JEDEC EIA-397-1-1980 Recommended Standards for Thyristors《晶闸管推荐标准 更正1980年9月》.pdf

1、E - - EIA 397-1 80 3234600 0067384 5 September 9, 1980 * 3 CORRECTION NOTICE TO RS-397-1 Gentlemen: On July 3, 1980 we mailed you a copy of RS-397-1 (Addendum No. 1 to RS-397) IRecommended Standards for Thyristors“. The enclosed pages have been updated to reflect clarification of the content of both

2、 RS-397 and RS-397-1. pages in RS-397-1 These pages should be used as replacement Enclosures: cc: Jack Kinn Publications Supervisor Engineering Department fa . .I . . 1-2 . - . .r_ ELECTRONIC INDUSTRIES ASSOCIATION 2001 EYE STREET, N.W. WASHINGTON, D.C. 20006 (202) 457-4900 TWX: 710-822-0148 7 F . b

3、 o) c) a I v) EIA 397-1 80 m 3234600 00b7385 7 m /- . RECOMMENDED STANDARDS FOR THYRISTORS EIA STANDARD RSm397.1 (Addendum No. 1 to RS-397) JULY 1980 Engineering Department ELECTRONIC INDUSTRIES A SSOCIATION EIA 377-1 80 = 3234600 0067386 9 NOTICE EIA Engineering standards are designed to serve the

4、public interest through eliminating misunderstandings between manufacturers and purchasers, faci- lit ating interchangeability and improvement of products, and assisting the purchaser in selecting and obtaining with minimum delay the proper product for his particular need. Existence of such standard

5、s shall not in any respect preclude any member or non-member of EIA from manufacturing or selling products not conforming to such standards, nor shall the existence of such standards preclude their voluntary use by those other than EIA members, whether the standard is to be used either domestically

6、or internationally. Recommended standards are adopted by EIA without regard to whether or not their adoption may involve patents on articles, materials, or processes. By such action, EIA does not assume any liability to any patent owner, nor does it assume any obligation whatever to parties adopting

7、 the recommended standards. This EIA Recommended Standard is considered to have international stan- dardization implications, but the IEC (or ISO) activity has not progressed to the point where a valid comparison between the EIA Recommended Standard and the IEC (or ISO) Recommendation can be made. P

8、ublished by ELECTRONIC INDUSTRIES ASSOCIATION Engineering Department 2001 Eye Street, N.W., Washington, D.C. 20006 Copyright 1980 Electronic IndusMes Association AU rlghta reserved PRICE: $17.00 EIA 397-1 80 3234bU0 00b7387 O RS-397-1 Addendum 1 RECOMMENDED STANDARDS FOR THYRISTORS (From EIA Standar

9、ds Proposal No. 1389, formulated under the cognizance of JEDEC JC- 22 Committee on Rectifier Diodes and Thyristors.) This “First Addendum to EIA Recommended Standard RS-397“ includes new and/or revised test methods which have been approved by Letter Ballots since 1972. As a means of merging the supp

10、lementary information into the original Standard RS-397, the original indexes to Chapters 5, 6 and 7 have been reproduced wherein the new and/or revised test methods are indicated by means of an asterisk, -1- - EIA 397-1 80 323YbOO 0067388 2 W RS-397-1 Addendum 1 test 5.1 5.2 PART 5 RATINGS ESTABLIS

11、HMENT AND VERIFICATION TESTS INDEX This Addendum forms part of EIA Recommended Standard RS-397, provided to replace page 82 of RS-397. methods found in Addendum No. 1. This page is Items asterisked indicate new or revised Introduction and Reference Table of Ratings and Test Methods Electrical Tests

12、5.3 5.2.1 Repetitive Rating Tests 5.2.1.1 5.2.1.2 5.2.1.3 5.2.1.4 5.2.1.5 5.2.1.6 521.7 5.2.1.8 5.2.1.9 Steady-State Operational Life Test for Unidirectional Thyristors Steady-State Operational Life Test for Bidirectional Thyristors Alternating Pricipal Voltage Life Test DC Off-State or Reverse Bloc

13、king Voltage Life Test Pulsed On-State Current Life Test Gate Rating Life Test for Unidirectional Triode Thyristors Gate Rating Life Test for Bidirectional Triode Thyristors Repetitive Pulse Current Rating Under Specified Turn-off Conditions Life Test for Reverse Blocking Thyristors Thermal Fatigue

14、Life Test for Thyristors 5.2.2 Non-Repetitive Rating Tests 5.2.2.1 5.2.2.2 5.2.2.3 5.2.2.4 5.2.2.5 60 Hz Sine-Wave Surge Current Test and Non-Repetitive Peak Reverse Voltage Test Surge (Non-Repetitive) On-State Current, 1.5 Millisecond Duration, Test Surge (Non-Repetitive) On-State Current, 0.5 Mill

