KS C IEC 61193-2-2009 Quality assessment systems－Part 2：Selection and use of sampling plans for inspection of electronic components and packages《质量评估系统 第2部分 电子元件和包装件检验用抽样检验方法的选择和使用.pdf

1、 KSKSKSKSKSKSKSK KSKSKS KSKSK KSKS KSK KS KS C IEC 61193 2 2： KS C IEC 61193 2:2009 2009 12 1 http:/www.kats.go.krKS C IEC 61193 2:2009 : ( ) ( ) FITI ( ) : (http:/www.standard.go.kr) ： ：2009 12 1 2009-0751 ： ： ( 02-509-7294) (http:/www.kats.go.kr). 10 5 , . KS C IEC 61193 2:2009 i ii 1 1 2 1 3 .2 4

2、 .2 4.1 .2 4.2 2 4.3 3 5 4 5.1 4 5.2 .4 6 (SVQL)5 6.1 .5 6.2 SVQL 5 A ( ) 60 % 100 (10 6) (SVQL) 6 A.1 SVQL 6 A.2 6 A.3 6 A.4 10 6 A.5 A.1 .9 B ( ) ISO 2859 1 10 B.1 OC ( ) 10 C ( ) (IEC/TC 40 Z )12 13 KS C IEC 61193 2:2009 14 KS C IEC 61193 2:2009 ii . , , . , , . KS C IEC 61193 2:2009 2： Quality a

3、ssessment systems Part 2： Selection and use of sampling plans for inspection of electronic components and packages 2007 1 IEC 61193 2, Quality assessment systems Part 2： Selection and use of sampling plans for inspection of electronic components and packages . 1 KS C IEC 61193 , ( “ ” ) . 0(Ac 0) ,

4、. , “ ” , . 60 % (SVQL) . “ ” KS C IEC 60194 . 2 . . ( ) . KS C IEC 60194, , KS Q ISO 2859 1, 1： (AQL) KS C IEC 61193 2:2009 2 KS Q ISO 3534 2, 2： 3 KS C IEC 60194, KS C ISO 2859 1 KS C ISO 3534 2 . 3.1 , / (MEMS) 3.2 3.3 . . 3.4 IL . 3.5 ( ) . 3.6 , 4 (Ac) 0 . 4.1 . , , , , . 4.2 KS C IEC 61193 2:2

5、009 3 4.2.1 (ISO 3534 2 3.1.3.4 ). . 4.2.2 . 4.3 4.3.1 . I, II, III , II . I , III . S-1, S-2, S-3 S-4 , . , . 4.3.2 1 , ( B ). 1 ISO 2859 1 . 1 KS C IEC 61193 2:2009 4 4.3.3 (Ac) 0, (Re) 1 . 4.3.4 , 2 (KS Q ISO 2859 1, 1 ) . KS Q ISO 2859 1 2-B( ) 2-C( ) . 2 5 5.1 4. . 5.2 . , ( ), , . 6. (SVQL) .

6、. . KS C IEC 61193 2:2009 5 6 (SVQL) 6.1 . ( ) . SVQL . SVQL . . . 100 (10 6) SVQL . . ( 3 ) . . . 6.2 SVQL 100 (10 6) SVQL . SVQL(10 6) CL / 106) CL . 3 60 % . 3 60 % (A.5 ) 0 1 2 3 4 5 6 7 8 9 10 (0.916)a2.02 1.55 1.39 1.31 1.26 1.22 1.20 1.18 1.16 1.15 10 , , A.4 ( A ). a 0 0.916 “ ” . KS C IEC 6

7、1193 2:2009 6 A ( ) 60 % 100 (10 6) (SVQL) A 60 % 100 (10 6) (SVQL) . A.1 SVQL A.1 SVQL , ( 3 ) . SVQL A.1 . a) SVQL (n) SVQL . b) SVQL SVQL . 60 % SVQL . 10(10 6) SVQL , , 140 000 . A.2 . , . . A.3 . . A.4 10 10 11 , ( ) 10 . KS C IEC 61193 2:2009 7 . A.1 100 (10 6) (SVQL) SVQL, 60 %(10 6) KS C IEC

8、 61193 2:2009 8 A.1 100 (10 6) (SVQL) ( ) 60 % (A.5 ). MIL-STD-690C 1, 8, 9 SVQL, 60 %(10 6) KS C IEC 61193 2:2009 9 A.5 A.1 A.1 . =crrnprnpepL0!/)()( np 60 % , c 0 c 10 . 1 0.6, i.e. L(p) 0.40 A.2 CL 60 % np 60 % np (c np/c 0) 0 1 2 3 4 5 6 7 8 9 10 0.916 2.02 3.11 4.18 5.24 6.29 7.35 8.39 9.43 10.

9、48 11.52 0.916 2.02 1.55 1.39 1.31 1.28 1.22 1.20 1.18 1.16 1.15 SVQL SVQL np/ . A.1 SVQL . KS C IEC 61193 2:2009 10 B ( ) ISO 2859 1 KS Q ISO 2859 1 . B.1 KS Q ISO 2859 1 2-A KS Q ISO 2859 1 , . KS Q ISO 2859 1 2 Ac/Re 0/1 . . . B.1 OC ( ) B.2 OC . AQL 1 B.1 (Ac) (Re) . 2 / 0/1 ISO 2859 1 2 . KS C

10、IEC 61193 2:2009 11 B.2 OC (p : ) . (%) P( ) KS C IEC 61193 2:2009 12 C ( ) (IEC/TC 40 Z ) C.1 IEC/TC 40 EZ a ILc nc cc A ( ) A0 4.3.2 4.3.3 4.3.1 ( A) 4.3.4 ( A) 100%d0 A1 4.2.1 S-4 b0 A2 4.2 eS-3 b B ( ) B1 4.7 S-3 b0 B2 4.14 S-3 b0 a . b 1 / KS Q ISO 2859 1(KS A IEC 60410) 2-A . c KS Q ISO 2859 1

11、(KS A IEC 60410) d 100 % . PPM . , . PPM . e SPC in-production . KS C IEC 61193 2:2009 13 KS A IEC 60410, IEC 62421： 2007, Electronic modules Generic standard KS C IEC 61193 2:2009 14 KS C IEC 61193 2:2009 . 1 1.1 (IEC) (KS) . (WTO/TBT ) , IEC 61193 2 , (KS 0001, 2009) . 2 (TC) 2.1 : TC 91( ) . 2.2

12、IEC 61193 2 KS C IEC 61193 2 . 3 3.1 , . / (,) / (.) . 3.2 . 4 . , (www.standard.go.kr ) . . 5 . 2： 153787 1 92 3(13) (02)26240114 (02)262401489 http:/ Korean Agency for Technology and Standards http:/www.kats.go.kr KS C IEC 61193 2:2009 KSKSKS SKSKS KSKS SKS KS SKS KSKS SKSKS KSKSKS Quality assessment systems Part 2：Selection and use of sampling plans for inspection of electronic components and packages ICS 31.190