitted from the emission surface of a remo

42、te phosphor compo-nent, to the total radiant flux e,incincident on the excitation surface of a remote phosphor component at a specified wavelength characteristic, noted as Kconv, with units of lm/W.The dominant, peak or centroid wavelength of the pump source shall be noted. The luminous flux typi-ca

43、lly includes unconverted light from the pump LED source(s).See Annex A for additional details on conversion efficacy. 3.5 Conversion Efficacy Maintenance The conversion efficacy over time, expressed as a percentage of the initial (at time equal to zero) conversion efficacy at any selected total elap

44、sed operating time.3.6 Device Under Test (DUT)A remote phosphor component undergoing mainte-nance test. 3.7 Emission Surface and Clear ApertureEmission surface is the surface of a remote phosphor component from which photons emanate due to excita-tion of phosphor by a pump light source and from whic

45、h some transmission of a pump light is emitted. Note that for remote phosphor components in which the phos-phor is disposed on a reflective material, the emission surface and the excitation surface may be coincident.Clear aperture is used in this document to desig-nate the remote phosphor opening or

46、 surface region through which light can travel. For example, if a 60 mil-limeter round remote phosphor component is held by a housing with an opening of 55 millimeters, then the clear aperture of the remote phosphor is 55 millimeters. 3.8 Excitation SurfaceThe surface of a remote phosphor component

47、irradi-ated by the pump LED source(s).3.9 Failure of DUTA catastrophic failure that leads to the DUT no longer being able to function in the intended light source test assembly. Failure modes include, but are not limited to the DUT melting, bending, or cracking.3.10 Maintenance Pump LED SourceAn LED

48、 irradiance source with or without mixing chamber that is used in conjunction with the DUT during the maintenance test and can be used for photometric measurement assuming stable output performance per Section 6.2.3.11 Maintenance TestThe functionality test for the DUT when it is ener-gized by the a

49、ppropriate pump LED source under specific electrical and environmental conditions. 3.12 Maximum Surface Temperature (Ts,max) The highest temperature on the excitation surface of the DUT. 3.13 Measurement IntervalThe measurement interval is the elapsed time between subsequent photometric or subsequent electrical measurements.3.14 Reference Pump LED SourceThe pump LED source with the same characteristics defined in Section 3.10 that is not used during the 3IES LM-86-15maintenance test. It is used in conjunction with the DUT for photometric measurement only.3.15 Remote PhosphorA