15、isecond Duration, Test Rectangular Pulse Surge Current Test , Peak Positive Anode Voltage Test *5.2.2.6 Critical Rate of Rise of On-State Current Test *5,.2.7 Destructive Current (Rupture) Test “5.2.2.8 Suppressible Surge Current Test Environmental Tests 5.3.1 Storage Life Test 5.3.2 Lead or Termina

16、l Temperature Test 5.4 Post Test Measurements ._. O -11- -. EIA 397-1 BO = 3234600 00b7389 V RS-397-1 Addendum 1 PART 6 CHARACTERISTIC TESTS INDEX This Addendum forms part of EIA Recommended Standard RS-397. provided to replace pages 113 and 114 of RS-397. revised test methods found in Addendum No.

17、1. This page is Items asterisked indicate new or 6.1 General 6.2 Electrical Measurements - General 6.2.1 Choice of Meters 6.2.1.1 Input 6.2.1.2 Output 6.2.2 Ripple Voltage 6.2.3 Thermal Equilibrium Conditions 6.2.3.1 Cteady-State DC Measurements 6.2.3.2 Pulse Measurements 6.2.4 Gate Trigger and Bias

18、 Conditions 6.2.4.1 Gate Trigger Pulse 6.2.4.2 Gate Bias 6.3 Types of Tests 6.3.1 DC Tests (Static) 6.3.1.1 Test Circuits and Procedures 6.3.1.1.1 6.3.1.1.2 6.3.1.1.3 6.3.1.1.4 6.3.1.1.5 6.3.1.1.6 6.3.1.1.7 6.3.1.1.8 6.3.1.1.9 6.3.1.1.10 DC Breakover Voltage DC Reverse Breakdown Voltage DC Reverse B

19、locking Current DC Off-State Current On-State Voltage Latching Current DC Holding Current Gate TFigger Current and Voltage Gate Non-Trigger Current and Voltage DC Negative Gate Current 6.3.2 AC Tests (Dynamic) 6.3.2.1 Test Circuits and Procedures 6.3.2.1.1 AC Reverse Blocking Current 6.3.2.1.2 AC Of

20、f-State Current 6.3.2.1.3 AC On-State Voltage EIA 393-1 80 3234600 0067390 O RS-397-1 Addendum 1 PART 6 CHARACTERISTIC TESTS (continued) INDEX 6.3.3 Instantaneous or Pulse Tests 6.3.3.1 Test Methods 6.3.4 Switching Time Tests 6.3.4.1 Gate-Controlled Turn-On Time Test Method 6.3.4.2 Circuit-Commutate

21、d Turn-off Time Test Method for Reverse Blocking Thyristors 6.3.4.3 Gate Turn-off Time Test Method for Gate Turn-off Thyristors Pulse-Circuit-Commutated Turn-off Time Test Method for Reverse Blocking Triode Thyristors 6.3.4.4 6.3.5 Critical Rate of Rise of Off-State Voltage Test 6.3.5.1 6.3.5.2 Expo

22、nential Voltage Rise Test Method Linear Voltage Rise Test Method *6.3.6 Thermal Resistance and Transient Thermal Impedance Test Method *6.3.7 Critical Rate of Rise of Commutation Voltage for Bidirectional Thyristors Reverse Recovery Characteristics for Thyristors Test Method , *6.3.8 *6.3.9 Suppress

23、ible Surge Current Characterisitic -iV- EIA 377-1 0 = 3234600 0067373 2 RS-397-1 Addendum 1 PART 7 USERS GUIDE INDEX This addendum forms part of EIA Recommended Standard RS-397, provided to replace page 159 of RS-397. test methods found in Addendum No. 1. This page is Items asterisked indicate new o

24、r revised 7.1 Introduction 7.2 Thyristor Safety Considerations 7.3 Voltage Considerations 7.3.1 Basis for Comparison of Thyristor Voltage Ratings 7.3.1.1 Repetitive Peak Reverse Voltage 7.3.1.2 Non-Repetitive Peak Reverse Voltage 7.3.1.3 Repetitive Off-State Voltage 7.3.1.4 Peak Principal Voltage 7.

