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JEDEC JESD371-1970 Measurement of Small-Signal VHF-UHF Transistor Short-Circuit Forward Current Transfer Ratio.pdf

1、JEDEC STANDARD The Measurement of Small-Signal VHF-UHF Transistor Short-Circuit Forward Current Transfer Ratio JESD371 (Previously known as RS-371 and/or EIA-371) FEBRUARY 1970 (Reaffirmed: April 1981, April 1999, March 2009) JEDEC SOLID STATE TECHNOLOGY ASSOCIATION NOTICE JEDEC standards and public

2、ations contain material that has been prepared, reviewed, and approved through the JEDEC Board of Directors level and subsequently reviewed and approved by the JEDEC legal counsel. JEDEC standards and publications are designed to serve the public interest through eliminating misunderstandings betwee

3、n manufacturers and purchasers, facilitating interchangeability and improvement of products, and assisting the purchaser in selecting and obtaining with minimum delay the proper product for use by those other than JEDEC members, whether the standard is to be used either domestically or international

4、ly. JEDEC standards and publications are adopted without regard to whether or not their adoption may involve patents or articles, materials, or processes. By such action JEDEC does not assume any liability to any patent owner, nor does it assume any obligation whatever to parties adopting the JEDEC

5、standards or publications. The information included in JEDEC standards and publications represents a sound approach to product specification and application, principally from the solid state device manufacturer viewpoint. Within the JEDEC organization there are procedures whereby a JEDEC standard or

6、 publication may be further processed and ultimately become an ANSI standard. No claims to be in conformance with this standard may be made unless all requirements stated in the standard are met. Inquiries, comments, and suggestions relative to the content of this JEDEC standard or publication shoul

7、d be addressed to JEDEC at the address below, or call (703) 907-7559 or www.jedec.org Published by JEDEC Solid State Technology Association 2009 3103 North 10th Street Suite 240 South Arlington, VA 22201-2107 This document may be downloaded free of charge; however JEDEC retains the copyright on this

8、 material. By downloading this file the individual agrees not to charge for or resell the resulting material. PRICE: Please refer to the current Catalog of JEDEC Engineering Standards and Publications online at http:/www.jedec.org/Catalog/catalog.cfm Printed in the U.S.A. All rights reserved PLEASE!

9、 DONT VIOLATE THE LAW! This document is copyrighted by JEDEC and may not be reproduced without permission. Organizations may obtain permission to reproduce a limited number of copies through entering into a license agreement. For information, contact: JEDEC Solid State Technology Association 3103 No

10、rth 10th Street Suite 240 South Arlington, VA 22201-2107 or call (703) 907-7559 EIA STANDARD FEBRUARY 1970 For THE MEASUREMENT OF SMALL-SIGNAL VHF-UHF TRANSISTOR SHORT-CIRCUIT FORWARD CURRENT TRANSFER RATIO ELECTRONIC INDUSTRIES ASSOCIATION STANDARD RS-371 Formulated by JEDE C Semiconductor Device C

11、ouncil NOTICE EIA engineering standards are designed to serve the public interest throu h eliminating mis- understandings between manufacturers and purchasers, facilitating interchan ea lhty and improve- ment of products, and assisting the purchaser in selectin a .% 8: . . and obtaining wit mmlmum d

12、elay the pro clu x er product for his particular need. Existence of SW standards shall not in any respect pre- e any member or non-member of EIA from manufacturing or selling products not conformin to such standards, nor shall the existence of such standards preclude their voluntary use by those o ,

13、 I +(hl ( 1 + (h&YL) ) (16) (17) (18) RS-371 Page 7 ii - + hll Fig. 1 - Hybrid Parameters of Transistor Under Test i2 1.5 mm (0.06”) SEATING PLANE -I- TRANSISTOR TERMINALS AND TRANSISTOR MOUNT REFERENCE PLANE Fig. 2 - Transistor Terminals ii 7-s - i2 - TRANSISTOR + UNDER -I “2 YL TEST Fig. 3 - Sourc

14、e Impedance and Load Admittance RELATED EIA STANDARDS In addition to this Standard, the following EIA Standards are available on measurements of semiconductor devices in VHF and UHF applications: RS-306 Standards for Measurement of Small Signal HF, VHF and UHF Power Gain Transistors (NEMA Publicatio

15、n No. SK 506-1965) . . . . . . . . . . . . . . . . . . $ .60 RS-311 Measurement of Transistor Noise Figure at HF and VHF (NEMA Publication No. SK 509-1965) : . . . . . . . . . . . . . . . . . $1.00 RS-372 The Measurement of Small Signal VHF-UHF Transistor Admittance Parameters . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . $1.80 Minimum Order $1 .OO For a free and complete list of EIA Standards and Publications write: Engineering Department Electronic Industries Association 2001 Eye Street, N.W. Washington, D.C. 20006

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