JEDEC JESD371-1970 Measurement of Small-Signal VHF-UHF Transistor Short-Circuit Forward Current Transfer Ratio.pdf

1、JEDEC STANDARD The Measurement of Small-Signal VHF-UHF Transistor Short-Circuit Forward Current Transfer Ratio JESD371 (Previously known as RS-371 and/or EIA-371) FEBRUARY 1970 (Reaffirmed: April 1981, April 1999, March 2009) JEDEC SOLID STATE TECHNOLOGY ASSOCIATION NOTICE JEDEC standards and public

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7、d be addressed to JEDEC at the address below, or call (703) 907-7559 or www.jedec.org Published by JEDEC Solid State Technology Association 2009 3103 North 10th Street Suite 240 South Arlington, VA 22201-2107 This document may be downloaded free of charge; however JEDEC retains the copyright on this

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10、rth 10th Street Suite 240 South Arlington, VA 22201-2107 or call (703) 907-7559 EIA STANDARD FEBRUARY 1970 For THE MEASUREMENT OF SMALL-SIGNAL VHF-UHF TRANSISTOR SHORT-CIRCUIT FORWARD CURRENT TRANSFER RATIO ELECTRONIC INDUSTRIES ASSOCIATION STANDARD RS-371 Formulated by JEDE C Semiconductor Device C

11、ouncil NOTICE EIA engineering standards are designed to serve the public interest throu h eliminating mis- understandings between manufacturers and purchasers, facilitating interchan ea lhty and improve- ment of products, and assisting the purchaser in selectin a .% 8: . . and obtaining wit mmlmum d

12、elay the pro clu x er product for his particular need. Existence of SW standards shall not in any respect pre- e any member or non-member of EIA from manufacturing or selling products not conformin to such standards, nor shall the existence of such standards preclude their voluntary use by those o ,

13、 I +(hl ( 1 + (h&YL) ) (16) (17) (18) RS-371 Page 7 ii - + hll Fig. 1 - Hybrid Parameters of Transistor Under Test i2 1.5 mm (0.06”) SEATING PLANE -I- TRANSISTOR TERMINALS AND TRANSISTOR MOUNT REFERENCE PLANE Fig. 2 - Transistor Terminals ii 7-s - i2 - TRANSISTOR + UNDER -I “2 YL TEST Fig. 3 - Sourc

14、e Impedance and Load Admittance RELATED EIA STANDARDS In addition to this Standard, the following EIA Standards are available on measurements of semiconductor devices in VHF and UHF applications: RS-306 Standards for Measurement of Small Signal HF, VHF and UHF Power Gain Transistors (NEMA Publicatio

15、n No. SK 506-1965) . . . . . . . . . . . . . . . . . . $ .60 RS-311 Measurement of Transistor Noise Figure at HF and VHF (NEMA Publication No. SK 509-1965) : . . . . . . . . . . . . . . . . . $1.00 RS-372 The Measurement of Small Signal VHF-UHF Transistor Admittance Parameters . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . $1.80 Minimum Order $1 .OO For a free and complete list of EIA Standards and Publications write: Engineering Department Electronic Industries Association 2001 Eye Street, N.W. Washington, D.C. 20006