25、3.2 Overvoltage 7.3.3 Series Operation 7.4 Current Considerations 7.4.1 Maximum Operating Junction Temperature 7.4.2 Junction Heat Generation 7.4.3 Thermal Resistance 7.4.4 Steady-State Current Ratings 7.4.5 Overload Current Ratings 7.4.6 Parallel Operation 7.5 Triggering 7.5.1 7.5.2 Triggering of D

26、iode Thyristors Gate Triggering of Triode Thyristors 7.6 Switching 7.6.1 Turn-On of Triode Thyristors 7.6.2 7.6.3 Turn-On Dissipation 7.6.4 Reverse Recovery 7.6.5 Turn-off Rate-Of-Rise of On-State Current in Triode Thyristors *7.6.6 Commutation Ability (Bidirectional Thyristors) 7.7 Fundamental Thyr

27、istor Circuits *7.8 Heat Dissipator Considerations O *7.8.1 General *7.8.2 Handling Considerations “7.8.3 Contact Surfaces *7.8.4 Mounting Torque (Stud Type) *7.8.5 Clamping Pressure (Disc Type) -. -i -V- e - _ EIA 377-1 BO m 3234b00 0067372 Y m RS-397-1 Addendum 1 Q PART 7 USERS GUIDE (continued) I

28、NDEX This Addendum forms part of EIA Recommended Standard RS-397. indicate new or revised test methods. Items asterisked 7.9 7.10 7.11 7.12 Temperature Measurements 7.9.1 General 7.9.2 Ambient Temperature 7.9.3 Thyristor Temperatures 7.9.4 Temperature Measuremer.,s Involving Thyristor Mounted on Hea

29、t Dissipators Thyristor Failure Modes 7.10.1 General 7.10.2 Catastrophic Failure 7.10.3 Degradation Failures Radio Frequency Interference Simple Measurements in Trouble Shooting 7.12.1 7.12.1 Gate Trigger Check Off-State and Reverse Blocking Voltage Checks -vi- EIA 397-1 80 m 323Llb00 00b7393 b m RS

30、-397-1 Addendum 1 RECOMMENDED STANDARDS FOR THYRISTORS TABLE OF CONTENTS Paragraph 5.2.2.6 Critical Rate of Rise of On-State Current Test 5.2.2.6.1 Introduction 5.2.2.6.2 Test Circuit 5.2.2.6.3 Operating Conditions 5.2.2.6.4 Test Duration 5.2.2.6.5 Post Test Measurements Destructive Current (Rupture

31、) Rating Test Method 5.2.2.7 5.2.2.7.1 introduction 5.2.2.7.2 Test Method 5.2.2.7.3 Operating Conditions 5.2.2.7.4 Post Test Measurements 5.2.2.8 Suppressible Surge Current Test 5.2.2.8.1 Introduction 5.2.2.8.2 Test Method 5.2.2.8.3 Operating Conditions 5.2.2.8.4 Post Test Measurements -vii- I- -! ,

32、; Page 1 1 1 1-2 3 3 4 4 4 4 5 7 7 8 8-9 9 EIA 377-1 80 = 323Lib00 00b7374 8 RS-397-1 Addendum 1 Paragraph 6.3.6 6.3.7 6.3.8 6.3.9 TABLE OF CONTENTS (continued) Page Thermal Resistance and Transient Thermal Impedance Test Method 13 6.3.6.1.1 6.3.6.1.2 6.3.6.1.3 6.3.6.1.4 6.3.6.1.5 6.3.6.2.1 6.3.6.3.

33、1 General Definitions General Test Description Heat Dissipator Requirements Determining Reference Temperatures Thermal Resistance Test Method 6.3.6.2.1.1 Test Procedure 6.3.6.2.1.2 Test Circuit 6.3.6.2.1.3 6.3.6.2.1.4 Characteristic to be Determined Test Conditions to be Specified Transient Thermal

34、Impedance Test Methods 6.3.6.3.1.1 Heating Pulse Method Test Procedure 6.3.6.3.1.2 Cooling Curve Method Test Procedure 6.3.6.3.1.3 Test Circuits 6.3.6.3.1.4 Test Conditions to be Specified 6.3.6.3.1.5 Characteristic to be Determined Critical Rate of Rise of Commutation Voltage for Bidirectional Thyr

35、istors 6.3.7.1 Test Description 6.3.7.2 Test Circuit 6.3.7.3 6.3.7.4 Characteristic to be Measured Test Conditions to be Specified Reverse Recovery Characteristics for Thyristors Test Method 6.3.8.1 Test Description 6.3.8.2 Test Circuit 6.3.8.3 Waveform of Recovery Current and Definition of Recovery

36、 Time 6.3.8.4 Recovered Charge 6.3.8.5 Test Conditions to be Specified 6.3.8.6 Characteristics to be Measured Suppressible Surge Current Characteristic 6.3.9.1 Test Description 6.3.9.2 Test Circuit 6.3.9.3 . Test Conditions to be Specified 6.3.9.4 Characteristic to be Measured 13 14 14 16-18 18-19 1

