KS C IEC 61580-4-2008 Methods of measurement for waveguides－Part 4：Attenuation of waveguide and waveguide assemblies《波导测量方法 第4部分 波导和波导组件的衰减》.pdf

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2、 1 2 1 3 .1 3.1 1 .2 3.2 2 .3 3.3 3 .3 3.4 4 5 4 5 4.1 1 .5 4.2 2 .5 4.3 3 .5 4.4 4 .5 5 6 5.1 6 6 .7 KS C IEC 61580 4:2008 ii . , , . , , . KS C IEC 61580 4:2008 4： Methods of measurement for waveguides Part 4： Attenuation of waveguide and waveguide assemblies (KS) (IS) 1997 1 KS C IEC 61580 4, Met

3、hods of measurement for waveguides Part 4： Attenuation of waveguide and waveguide assemblies 2006 Corrigendum 1 , . 1 . . 2 (frequency sweep) . , . 4 . 1： . . 2： . . 3： . . 4： . . (peak) (trough) . 3 1, 2 3 . . a) RF (sweep RF generator) KS C IEC 61580 4:2008 2 . b) . c) (spurious) . (return loss) ,

4、 RF . , RF . d) . ( ) , ( 45 dB ) . 1020 dB . e) (calibrated attenuators) . 3.1 1 1 1 RF / WUT KS C IEC 61580 4:2008 3 3.2 2 2 2 3.3 3 3 3 RF / WUT RF WUT / KS C IEC 61580 4:2008 4 3.3.1 (one-port cavity) Q . l , Ye 10 dB (iris) . Ye= coth( l ) (1) ： ( = j) Ys , Ytot = jYs coth( l ) (2) ljllljjYYtot

5、stantan)tanh(tan1+= , Ye (polar chart) . f0 0222tantanhtanh)1(tan)Re( YllllYtot =+=(3) llllYs222tantanh)1(tanh)(tan+= A = tanh l , AAYtotAYtotYs)(Re()Re(1(2= (4) Q0 , fBYfQ=0002 (5) , B f B = Im(Ytot). A21 dfYddfYS)(lme20gg0= lQA ( Neper) (6) , g , 0 . f0 . KS C IEC 61580 4:2008 5 AAl +=11ln21 (7) 3

6、.4 4 , , , , 1 2 . , . , WUT , . 4 4.1 1 . , . ( , ) , . . 4.2 2 . 100 % 0 dB . ( , ) , . . 4.3 3 . . ( ) , f0, Y0, B, f Q0 . 4.4 4 (open), (short), (load), (offset) . . , . . . KS C IEC 61580 4:2008 6 (dimensional tolerances) (stability of phase cable) (connector repeatability) (gaps at connector i

7、nterface) TRL . TRL 3 . , (through connection), . . . 5 , WUT . , WUT . (computational method) . 5.1 , 2 S . S11 . (directivity) (source match) (reflection tracking) S21 . (source and load match) (transmission tracking) (isolation) . . , . , . KS C IEC 61580 4:2008 7 6 . 4 4： 135513 7017 (02)60094114 (02)600948878 http:/ Korean Agency for Technology and Standards http:/www.kats.go.kr KS C IEC 61580 4:2008 KSKSKS SKSKS KSKS SKS KS SKS KSKS SKSKS KSKSKS Methods of measurement for waveguidesPart 4：Attenuation of waveguide and waveguide assemblies ICS 17.220.20； 33.120.10