JEDEC JEP79-1969 Life Test Methods for Photoconductive Cells《光敏单元的寿命测试方法》.pdf

1、 - EIA JEP79 69 W 3234600 0003408 3 SEPTEMBER 1969 LIFE TEST METHODS FOR PHOTOCONDUCTIVE CELLS PRICE 25$ FORMULATED BY JEDEC SEMICONDUCTOR DEVICE COUNCIL I _ JEDEC PUBLiCATION -NO. 79 EIA JEP79 69 W 3234b00 0003409 5 W . Publiahed by ELECTRONIC INDUSTRIES ASSOCIATION Engineering Department 2001 Eye

2、 Street, N. W., Wmhington, D. C. 20006 , - - EIA JEP79 69 M 3234600 00034LO L = LIFE TEST METHODS FOR PHOTOCONDUCTIVE CELLS (For Photoconductive Cells Sensitive Primarily In the Visible and Near Infrared Region) FOREWORD The material presented in this publication has been prepared under the cognizan

3、ce of the JS-4 Committee on Solid State Electro- Optical Devices and approved by the JEDEC Semlconductor Device Council. , ELETRICAL LIFE TESTS A) Dissipation 1. Continous operation 2. Intermittent operation B) Power dissipation derating C) characteristic DC or AC peak voltage P) Temperature 1. Oper

4、ating temperature (minimum md maximum) ENVIRC“TAL LIFE TEST A) Temperature TSTG 1. Storage temperature, (minimum and maximum) EIA JEP7 b = 3234600 00034Ll 3 Operational Electrical Life Test for Photoconductive Cells Operational Electrical Life Test for Photoconductive Cells Operational Electrical Li

5、fe Test for Photoconductive Cells Operational Electrical Life Test for Photoconduc tive Cell s - Storage Temperature Environ- mental Life Test for Photocon- ductive Cells LIFE TEST WHODS FOR PHOTOCONDUCTIVE CEUS O O This publication describes standard life test methods to be used in verifying or est

6、ablishing the maximum ratings given in JEDEC registration format JS-4 RDF-2, “Photoconductive Cell, “ dated iO/i6/65. The following table lists the maximum ratings and cross references them to the section which describes the life test method for establishing the rating . (for photoconductive cells s

7、ensitive primarily in the visible and near infrared O region) 1.0 INTRODUCTION AND REFERENCE TABLE OF RATINGS AND LIFE TEST PIIEiTHODS MAXIMUM RATING I . LIFE TEST MEXHOD r SECTION I =I 1.1.1 1.1.1 1.1.1 1.1.1 1.2.1 3 1.1 ELGTRICAL TESTS 1.1.1 Operational Electrical Life Test for Photoconductive Cel

8、ls A. Introduction This test method is to be used to establish or to verify the maximum and minimum operating temperature ratings, the maximum voltage rating, the maximum dissipation rating under inter- mittent operation, and the power dissipation derating charac- teristic for photoconductive cells.

9、 B. Operating Conditions a. Power source shall be dc or 50-60 hertz. b. C. d. The series resistor shall be adjusted to the value The test circuit shall consist of the photocell and a resistor in series accross the voltage source. The voltage source shall be adjusted to maximum rated voltage for the

10、cell. Where Pmax is the maximum rated power dissipation (watts) and Emax is the maximum rated voltage (volts). Both values are given in the registration format. e. !lhe illmination on the photocell shall be adjusted to give the maximm power dissipation as registered. Re- adjustment of the illuminati

11、on during the test may be necessary. The primary radiation from the light source shall be consistent with the spectral response of the device (1) (2) During the continuous operation dissipation rating test, the illumination shall be applied continuously. During the intermittent ogeration dissipation

12、 rating test, the illumination shall be applied in the manner stated in the regiskration format under Item III.A, Dissipation, f. g. During the dc or ac peak voltage maximum rating test, the cell illumination shall be zero, The temperature during the power dissipation tests will be as registered for

13、 the given power dissipation. ture can refer to the metal case temperature, to the sub- strate back surface temperature, or to the ambient air temperature, whichever one is specified. In the case where the measurements are made in ambient air, the mounting con- ditions and the connection mode should

14、 be as specified. The heat is to be taken away by free-air convection. The tempera- b EIA JEP79 b9 m 3234b00 0003433 7 m C. The duration of the life test shall be.500 hours. D1 Pre-Test and Post-Test Measurements All of the characteristics given in Section 1.3 which are indicated as being applicable

15、 to the device type shall be measured to establish the rating. 1. 2 ENVIR0“TAL LIFE TEST 102.1 Storage Temperature Environmental Life Test for Photoconductive Cells A. Introduction This test method is to be used to establish or to verify the storage temperature rating for photoconductive cells. imum

16、 temperature are usually specified. A maximum and a min- B. Operating Conditions R. The cells will be stored at both the maximum and the minimum b. The cells will be in the dark during the storage period. specified temperature in separate groups. C. The duration of the storage shall be 500 hours. D.

17、 Pre-Test and Post-Test Measurements All of the characteristics given in Section 1.3 which are indicated as being applicable to the device iy-pe shall be measured to establish -the rating. 1.3 PRE-LIFE TEST AND POST-LIFE TEST MEASUREMEDITS The following characteristics of photoconductive cells shall

18、 be measured before and after any of the life tests of Sections 1.1 and 1.2. The test conditions for measurement of each characteristic shall preferably be as per the registration format JS-4 RDF-2, “Photoconductive Cell, I dated i0/16/65 . (1) Illumination characteristic (all devices) - (Appendix A

19、 gbes method of test.) Response time (for devices rated for speed of response) (Appendix B gives method of test.) 2) Dark characteristic (all devices) 3) Related Publication of Interest EIA-NEMA Standard: “Air-Convection Cooled Life Test Environment for Lead- Mounted Semiconductor Devices, RS-323 (NEMA Publication No. SK 515-1966) -3-