37、9 20-23 24-26 26 27 27 27-31 31-35 35-36 37 38 39 39 39-40 42 42 43 43 43-45 45-46 46-47 47 48 52 52-53 53 54 54 -viii- EIA 377-1 0 m 3234600 0067395 T m RS-397-1 Addendum 1 Paraqraph 7.6 Switching O TABLE OF CONTENTS (continued) 7.6.6 Commutation Ability (Bidirectional Thyristors) 7.8 Heat Dicsipat

38、or Considerations 7.8.1 General 7.8.2 Handling Considerations 7.8.3 Contact Surfaces 7.8.4 Mounnting Torque (Stud Types) 7.8.5 Clamping Pressure (Disc Type) Page 60 63 64 64 64 64 66 66-67 -ix- r EIA 397-1 80 W 323YbOO 0067396 II W Figure FIGURE 5.2.2.6-1 FIGURE 5.2.2.6-2 FIGURE 5.2.2.7-1 FIGURE 5.2

39、.2.8-1 FIGURE 5.2.2.8-2 FIGURE 6.3.6-1 FIGURE 6.3.6.-2 FIGURE 6.3.6-3 FIGURE 6.3.6-4 FIGURE 6.3.6-5 FIGURE 6.3.6-6 FIGURE 6.3.6-7 FIGURE 6.3.7-1 FIGURE 6.3.7-2 FIGURE 6.3.8-1 FIGURE 6.3.8-2 FIGURE 6.3.8-3 FIGURE 6.3.9-1 FIGURE 6.3.9-2 RS-397-1 Addendum 1 LIST OF FIGURES Basic Test Circuit for the Cr

40、itical Rate of Rise of On-State Current Test On-State Current Waveshape for the Critical Rate of On-State Current Test Fault Test Circuit Basic Test Circuit for Suppressible Surge Current Rating Test Current and Voltage Waveform applied to the Device Under Test Typical Transient Thermal Impedance Ch

41、aracteristic Current and Voltage Waveforms During Thermal Resistance Test Illustration of On-State Voltage Waveform Extrapolation Thermal Resistance Test Circuit Current and Voltage Waveform for Transient Thermal Impedance Test Reference Temperature TRI Basic Test Circuit for Transient Thermal Imped

42、ance Test Method Test Wavef orms Critical Rate of Rate of Rise Commutation Voltage Test Circuit Circuit for Measuring Reverse Recovery Characteristics for Thyris tors Test Circuit for Measuring Reverse Voltage Recovery Characteristics of Thyristors Page 2 3 6 10 10 16 21 22 25 30 34 35 41 42 49 50 R

43、everse Recovery Current Waveform for Various Type of Thyrsistors 51 Basic Test Circuit for Suppressible Surge Current Characteris tic Test 5.5 Current and Voltage Waveforms Applied to the Device under Test 55 RS-397-1 Addendum 1 Page 1 5.2.2.6 Critical Rate of Rise of On-State Current Test 5.2.2.6.1

44、 ,Introduction The rate at which on-state current can be increased in a thyristor is limited by the initial turned on area and the rate of increase and modulation of the active area during turn on. This test method may be used to apply arate of rise of on-state current (di/dt) stress to a triode thy

45、ristor for the purpose of establishing a rating. This rating is necessary for those devices unable to withstand the rate of rise of on-state current determined by their turn-on characteristics in a non- inductive circuit. This rating may be either repetitive or non-repetitive which means respectivel

46、y that the rating may be applied an unlimited or a limited number of times. Two differ- ent non-repetitive ratings may be assigned to triode thyristors: one for gate triggering and one for trigger- ing by exceeding the thyristor breakover voltage. time between on-state current pulses in the non-repe

47、ti- tive rating case shall. be long enough to insure that the device temperature has returned to its original thermal equilibrium. For bidirectional devices,these ratings apply for operation in either quadrant. The 5.2.2.6.2 Test Circuit A suitable test circuit is shown in Fig. 5.2.2.6-1. The di/dt

48、stress is applied using the device under test to discharge a capacitor through a series resis- tor and inductor to produce a damped on-state current pulse, as this method is intended to be a test of on-state switching capability only. Approximate values of R, L and C in terms of the test conditions

49、are given in Fig. 5.2.2.6-1. For those values of circuit constants to apply in the case of breakover voltage triggering, ?DM is replaced by the V(BO) of the test device. Revers.e switching-transients may be suppressed 5.2.2.6.3 Operating Conditions 5.2.2.6.3.1 Fig 5.2.2.6-2 illustrates the on-state current wave shape, and jdentifies several test conditions. Zero time is determined by the intersection, with the time axis, of the straight line passing through the 10% and 50% test current. EIA 397-1 80 323LIbOO O067398 5 a 1 RS-397-1 Addendum 1 Page 2 5.2.2.6.3.2 5.2.2.6.3.3 The