JEDEC JESD5-1982 Mesurement of Temperature Coefficient of Voltage Regulator Diodes《电压常规两极真空管温度系数测试》.pdf

1、JEDEC STANDARD Measurement of Temperature Coefficient of Voltage Regulator Diodes JESDS FEBRUARY 1982 (Reaffirmec. APRIL 999,l PRIL 2002) JEDEC SOLID STATE TECHNOLOGY ASSOCIATION NOTICE JEDEC standards and publications contain material that has been prepared, reviewed, and approved through the JEDEC

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5、resents a sound approach to product specification and application, principally from the solid state device manufacturer viewpoint. No claims to be in conformance with this standard may be made unless all requirements stated in the standard are met. Inquiries, comments, and suggestions relative to th

6、e content of this JEDEC standard or publication should be addressed to JEDEC at the address below, or call (703) 907-7559 or www.jedec.org Published by OJEDEC Solid State Technology Association 2002 2500 Wilson Boulevard Arlingtq VA 22201-3834 This document may be downloaded free of charge; however

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9、ement. For informatioq contact: JEDEC Solid State Technology Association 2500 Wilson Boulevard Arlingtq Virginia 2220 1 - 3 8 34 or call (703) 907-7559 JEDEC STANDARD No. 5 MEASUREMEN7 OF TEMPERATUHE COEFFICIENT OF VOLTAGE REGULATUR DIODES rorrriery JEDEC Ciiqgested Ctariclard No. 5-A Prepared by JE

10、DEC JC-22.4 Committee on Ciqnal and Rerjulator Diodes The material contained herein was de- veloped by the EIA/JC-22.4 Committee on Siyrial and Regiilntur Dindes of the Joint Electron Device Engineering Couri- cil. 11 has been approved for pthlication by the JEDEC Solid State Products Enqi- rieerinq

11、 Council us a JTDEL Clandard. This document is isstred ir1 the form of a JEDEC Standard so that it may be applied immediately to new devices. MEASUREMENT OF TEMPERATURE COEFFICIENT OF VOLTAGE-REGULATOR DIODES PURPOSE This standard is designed to define voltage-temperature characteristic measurement

12、techniques and method of calculation, Although many me- thods could be defined, this method provides a desired uniformity and lends itself to production testing, GENERAL I. Temperature coefficient and voltage variation with temperature are parameters describing the voltage-temperature characteris- t

13、ics o regulator and reference diodes as referenced below: A. The linear voltage regulator temperat-Ure coefficient is properly stated in terms of %/OC or millivolts /C. B. The non1,inear voltage reference diode voltage varia- tion with temperatureis described by a maximum allowable vol tage variatio

14、n in millivolts with a specified tempera- ture change. TEST METHOD vz I. A. Vz is measured at Is. Tolerance of this currtint(s) is understood to be k 1% unless otherwise defined. In the event a range of I is required, the tolerance of Vz is specified such dat all devices fall within this Lolerance a

15、t the test current extremes. Temperature tolerance shall be I lC unless otherwise defined. -2- B. The device will be measured at Tl,T2,T3 . Tn, where TI is the lowest temperature, and Tn is the highest temperature. PROCEDURE I. The device is subjected to Tl,T2,T3, . T and the correspond- ing voltage

16、s VI ,V2 ,V3 .Vnare obtained. a? t,hermal equilibrium.* A. When a current range is specified, the following is applicable: Each voltage shall be measured at the ex- tremes of the specified current range and the expres- sion under calculation must be maximized. B. Cs7.culat ion where Vhi = highest vo

17、ltage reading at any temperature = lowest voltage reading at any temperature o T1 ,T2 , r3, . T, * shall be determined separately at each cur- L( temp) AV rent extreme for current rangc devices. The highest magnitude value temperature coefficient of regulator voltage for regulator diodes may be expr

18、essed in terms of %/OC by the calculation (Vz at 25OC) Temperature coefficient expression in terms of %/OC or millivolts /OC is not recommended for reference diodes due to nonlinearity of the voltage variation. A voltage change over the deined temperature range is the prefer- red exgression. * A con

19、dition of thermal equilibrium may be considered to have been achieved if halving the time between the ap- plication of power and the taking of the reading causes no error in the indicated result within the required accuracy o measurement. For these purposes very long pulses or step functions may be considered as steady- state dc.